ES2074041T3 - Materiales de alimentacion de deposito y materiales de dopado utilizados en la fabricacion de las aleaciones de silicio amorfo hidrogenado para dispositivos fotovoltaicos y otros dispositivos semi-conductores. - Google Patents

Materiales de alimentacion de deposito y materiales de dopado utilizados en la fabricacion de las aleaciones de silicio amorfo hidrogenado para dispositivos fotovoltaicos y otros dispositivos semi-conductores.

Info

Publication number
ES2074041T3
ES2074041T3 ES87102090T ES87102090T ES2074041T3 ES 2074041 T3 ES2074041 T3 ES 2074041T3 ES 87102090 T ES87102090 T ES 87102090T ES 87102090 T ES87102090 T ES 87102090T ES 2074041 T3 ES2074041 T3 ES 2074041T3
Authority
ES
Spain
Prior art keywords
silicon alloys
useful
devices
photovoltaic
hydrogenated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES87102090T
Other languages
English (en)
Inventor
Charles Robert Dickson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Solarex Corp
Original Assignee
Solarex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solarex Corp filed Critical Solarex Corp
Application granted granted Critical
Publication of ES2074041T3 publication Critical patent/ES2074041T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/202—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/202—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
    • H01L31/204—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table including AIVBIV alloys, e.g. SiGe, SiC
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/548—Amorphous silicon PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Electromagnetism (AREA)
  • Photovoltaic Devices (AREA)
  • Silicon Compounds (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

COMPUESTOS QUE TIENEN LA FORMULA (MX3)NM''X4-N, EN LA QUE M Y M'' SON ATOMOS DIFERENTES DEL GRUPO 4A, POR LO MENOS UNO DE M Y M'' ES SILICIO, X ES HIDROGENO, HALOGENO O MEZCLAS DE ESTOS, Y N ES UN ENTERO ENTRE 1 Y 4 INCLUSIVE, SON UTILES COMO MATERIALES PARA ALIMENTACION DE DEPOSICION EN LA FORMACION DE ALEACIONES DE SILICIO AMORFO HIDROGENADO, EMPLEADAS EN LA FABRICACION DE DISPOSITIVOS FOTOVOLTAICOS Y OTROS ELECTRONICAMENTE ACTIVOS. DOPANTES QUE TIENEN LA FORMULA (SIX3)MLX3-M, EN LA QUE L ES UN ATOMO DEL GRUPO 5A, ELEGIDO DEL GRUPO DE FOSFORO, ARSENICO, ANTIMONIO Y BISMUTO, X ES HIDROGENO, HALOGENO O MEZCLAS DE ESTOS Y M ES UN ENTERO ENTRE 1 Y 3 INCLUSIVE, SON UTILES PARA LA FABRICACION DE ALEACIONES DE SILICIO AMORFO HIDROGENADO, DOPADO NEGATIVAMENTE, EMPLEADAS EN LA FABRICACION DE DISPOSITIVOS FOTOVOLTAICOS Y OTROS ELECTRONICAMENTE ACTIVOS. DOPANTES QUE TIENEN LA FORMULA YJX2, EN LA QUE Y ES HALOGENO O CARBONILO, J ES UN ATOMO DEL GRUPO 3A, Y X ES HIDROGENO, HALOGENO O MEZCLAS DE ESTOS, SON UTILES PARA LA FORMACION DE ALEACIONES DE SILICIO AMORFO HIDROGENADO, DOPADO POSITIVAMENTE, EMPLEADAS EN LA FABRICACION DE DISPOSITIVOS FOTOVOLTAICOS Y OTROS ELECTRONICAMENTE ACTIVOS.
ES87102090T 1986-02-18 1987-02-13 Materiales de alimentacion de deposito y materiales de dopado utilizados en la fabricacion de las aleaciones de silicio amorfo hidrogenado para dispositivos fotovoltaicos y otros dispositivos semi-conductores. Expired - Lifetime ES2074041T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US83007386A 1986-02-18 1986-02-18

Publications (1)

Publication Number Publication Date
ES2074041T3 true ES2074041T3 (es) 1995-09-01

Family

ID=25256250

Family Applications (1)

Application Number Title Priority Date Filing Date
ES87102090T Expired - Lifetime ES2074041T3 (es) 1986-02-18 1987-02-13 Materiales de alimentacion de deposito y materiales de dopado utilizados en la fabricacion de las aleaciones de silicio amorfo hidrogenado para dispositivos fotovoltaicos y otros dispositivos semi-conductores.

