EP3363044A4 - Substrate carrier system - Google Patents
Substrate carrier system Download PDFInfo
- Publication number
- EP3363044A4 EP3363044A4 EP16856168.6A EP16856168A EP3363044A4 EP 3363044 A4 EP3363044 A4 EP 3363044A4 EP 16856168 A EP16856168 A EP 16856168A EP 3363044 A4 EP3363044 A4 EP 3363044A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- carrier system
- substrate carrier
- substrate
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
- H01L21/67265—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68792—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562242174P | 2015-10-15 | 2015-10-15 | |
PCT/US2016/056798 WO2017066418A1 (en) | 2015-10-15 | 2016-10-13 | Substrate carrier system |
Publications (3)
Publication Number | Publication Date |
---|---|
EP3363044A1 EP3363044A1 (en) | 2018-08-22 |
EP3363044A4 true EP3363044A4 (en) | 2019-06-12 |
EP3363044B1 EP3363044B1 (en) | 2021-12-15 |
Family
ID=58518570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP16856168.6A Active EP3363044B1 (en) | 2015-10-15 | 2016-10-13 | Substrate carrier system |
Country Status (6)
Country | Link |
---|---|
US (1) | US9929029B2 (en) |
EP (1) | EP3363044B1 (en) |
JP (1) | JP6942121B2 (en) |
KR (1) | KR102615853B1 (en) |
TW (1) | TWI691006B (en) |
WO (1) | WO2017066418A1 (en) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9929029B2 (en) * | 2015-10-15 | 2018-03-27 | Applied Materials, Inc. | Substrate carrier system |
DE102015223807A1 (en) * | 2015-12-01 | 2017-06-01 | Siltronic Ag | Process for producing a semiconductor wafer with epitaxial layer in a deposition chamber, apparatus for producing an epitaxial-layer semiconductor wafer and semiconductor wafer with epitaxial layer |
US10872804B2 (en) * | 2017-11-03 | 2020-12-22 | Asm Ip Holding B.V. | Apparatus and methods for isolating a reaction chamber from a loading chamber resulting in reduced contamination |
US10872803B2 (en) | 2017-11-03 | 2020-12-22 | Asm Ip Holding B.V. | Apparatus and methods for isolating a reaction chamber from a loading chamber resulting in reduced contamination |
US10755955B2 (en) * | 2018-02-12 | 2020-08-25 | Applied Materials, Inc. | Substrate transfer mechanism to reduce back-side substrate contact |
CN112005356A (en) * | 2018-05-03 | 2020-11-27 | 应用材料公司 | Substrate tilt control in high speed rotary sorter |
US11499666B2 (en) | 2018-05-25 | 2022-11-15 | Applied Materials, Inc. | Precision dynamic leveling mechanism with long motion capability |
JP7147551B2 (en) | 2018-12-27 | 2022-10-05 | 株式会社Sumco | Vapor deposition apparatus and carrier used therefor |
JP7163764B2 (en) * | 2018-12-27 | 2022-11-01 | 株式会社Sumco | Vapor deposition equipment |
JP7003905B2 (en) | 2018-12-27 | 2022-01-21 | 株式会社Sumco | Vapor deposition equipment |
JP7245071B2 (en) * | 2019-02-21 | 2023-03-23 | 株式会社ジェイテクトサーモシステム | Substrate support device |
JP7188250B2 (en) * | 2019-04-11 | 2022-12-13 | 株式会社Sumco | Vapor deposition apparatus and carrier used therefor |
JP7188256B2 (en) | 2019-04-18 | 2022-12-13 | 株式会社Sumco | Vapor deposition method and vapor deposition apparatus |
JP7099398B2 (en) * | 2019-04-18 | 2022-07-12 | 株式会社Sumco | Vapor phase growth method and vapor phase growth device |
KR20220020961A (en) * | 2019-07-17 | 2022-02-21 | 어플라이드 머티어리얼스, 인코포레이티드 | Methods and apparatus for post-exposure processing |
JP6999614B2 (en) * | 2019-07-26 | 2022-01-18 | 株式会社バルカー | Support member |
JP7264038B2 (en) * | 2019-12-19 | 2023-04-25 | 株式会社Sumco | Vapor deposition apparatus and vapor deposition treatment method |
JP7192756B2 (en) * | 2019-12-19 | 2022-12-20 | 株式会社Sumco | Vapor deposition apparatus and vapor deposition method |
JP7205458B2 (en) | 2019-12-25 | 2023-01-17 | 株式会社Sumco | Vapor deposition equipment |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110318142A1 (en) * | 2008-12-11 | 2011-12-29 | Christopher Gage | Minimum contact area wafer clamping with gas flow for rapid wafer cooling |
Family Cites Families (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5800686A (en) * | 1993-04-05 | 1998-09-01 | Applied Materials, Inc. | Chemical vapor deposition chamber with substrate edge protection |
JP3082624B2 (en) | 1994-12-28 | 2000-08-28 | 住友金属工業株式会社 | How to use electrostatic chuck |
JP4227623B2 (en) * | 1995-12-12 | 2009-02-18 | 東京エレクトロン株式会社 | Semiconductor processing equipment |
JPH09278179A (en) * | 1996-04-16 | 1997-10-28 | Hitachi Ltd | Carrying device |
US6120609A (en) * | 1996-10-25 | 2000-09-19 | Applied Materials, Inc. | Self-aligning lift mechanism |
WO1998053484A1 (en) * | 1997-05-20 | 1998-11-26 | Tokyo Electron Limited | Processing apparatus |
US6063440A (en) * | 1997-07-11 | 2000-05-16 | Applied Materials, Inc. | Method for aligning a wafer |
US6197117B1 (en) * | 1997-07-23 | 2001-03-06 | Applied Materials, Inc. | Wafer out-of-pocket detector and susceptor leveling tool |
US5974681A (en) * | 1997-09-10 | 1999-11-02 | Speedfam-Ipec Corp. | Apparatus for spin drying a workpiece |
US6146463A (en) * | 1998-06-12 | 2000-11-14 | Applied Materials, Inc. | Apparatus and method for aligning a substrate on a support member |
US6063196A (en) * | 1998-10-30 | 2000-05-16 | Applied Materials, Inc. | Semiconductor processing chamber calibration tool |
US6168668B1 (en) * | 1998-11-25 | 2001-01-02 | Applied Materials, Inc. | Shadow ring and guide for supporting the shadow ring in a chamber |
DE19901291C2 (en) * | 1999-01-15 | 2002-04-18 | Sez Semiconduct Equip Zubehoer | Device for the etching treatment of a disc-shaped object |
US6695546B2 (en) * | 2000-03-28 | 2004-02-24 | Mirae Corporation | Single drive aligner elevation apparatus for an integrated circuit handler |
JP4117762B2 (en) * | 2001-07-04 | 2008-07-16 | 松下電器産業株式会社 | Substrate positioning method and apparatus |
US6743296B2 (en) * | 2001-10-12 | 2004-06-01 | Taiwan Semiconductor Manufacturing Co., Ltd | Apparatus and method for self-centering a wafer in a sputter chamber |
JP3976170B2 (en) * | 2001-10-16 | 2007-09-12 | 株式会社日立プラントテクノロジー | Thin article positioning device |
US6824343B2 (en) * | 2002-02-22 | 2004-11-30 | Applied Materials, Inc. | Substrate support |
JP4244555B2 (en) * | 2002-02-25 | 2009-03-25 | 東京エレクトロン株式会社 | Support mechanism for workpiece |
WO2005055312A1 (en) * | 2003-12-04 | 2005-06-16 | Hirata Corporation | Substrate positioning system |
JP2006005177A (en) | 2004-06-17 | 2006-01-05 | Tokyo Electron Ltd | Thermal treatment apparatus |
KR100574058B1 (en) * | 2004-08-20 | 2006-04-27 | 삼성전자주식회사 | Wafer bake apparatus |
JP2006066747A (en) * | 2004-08-30 | 2006-03-09 | Hitachi High-Tech Electronics Engineering Co Ltd | Positioning apparatus and method of substrate |
JP4619854B2 (en) * | 2005-04-18 | 2011-01-26 | 東京エレクトロン株式会社 | Load lock device and processing method |
JP4642610B2 (en) * | 2005-09-05 | 2011-03-02 | 東京エレクトロン株式会社 | Substrate alignment device and substrate accommodation unit |
JP4781802B2 (en) * | 2005-12-06 | 2011-09-28 | 東京応化工業株式会社 | Support plate laminating means and laminating apparatus, and support plate laminating method |
JP4750724B2 (en) * | 2007-01-25 | 2011-08-17 | 東京応化工業株式会社 | Overlay unit and bonding apparatus |
JP2008192840A (en) * | 2007-02-05 | 2008-08-21 | Tokyo Electron Ltd | Vacuum processing apparatus, method for vacuum processing and storage medium |
JP2008300414A (en) * | 2007-05-29 | 2008-12-11 | Dainippon Screen Mfg Co Ltd | Thin-film forming apparatus and thin-film forming method |
