ES2100729T3 - Adaptador de material macizo. - Google Patents
Adaptador de material macizo.Info
- Publication number
- ES2100729T3 ES2100729T3 ES94922259T ES94922259T ES2100729T3 ES 2100729 T3 ES2100729 T3 ES 2100729T3 ES 94922259 T ES94922259 T ES 94922259T ES 94922259 T ES94922259 T ES 94922259T ES 2100729 T3 ES2100729 T3 ES 2100729T3
- Authority
- ES
- Spain
- Prior art keywords
- adapter
- contact
- printed circuit
- pins
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
LA INVENCION SE REFIERE A UN ADAPTADOR DISEÑADO PARA ADAPTACION DE DISPOSICION DE CONTACTO REGULAR EN UN DISPOSITIVO DE PRUEBA ELECTRICO PARA PLACAS DE CIRCUITO IMPRESO CON RESPECTO A LA CONFIGURACION IRREGULAR DE LOS PUNTOS DE CONTACTO SOBRE UNO O AMBOS LADOS DE LA PLACA DE CIRCUITO IMPRESO BAJO PRUEBA. EL ADAPTADOR DISPONE DE PASADORES DE TEST SIMILARES A AGUJAS QUE DESCANSAN EN UN EXTREMO CONTRA LOS CONTACTOS DISPUESTOS DE FORMA REGULAR EN EL BANDO DE CONTACTO DEL DISPOSITIVO DE PRUEBA Y SE EXTIENDEN A TRAVES DE CANALES EN EL ADAPTADOR, LOS OTROS EXTREMOS DE LOS PASADORES CONTACTAN LOS PUNTOS DE CONTACTADO DISTRIBUIDOS IRREGULARMENTE DE FORMA HABITUAL DE LA PLACA DE CIRCUITO IMPRESO BAJO PRUEBA. LA SUPERFICIE SUPERIOR DEL ADAPTADOR DESCANSA CONTRA LA SUPERFICIE DE CIRCUITO IMPRESO CONTACTADA Y LA SUPERFICIE DEL FONDO DESCANSA CONTRA EL BANCO DE CONTACTO DEL DISPOSITIVO DE PRUEBA. PARA DISPONER DE UN ADAPTADOR QUE NO ES CARO DE FABRICAR Y QUE PUEDA SER UTILIZADO PARA AMBOS LADOS DE LA PLACA DE CIRCUITO IMPRESO CON UNA DENSIDAD DE CONTACTO ALTA, LA INVENCION PROPONE QUE, EN LA ZONA ENTRE LA SUPERFICIE DEL FONDO Y LA SUPERFICIE SUPERIOR, EL ADAPTADOR COMPRENDA UN CUERPO SOLIDO DE BAJA DENSIDAD ESENCIALMENTE INCOMPRENSIBLE CON UNA ALTA RESISTENCIA AL APLASTADO Y A TRAVES DEL CUAL PASA LOS CANALES DE PASADORES DE PRUEBA. ADECUADO PARA UTILIZACION EN UN ADAPTADOR DE ESTE TIPO SON PASADORES DE PRUEBA DEL TIPO SUAVE "MUSIC WIRE" SIN CARACTERISTICAS DE SUPERFICIE, DISPONIENDO LOS PASADORES DE UN CABEZAL ELABORADO MEDIANTE SIMPLE CURVADO DEL EXTREMO DEL PASADOR PARA FORMAR UN CIRCULO O GANCHO.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4323276A DE4323276A1 (de) | 1993-07-12 | 1993-07-12 | Vollmaterialadapter |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2100729T3 true ES2100729T3 (es) | 1997-06-16 |
Family
ID=6492596
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES94922259T Expired - Lifetime ES2100729T3 (es) | 1993-07-12 | 1994-07-05 | Adaptador de material macizo. |
Country Status (8)
Country | Link |
---|---|
US (1) | US5977786A (es) |
EP (1) | EP0708926B1 (es) |
JP (1) | JPH09503578A (es) |
CA (1) | CA2167062C (es) |
DE (2) | DE4323276A1 (es) |
DK (1) | DK0708926T3 (es) |
ES (1) | ES2100729T3 (es) |
WO (1) | WO1995002829A1 (es) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6154863A (en) * | 1996-10-28 | 2000-11-28 | Atg Test Systems Gmbh | Apparatus and method for testing non-componented printed circuit boards |
DE19644725C1 (de) * | 1996-10-28 | 1998-04-02 | Atg Test Systems Gmbh | Vorrichtung und Verfahren zum Prüfen von Leiterplatten |
DE19939955A1 (de) * | 1999-08-23 | 2001-03-01 | Atg Test Systems Gmbh | Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten |
DE10043726C2 (de) * | 2000-09-05 | 2003-12-04 | Atg Test Systems Gmbh | Verfahren zum Prüfen von Leiterplatten mit einem Paralleltester und eine Vorrichtung zum Ausführen des Verfahrens |
DE10043728C2 (de) * | 2000-09-05 | 2003-12-04 | Atg Test Systems Gmbh | Verfahren zum Prüfen von Leiterplatten und Verwendung einer Vorrichtung zum Ausführen des Verfahrens |
EP1233272A1 (de) * | 2001-02-19 | 2002-08-21 | MANIA GmbH & Co. | Verfahren zur Herstellung eines Vollmaterialadapters aus einem mit Licht aushärtbaren Photopolymer |
US20090267631A1 (en) * | 2008-04-24 | 2009-10-29 | Honeywell International Inc. | Large Component Thermal Head Adapter |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1508884A (en) * | 1975-05-17 | 1978-04-26 | Int Computers Ltd | Apparatus for testing printed circuit board assemblies |
SU813330A1 (ru) * | 1977-07-18 | 1981-03-15 | Завод "Калибр" Минского Производст-Венного Объединения Имени B.И.Ленина | Зондовое устройство |
