DE3379688D1 - Diagnostic system in a data processor - Google Patents

Diagnostic system in a data processor

Info

Publication number
DE3379688D1
DE3379688D1 DE8383300907T DE3379688T DE3379688D1 DE 3379688 D1 DE3379688 D1 DE 3379688D1 DE 8383300907 T DE8383300907 T DE 8383300907T DE 3379688 T DE3379688 T DE 3379688T DE 3379688 D1 DE3379688 D1 DE 3379688D1
Authority
DE
Germany
Prior art keywords
data processor
diagnostic system
scanned
internal memory
internal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383300907T
Other languages
English (en)
Inventor
Katsuhiko C O Fujitsu L Shioya
Tetsuhiko C O Fujitsu Lt Ifuku
Seiichi C O Fujitsu Lt Inamasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3379688D1 publication Critical patent/DE3379688D1/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268Logging of test results

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8383300907T 1982-02-24 1983-02-22 Diagnostic system in a data processor Expired DE3379688D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57028642A JPS58144954A (ja) 1982-02-24 1982-02-24 診断方式

Publications (1)

Publication Number Publication Date
DE3379688D1 true DE3379688D1 (en) 1989-05-24

Family

ID=12254170

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383300907T Expired DE3379688D1 (en) 1982-02-24 1983-02-22 Diagnostic system in a data processor

Country Status (4)

Country Link
EP (1) EP0087314B1 (de)
JP (1) JPS58144954A (de)
DE (1) DE3379688D1 (de)
ES (1) ES8402967A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02181677A (ja) * 1989-01-06 1990-07-16 Sharp Corp Lsiのテストモード切替方式
JPH0394350A (ja) * 1989-09-07 1991-04-19 Nec Corp 半導体記憶装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833576B2 (ja) * 1977-03-14 1983-07-20 株式会社東芝 計算機システムの故障診断装置
JPS5939052B2 (ja) * 1977-03-15 1984-09-20 株式会社東芝 情報処理装置及び方法
US4223382A (en) * 1978-11-30 1980-09-16 Sperry Corporation Closed loop error correct
JPS55150047A (en) * 1979-05-10 1980-11-21 Nec Corp Test unit for information processor

Also Published As

Publication number Publication date
JPS6246021B2 (de) 1987-09-30
ES519977A0 (es) 1984-03-01
EP0087314A3 (en) 1985-07-31
ES8402967A1 (es) 1984-03-01
EP0087314A2 (de) 1983-08-31
JPS58144954A (ja) 1983-08-29
EP0087314B1 (de) 1989-04-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee