ATE241801T1 - Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle - Google Patents

Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle

Info

Publication number
ATE241801T1
ATE241801T1 AT00991611T AT00991611T ATE241801T1 AT E241801 T1 ATE241801 T1 AT E241801T1 AT 00991611 T AT00991611 T AT 00991611T AT 00991611 T AT00991611 T AT 00991611T AT E241801 T1 ATE241801 T1 AT E241801T1
Authority
AT
Austria
Prior art keywords
module
light source
circuit
light
measuring
Prior art date
Application number
AT00991611T
Other languages
German (de)
English (en)
Inventor
Lukas Birrer
Thomas Caratsch
Olivier Elsenhans
Emad Sarofim
Urban Schnell
Original Assignee
Hoffmann La Roche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoffmann La Roche filed Critical Hoffmann La Roche
Application granted granted Critical
Publication of ATE241801T1 publication Critical patent/ATE241801T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
AT00991611T 1999-12-24 2000-12-19 Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle ATE241801T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP99811214A EP1111355A1 (en) 1999-12-24 1999-12-24 A method and a device for measuring the intensity of a light beam and a method for regulating a light source
PCT/EP2000/012986 WO2001048450A1 (en) 1999-12-24 2000-12-19 A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source

Publications (1)

Publication Number Publication Date
ATE241801T1 true ATE241801T1 (de) 2003-06-15

Family

ID=8243220

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00991611T ATE241801T1 (de) 1999-12-24 2000-12-19 Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle

Country Status (7)

Country Link
US (1) US6649896B2 (enExample)
EP (2) EP1111355A1 (enExample)
JP (1) JP2003518616A (enExample)
AT (1) ATE241801T1 (enExample)
DE (1) DE60003084T2 (enExample)
ES (1) ES2198373T3 (enExample)
WO (1) WO2001048450A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7348530B2 (en) * 2004-10-05 2008-03-25 Avago Technologies Ecbu Ip Pte Ltd System, method and apparatus for regulating the light emitted by a light source
US8362436B1 (en) 2006-03-14 2013-01-29 Advanced Precision Inc. Electro-optic fluid quantity measurement system
US7671539B1 (en) 2006-11-16 2010-03-02 Advanced Precision Inc. Systems and methods for generating optical energy using a light-emitting diode
JP4645655B2 (ja) * 2008-02-04 2011-03-09 富士ゼロックス株式会社 光伝送モジュール
US8378661B1 (en) 2008-05-29 2013-02-19 Alpha-Omega Power Technologies, Ltd.Co. Solar simulator
US9526150B1 (en) * 2013-04-02 2016-12-20 Kla-Tencor Corporation LED calibration standard having fast stabilization and lasting stability

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049963A (en) * 1973-09-14 1977-09-20 Coulter Information Systems, Inc. Photoelectric measuring device
US4060426A (en) 1974-07-02 1977-11-29 Polaroid Corporation Tin indium oxide and polyvinylcarbazole layered polarized photovoltaic cell
FR2277436A1 (fr) * 1974-07-02 1976-01-30 Polaroid Corp Transducteur photosensible
DE3309091A1 (de) * 1983-03-15 1984-09-20 Hanno Prof. Dr. 2000 Hamburg Schaumburg Semitransparente sensoren sowie deren herstellung und anwendung
JPH0635147Y2 (ja) * 1989-06-07 1994-09-14 アンリツ株式会社 光検出器
US5408314A (en) * 1993-02-24 1995-04-18 Perry; Jeffrey Dark current subtraction with abbreviated reference cycles and recursive filtering
JP3147570B2 (ja) * 1993-03-09 2001-03-19 日本電信電話株式会社 光通信装置
US5489771A (en) 1993-10-15 1996-02-06 University Of Virginia Patent Foundation LED light standard for photo- and videomicroscopy
GB9406605D0 (en) * 1994-04-05 1994-06-08 British Nuclear Fuels Plc Radiation beam position sensor
US5753903A (en) * 1996-11-05 1998-05-19 Medar, Inc. Method and system for controlling light intensity in a machine vision system
JP4131998B2 (ja) * 1998-04-30 2008-08-13 佐々木 実 透明な半導体受光素子およびその製造方法
US6516013B1 (en) * 1999-12-20 2003-02-04 Lambda Physik Ag Laser beam monitoring apparatus and method
CA2280398C (en) * 1998-10-26 2009-01-20 Lothar Lilge A semiconductor based excitation illuminator for fluorescence and phosphorescence microscopy

Also Published As

Publication number Publication date
DE60003084D1 (de) 2003-07-03
EP1111355A1 (en) 2001-06-27
EP1240484A1 (en) 2002-09-18
EP1240484B1 (en) 2003-05-28
DE60003084T2 (de) 2004-04-08
WO2001048450A1 (en) 2001-07-05
ES2198373T3 (es) 2004-02-01
US20020190194A1 (en) 2002-12-19
JP2003518616A (ja) 2003-06-10
US6649896B2 (en) 2003-11-18

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