US4322682A (en) * | 1979-05-21 | 1982-03-30 | Everett/Charles Inc. | Vacuum actuated test head having programming plate |
US4352061A (en) * | 1979-05-24 | 1982-09-28 | Fairchild Camera & Instrument Corp. | Universal test fixture employing interchangeable wired personalizers |
DE3316103C2 (de) * | 1983-05-03 | 1991-12-12 | Nixdorf Computer Ag, 4790 Paderborn | Prüfnadel für ein Prüfgerät zum Prüfen von Leiterplatten |
DE3343274A1 (de) * | 1983-11-30 | 1985-06-05 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung |
SU1206711A1 (ru) * | 1983-12-20 | 1986-01-23 | Таганрогский радиотехнический институт им.В.Д.Калмыкова | Способ изготовлени зондовых головок |
DE8501493U1 (de) * | 1985-01-22 | 1986-08-14 | Feinmetall Gmbh, 7033 Herrenberg | Prüfadapter |
DE3678825D1 (de) * | 1985-11-01 | 1991-05-23 | Hewlett Packard Co | Halterung fuer leiterplattentest. |
DE3539720A1 (de) * | 1985-11-08 | 1987-05-14 | Martin Maelzer | Adapter fuer ein leiterplattenpruefgeraet |
DE3702184A1 (de) * | 1986-01-27 | 1987-07-30 | Feinmetall Gmbh | Pruefeinrichtung zur wafer-pruefung |
US4841241A (en) * | 1986-08-07 | 1989-06-20 | Siemens Aktiengesellschaft | Testing device for both-sided contacting of component-equipped printed circuit boards |
DE3630548A1 (de) * | 1986-09-08 | 1988-03-10 | Mania Gmbh | Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster |
DE3638372A1 (de) * | 1986-11-11 | 1988-05-26 | Lang Dahlke Helmut | Vorrichtung zum pruefen von elektrischen leiterplatten |
DE3736689A1 (de) * | 1986-11-18 | 1988-05-26 | Luther Erich | Adapter fuer ein leiterplattenpruefgeraet |
DE3639360A1 (de) * | 1986-11-18 | 1988-05-19 | Luther Erich | Pruefstift fuer einen adapter zum verbinden von im raster befindlichen pruefkontakten eines leiterplattenpruefgeraetes mit in und/oder ausser raster befindlichen pruefpunkten eines prueflings |
DE3801222C2 (de) * | 1988-01-18 | 1996-11-14 | Siemens Ag | Kontaktiereinrichtung für Prüfzwecke, insbesondere zur Prüfung von Halbleiterbausteinen |
DE3806793A1 (de) * | 1988-02-29 | 1989-09-07 | Siemens Ag | Adaptereinrichtung fuer eine vorrichtung zum pruefen von leiterplatten |
CH676898A5 (es) * | 1988-09-02 | 1991-03-15 | Microcontact Ag | |
DE4011434A1 (de) * | 1990-04-09 | 1991-10-10 | Atg Electronic Gmbh | Verfahren und vorrichtung zum bohren und/oder bestuecken der fuehrungsplatten eines pruefadapters |
US5043656A (en) * | 1990-06-20 | 1991-08-27 | Clark Oren S | Electrical test probe |
US5351002A (en) * | 1990-08-20 | 1994-09-27 | Snap-On Incorporated | Test probe |
DE9014236U1 (de) * | 1990-10-13 | 1990-12-20 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung für die elektrische Verbindung einer Prüfeinrichtung mit einem Prüfling |
GB9103191D0 (en) * | 1991-02-14 | 1991-04-03 | Dow Corning | Platinum complexes and use thereof |
US5159265A (en) * | 1991-09-19 | 1992-10-27 | Motorola, Inc. | Pivotable spring contact |
US5175493A (en) * | 1991-10-11 | 1992-12-29 | Interconnect Devices, Inc. | Shielded electrical contact spring probe assembly |
US5493230A (en) * | 1994-02-25 | 1996-02-20 | Everett Charles Technologies, Inc. | Retention of test probes in translator fixtures |
-
1993
- 1993-07-12 DE DE4323276A patent/DE4323276A1/de not_active Withdrawn
-
1994
- 1994-07-05 DE DE59401837T patent/DE59401837D1/de not_active Expired - Fee Related
- 1994-07-05 EP EP94922259A patent/EP0708926B1/de not_active Expired - Lifetime
- 1994-07-05 WO PCT/EP1994/002198 patent/WO1995002829A1/de active IP Right Grant
- 1994-07-05 DK DK94922259.0T patent/DK0708926T3/da active
- 1994-07-05 CA CA002167062A patent/CA2167062C/en not_active Expired - Fee Related
- 1994-07-05 ES ES94922259T patent/ES2100729T3/es not_active Expired - Lifetime
- 1994-07-05 JP JP7504323A patent/JPH09503578A/ja active Pending
- 1994-07-05 US US08/591,554 patent/US5977786A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH09503578A (ja) | 1997-04-08 |
WO1995002829A1 (de) | 1995-01-26 |
EP0708926A1 (de) | 1996-05-01 |
DE59401837D1 (de) | 1997-03-27 |
DK0708926T3 (da) | 1997-09-01 |
DE4323276A1 (de) | 1995-01-19 |
EP0708926B1 (de) | 1997-02-19 |
CA2167062A1 (en) | 1995-01-26 |
CA2167062C (en) | 2000-02-15 |
US5977786A (en) | 1999-11-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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