ES2079282B1 - Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser. - Google Patents

Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser.

Info

Publication number
ES2079282B1
ES2079282B1 ES9302041A ES9302041A ES2079282B1 ES 2079282 B1 ES2079282 B1 ES 2079282B1 ES 9302041 A ES9302041 A ES 9302041A ES 9302041 A ES9302041 A ES 9302041A ES 2079282 B1 ES2079282 B1 ES 2079282B1
Authority
ES
Spain
Prior art keywords
measuring
stabilizing
wave length
diode laser
interferometric device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES9302041A
Other languages
English (en)
Other versions
ES2079282R (es
ES2079282A2 (es
Inventor
Calvo Tomas Morlanes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fagor Electrodomesticos SCL
Original Assignee
Fagor Electrodomesticos SCL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fagor Electrodomesticos SCL filed Critical Fagor Electrodomesticos SCL
Priority to ES9302041A priority Critical patent/ES2079282B1/es
Priority to DE19944429748 priority patent/DE4429748A1/de
Publication of ES2079282A2 publication Critical patent/ES2079282A2/es
Publication of ES2079282R publication Critical patent/ES2079282R/es
Application granted granted Critical
Publication of ES2079282B1 publication Critical patent/ES2079282B1/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
    • H01S5/0687—Stabilising the frequency of the laser

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

DISPOSITIVO INTERFEROMETRICO Y METODO PARA MEDIR Y PARA ESTABILIZAR LA LONGITUD DE ONDA DE DIODO LASER. EL DISPOSITIVO (1) SE ACOPLA A CUALQUIER SISTEMA OPTICO DONDE SE REQUIERA DISPONER DEL VALOR REAL DE LA LONGITUD DE ONDA, Y COMPRENDE UN ELEMENTO (9) OPTICO UNICO QUE SE INTERPONE DIRECTAMENTE EN EL CAMINO DEL HAZ (11) LASER OBTENIENDO DOS HACES (13, 14) CUYA DIFERENCIA DE CAMINO RECORRIDO ES CONSTANTE PORQUE ESTA LIMITADA AL INTERIOR DEL ELEMENTO (9); LA INTENSIDAD LUMINOSA DEL CAMPO INTERFERENCIAL ES LA UNICA VARIABLE EN EL CALCULO DE LA LONGITUD DE ONDA. SE APLICA EL DISPOSITIVO (1) PREFERENTEMENTE EN INTERFEROMETROS DE MAQUINA HERRAMIENTA QUE MIDEN DESPLAZAMIENTOS LONGITUDINALES.
ES9302041A 1993-09-13 1993-09-13 Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser. Expired - Fee Related ES2079282B1 (es)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ES9302041A ES2079282B1 (es) 1993-09-13 1993-09-13 Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser.
DE19944429748 DE4429748A1 (de) 1993-09-13 1994-08-22 Interferometer und Verfahren zum Messen und Stabilisieren der Wellenlänge des von einer Laserdiode emittierten Lichts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES9302041A ES2079282B1 (es) 1993-09-13 1993-09-13 Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser.

Publications (3)

Publication Number Publication Date
ES2079282A2 ES2079282A2 (es) 1996-01-01
ES2079282R ES2079282R (es) 1997-05-16
ES2079282B1 true ES2079282B1 (es) 1997-11-16

Family

ID=8283162

Family Applications (1)

Application Number Title Priority Date Filing Date
ES9302041A Expired - Fee Related ES2079282B1 (es) 1993-09-13 1993-09-13 Dispositivo interferometrico y metodo para medir y para estabilizar la longitud de onda de diodo laser.

Country Status (2)

Country Link
DE (1) DE4429748A1 (es)
ES (1) ES2079282B1 (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19645029A1 (de) * 1996-10-31 1998-05-07 Laserspec Analytik Gmbh Verfahren zum Betrieb einer Laserstrahlungsquelle
DE59808542D1 (de) 1997-03-26 2003-07-03 Infineon Technologies Ag Lasermodul mit wellenlängenstabilisierung
GB9715022D0 (en) * 1997-07-18 1997-09-24 Renishaw Plc Frequency stabilised laser diode
EP1315259A1 (en) * 2001-11-23 2003-05-28 Agilent Technologies, Inc. (a Delaware corporation) Optical apparatus and method therefor
EP1554787B8 (en) * 2002-09-13 2007-03-07 Agilent Technologies, Inc. Control of laser tuning velocity
JP5558768B2 (ja) * 2008-10-24 2014-07-23 キヤノン株式会社 測定装置、光源装置、干渉測定装置、露光装置、及びデバイス製造方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3212809C2 (de) * 1982-04-06 1984-12-20 Fa. Carl Zeiss, 7920 Heidenheim Meßeinrichtung für die Stabilisierung von Lasern
DE3715627A1 (de) * 1987-05-11 1988-12-08 Hommelwerke Gmbh Vorrichtung zur messung des abstandes zwischen der vorrichtung und einer messflaeche
DE3911473A1 (de) * 1989-04-08 1990-10-11 Kerner Anna Wellenlaengenstabilisierung
DE3923885A1 (de) * 1989-07-19 1991-01-24 Rheinmetall Gmbh Bombletgeschoss mit stabilisierungsband
FR2650664B1 (fr) * 1989-08-01 1991-11-15 Micro Controle Dispositif de mesure de deplacement par interferometrie
DE3930273A1 (de) * 1989-09-11 1991-03-14 Helios Messtechnik Messinterferometer, das mit dem licht eines lasers versorgt wird, welcher mit laserdioden angeregt ist
JPH0436622A (ja) * 1990-06-01 1992-02-06 Mitsui Petrochem Ind Ltd レーザ光の波長検出方法及び装置
JP2914748B2 (ja) * 1990-10-20 1999-07-05 富士通株式会社 半導体レーザの周波数安定化装置
US5127731A (en) * 1991-02-08 1992-07-07 Hughes Aircraft Company Stabilized two-color laser diode interferometer
AT396841B (de) * 1992-04-02 1993-12-27 Rsf Elektronik Gmbh Anordnung zur stabilisierung der wellenlänge des von einer laserdiode abgegebenen lichtstrahlesund laser-interferometer

Also Published As

Publication number Publication date
ES2079282R (es) 1997-05-16
DE4429748A1 (de) 1995-03-16
ES2079282A2 (es) 1996-01-01

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Owner name: FAGOR S.COOP.

EC2A Search report published

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