ES2062733T3 - Procedimiento y dispositivo de medida de perfil transversal de espesor de una banda metalica, en especial de acero. - Google Patents

Procedimiento y dispositivo de medida de perfil transversal de espesor de una banda metalica, en especial de acero.

Info

Publication number
ES2062733T3
ES2062733T3 ES91470023T ES91470023T ES2062733T3 ES 2062733 T3 ES2062733 T3 ES 2062733T3 ES 91470023 T ES91470023 T ES 91470023T ES 91470023 T ES91470023 T ES 91470023T ES 2062733 T3 ES2062733 T3 ES 2062733T3
Authority
ES
Spain
Prior art keywords
strip
band
procedure
steel
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES91470023T
Other languages
English (en)
Inventor
Pierre Gauje
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sollac SA
Original Assignee
Sollac SA
Lorraine de Laminage Continu SA SOLLAC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sollac SA, Lorraine de Laminage Continu SA SOLLAC filed Critical Sollac SA
Application granted granted Critical
Publication of ES2062733T3 publication Critical patent/ES2062733T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

ESTE DISPOSITIVO COMPRENDE UN TUBO EMISOR (4) DE RADIACION X Y UN DETECTOR LINEAL (6) DISPUESTOS POR AMBAS PARTES DEL PLANO DE LA BANDA (13), MEDIOS ELECTRONICOS DE AQUISICION, DE MEDICION Y DE CONTROL, ASI COMO UNA MASCARA (9) TRANSVERSALMENTE MOVIL A LA BANDA QUE OCULTA LA RADIACION (17) NO INTERCEPTADA POR LA BANDA ASI COMO LA RADIACION (16) QUE ATRAVIESA LA ZONA DE BORDE (14) DE ESTA. ESTE DISPOSITIVO PERMITE OBTENER UNA BUENA PRECISION DE MEDICION EN PARTICULAR JUNTO AL BORDE DE LA BANDA.
ES91470023T 1990-09-05 1991-08-26 Procedimiento y dispositivo de medida de perfil transversal de espesor de una banda metalica, en especial de acero. Expired - Lifetime ES2062733T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9011037A FR2666409B1 (fr) 1990-09-05 1990-09-05 Procede et dispositif de mesure de profil transversal d'epaisseur d'une bande metallique notamment en acier.

Publications (1)

Publication Number Publication Date
ES2062733T3 true ES2062733T3 (es) 1994-12-16

Family

ID=9400103

Family Applications (1)

Application Number Title Priority Date Filing Date
ES91470023T Expired - Lifetime ES2062733T3 (es) 1990-09-05 1991-08-26 Procedimiento y dispositivo de medida de perfil transversal de espesor de una banda metalica, en especial de acero.

Country Status (11)

Country Link
US (1) US5202909A (es)
EP (1) EP0477120B1 (es)
JP (1) JP2596905B2 (es)
KR (1) KR0169488B1 (es)
AT (1) ATE112050T1 (es)
AU (1) AU643555B2 (es)
CA (1) CA2049763C (es)
DE (1) DE69104164T2 (es)
DK (1) DK0477120T3 (es)
ES (1) ES2062733T3 (es)
FR (1) FR2666409B1 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19950254C2 (de) * 1999-10-18 2003-06-26 Ims Messsysteme Gmbh Verfahren zur Bestimmung eines Dickenquerprofils und des Dickenlängsprofils eines laufenden Materialbandes
JP2002296021A (ja) * 2001-04-03 2002-10-09 Futec Inc 厚さ測定装置
DE102005020297A1 (de) * 2005-04-30 2006-11-09 Fagus-Grecon Greten Gmbh & Co Kg Vorrichtung zum Prüfen eines Plattenmaterials und Verfahren zum Prüfen eines Plattenmaterials mit Hilfe der vorgenannten Vorrichtung
CN102240681B (zh) * 2011-05-19 2013-06-19 清华大学 一种凸度仪x光机的安装与调节机构

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4874865A (es) * 1971-12-29 1973-10-09
DE3113440A1 (de) * 1981-04-03 1982-11-11 Philips Patentverwaltung Gmbh, 2000 Hamburg "verfahren zur ueberpruefung von gleichartigen objekten auf fehler"
US4574387A (en) * 1981-09-18 1986-03-04 Data Measurement Corporation Apparatus and method for measuring thickness
US4891833A (en) * 1987-11-19 1990-01-02 Bio-Imaging Research, Inc. Blinder for cat scanner
US4954719A (en) * 1988-09-07 1990-09-04 Harrel, Inc. Sheet thickness gauging method and system with auto calibration

Also Published As

Publication number Publication date
EP0477120B1 (fr) 1994-09-21
FR2666409A1 (fr) 1992-03-06
ATE112050T1 (de) 1994-10-15
JPH04264209A (ja) 1992-09-21
US5202909A (en) 1993-04-13
CA2049763A1 (fr) 1992-03-06
CA2049763C (fr) 2000-08-15
DE69104164T2 (de) 1995-04-13
DE69104164D1 (de) 1994-10-27
KR0169488B1 (ko) 1999-05-01
FR2666409B1 (fr) 1992-12-11
JP2596905B2 (ja) 1997-04-02
DK0477120T3 (da) 1995-02-06
EP0477120A1 (fr) 1992-03-25
AU8343791A (en) 1992-03-12
KR920006721A (ko) 1992-04-28
AU643555B2 (en) 1993-11-18

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