JP4616873B2 (en) | 2007-09-28 | 2011-01-19 | 東京エレクトロン株式会社 | Semiconductor manufacturing apparatus, substrate holding method, and program |
US20090181553A1 (en) * | 2008-01-11 | 2009-07-16 | Blake Koelmel | Apparatus and method of aligning and positioning a cold substrate on a hot surface |
JP2009182235A (en) | 2008-01-31 | 2009-08-13 | Tokyo Electron Ltd | Load lock apparatus and substrate cooling method |
JP2011530833A (en) * | 2008-08-12 | 2011-12-22 | アプライド マテリアルズ インコーポレイテッド | Electrostatic chuck assembly |
JP2010087342A (en) | 2008-10-01 | 2010-04-15 | Toray Eng Co Ltd | Lift pin |
US8314371B2 (en) * | 2008-11-06 | 2012-11-20 | Applied Materials, Inc. | Rapid thermal processing chamber with micro-positioning system |
US8388853B2 (en) | 2009-02-11 | 2013-03-05 | Applied Materials, Inc. | Non-contact substrate processing |
JP5071437B2 (en) * | 2009-05-18 | 2012-11-14 | パナソニック株式会社 | Plasma processing apparatus and tray mounting method in plasma processing apparatus |
CN101840880A (en) * | 2010-03-24 | 2010-09-22 | 友达光电(苏州)有限公司 | Substrate clamping device |
CN103502508B (en) * | 2010-12-30 | 2016-04-27 | 维易科仪器公司 | Use the wafer processing of loader expansion |
CN103403852B (en) * | 2011-03-01 | 2016-06-08 | 应用材料公司 | The elimination of double; two load locks configuration and lift-off processing chamber |
JP2012195427A (en) * | 2011-03-16 | 2012-10-11 | Ulvac Japan Ltd | Substrate processing apparatus and substrate processing method |
WO2014082196A1 (en) * | 2012-11-27 | 2014-06-05 | Acm Research (Shanghai) Inc. | Substrate supporting apparatus |
US9355876B2 (en) * | 2013-03-15 | 2016-05-31 | Applied Materials, Inc. | Process load lock apparatus, lift assemblies, electronic device processing systems, and methods of processing substrates in load lock locations |
JP6181438B2 (en) * | 2013-06-24 | 2017-08-16 | 株式会社荏原製作所 | Substrate holding device and substrate cleaning device |
TWI667722B (en) * | 2014-02-27 | 2019-08-01 | 日商斯克林集團公司 | Substrate processing apparatus |
JP6369054B2 (en) * | 2014-03-03 | 2018-08-08 | 東京エレクトロン株式会社 | Substrate placing apparatus and substrate processing apparatus |
WO2015138094A1 (en) * | 2014-03-12 | 2015-09-17 | Applied Materials, Inc. | Wafer rotation in a semiconductor chamber |
JP6270270B2 (en) * | 2014-03-17 | 2018-01-31 | 株式会社Screenホールディングス | Substrate processing method and substrate processing apparatus |
US20160314997A1 (en) * | 2015-04-22 | 2016-10-27 | Applied Materials, Inc. | Loadlock apparatus, cooling plate assembly, and electronic device processing systems and methods |
US9929029B2 (en) * | 2015-10-15 | 2018-03-27 | Applied Materials, Inc. | Substrate carrier system |
-
2016
- 2016-10-13 US US15/292,680 patent/US9929029B2/en active Active
- 2016-10-13 WO PCT/US2016/056798 patent/WO2017066418A1/en active Application Filing
- 2016-10-13 KR KR1020187013702A patent/KR102615853B1/en active IP Right Grant
- 2016-10-13 EP EP16856168.6A patent/EP3363044B1/en active Active
- 2016-10-13 JP JP2018519317A patent/JP6942121B2/en active Active
- 2016-10-14 TW TW105133136A patent/TWI691006B/en active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110318142A1 (en) * | 2008-12-11 | 2011-12-29 | Christopher Gage | Minimum contact area wafer clamping with gas flow for rapid wafer cooling |
Also Published As
Publication number | Publication date |
---|---|
WO2017066418A1 (en) | 2017-04-20 |
KR20180056790A (en) | 2018-05-29 |
TW201725645A (en) | 2017-07-16 |
EP3363044B1 (en) | 2021-12-15 |
TWI691006B (en) | 2020-04-11 |
EP3363044A1 (en) | 2018-08-22 |
KR102615853B1 (en) | 2023-12-21 |
JP2018536986A (en) | 2018-12-13 |
JP6942121B2 (en) | 2021-09-29 |
US9929029B2 (en) | 2018-03-27 |
US20170110352A1 (en) | 2017-04-20 |
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