DE60003084T2 - Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle - Google Patents
Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle Download PDFInfo
- Publication number
- DE60003084T2 DE60003084T2 DE60003084T DE60003084T DE60003084T2 DE 60003084 T2 DE60003084 T2 DE 60003084T2 DE 60003084 T DE60003084 T DE 60003084T DE 60003084 T DE60003084 T DE 60003084T DE 60003084 T2 DE60003084 T2 DE 60003084T2
- Authority
- DE
- Germany
- Prior art keywords
- photoelectric
- light
- light source
- light beam
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000001105 regulatory effect Effects 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims description 14
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000009826 distribution Methods 0.000 claims abstract description 5
- 230000010287 polarization Effects 0.000 claims description 6
- 230000032683 aging Effects 0.000 claims description 3
- 229920000642 polymer Polymers 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims description 2
- 230000001276 controlling effect Effects 0.000 claims 1
- 229920002120 photoresistant polymer Polymers 0.000 claims 1
- 238000007493 shaping process Methods 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 abstract description 7
- 239000000758 substrate Substances 0.000 description 20
- 230000003287 optical effect Effects 0.000 description 9
- 241000219739 Lens Species 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 240000004322 Lens culinaris Species 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- HVMJUDPAXRRVQO-UHFFFAOYSA-N copper indium Chemical compound [Cu].[In] HVMJUDPAXRRVQO-UHFFFAOYSA-N 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- ZZEMEJKDTZOXOI-UHFFFAOYSA-N digallium;selenium(2-) Chemical compound [Ga+3].[Ga+3].[Se-2].[Se-2].[Se-2] ZZEMEJKDTZOXOI-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000000338 in vitro Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
- G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
- G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP99811214A EP1111355A1 (en) | 1999-12-24 | 1999-12-24 | A method and a device for measuring the intensity of a light beam and a method for regulating a light source |
| EP99811214 | 1999-12-24 | ||
| PCT/EP2000/012986 WO2001048450A1 (en) | 1999-12-24 | 2000-12-19 | A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60003084D1 DE60003084D1 (de) | 2003-07-03 |
| DE60003084T2 true DE60003084T2 (de) | 2004-04-08 |
Family
ID=8243220
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60003084T Expired - Lifetime DE60003084T2 (de) | 1999-12-24 | 2000-12-19 | Verfahren und vorrichtung zur messung der räumlich gemittelten intensität eines lichtstrahls, verfahren und vorrichtung zur regelung einer lichtquelle |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6649896B2 (enExample) |
| EP (2) | EP1111355A1 (enExample) |
| JP (1) | JP2003518616A (enExample) |
| AT (1) | ATE241801T1 (enExample) |
| DE (1) | DE60003084T2 (enExample) |
| ES (1) | ES2198373T3 (enExample) |
| WO (1) | WO2001048450A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7348530B2 (en) * | 2004-10-05 | 2008-03-25 | Avago Technologies Ecbu Ip Pte Ltd | System, method and apparatus for regulating the light emitted by a light source |
| US8362436B1 (en) | 2006-03-14 | 2013-01-29 | Advanced Precision Inc. | Electro-optic fluid quantity measurement system |
| US7671539B1 (en) | 2006-11-16 | 2010-03-02 | Advanced Precision Inc. | Systems and methods for generating optical energy using a light-emitting diode |
| JP4645655B2 (ja) * | 2008-02-04 | 2011-03-09 | 富士ゼロックス株式会社 | 光伝送モジュール |
| US8378661B1 (en) | 2008-05-29 | 2013-02-19 | Alpha-Omega Power Technologies, Ltd.Co. | Solar simulator |
| US9526150B1 (en) * | 2013-04-02 | 2016-12-20 | Kla-Tencor Corporation | LED calibration standard having fast stabilization and lasting stability |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4049963A (en) * | 1973-09-14 | 1977-09-20 | Coulter Information Systems, Inc. | Photoelectric measuring device |
| US4060426A (en) | 1974-07-02 | 1977-11-29 | Polaroid Corporation | Tin indium oxide and polyvinylcarbazole layered polarized photovoltaic cell |
| FR2277436A1 (fr) * | 1974-07-02 | 1976-01-30 | Polaroid Corp | Transducteur photosensible |
| DE3309091A1 (de) * | 1983-03-15 | 1984-09-20 | Hanno Prof. Dr. 2000 Hamburg Schaumburg | Semitransparente sensoren sowie deren herstellung und anwendung |
| JPH0635147Y2 (ja) * | 1989-06-07 | 1994-09-14 | アンリツ株式会社 | 光検出器 |
| US5408314A (en) * | 1993-02-24 | 1995-04-18 | Perry; Jeffrey | Dark current subtraction with abbreviated reference cycles and recursive filtering |
| JP3147570B2 (ja) * | 1993-03-09 | 2001-03-19 | 日本電信電話株式会社 | 光通信装置 |
| US5489771A (en) | 1993-10-15 | 1996-02-06 | University Of Virginia Patent Foundation | LED light standard for photo- and videomicroscopy |
| GB9406605D0 (en) * | 1994-04-05 | 1994-06-08 | British Nuclear Fuels Plc | Radiation beam position sensor |
| US5753903A (en) * | 1996-11-05 | 1998-05-19 | Medar, Inc. | Method and system for controlling light intensity in a machine vision system |
| JP4131998B2 (ja) * | 1998-04-30 | 2008-08-13 | 佐々木 実 | 透明な半導体受光素子およびその製造方法 |
| US6516013B1 (en) * | 1999-12-20 | 2003-02-04 | Lambda Physik Ag | Laser beam monitoring apparatus and method |
| CA2280398C (en) * | 1998-10-26 | 2009-01-20 | Lothar Lilge | A semiconductor based excitation illuminator for fluorescence and phosphorescence microscopy |
-
1999
- 1999-12-24 EP EP99811214A patent/EP1111355A1/en not_active Withdrawn
-
2000
- 2000-12-19 EP EP00991611A patent/EP1240484B1/en not_active Expired - Lifetime
- 2000-12-19 DE DE60003084T patent/DE60003084T2/de not_active Expired - Lifetime
- 2000-12-19 ES ES00991611T patent/ES2198373T3/es not_active Expired - Lifetime
- 2000-12-19 US US10/168,790 patent/US6649896B2/en not_active Expired - Lifetime
- 2000-12-19 JP JP2001548914A patent/JP2003518616A/ja active Pending
- 2000-12-19 WO PCT/EP2000/012986 patent/WO2001048450A1/en not_active Ceased
- 2000-12-19 AT AT00991611T patent/ATE241801T1/de active
Also Published As
| Publication number | Publication date |
|---|---|
| DE60003084D1 (de) | 2003-07-03 |
| EP1111355A1 (en) | 2001-06-27 |
| EP1240484A1 (en) | 2002-09-18 |
| EP1240484B1 (en) | 2003-05-28 |
| WO2001048450A1 (en) | 2001-07-05 |
| ES2198373T3 (es) | 2004-02-01 |
| US20020190194A1 (en) | 2002-12-19 |
| ATE241801T1 (de) | 2003-06-15 |
| JP2003518616A (ja) | 2003-06-10 |
| US6649896B2 (en) | 2003-11-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |