ES2167885T3 - Aparato y metodo de formacion de imagen por microscopia. - Google Patents
Aparato y metodo de formacion de imagen por microscopia.Info
- Publication number
- ES2167885T3 ES2167885T3 ES98914965T ES98914965T ES2167885T3 ES 2167885 T3 ES2167885 T3 ES 2167885T3 ES 98914965 T ES98914965 T ES 98914965T ES 98914965 T ES98914965 T ES 98914965T ES 2167885 T3 ES2167885 T3 ES 2167885T3
- Authority
- ES
- Spain
- Prior art keywords
- microscopy
- image formation
- images
- recorded
- transparent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000015572 biosynthetic process Effects 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000000386 microscopy Methods 0.000 title 1
- 230000000737 periodic effect Effects 0.000 abstract 1
- 238000001454 recorded image Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Closed-Circuit Television Systems (AREA)
- Eye Examination Apparatus (AREA)
Abstract
Un método de generación de una imagen de una muestra (0) que consta de los pasos de iluminar la muestra (0) con una fuente de luz (10); generar un modelo espacial sustancialmente periódico sobre la muestra (0); grabar una primera imagen de la muestra (0); alterar la fase espacial del modelo sobre la muestra (0) y grabar una segunda imagen de la muestra (0); repetir al menos una vez más los pasos de alterar la fase espacial del modelo en la muestra (0) y grabar una tercera imagen de la muestra (0), siendo diferente la fase espacial del modelo en al menos tres imágenes grabadas de la muestra (0); y analizar las tres o más imágenes grabadas de la muestra (0) para eliminar el modelo espacial de las imágenes para generar con ello una imagen ópticamente seccionada de la muestra (0), caracterizado porque se obtiene una imagen ópticamente seccionada agrupando las imágenes grabadas en parejas de imágenes, calculando la raíz cuadrada de la suma de los cuadrados de las diferencias entre las imágenes grabadas en cada pareja de imágenes, y, si se graban tres imágenes, el modelo espacial se elimina según la fórmula: I= q (I1-I2) 2 + (I1-I3) 2 + (I2-I3) 2 en la que las tres imágenes grabadas son I1, I2 e I3, y la imagen ópticamente seccionada es I.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9706843.1A GB9706843D0 (en) | 1997-04-04 | 1997-04-04 | Microscopy imaging apparatus and a method thereof |
GBGB9726485.7A GB9726485D0 (en) | 1997-12-15 | 1997-12-15 | Microscopy imaging apparatus and method |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2167885T3 true ES2167885T3 (es) | 2002-05-16 |
Family
ID=26311316
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES98914965T Expired - Lifetime ES2167885T3 (es) | 1997-04-04 | 1998-04-03 | Aparato y metodo de formacion de imagen por microscopia. |
Country Status (11)
Country | Link |
---|---|
US (1) | US6376818B1 (es) |
EP (1) | EP0972220B1 (es) |
JP (1) | JP3066874B2 (es) |
KR (1) | KR100504261B1 (es) |
AT (1) | ATE208911T1 (es) |
AU (1) | AU737617B2 (es) |
DE (1) | DE69802514T2 (es) |
DK (1) | DK0972220T3 (es) |
ES (1) | ES2167885T3 (es) |
GB (1) | GB2338858B (es) |
WO (1) | WO1998045745A1 (es) |
Families Citing this family (70)
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DE19908883A1 (de) | 1999-03-02 | 2000-09-07 | Rainer Heintzmann | Verfahren zur Erhöhung der Auflösung optischer Abbildung |
US6731390B2 (en) | 1999-07-01 | 2004-05-04 | Carl Zeiss Jena Gmbh | Process and apparatus for determining surface information using a projected structure with a periodically changing brightness curve |
