JP2003518616A - 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置 - Google Patents

光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置

Info

Publication number
JP2003518616A
JP2003518616A JP2001548914A JP2001548914A JP2003518616A JP 2003518616 A JP2003518616 A JP 2003518616A JP 2001548914 A JP2001548914 A JP 2001548914A JP 2001548914 A JP2001548914 A JP 2001548914A JP 2003518616 A JP2003518616 A JP 2003518616A
Authority
JP
Japan
Prior art keywords
light
light beam
optoelectronic
photoelectric
array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001548914A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003518616A5 (enExample
Inventor
ビラー、ルーカス
カラッシュ、トマス
エルゼンハンス、オリヴィア
サロフィム、エマト
シュネル、ウァバーン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
F Hoffmann La Roche AG
Original Assignee
F Hoffmann La Roche AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by F Hoffmann La Roche AG filed Critical F Hoffmann La Roche AG
Publication of JP2003518616A publication Critical patent/JP2003518616A/ja
Publication of JP2003518616A5 publication Critical patent/JP2003518616A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2001548914A 1999-12-24 2000-12-19 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置 Pending JP2003518616A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP99811214.8 1999-12-24
EP99811214A EP1111355A1 (en) 1999-12-24 1999-12-24 A method and a device for measuring the intensity of a light beam and a method for regulating a light source
PCT/EP2000/012986 WO2001048450A1 (en) 1999-12-24 2000-12-19 A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source

Publications (2)

Publication Number Publication Date
JP2003518616A true JP2003518616A (ja) 2003-06-10
JP2003518616A5 JP2003518616A5 (enExample) 2007-08-30

Family

ID=8243220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001548914A Pending JP2003518616A (ja) 1999-12-24 2000-12-19 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置

Country Status (7)

Country Link
US (1) US6649896B2 (enExample)
EP (2) EP1111355A1 (enExample)
JP (1) JP2003518616A (enExample)
AT (1) ATE241801T1 (enExample)
DE (1) DE60003084T2 (enExample)
ES (1) ES2198373T3 (enExample)
WO (1) WO2001048450A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7348530B2 (en) * 2004-10-05 2008-03-25 Avago Technologies Ecbu Ip Pte Ltd System, method and apparatus for regulating the light emitted by a light source
US8362436B1 (en) 2006-03-14 2013-01-29 Advanced Precision Inc. Electro-optic fluid quantity measurement system
US7671539B1 (en) 2006-11-16 2010-03-02 Advanced Precision Inc. Systems and methods for generating optical energy using a light-emitting diode
JP4645655B2 (ja) * 2008-02-04 2011-03-09 富士ゼロックス株式会社 光伝送モジュール
US8378661B1 (en) 2008-05-29 2013-02-19 Alpha-Omega Power Technologies, Ltd.Co. Solar simulator
US9526150B1 (en) * 2013-04-02 2016-12-20 Kla-Tencor Corporation LED calibration standard having fast stabilization and lasting stability

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0125390A1 (de) * 1983-03-15 1984-11-21 Hanno Prof. Dr.-Ing. Schaumburg Semitransparente Sensoren sowie deren Herstellung und Anwendung
JPH036529U (enExample) * 1989-06-07 1991-01-22
JPH06260676A (ja) * 1993-03-09 1994-09-16 Nippon Telegr & Teleph Corp <Ntt> 光通信装置
JPH11312821A (ja) * 1998-04-30 1999-11-09 Kazuhiro Hane 透明な半導体受光素子およびその製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049963A (en) * 1973-09-14 1977-09-20 Coulter Information Systems, Inc. Photoelectric measuring device
US4060426A (en) 1974-07-02 1977-11-29 Polaroid Corporation Tin indium oxide and polyvinylcarbazole layered polarized photovoltaic cell
FR2277436A1 (fr) * 1974-07-02 1976-01-30 Polaroid Corp Transducteur photosensible
US5408314A (en) * 1993-02-24 1995-04-18 Perry; Jeffrey Dark current subtraction with abbreviated reference cycles and recursive filtering
US5489771A (en) 1993-10-15 1996-02-06 University Of Virginia Patent Foundation LED light standard for photo- and videomicroscopy
GB9406605D0 (en) * 1994-04-05 1994-06-08 British Nuclear Fuels Plc Radiation beam position sensor
US5753903A (en) * 1996-11-05 1998-05-19 Medar, Inc. Method and system for controlling light intensity in a machine vision system
US6516013B1 (en) * 1999-12-20 2003-02-04 Lambda Physik Ag Laser beam monitoring apparatus and method
CA2280398C (en) * 1998-10-26 2009-01-20 Lothar Lilge A semiconductor based excitation illuminator for fluorescence and phosphorescence microscopy

