EP2651119B1 - Strahlungsdetektor - Google Patents

Strahlungsdetektor Download PDF

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Publication number
EP2651119B1
EP2651119B1 EP10860506.4A EP10860506A EP2651119B1 EP 2651119 B1 EP2651119 B1 EP 2651119B1 EP 10860506 A EP10860506 A EP 10860506A EP 2651119 B1 EP2651119 B1 EP 2651119B1
Authority
EP
European Patent Office
Prior art keywords
data
read
bit
radiation detector
send
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
EP10860506.4A
Other languages
English (en)
French (fr)
Other versions
EP2651119A1 (de
EP2651119A4 (de
Inventor
Akira Tsukiyama
Takuto Sakumura
Yuji Tsuji
Pawel Grybos
Piotr MAJ
Robert SZCZYGIEL
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of EP2651119A1 publication Critical patent/EP2651119A1/de
Publication of EP2651119A4 publication Critical patent/EP2651119A4/de
Application granted granted Critical
Publication of EP2651119B1 publication Critical patent/EP2651119B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Definitions

  • the present invention relates to a radiation detector (imaging device) having a plurality of single-photon-counting imaging cells.
  • the radiation detector 100 is considered, in which the number of bits of the counter unit CU is four and the number of the data read structures 11 is four.
  • the read clock Pck, the load signal Ld, and the send-out clock Sck are caused to operate in combination for the radiation detector 100.
  • data bits are output in order from an output terminal Sout.
  • the flowchart of Fig. 14 shows processing when read is omitted for the third bit data of all the pixels.
  • the data read structure 11 switches the state of the internal circuit from data recording to readout (step T1).
  • the external control unit determines whether or not the order of the data bit to be read is the third bit in accordance with the setting (step T2).
  • the processing proceeds to step T7.
  • the load signal is transmitted from outside.
  • the intake circuit 14 receives the load signal Ld and the shift unit SU reads the data bit from the data read structure 11 (step T3).
  • Fig. 20 is a diagram showing an example of a 16-bit read clock and a circuit current. In the example shown in Fig. 20 , all the data is read without performing rearrangement. In Fig. 20 , the bit position to be output is indicated by a numeral on the waveform of each read clock Pck. It is assumed that the read starts from data bit b15 and is performed up to data bit b0.

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Claims (9)