DE19930816A1 (de) * | 1999-07-01 | 2001-01-04 | Zeiss Carl Jena Gmbh | Verfahren und Vorrichtung zur Tiefenselektion von Mikroskopbildern |
JP4429431B2 (ja) * | 1999-10-21 | 2010-03-10 | オリンパス株式会社 | 光学装置 |
JP2001311874A (ja) * | 2000-04-28 | 2001-11-09 | Yokogawa Electric Corp | 光スキャナ及びこれを用いた断層画像取得装置 |
DE10038527A1 (de) * | 2000-08-08 | 2002-02-21 | Zeiss Carl Jena Gmbh | Anordnung zur Erhöhung der Tiefendiskriminierung optisch abbildender Systeme |
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US7274446B2 (en) | 2001-04-07 | 2007-09-25 | Carl Zeiss Jena Gmbh | Method and arrangement for the deep resolved optical recording of a sample |
GB0200819D0 (en) * | 2002-01-15 | 2002-03-06 | Cole Polytechnique Federale De | Microscopy imaging apparatus and method for generating an image |
DE10250567C5 (de) | 2002-10-28 | 2019-09-12 | Carl Zeiss Microscopy Gmbh | Mikroskop mit einem Schieber und Schieber |
DE10250568A1 (de) * | 2002-10-28 | 2004-05-13 | Carl Zeiss Jena Gmbh | Verfahren zur Verbesserung der Tiefendiskriminierung optisch abbildender Systeme |
DE10254139A1 (de) * | 2002-11-15 | 2004-05-27 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe |
GB0301775D0 (en) * | 2003-01-25 | 2003-02-26 | Wilson John E | Device and method for 3Dimaging |
DE10347389A1 (de) * | 2003-07-03 | 2005-05-19 | Carl Zeiss Jena Gmbh | Anordnung zur Eliminierung von Falschlicht |
US7139067B2 (en) * | 2003-09-12 | 2006-11-21 | Textron Systems Corporation | Three-dimensional imaging with multiframe blind deconvolution |
EP1607064B1 (en) | 2004-06-17 | 2008-09-03 | Cadent Ltd. | Method and apparatus for colour imaging a three-dimensional structure |
US7115848B1 (en) | 2004-09-29 | 2006-10-03 | Qioptiq Imaging Solutions, Inc. | Methods, systems and computer program products for calibration of microscopy imaging devices |
DE102004053730B4 (de) * | 2004-11-06 | 2014-04-03 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur Unterdrückung von Falschlicht |
DE102005046754A1 (de) * | 2005-09-29 | 2007-04-05 | Carl Zeiss Jena Gmbh | Vorrichtung und Verfahren zur tiefenaufgelösten optischen Erfassung einer Probe |
DE102005046755A1 (de) * | 2005-09-29 | 2007-04-19 | Carl Zeiss Jena Gmbh | Vorrichtung und Verfahren zum Erzeugen eines Bildes eines Objektes |
DE102006031177A1 (de) | 2006-07-06 | 2008-01-10 | Carl Zeiss Microimaging Gmbh | Verfahren und Vorrichtung zur Erzeugung eines Bildes einer dünnen Schicht eines Objekts |
DE102007018048A1 (de) | 2007-04-13 | 2008-10-16 | Michael Schwertner | Verfahren und Anordnung zur optischen Abbildung mit Tiefendiskriminierung |
DE102007023270A1 (de) | 2007-05-18 | 2008-11-20 | Linos Photonics Gmbh & Co. Kg | Funduskamera |
US7729049B2 (en) * | 2007-05-26 | 2010-06-01 | Zeta Instruments, Inc. | 3-d optical microscope |
US8184364B2 (en) * | 2007-05-26 | 2012-05-22 | Zeta Instruments, Inc. | Illuminator for a 3-D optical microscope |
DE102007045897A1 (de) | 2007-09-26 | 2009-04-09 | Carl Zeiss Microimaging Gmbh | Verfahren zur mikroskopischen dreidimensionalen Abbildung einer Probe |
DE102007047466A1 (de) | 2007-09-28 | 2009-04-02 | Carl Zeiss Microimaging Gmbh | Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe |
DE102007047460A1 (de) * | 2007-09-28 | 2009-04-09 | Carl Zeiss Meditec Ag | Vorrichtung und Verfahren zur Untersuchung des Augenhintergrundes, inbesondere der Photorezeptoren |
US8537461B2 (en) | 2007-11-26 | 2013-09-17 | Carl Zeiss Microimaging Gmbh | Method and configuration for the optical detection of an illuminated specimen |
US8089691B2 (en) * | 2007-12-10 | 2012-01-03 | Quorum Technologies Inc. | Projection device for patterned illumination and microscopy |
