DE3678825D1 - Halterung fuer leiterplattentest. - Google Patents

Halterung fuer leiterplattentest.

Info

Publication number
DE3678825D1
DE3678825D1 DE8686113905T DE3678825T DE3678825D1 DE 3678825 D1 DE3678825 D1 DE 3678825D1 DE 8686113905 T DE8686113905 T DE 8686113905T DE 3678825 T DE3678825 T DE 3678825T DE 3678825 D1 DE3678825 D1 DE 3678825D1
Authority
DE
Germany
Prior art keywords
bracket
pcb test
pcb
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686113905T
Other languages
English (en)
Inventor
Stephen J Cook
Michael L Bullock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE3678825D1 publication Critical patent/DE3678825D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE8686113905T 1985-11-01 1986-10-07 Halterung fuer leiterplattentest. Expired - Lifetime DE3678825D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US79419885A 1985-11-01 1985-11-01

Publications (1)

Publication Number Publication Date
DE3678825D1 true DE3678825D1 (de) 1991-05-23

Family

ID=25161988

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686113905T Expired - Lifetime DE3678825D1 (de) 1985-11-01 1986-10-07 Halterung fuer leiterplattentest.

Country Status (3)

Country Link
EP (1) EP0233992B1 (de)
JP (1) JPH0652287B2 (de)
DE (1) DE3678825D1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4803424A (en) * 1987-08-31 1989-02-07 Augat Inc. Short-wire bed-of-nails test fixture
DE4226069C2 (de) * 1992-08-06 1994-08-04 Test Plus Electronic Gmbh Adaptereinrichtung für eine Prüfeinrichtung für Schaltungsplatinen
DE4323276A1 (de) * 1993-07-12 1995-01-19 Mania Gmbh Vollmaterialadapter
DE4416151C1 (de) * 1994-05-09 1995-07-27 Ingun Pruefmittelbau Vorrichtung zum Kontaktieren von Prüfpunkten einer elektronischen Leiterplatte o. dgl. Prüfling
DE19507127A1 (de) * 1995-03-01 1996-09-12 Test Plus Electronic Gmbh Adaptersystem für Baugruppen-Platinen, zu verwenden in einer Prüfeinrichtung
DE19535733C1 (de) * 1995-09-26 1997-04-17 Atg Test Systems Gmbh Prüfadapter
US7059046B2 (en) * 2002-06-24 2006-06-13 Delaware Capital Formation, Inc. Method for producing a captive wired test fixture and fixture therefor
KR101462954B1 (ko) * 2013-08-21 2014-11-21 대한민국 전자회로카드 검사용 자동화 점검장비 고정치구

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE8108547U1 (de) * 1981-03-24 1981-07-16 Esko Prüfmitteltechnik GmbH, 7750 Konstanz Bearbeitungs- oder pruefvorrichtung fuer elektromechanische, elektronische oder dergl. bauteile oder baugruppen, insbesondere fuer gedruckte, geaetzte oder dergl. schaltungen
GB2146849B (en) * 1983-09-17 1987-08-05 Marconi Instruments Ltd Electrical test probe head assembly

Also Published As

Publication number Publication date
EP0233992B1 (de) 1991-04-17
EP0233992A1 (de) 1987-09-02
JPH0652287B2 (ja) 1994-07-06
JPS62115378A (ja) 1987-05-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8339 Ceased/non-payment of the annual fee