  1. Strahlungsdetektor mit mehreren Abbildungszellen für Einzelphotonzählung, umfassend:
    eine Abbildungszelle (1), die ausgebildet ist zum Erzeugen eines Erfassungssignals gemäß der Strahlungsintensität;
    eine Digitalisierungsschaltung (5), die ausgebildet ist zum Digitalisieren des Erfassungssignals;
    mindestens eine Datenlesestruktur (11), die ausgebildet ist zum Zählen des digitalisierten Erfassungssignals, zum Speichern des Ergebnisses als Bitdaten und zum Ausgaben der Bitdaten gemäß eines Lesetaktes (Pck); und
    ein Aussenderegister (13), das eine Schiebeeinheit (SU) für jede Datenlesestruktur (11) enthält, sodass die Ausgabe jeder Datenlesestruktur (11) mit einer jeweiligen Schiebeeinheit (SU) verbunden ist; wobei
    die Schiebeeinheiten (SU) innerhalb des Aussenderegisters (13) in Serie geschaltet sind und jede Schiebeeinheit (SU) eine Einlassschaltung (14) und ein Bitregister (15) enthält, wobei die Einlassschaltung (14) ausgestaltet ist zur Umschaltung zwischen der Aktivierung und Deaktivierung der Eingabe eines Datenbits, das von der Datenlesestruktur (11) in der jeweiligen Schiebeeinheit gemäß einem Ladesignal (Ld), das in die Einlassschaltung eingegeben wird, ausgegeben wird; und wobei
    das Aussenderegister (13) ausgestaltet ist, um die Menge der Ausgabedaten zu senken, indem ein Ladesignal (Ld3) für ein Datenbit, das nicht von der Datenlesestruktur (11) an das Aussenderegister (13) übertragen werden soll, ausgelassen wird und indem ein Zeitabstand zwischen einem Ladesignal (Ld2), das dem ausgelassenen Ladesignal (Ld3) vorgeordnet ist, und einem Lesetakt (Pck2), der dem ausgelassenen Ladesignal (Ld3) folgt, verringert wird.
  2. Strahlungsdetektor nach Anspruch 1, wobei
    die Datenlesestruktur (11) mehrere Zählereinheiten (CU) enthält, von denen jede ein internes Schieberegister aufweist und dazu dient, die Eingabe des internen Schieberegisters zwischen einer Dateneingabe von einer jeweiligen Digitalisierungsschaltung und dem Auslesen durch eine Steuerung von außerhalb zu schalten.
  3. Strahlungsdetektor nach Anspruch 1 oder 2, wobei
    das Aussenderegister (13) durch die Steuerung der Eingabe der Bitdaten mithilfe des Ladesignals ausgestaltet ist, um die Ausgabe der Datenbits durch das Aussenderegister auf die niedrigstwertigen Bits zu beschränken.
  4. Strahlungsdetektor nach einem der Ansprüche 1 bis 3, wobei
    das Aussenderegister (13) durch die Steuerung der Eingabe der Bitdaten mithilfe des Ladesignals ausgestaltet ist, um die Ausgabe der Datenbits durch das Aussenderegister auf die höchstwertigen Bits zu beschränken.
  5. Strahlungsdetektor nach Anspruch 1, wobei die Abbildungszelle eine Fotodiode (3) aufweist, die mit einer Sperrspannung aufgebracht wird und die als Reaktion auf einen Strahlungseinfall ein Stromsignal erzeugt,
    wobei die Digitalisierungsschaltung (5) Folgendes aufweist:
    einen Verstärker (21), der ausgestaltet ist, um ein Eingabesignal aufgrund des Stromsignals, das von der Fotodiode (3) erzeugt wird, zu verstärken; und
    einen Wellenhöhendiskriminator (22), der ausgestaltet ist, um Ausgabesignale aufgrund des verstärkten Signals zu diskriminieren.
  6. Strahlungsdetektor nach Anspruch 1, wobei
    das Aussenderegister (13) Ausgaben sowohl von einem Ende als auch von einer Mitte der Reihe der Schiebeeinheiten (SU) aufweist.
  7. Strahlungsdetektor nach einem der Ansprüche 1 bis 6, wobei
    die Datenlesestruktur (11) mehrere Zählereinheiten (CU) enthält, wobei jede ein Schieberegister aufweist, das ausgestaltet ist, um die Bitdaten zu speichern, und ein Übertragungsschieberegister, das ausgestaltet ist, um die Datenbits, die in dem Schieberegister aufgrund einer Steuerung von außerhalb gespeichert werden, wiederzugeben.
  8. Strahlungsdetektor nach Anspruch 7, wobei das Schieberegister Daten in dem Übertragungsschieberegister nach dem erneuten Anordnen der Position jedes der Datenbits gemäß einem Muster aufgrund einer vorab bestimmten Tabelle wiedergibt.
  9. Strahlungsdetektor nach einem der Ansprüche 2 bis 8, ferner umfassend:
    eine Umgehung (32), die ausgestaltet ist, um eine spezifische Zählereinheit (CU) der mehreren Zählereinheiten (CU) auszuschließen, wobei die Eingaben und Ausgaben, die miteinander in Reihe geschaltet sind, dadurch die Datenlesestruktur (11) konfigurieren; und
    eine Umgehungsauswahlschaltung, die ausgestaltet ist, um die Auswahl oder die Aufhebung der Auswahl der Umgebung (32) festzulegen.
EP10860506.4A 2010-12-09 2010-12-09 Strahlungsdetektor Active EP2651119B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2010/072151 WO2012077217A1 (ja) 2010-12-09 2010-12-09 放射線検出器

Publications (3)