US7994485B2 (en) * | 2008-04-08 | 2011-08-09 | Carestream Health, Inc. | Apparatus and method for fluorescence measurements using spatially structured illumination |
CN101661159B (zh) * | 2008-08-25 | 2011-09-21 | 麦克奥迪实业集团有限公司 | 一种基于二维调制技术的切层图像获取方法 |
DE102008049886B4 (de) | 2008-09-30 | 2021-11-04 | Carl Zeiss Microscopy Gmbh | Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben |
DE102009009950A1 (de) | 2009-02-23 | 2010-10-21 | Confovis Gmbh | Anordnung und Verfahren für die Gewinnung von dreidimensionalen Objektdaten |
GB0907965D0 (en) * | 2009-05-08 | 2009-06-24 | King S College London | Imaging system |
CA2763826C (en) | 2009-06-17 | 2020-04-07 | 3Shape A/S | Focus scanning apparatus |
EP2327956B1 (en) | 2009-11-20 | 2014-01-22 | Mitutoyo Corporation | Method and apparatus for determining the height of a number of spatial positions on a sample |
US9389408B2 (en) | 2010-07-23 | 2016-07-12 | Zeta Instruments, Inc. | 3D microscope and methods of measuring patterned substrates |
EP2437027A3 (de) | 2010-10-03 | 2012-05-30 | Confovis GmbH | Vorrichtung und Verfahren zur dreidimensionalen optischen Abtastung einer Probe |
US8649024B2 (en) | 2010-12-03 | 2014-02-11 | Zygo Corporation | Non-contact surface characterization using modulated illumination |
DE102011077236A1 (de) | 2011-06-08 | 2012-12-13 | Carl Zeiss Microlmaging Gmbh | Autofokusverfahren für Mikroskop und Mikroskop mit Autofokuseinrichtung |
DE102011114500B4 (de) | 2011-09-29 | 2022-05-05 | Fei Company | Mikroskopvorrichtung |
US8964183B2 (en) * | 2012-05-31 | 2015-02-24 | General Electric Company | Systems and methods for screening of biological samples |
DE102012223128B4 (de) | 2012-12-13 | 2022-09-01 | Carl Zeiss Microscopy Gmbh | Autofokusverfahren für Mikroskop und Mikroskop mit Autofokuseinrichtung |
US20140168402A1 (en) * | 2012-12-13 | 2014-06-19 | Vala Sciences, Inc. | Continuous-Scanning Image Acquisition in Automated Microscopy Using Reflective Autofocus |
JP6104662B2 (ja) * | 2013-03-25 | 2017-03-29 | 株式会社東芝 | 計測装置、方法及びプログラム |
US9350921B2 (en) | 2013-06-06 | 2016-05-24 | Mitutoyo Corporation | Structured illumination projection with enhanced exposure control |
JP6327830B2 (ja) | 2013-10-25 | 2018-05-23 | 株式会社キーエンス | 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム |
JP6266302B2 (ja) * | 2013-10-25 | 2018-01-24 | 株式会社キーエンス | 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム |
JP6305012B2 (ja) | 2013-10-25 | 2018-04-04 | 株式会社キーエンス | 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム |
EP2899583A3 (en) | 2014-01-26 | 2015-08-12 | Matthew Stefan Muller | Periodic fringe imaging with structured pattern illumination and electronic rolling shutter detection |
WO2015118120A1 (en) | 2014-02-07 | 2015-08-13 | 3Shape A/S | Detecting tooth shade |
US9675430B2 (en) | 2014-08-15 | 2017-06-13 | Align Technology, Inc. | Confocal imaging apparatus with curved focal surface |
KR200481573Y1 (ko) * | 2014-10-14 | 2016-10-28 | 금다운 | 나전사 및 이를 이용하여 제직된 나전직 원단 |
WO2016160716A1 (en) * | 2015-03-27 | 2016-10-06 | Syntheslide, LLC | Systems and methods for combining magnified images of a sample |
JP6627871B2 (ja) | 2015-06-08 | 2020-01-08 | 株式会社ニコン | 構造化照明顕微鏡システム、方法及びプログラム |
CN106054380A (zh) * | 2016-07-15 | 2016-10-26 | 中国科学院苏州生物医学工程技术研究所 | 使用fpga加速处理结构光照明光切片荧光图像的方法 |
DE102016117803A1 (de) | 2016-09-21 | 2018-03-22 | Leica Microsystems Cms Gmbh | Mikroskopbeleuchtungsanordnung zur strukturierten Beleuchtung |
CN107101982A (zh) * | 2017-03-09 | 2017-08-29 | 深圳先进技术研究院 | 荧光显微装置 |
