EP3363044A4 - Substrate carrier system - Google Patents

Substrate carrier system Download PDF

Info

Publication number
EP3363044A4
EP3363044A4 EP16856168.6A EP16856168A EP3363044A4 EP 3363044 A4 EP3363044 A4 EP 3363044A4 EP 16856168 A EP16856168 A EP 16856168A EP 3363044 A4 EP3363044 A4 EP 3363044A4
Authority
EP
European Patent Office
Prior art keywords
carrier system
substrate carrier
substrate
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP16856168.6A
Other languages
German (de)
French (fr)
Other versions
EP3363044B1 (en
EP3363044A1 (en
Inventor
Jeffrey Tobin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of EP3363044A1 publication Critical patent/EP3363044A1/en
Publication of EP3363044A4 publication Critical patent/EP3363044A4/en
Application granted granted Critical
Publication of EP3363044B1 publication Critical patent/EP3363044B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67201Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • H01L21/67265Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68792Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
EP16856168.6A 2015-10-15 2016-10-13 Substrate carrier system Active EP3363044B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201562242174P 2015-10-15 2015-10-15
PCT/US2016/056798 WO2017066418A1 (en) 2015-10-15 2016-10-13 Substrate carrier system

Publications (3)

Publication Number Publication Date
EP3363044A1 EP3363044A1 (en) 2018-08-22
EP3363044A4 true EP3363044A4 (en) 2019-06-12
EP3363044B1 EP3363044B1 (en) 2021-12-15

Family

ID=58518570

Family Applications (1)

Application Number Title Priority Date Filing Date
EP16856168.6A Active EP3363044B1 (en) 2015-10-15 2016-10-13 Substrate carrier system

Country Status (6)

Country Link
US (1) US9929029B2 (en)
EP (1) EP3363044B1 (en)
JP (1) JP6942121B2 (en)
KR (1) KR102615853B1 (en)
TW (1) TWI691006B (en)
WO (1) WO2017066418A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9929029B2 (en) * 2015-10-15 2018-03-27 Applied Materials, Inc. Substrate carrier system
DE102015223807A1 (en) * 2015-12-01 2017-06-01 Siltronic Ag Process for producing a semiconductor wafer with epitaxial layer in a deposition chamber, apparatus for producing an epitaxial-layer semiconductor wafer and semiconductor wafer with epitaxial layer
US10872804B2 (en) * 2017-11-03 2020-12-22 Asm Ip Holding B.V. Apparatus and methods for isolating a reaction chamber from a loading chamber resulting in reduced contamination
US10872803B2 (en) 2017-11-03 2020-12-22 Asm Ip Holding B.V. Apparatus and methods for isolating a reaction chamber from a loading chamber resulting in reduced contamination
US10755955B2 (en) * 2018-02-12 2020-08-25 Applied Materials, Inc. Substrate transfer mechanism to reduce back-side substrate contact
CN112005356A (en) * 2018-05-03 2020-11-27 应用材料公司 Substrate tilt control in high speed rotary sorter
US11499666B2 (en) 2018-05-25 2022-11-15 Applied Materials, Inc. Precision dynamic leveling mechanism with long motion capability
JP7147551B2 (en) 2018-12-27 2022-10-05 株式会社Sumco Vapor deposition apparatus and carrier used therefor
JP7163764B2 (en) * 2018-12-27 2022-11-01 株式会社Sumco Vapor deposition equipment
JP7003905B2 (en) 2018-12-27 2022-01-21 株式会社Sumco Vapor deposition equipment
JP7245071B2 (en) * 2019-02-21 2023-03-23 株式会社ジェイテクトサーモシステム Substrate support device
JP7188250B2 (en) * 2019-04-11 2022-12-13 株式会社Sumco Vapor deposition apparatus and carrier used therefor
JP7188256B2 (en) 2019-04-18 2022-12-13 株式会社Sumco Vapor deposition method and vapor deposition apparatus
JP7099398B2 (en) * 2019-04-18 2022-07-12 株式会社Sumco Vapor phase growth method and vapor phase growth device
KR20220020961A (en) * 2019-07-17 2022-02-21 어플라이드 머티어리얼스, 인코포레이티드 Methods and apparatus for post-exposure processing
JP6999614B2 (en) * 2019-07-26 2022-01-18 株式会社バルカー Support member
JP7264038B2 (en) * 2019-12-19 2023-04-25 株式会社Sumco Vapor deposition apparatus and vapor deposition treatment method
JP7192756B2 (en) * 2019-12-19 2022-12-20 株式会社Sumco Vapor deposition apparatus and vapor deposition method
JP7205458B2 (en) 2019-12-25 2023-01-17 株式会社Sumco Vapor deposition equipment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110318142A1 (en) * 2008-12-11 2011-12-29 Christopher Gage Minimum contact area wafer clamping with gas flow for rapid wafer cooling

