ES2198373T3 - Un metodo y un dispositivo para medir la intensidad promedio especial de un haz de luz y un metodo y dispositivo para regular un foco luminoso. - Google Patents

Un metodo y un dispositivo para medir la intensidad promedio especial de un haz de luz y un metodo y dispositivo para regular un foco luminoso.

Info

Publication number
ES2198373T3
ES2198373T3 ES00991611T ES00991611T ES2198373T3 ES 2198373 T3 ES2198373 T3 ES 2198373T3 ES 00991611 T ES00991611 T ES 00991611T ES 00991611 T ES00991611 T ES 00991611T ES 2198373 T3 ES2198373 T3 ES 2198373T3
Authority
ES
Spain
Prior art keywords
light
photoelectric
support
components
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES00991611T
Other languages
English (en)
Spanish (es)
Inventor
Lukas Birrer
Thomas Caratsch
Olivier Elsenhans
Emad Sarofim
Urban Schnell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
F Hoffmann La Roche AG
Original Assignee
F Hoffmann La Roche AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by F Hoffmann La Roche AG filed Critical F Hoffmann La Roche AG
Application granted granted Critical
Publication of ES2198373T3 publication Critical patent/ES2198373T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
ES00991611T 1999-12-24 2000-12-19 Un metodo y un dispositivo para medir la intensidad promedio especial de un haz de luz y un metodo y dispositivo para regular un foco luminoso. Expired - Lifetime ES2198373T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP99811214 1999-12-24
EP99811214A EP1111355A1 (en) 1999-12-24 1999-12-24 A method and a device for measuring the intensity of a light beam and a method for regulating a light source

Publications (1)

Publication Number Publication Date
ES2198373T3 true ES2198373T3 (es) 2004-02-01

Family

ID=8243220

Family Applications (1)

Application Number Title Priority Date Filing Date
ES00991611T Expired - Lifetime ES2198373T3 (es) 1999-12-24 2000-12-19 Un metodo y un dispositivo para medir la intensidad promedio especial de un haz de luz y un metodo y dispositivo para regular un foco luminoso.

Country Status (7)

Country Link
US (1) US6649896B2 (enExample)
EP (2) EP1111355A1 (enExample)
JP (1) JP2003518616A (enExample)
AT (1) ATE241801T1 (enExample)
DE (1) DE60003084T2 (enExample)
ES (1) ES2198373T3 (enExample)
WO (1) WO2001048450A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7348530B2 (en) * 2004-10-05 2008-03-25 Avago Technologies Ecbu Ip Pte Ltd System, method and apparatus for regulating the light emitted by a light source
US8362436B1 (en) 2006-03-14 2013-01-29 Advanced Precision Inc. Electro-optic fluid quantity measurement system
US7671539B1 (en) 2006-11-16 2010-03-02 Advanced Precision Inc. Systems and methods for generating optical energy using a light-emitting diode
JP4645655B2 (ja) * 2008-02-04 2011-03-09 富士ゼロックス株式会社 光伝送モジュール
US8378661B1 (en) * 2008-05-29 2013-02-19 Alpha-Omega Power Technologies, Ltd.Co. Solar simulator
US9526150B1 (en) * 2013-04-02 2016-12-20 Kla-Tencor Corporation LED calibration standard having fast stabilization and lasting stability
DE102020116167A1 (de) * 2020-06-18 2021-12-23 Instrument Systems Optische Messtechnik Gmbh Messsystem zur Vermessung von Lichtquellen

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049963A (en) * 1973-09-14 1977-09-20 Coulter Information Systems, Inc. Photoelectric measuring device
FR2277436A1 (fr) * 1974-07-02 1976-01-30 Polaroid Corp Transducteur photosensible
US4060426A (en) 1974-07-02 1977-11-29 Polaroid Corporation Tin indium oxide and polyvinylcarbazole layered polarized photovoltaic cell
DE3309091A1 (de) * 1983-03-15 1984-09-20 Hanno Prof. Dr. 2000 Hamburg Schaumburg Semitransparente sensoren sowie deren herstellung und anwendung
JPH0635147Y2 (ja) * 1989-06-07 1994-09-14 アンリツ株式会社 光検出器
US5408314A (en) * 1993-02-24 1995-04-18 Perry; Jeffrey Dark current subtraction with abbreviated reference cycles and recursive filtering
JP3147570B2 (ja) * 1993-03-09 2001-03-19 日本電信電話株式会社 光通信装置
US5489771A (en) 1993-10-15 1996-02-06 University Of Virginia Patent Foundation LED light standard for photo- and videomicroscopy
GB9406605D0 (en) * 1994-04-05 1994-06-08 British Nuclear Fuels Plc Radiation beam position sensor
US5753903A (en) * 1996-11-05 1998-05-19 Medar, Inc. Method and system for controlling light intensity in a machine vision system
JP4131998B2 (ja) * 1998-04-30 2008-08-13 佐々木 実 透明な半導体受光素子およびその製造方法
US6516013B1 (en) * 1999-12-20 2003-02-04 Lambda Physik Ag Laser beam monitoring apparatus and method
US6154282A (en) * 1998-10-26 2000-11-28 Cytotelesis Inc. Semiconductor based excitation illuminator for fluorescence and phosphorescence microscopy

Also Published As

Publication number Publication date
EP1240484B1 (en) 2003-05-28
DE60003084D1 (de) 2003-07-03
EP1240484A1 (en) 2002-09-18
US20020190194A1 (en) 2002-12-19
ATE241801T1 (de) 2003-06-15
US6649896B2 (en) 2003-11-18
JP2003518616A (ja) 2003-06-10
WO2001048450A1 (en) 2001-07-05
DE60003084T2 (de) 2004-04-08
EP1111355A1 (en) 2001-06-27

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