Country Status (12)

Country Link
EP (1) EP0233613B1 (es)
JP (1) JPH06103667B2 (es)
KR (1) KR910001876B1 (es)
CN (1) CN1024929C (es)
AT (1) ATE120884T1 (es)
AU (3) AU604227B2 (es)
CA (1) CA1332343C (es)
DE (1) DE3751209T2 (es)
EG (1) EG18056A (es)
ES (1) ES2074041T3 (es)
IE (1) IE870367L (es)
IN (1) IN168381B (es)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EG18056A (en) * 1986-02-18 1991-11-30 Solarex Corp Dispositif feedstock materials useful in the fabrication of hydrogenated amorphous silicon alloys for photo-voltaic devices and other semiconductor devices
AU631436B2 (en) * 1989-06-28 1992-11-26 Mitsui Toatsu Chemicals Inc. Semiconductor film and process for its production
DE3941997C1 (en) * 1989-12-20 1991-01-24 Phototronics Solartechnik Gmbh, 8011 Putzbrunn, De Prepn. of di-, tri- or tetra-silyl-methane - by reacting aryl-halo-silane with di-, tri- or tetra -halo-methane in presence of reducing metal, and reacting prod. with hydrogen halide
DE3942058A1 (de) * 1989-12-20 1991-06-27 Phototronics Solartechnik Gmbh Tetrasilylmethan und verfahren zu dessen herstellung
KR20010052441A (ko) * 1999-03-30 2001-06-25 마쯔모또 에이찌 코팅 조성물
AU2002306436A1 (en) 2001-02-12 2002-10-15 Asm America, Inc. Improved process for deposition of semiconductor films
US7186630B2 (en) 2002-08-14 2007-03-06 Asm America, Inc. Deposition of amorphous silicon-containing films
US7981392B2 (en) * 2004-09-14 2011-07-19 The Arizona Board Of Regents, A Body Corporate Of The State Of Arizona Acting For And On Behalf Of Arizona State University Hydride compounds with silicon and germanium core atoms and method of synthesizing same
US7312128B2 (en) * 2004-12-01 2007-12-25 Applied Materials, Inc. Selective epitaxy process with alternating gas supply
JP5265376B2 (ja) * 2005-11-23 2013-08-14 アリゾナ ボード オブ リージェンツ ア ボディー コーポレート アクティング オン ビハーフ オブ アリゾナ ステイト ユニバーシティ 新規な水素化シリコンゲルマニウム、その製造法および使用法
EP1919264A1 (en) 2006-11-02 2008-05-07 Dow Corning Corporation Device for forming a film by deposition from a plasma
EP1918965A1 (en) 2006-11-02 2008-05-07 Dow Corning Corporation Method and apparatus for forming a film by deposition from a plasma
EP1923483A1 (en) 2006-11-02 2008-05-21 Dow Corning Corporation Deposition of amorphous silicon films by electron cyclotron resonance
EP1918414A1 (en) 2006-11-02 2008-05-07 Dow Corning Corporation Film deposition of amorphous films with a graded bandgap by electron cyclotron resonance
EP1918967B1 (en) 2006-11-02 2013-12-25 Dow Corning Corporation Method of forming a film by deposition from a plasma
EP1918966A1 (en) 2006-11-02 2008-05-07 Dow Corning Corporation Method for forming a film with a graded bandgap by deposition of an amorphous material from a plasma
CN103275113B (zh) 2007-03-30 2016-12-28 印度龙树肥料化工有限公司 四卤化硅或有机卤硅烷的等离子体辅助的有机官能化
US8043980B2 (en) * 2007-04-02 2011-10-25 Arizona Board of Regents, a body corporate acting for and on behalf of Arizona State University Methods for making and using halosilylgermanes