Family Cites Families (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5800686A (en) * 1993-04-05 1998-09-01 Applied Materials, Inc. Chemical vapor deposition chamber with substrate edge protection
JP3082624B2 (en) 1994-12-28 2000-08-28 住友金属工業株式会社 How to use electrostatic chuck
JP4227623B2 (en) * 1995-12-12 2009-02-18 東京エレクトロン株式会社 Semiconductor processing equipment
JPH09278179A (en) * 1996-04-16 1997-10-28 Hitachi Ltd Carrying device
US6120609A (en) * 1996-10-25 2000-09-19 Applied Materials, Inc. Self-aligning lift mechanism
WO1998053484A1 (en) * 1997-05-20 1998-11-26 Tokyo Electron Limited Processing apparatus
US6063440A (en) * 1997-07-11 2000-05-16 Applied Materials, Inc. Method for aligning a wafer
US6197117B1 (en) * 1997-07-23 2001-03-06 Applied Materials, Inc. Wafer out-of-pocket detector and susceptor leveling tool
US5974681A (en) * 1997-09-10 1999-11-02 Speedfam-Ipec Corp. Apparatus for spin drying a workpiece
US6146463A (en) * 1998-06-12 2000-11-14 Applied Materials, Inc. Apparatus and method for aligning a substrate on a support member
US6063196A (en) * 1998-10-30 2000-05-16 Applied Materials, Inc. Semiconductor processing chamber calibration tool
US6168668B1 (en) * 1998-11-25 2001-01-02 Applied Materials, Inc. Shadow ring and guide for supporting the shadow ring in a chamber
DE19901291C2 (en) * 1999-01-15 2002-04-18 Sez Semiconduct Equip Zubehoer Device for the etching treatment of a disc-shaped object
US6695546B2 (en) * 2000-03-28 2004-02-24 Mirae Corporation Single drive aligner elevation apparatus for an integrated circuit handler
JP4117762B2 (en) * 2001-07-04 2008-07-16 松下電器産業株式会社 Substrate positioning method and apparatus
US6743296B2 (en) * 2001-10-12 2004-06-01 Taiwan Semiconductor Manufacturing Co., Ltd Apparatus and method for self-centering a wafer in a sputter chamber
JP3976170B2 (en) * 2001-10-16 2007-09-12 株式会社日立プラントテクノロジー Thin article positioning device
US6824343B2 (en) * 2002-02-22 2004-11-30 Applied Materials, Inc. Substrate support
JP4244555B2 (en) * 2002-02-25 2009-03-25 東京エレクトロン株式会社 Support mechanism for workpiece
WO2005055312A1 (en) * 2003-12-04 2005-06-16 Hirata Corporation Substrate positioning system
JP2006005177A (en) 2004-06-17 2006-01-05 Tokyo Electron Ltd Thermal treatment apparatus
KR100574058B1 (en) * 2004-08-20 2006-04-27 삼성전자주식회사 Wafer bake apparatus
JP2006066747A (en) * 2004-08-30 2006-03-09 Hitachi High-Tech Electronics Engineering Co Ltd Positioning apparatus and method of substrate
JP4619854B2 (en) * 2005-04-18 2011-01-26 東京エレクトロン株式会社 Load lock device and processing method
JP4642610B2 (en) * 2005-09-05 2011-03-02 東京エレクトロン株式会社 Substrate alignment device and substrate accommodation unit
JP4781802B2 (en) * 2005-12-06 2011-09-28 東京応化工業株式会社 Support plate laminating means and laminating apparatus, and support plate laminating method
JP4750724B2 (en) * 2007-01-25 2011-08-17 東京応化工業株式会社 Overlay unit and bonding apparatus
JP2008192840A (en) * 2007-02-05 2008-08-21 Tokyo Electron Ltd Vacuum processing apparatus, method for vacuum processing and storage medium
JP2008300414A (en) * 2007-05-29 2008-12-11 Dainippon Screen Mfg Co Ltd Thin-film forming apparatus and thin-film forming method
