EP3465686A4 - Amplificateur de détection asymétrique et procédé associe pour dispositifs de mémoire flash - Google Patents

Amplificateur de détection asymétrique et procédé associe pour dispositifs de mémoire flash Download PDF

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Publication number
EP3465686A4
EP3465686A4 EP17803288.4A EP17803288A EP3465686A4 EP 3465686 A4 EP3465686 A4 EP 3465686A4 EP 17803288 A EP17803288 A EP 17803288A EP 3465686 A4 EP3465686 A4 EP 3465686A4
Authority
EP
European Patent Office
Prior art keywords
flash memory
memory devices
related method
sensing amplifier
asymmetrical sensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP17803288.4A
Other languages
German (de)
English (en)
Other versions
EP3465686A1 (fr
EP3465686B1 (fr
Inventor
Hieu Van Tran
Anh Ly
Thuan Vu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Silicon Storage Technology Inc
Original Assignee
Silicon Storage Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silicon Storage Technology Inc filed Critical Silicon Storage Technology Inc
Priority to EP22160365.7A priority Critical patent/EP4030433B1/fr
Publication of EP3465686A1 publication Critical patent/EP3465686A1/fr
Publication of EP3465686A4 publication Critical patent/EP3465686A4/fr
Application granted granted Critical
Publication of EP3465686B1 publication Critical patent/EP3465686B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0433—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and one or more separate select transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/24—Bit-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/065—Differential amplifiers of latching type
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/14—Dummy cell management; Sense reference voltage generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/06—Sense amplifier related aspects
    • G11C2207/061—Sense amplifier enabled by a address transition detection related control signal

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
EP17803288.4A 2016-05-24 2017-05-14 Amplificateur de détection asymétrique pour dispositifs de mémoire flash Active EP3465686B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP22160365.7A EP4030433B1 (fr) 2016-05-24 2017-05-14 Système de mémoire flash avec amplificateur de détection asymétrique

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/163,548 US9911501B2 (en) 2016-05-24 2016-05-24 Sensing amplifier comprising a built-in sensing offset for flash memory devices
PCT/US2017/032575 WO2017205088A1 (fr) 2016-05-24 2017-05-14 Amplificateur de détection asymétrique et procédé associe pour dispositifs de mémoire flash

Related Child Applications (2)

Application Number Title Priority Date Filing Date
EP22160365.7A Division EP4030433B1 (fr) 2016-05-24 2017-05-14 Système de mémoire flash avec amplificateur de détection asymétrique
EP22160365.7A Division-Into EP4030433B1 (fr) 2016-05-24 2017-05-14 Système de mémoire flash avec amplificateur de détection asymétrique

Publications (3)

Publication Number Publication Date
EP3465686A1 EP3465686A1 (fr) 2019-04-10
EP3465686A4 true EP3465686A4 (fr) 2020-01-15
EP3465686B1 EP3465686B1 (fr) 2022-04-13

Family

ID=60412588

Family Applications (2)

Application Number Title Priority Date Filing Date
EP17803288.4A Active EP3465686B1 (fr) 2016-05-24 2017-05-14 Amplificateur de détection asymétrique pour dispositifs de mémoire flash
EP22160365.7A Active EP4030433B1 (fr) 2016-05-24 2017-05-14 Système de mémoire flash avec amplificateur de détection asymétrique

Family Applications After (1)

Application Number Title Priority Date Filing Date
EP22160365.7A Active EP4030433B1 (fr) 2016-05-24 2017-05-14 Système de mémoire flash avec amplificateur de détection asymétrique

Country Status (7)

Country Link
US (2) US9911501B2 (fr)
EP (2) EP3465686B1 (fr)
JP (1) JP6570773B2 (fr)
KR (1) KR102017447B1 (fr)
CN (1) CN109155138B (fr)
TW (1) TWI634558B (fr)
WO (1) WO2017205088A1 (fr)

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US9858979B1 (en) * 2016-10-05 2018-01-02 Micron Technology, Inc. Reprogrammable non-volatile ferroelectric latch for use with a memory controller
US10096378B1 (en) * 2017-02-23 2018-10-09 Pdf Solutions, Inc. On-chip capacitance measurement for memory characterization vehicle
US10163481B1 (en) 2017-07-20 2018-12-25 Micron Technology, Inc. Offset cancellation for latching in a memory device
US10395697B1 (en) 2018-02-08 2019-08-27 Micron Technology, Inc. Self-referencing sensing schemes with coupling capacitance
CN110610738B (zh) * 2018-06-15 2023-08-18 硅存储技术公司 用于闪存存储器系统的改进的感测放大器
KR102478221B1 (ko) * 2018-07-09 2022-12-15 에스케이하이닉스 주식회사 읽기 동작을 제어하는 제어회로를 포함하는 반도체 메모리 장치
US11145358B2 (en) * 2018-08-31 2021-10-12 Micron Technology, Inc. Offsetting capacitance of a digit line coupled to storage memory cells coupled to a sense amplifier using offset memory cells
US11978528B2 (en) 2021-10-15 2024-05-07 Infineon Technologies LLC Dynamic sensing levels for nonvolatile memory devices

Citations (3)

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EP0805454A1 (fr) * 1996-04-30 1997-11-05 STMicroelectronics S.r.l. Circuit de détection pour lecture et vérification du contenu d'une cellule de mémoire
US20140192603A1 (en) * 2013-01-08 2014-07-10 Lsi Corporation Differential sense amplifier for solid-state memories
US20150078103A1 (en) * 2013-09-13 2015-03-19 Lsi Corporation Sensing technique for single-ended bit line memory architectures

