ES3073091T3 - X-ray image acquisition device and x-ray image acquisition system - Google Patents

X-ray image acquisition device and x-ray image acquisition system

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Publication number
ES3073091T3
ES3073091T3 ES22841749T ES22841749T ES3073091T3 ES 3073091 T3 ES3073091 T3 ES 3073091T3 ES 22841749 T ES22841749 T ES 22841749T ES 22841749 T ES22841749 T ES 22841749T ES 3073091 T3 ES3073091 T3 ES 3073091T3
Authority
ES
Spain
Prior art keywords
pixel
sections
summing
pixel portions
imaging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES22841749T
Other languages
English (en)
Spanish (es)
Inventor
Haruki Suzuki
Masahiro Kamiya
Yukinobu Sugiyama
Naonori HOSOYA
Hidetoshi Yoshimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of ES3073091T3 publication Critical patent/ES3073091T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/768—Addressed sensors, e.g. MOS or CMOS sensors for time delay and integration [TDI]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/779—Circuitry for scanning or addressing the pixel array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/505—Detectors scintillation

Landscapes

  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
ES22841749T 2021-07-13 2022-03-31 X-ray image acquisition device and x-ray image acquisition system Active ES3073091T3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021115658 2021-07-13
PCT/JP2022/016600 WO2023286401A1 (ja) 2021-07-13 2022-03-31 Ｘ線画像取得装置及びｘ線画像取得システム

Publications (1)

Publication Number Publication Date
ES3073091T3 true ES3073091T3 (en) 2026-07-08

Family

ID=84919324

Family Applications (1)

Application Number Title Priority Date Filing Date
ES22841749T Active ES3073091T3 (en) 2021-07-13 2022-03-31 X-ray image acquisition device and x-ray image acquisition system

Country Status (8)

Country Link
US (2) US12584867B2 (de)
EP (1) EP4358505B1 (de)
JP (2) JP7311731B2 (de)
KR (1) KR20240032111A (de)
CN (1) CN117716695A (de)
ES (1) ES3073091T3 (de)
FI (1) FI4358505T3 (de)
WO (1) WO2023286401A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
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CN121729635A (zh) * 2023-08-30 2026-03-24 浜松光子学株式会社 X射线图像获取装置、x射线图像获取系统及x射线图像获取方法
CN118229522B (zh) * 2024-02-29 2025-02-28 北京长远佳信息科技有限公司 一种全景x射线片生成方法及装置

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Also Published As

Publication number Publication date
FI4358505T3 (fi) 2026-07-13
EP4358505A4 (de) 2025-02-26
US12584867B2 (en) 2026-03-24
JPWO2023286401A1 (de) 2023-01-19
KR20240032111A (ko) 2024-03-08
US20240319116A1 (en) 2024-09-26
JP2023118936A (ja) 2023-08-25
US20260153452A1 (en) 2026-06-04
EP4358505A1 (de) 2024-04-24
CN117716695A (zh) 2024-03-15
WO2023286401A1 (ja) 2023-01-19
JP7311731B2 (ja) 2023-07-19
EP4358505B1 (de) 2026-05-27