NO342873B1 (no) 2008-02-11 2018-08-20 Inst Energiteknik Halvlederkomponent
CN103628044A (zh) * 2013-11-07 2014-03-12 中山市创科科研技术服务有限公司 一种利用光化学气相沉积制备α_SiH膜的设备
CN109686802A (zh) * 2018-11-09 2019-04-26 惠州凯珑光电有限公司 一种电子元器件和模组的封装工艺
TW202426689A (zh) * 2021-12-23 2024-07-01 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 V族元素的新型無機矽基和聚矽基衍生物及其合成方法和使用其沈積之方法
CN115117201B (zh) * 2022-06-24 2024-03-12 英利能源发展有限公司 一种硅片磷或硼掺杂的方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4226897A (en) * 1977-12-05 1980-10-07 Plasma Physics Corporation Method of forming semiconducting materials and barriers
FR2485810A1 (fr) * 1980-06-24 1981-12-31 Thomson Csf Procede de realisation d'une couche contenant du silicium et dispositif de conversion photo-electrique mettant en oeuvre ce procede
JPS59182521A (ja) * 1983-04-01 1984-10-17 Mitsui Toatsu Chem Inc 水素化シリコン薄膜の形成方法
JPS59200248A (ja) * 1983-04-28 1984-11-13 Canon Inc 像形成部材の製造法
DE3429899A1 (de) * 1983-08-16 1985-03-07 Canon K.K., Tokio/Tokyo Verfahren zur bildung eines abscheidungsfilms
JPS60117712A (ja) * 1983-11-30 1985-06-25 Toshiba Corp 薄膜形成方法
JPS60154521A (ja) * 1984-01-23 1985-08-14 Semiconductor Energy Lab Co Ltd 炭化珪素被膜作製方法
JPH0669029B2 (ja) * 1984-07-25 1994-08-31 工業技術院長 Ｐ型半導体薄膜の形成方法
US4695331A (en) * 1985-05-06 1987-09-22 Chronar Corporation Hetero-augmentation of semiconductor materials
GB2177119B (en) * 1985-06-26 1989-04-26 Plessey Co Plc Organometallic chemical vapour deposition
IL79612A0 (en) * 1985-08-09 1986-11-30 American Cyanamid Co Method and apparatus for the chemical vapor deposition of iii-v semiconductors utilizing organometallic and elemental pnictide sources
US4690830A (en) * 1986-02-18 1987-09-01 Solarex Corporation Activation by dehydrogenation or dehalogenation of deposition feedstock and dopant materials useful in the fabrication of hydrogenated amorphous silicon alloys for photovoltaic devices and other semiconductor devices
EG18056A (en) * 1986-02-18 1991-11-30 Solarex Corp Dispositif feedstock materials useful in the fabrication of hydrogenated amorphous silicon alloys for photo-voltaic devices and other semiconductor devices

Also Published As

Publication number Publication date
EP0233613A2 (en) 1987-08-26
KR910001876B1 (ko) 1991-03-28
IN168381B (es) 1991-03-23
IE870367L (en) 1987-08-18
KR870008376A (ko) 1987-09-26
EP0233613A3 (en) 1990-11-28
DE3751209T2 (de) 1995-08-10
EP0233613B1 (en) 1995-04-05
DE3751209D1 (de) 1995-05-11
CA1332343C (en) 1994-10-11
CN1024929C (zh) 1994-06-08
AU637852B2 (en) 1993-06-10
JPS6351680A (ja) 1988-03-04
AU640408B2 (en) 1993-08-26
AU6767190A (en) 1991-03-14
JPH06103667B2 (ja) 1994-12-14
ATE120884T1 (de) 1995-04-15
AU6883987A (en) 1987-08-20
AU6308090A (en) 1990-12-13
EG18056A (en) 1991-11-30
CN87100729A (zh) 1987-11-25
AU604227B2 (en) 1990-12-13

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