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US4797614A (en) * 1984-11-02 1989-01-10 Sierracin Corporation Apparatus and method for measuring conductance including a temperature controlled resonant tank circuit with shielding
JPS61224192A (ja) * 1985-03-29 1986-10-04 Sony Corp 読出し増幅器
US5268319A (en) * 1988-06-08 1993-12-07 Eliyahou Harari Highly compact EPROM and flash EEPROM devices
EP0740307B1 (fr) * 1995-04-28 2001-12-12 STMicroelectronics S.r.l. Circuit amplificateur de détection pour dispositifs de mémoire à semi-conducteurs
JP3196824B2 (ja) * 1997-07-16 2001-08-06 日本電気株式会社 強誘電体メモリ装置
JP3221428B2 (ja) * 1999-02-12 2001-10-22 日本電気株式会社 ラッチ型センスアンプ回路
JP2000298989A (ja) * 1999-04-14 2000-10-24 Nec Ic Microcomput Syst Ltd Ｓｒａｍ読み出し回路およびｓｒａｍ読み出し方法
EP1160795B1 (fr) * 2000-05-31 2007-12-19 STMicroelectronics S.r.l. Structure matricielle de cellules de références pour la lecture de données dans un dispositif de mémoire nonvolatile
US6496051B1 (en) * 2001-09-06 2002-12-17 Sharp Laboratories Of America, Inc. Output sense amplifier for a multibit memory cell
US6529409B1 (en) * 2001-09-10 2003-03-04 Silicon Storage Technology, Inc. Integrated circuit for concurrent flash memory with uneven array architecture
US6807118B2 (en) * 2003-01-23 2004-10-19 Hewlett-Packard Development Company, L.P. Adjustable offset differential amplifier
US20050117429A1 (en) * 2003-04-28 2005-06-02 Chin-Hsi Lin Nonvolatile memory structure with high speed high bandwidth and low voltage
US6888771B2 (en) * 2003-05-09 2005-05-03 Micron Technology, Inc. Skewed sense AMP for variable resistance memory sensing
US7221605B2 (en) * 2004-08-31 2007-05-22 Micron Technology, Inc. Switched capacitor DRAM sense amplifier with immunity to mismatch and offsets
US7405988B2 (en) * 2005-09-26 2008-07-29 Silicon Storage Technology, Inc. Method and apparatus for systematic and random variation and mismatch compensation for multilevel flash memory operation
US7567458B2 (en) * 2005-09-26 2009-07-28 Silicon Storage Technology, Inc. Flash memory array having control/decode circuitry for disabling top gates of defective memory cells
JP4901211B2 (ja) * 2005-12-26 2012-03-21 株式会社東芝 センスアンプ及び半導体記憶装置
US7898885B2 (en) * 2007-07-19 2011-03-01 Micron Technology, Inc. Analog sensing of memory cells in a solid state memory device
US20090039410A1 (en) 2007-08-06 2009-02-12 Xian Liu Split Gate Non-Volatile Flash Memory Cell Having A Floating Gate, Control Gate, Select Gate And An Erase Gate With An Overhang Over The Floating Gate, Array And Method Of Manufacturing
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US8208237B2 (en) * 2008-09-30 2012-06-26 International Business Machines Corporation Administering offset voltage error in a current sensing circuit
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JP5156069B2 (ja) * 2010-09-17 2013-03-06 株式会社東芝 強誘電体メモリ
JP2012069214A (ja) * 2010-09-24 2012-04-05 Toshiba Corp ビット線負電位回路および半導体記憶装置
US8437210B2 (en) * 2011-02-18 2013-05-07 Taiwan Semiconductor Manufacturing Company, Ltd. Asymmetric sense amplifier design
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US8624668B2 (en) * 2011-07-12 2014-01-07 Analog Devices, Inc. Common-mode step response for autozero amplifiers
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US9704554B2 (en) * 2015-08-25 2017-07-11 Texas Instruments Incorporated Sense amplifier with offset compensation
US9478277B1 (en) * 2015-09-03 2016-10-25 Bo Liu Tri-level-cell DRAM and sense amplifier with alternating offset voltage

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0805454A1 (fr) * 1996-04-30 1997-11-05 STMicroelectronics S.r.l. Circuit de détection pour lecture et vérification du contenu d'une cellule de mémoire
US20140192603A1 (en) * 2013-01-08 2014-07-10 Lsi Corporation Differential sense amplifier for solid-state memories
US20150078103A1 (en) * 2013-09-13 2015-03-19 Lsi Corporation Sensing technique for single-ended bit line memory architectures

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2017205088A1 *

Also Published As

Publication number Publication date
KR20190009380A (ko) 2019-01-28
JP2019522862A (ja) 2019-08-15
US9911501B2 (en) 2018-03-06
TW201812781A (zh) 2018-04-01
EP4030433B1 (fr) 2024-04-03
EP3465686A1 (fr) 2019-04-10
KR102017447B1 (ko) 2019-09-02
EP3465686B1 (fr) 2022-04-13
US20180144804A1 (en) 2018-05-24
US10236068B2 (en) 2019-03-19
CN109155138B (zh) 2020-08-07
US20170345509A1 (en) 2017-11-30
WO2017205088A1 (fr) 2017-11-30
CN109155138A (zh) 2019-01-04
JP6570773B2 (ja) 2019-09-04
TWI634558B (zh) 2018-09-01
EP4030433A1 (fr) 2022-07-20

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