JP4616873B2 (en) 2007-09-28 2011-01-19 東京エレクトロン株式会社 Semiconductor manufacturing apparatus, substrate holding method, and program
US20090181553A1 (en) * 2008-01-11 2009-07-16 Blake Koelmel Apparatus and method of aligning and positioning a cold substrate on a hot surface
JP2009182235A (en) 2008-01-31 2009-08-13 Tokyo Electron Ltd Load lock apparatus and substrate cooling method
JP2011530833A (en) * 2008-08-12 2011-12-22 アプライド マテリアルズ インコーポレイテッド Electrostatic chuck assembly
JP2010087342A (en) 2008-10-01 2010-04-15 Toray Eng Co Ltd Lift pin
US8314371B2 (en) * 2008-11-06 2012-11-20 Applied Materials, Inc. Rapid thermal processing chamber with micro-positioning system
US8388853B2 (en) 2009-02-11 2013-03-05 Applied Materials, Inc. Non-contact substrate processing
JP5071437B2 (en) * 2009-05-18 2012-11-14 パナソニック株式会社 Plasma processing apparatus and tray mounting method in plasma processing apparatus
CN101840880A (en) * 2010-03-24 2010-09-22 友达光电(苏州)有限公司 Substrate clamping device
CN103502508B (en) * 2010-12-30 2016-04-27 维易科仪器公司 Use the wafer processing of loader expansion
CN103403852B (en) * 2011-03-01 2016-06-08 应用材料公司 The elimination of double; two load locks configuration and lift-off processing chamber
JP2012195427A (en) * 2011-03-16 2012-10-11 Ulvac Japan Ltd Substrate processing apparatus and substrate processing method
WO2014082196A1 (en) * 2012-11-27 2014-06-05 Acm Research (Shanghai) Inc. Substrate supporting apparatus
US9355876B2 (en) * 2013-03-15 2016-05-31 Applied Materials, Inc. Process load lock apparatus, lift assemblies, electronic device processing systems, and methods of processing substrates in load lock locations
JP6181438B2 (en) * 2013-06-24 2017-08-16 株式会社荏原製作所 Substrate holding device and substrate cleaning device
TWI667722B (en) * 2014-02-27 2019-08-01 日商斯克林集團公司 Substrate processing apparatus
JP6369054B2 (en) * 2014-03-03 2018-08-08 東京エレクトロン株式会社 Substrate placing apparatus and substrate processing apparatus
WO2015138094A1 (en) * 2014-03-12 2015-09-17 Applied Materials, Inc. Wafer rotation in a semiconductor chamber
JP6270270B2 (en) * 2014-03-17 2018-01-31 株式会社Screenホールディングス Substrate processing method and substrate processing apparatus
US20160314997A1 (en) * 2015-04-22 2016-10-27 Applied Materials, Inc. Loadlock apparatus, cooling plate assembly, and electronic device processing systems and methods
US9929029B2 (en) * 2015-10-15 2018-03-27 Applied Materials, Inc. Substrate carrier system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110318142A1 (en) * 2008-12-11 2011-12-29 Christopher Gage Minimum contact area wafer clamping with gas flow for rapid wafer cooling

Also Published As

Publication number Publication date
WO2017066418A1 (en) 2017-04-20
KR20180056790A (en) 2018-05-29
TW201725645A (en) 2017-07-16
EP3363044B1 (en) 2021-12-15
TWI691006B (en) 2020-04-11
EP3363044A1 (en) 2018-08-22
KR102615853B1 (en) 2023-12-21
JP2018536986A (en) 2018-12-13
JP6942121B2 (en) 2021-09-29
US9929029B2 (en) 2018-03-27
US20170110352A1 (en) 2017-04-20

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