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0125390A1 (de) * 1983-03-15 1984-11-21 Hanno Prof. Dr.-Ing. Schaumburg Semitransparente Sensoren sowie deren Herstellung und Anwendung
JPH036529U (enExample) * 1989-06-07 1991-01-22
JPH06260676A (ja) * 1993-03-09 1994-09-16 Nippon Telegr & Teleph Corp <Ntt> 光通信装置
JPH11312821A (ja) * 1998-04-30 1999-11-09 Kazuhiro Hane 透明な半導体受光素子およびその製造方法

Also Published As

Publication number Publication date
DE60003084D1 (de) 2003-07-03
EP1111355A1 (en) 2001-06-27
EP1240484A1 (en) 2002-09-18
EP1240484B1 (en) 2003-05-28
DE60003084T2 (de) 2004-04-08
WO2001048450A1 (en) 2001-07-05
ES2198373T3 (es) 2004-02-01
US20020190194A1 (en) 2002-12-19
ATE241801T1 (de) 2003-06-15
US6649896B2 (en) 2003-11-18

Similar Documents

Publication Publication Date Title
FI77736B (fi) Foerfarande foer reglering av straolkaella och reglerbar straolkaella.
KR100832161B1 (ko) 광학 피드백을 위한 광감지기 구성을 구비하는 ｌｅｄ조명 기구
JP5615909B2 (ja) 量子効率測定システムおよび使用方法
US20060226336A1 (en) Apparatus and method for collecting and detecting light emitted by a lighting apparatus
US4319830A (en) Multispectral light detection system
CN102472463A (zh) 太阳能模拟器和太阳能电池检查设备
JP2003518616A (ja) 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置
TWI740416B (zh) 光源裝置及光源裝置勻光度即時監測系統
CN117419304A (zh) 一种太阳光模拟装置及其控制方法
WO2006099732A1 (en) Apparatus and method for collecting and detecting light emitted by a lighting apparatus
CN111366241B (zh) 激光器脉冲能量测量装置、系统和方法
TWM345349U (en) Optical receiver device of solar cell and the entire luminous flux detection system with it
CN111157141A (zh) 一种多路合一的光纤测温模块及其控制方法
CN212682786U (zh) 带有功率校正功能的激光加工系统
CN217239990U (zh) 一种波长稳定的激光器
US5072112A (en) Method for realizing a primary photometric standard of optical radiation using a silicon photodiode
RU2043638C1 (ru) Элемент питания устройства телеметрии
RU2038585C1 (ru) Фотоколориметрический газоанализатор
US5061066A (en) Method for realizing a primary photometric standard of optical radiation using a photodetector and photodetecting apparatus therefor
JPH11142326A (ja) グリコヘモグロビン測定用の吸光度計
JP2512249B2 (ja) 光ビ―ム加熱装置
WO2024175709A1 (en) Factory or in-field calibration of thermo-electric and thermo-optical properties
CN114200068A (zh) 一种具有参比端的二极管阵列检测器及控制方法
Ganiany et al. Solar photometry: Application of new silicon cell
JPS61225626A (ja) 光計測装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070712

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070712

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100413

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100423

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20100723

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20100730

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20110114