DE102017004428B4 (de) | 2017-05-08 | 2018-11-29 | Universität Stuttgart | Verfahren und Anordnung zur robusten, tiefenscannenden fokussierenden Streifen-Triangulation mit mehreren Wavelets |
DE102017004429B4 (de) | 2017-05-08 | 2019-05-09 | Universität Stuttgart | Verfahren und Anordnung zur robusten, tiefenscannenden/fokussierenden Streifen-Triangulation |
GB201721451D0 (en) * | 2017-12-20 | 2018-01-31 | Univ Manchester | Apparatus and method for determining spectral information |
CN108169887B (zh) * | 2017-12-27 | 2020-04-24 | 清华大学 | 3d多焦面结构光快速显微成像系统及方法 |
TWI696820B (zh) * | 2018-02-22 | 2020-06-21 | 致茂電子股份有限公司 | 檢測裝置 |
CN110186925A (zh) * | 2018-02-22 | 2019-08-30 | 致茂电子(苏州)有限公司 | 检测装置 |
EP3857284B1 (en) * | 2018-09-27 | 2023-12-27 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Method of and apparatus for forming and shifting a light intensity distribution in a focal area of an objective lens |
CN111122567B (zh) * | 2018-11-01 | 2022-09-16 | 华中科技大学苏州脑空间信息研究院 | 一种高通量光学层析三维成像系统 |
DE102019129932B4 (de) * | 2019-11-06 | 2023-12-21 | Technische Universität Braunschweig | Optische Detektionseinrichtung und Verfahren zum Betreiben einer optischen Detektionseinrichtung |
US20240019678A1 (en) * | 2022-07-15 | 2024-01-18 | Nanotronics Imaging, Inc. | Autofocus system and method |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2928548B2 (ja) * | 1989-08-02 | 1999-08-03 | 株式会社日立製作所 | 立体形状検出方法及びその装置 |
GB9102903D0 (en) * | 1991-02-12 | 1991-03-27 | Oxford Sensor Tech | An optical sensor |
US5513275A (en) * | 1993-01-12 | 1996-04-30 | Board Of Trustees Of The Leland Stanford Junior University | Automated direct patterned wafer inspection |
JPH11504452A (ja) * | 1995-04-25 | 1999-04-20 | コグニテンズ・リミテッド | 2次元投影図に基づいて3次元の対象物を再現し、取り扱うための装置と方法 |
US5867604A (en) * | 1995-08-03 | 1999-02-02 | Ben-Levy; Meir | Imaging measurement system |
JPH11242189A (ja) * | 1997-12-25 | 1999-09-07 | Olympus Optical Co Ltd | 像形成法、像形成装置 |
US6188478B1 (en) * | 1998-10-21 | 2001-02-13 | Philips Electronics North America Corporation | Method and apparatus for film-thickness measurements |
-
1998
- 1998-04-03 ES ES98914965T patent/ES2167885T3/es not_active Expired - Lifetime
- 1998-04-03 AT AT98914965T patent/ATE208911T1/de not_active IP Right Cessation
- 1998-04-03 AU AU69264/98A patent/AU737617B2/en not_active Ceased
- 1998-04-03 DK DK98914965T patent/DK0972220T3/da active
- 1998-04-03 JP JP10542491A patent/JP3066874B2/ja not_active Expired - Fee Related
- 1998-04-03 KR KR10-1999-7009051A patent/KR100504261B1/ko not_active IP Right Cessation
- 1998-04-03 EP EP98914965A patent/EP0972220B1/en not_active Expired - Lifetime
- 1998-04-03 GB GB9922732A patent/GB2338858B/en not_active Expired - Fee Related
- 1998-04-03 WO PCT/GB1998/000988 patent/WO1998045745A1/en active IP Right Grant
- 1998-04-03 DE DE69802514T patent/DE69802514T2/de not_active Expired - Lifetime
-
1999
- 1999-10-01 US US09/410,614 patent/US6376818B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ATE208911T1 (de) | 2001-11-15 |
WO1998045745A1 (en) | 1998-10-15 |
JP2000506634A (ja) | 2000-05-30 |
JP3066874B2 (ja) | 2000-07-17 |
GB9922732D0 (en) | 1999-11-24 |
US6376818B1 (en) | 2002-04-23 |
DE69802514T2 (de) | 2002-06-27 |
GB2338858B (en) | 2000-12-27 |
DK0972220T3 (da) | 2002-03-11 |
AU737617B2 (en) | 2001-08-23 |
EP0972220B1 (en) | 2001-11-14 |
GB2338858A (en) | 1999-12-29 |
AU6926498A (en) | 1998-10-30 |
DE69802514D1 (de) | 2001-12-20 |
KR20010005974A (ko) | 2001-01-15 |
EP0972220A1 (en) | 2000-01-19 |
KR100504261B1 (ko) | 2005-07-27 |
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