Publication Number Publication Date
EP2651119A1 EP2651119A1 (de) 2013-10-16
EP2651119A4 EP2651119A4 (de) 2014-05-28
EP2651119B1 true EP2651119B1 (de) 2017-02-22

Family

ID=46206736

Family Applications (1)

Application Number Title Priority Date Filing Date
EP10860506.4A Active EP2651119B1 (de) 2010-12-09 2010-12-09 Strahlungsdetektor

Country Status (5)

Country Link
US (1) US9134431B2 (de)
EP (1) EP2651119B1 (de)
JP (1) JP5451900B2 (de)
PL (1) PL2651119T3 (de)
WO (1) WO2012077217A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI802580B (zh) * 2017-07-26 2023-05-21 中國大陸商深圳幀觀德芯科技有限公司 適用於檢測輻射的裝置、包括其的系統及電子顯微鏡和用於檢測輻射的方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6494160B2 (ja) * 2013-12-27 2019-04-03 キヤノン株式会社 撮像装置およびその制御方法
JP6760258B2 (ja) 2015-02-23 2020-09-23 ソニー株式会社 比較器、ａｄ変換器、固体撮像装置、電子機器、比較器の制御方法、およびデータ転送回路
JP6482032B2 (ja) * 2016-02-19 2019-03-13 キヤノンメディカルシステムズ株式会社 ヒストグラムカウンタ及び放射線検出回路
JP7277242B2 (ja) * 2019-04-23 2023-05-18 キヤノン株式会社 撮像装置およびその制御方法
WO2024018860A1 (ja) * 2022-07-20 2024-01-25 浜松ホトニクス株式会社 放射線検出器、集積回路、及び放射線検出方法

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GB2318411B (en) 1996-10-15 1999-03-10 Simage Oy Imaging device for imaging radiation
JPH10271365A (ja) * 1997-03-26 1998-10-09 Nec Corp テレビジョンカメラ装置
GB2343577B (en) * 1998-11-05 2001-01-24 Simage Oy Imaging device
FI111759B (fi) * 2000-03-14 2003-09-15 Planmed Oy Anturijärjestelmä ja menetelmä digitaalisessa röntgenkuvantamisessa
JP4135486B2 (ja) * 2002-12-06 2008-08-20 日本ビクター株式会社 イメージセンサ
EP1581971B1 (de) 2003-01-10 2009-05-27 Paul Scherrer Institut Photonenzähl-abbildungseinrichtung
JP2006033496A (ja) 2004-07-16 2006-02-02 Ricoh Co Ltd データ幅可変な撮像装置及び撮像方法
US7456409B2 (en) * 2005-07-28 2008-11-25 Carestream Health, Inc. Low noise image data capture for digital radiography
EP1788629A1 (de) * 2005-11-21 2007-05-23 Paul Scherrer Institut Auslesechip für Einzelphotonenzählung
EP1858245A1 (de) 2006-05-17 2007-11-21 STMicroelectronics (Research & Development) Limited Hochleistungsfotosensor
EP2054738A2 (de) * 2006-08-14 2009-05-06 Koninklijke Philips Electronics N.V. Strahlungsdetektor mit zählelektronik
JP4893320B2 (ja) 2007-01-12 2012-03-07 ソニー株式会社 固体撮像装置、撮像装置

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI802580B (zh) * 2017-07-26 2023-05-21 中國大陸商深圳幀觀德芯科技有限公司 適用於檢測輻射的裝置、包括其的系統及電子顯微鏡和用於檢測輻射的方法
US11782173B2 (en) 2017-07-26 2023-10-10 Shenzhen Xpectvision Technology Co., Ltd. Radiation detector and methods of data output from it

Also Published As

Publication number Publication date
EP2651119A1 (de) 2013-10-16
PL2651119T3 (pl) 2017-06-30
WO2012077217A1 (ja) 2012-06-14
EP2651119A4 (de) 2014-05-28
JPWO2012077217A1 (ja) 2014-05-19
US20140131588A1 (en) 2014-05-15
JP5451900B2 (ja) 2014-03-26
US9134431B2 (en) 2015-09-15

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