EP2570840A4 - Digitalmikroskop - Google Patents

Digitalmikroskop

Info

Publication number
EP2570840A4
EP2570840A4 EP11780359.3A EP11780359A EP2570840A4 EP 2570840 A4 EP2570840 A4 EP 2570840A4 EP 11780359 A EP11780359 A EP 11780359A EP 2570840 A4 EP2570840 A4 EP 2570840A4
Authority
EP
European Patent Office
Prior art keywords
digital microscope
microscope
digital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP11780359.3A
Other languages
English (en)
French (fr)
Other versions
EP2570840B1 (de
EP2570840A1 (de
Inventor
Yoichi Kajiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hirox Co Ltd
Original Assignee
Hirox Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hirox Co Ltd filed Critical Hirox Co Ltd
Publication of EP2570840A1 publication Critical patent/EP2570840A1/de
Publication of EP2570840A4 publication Critical patent/EP2570840A4/de
Application granted granted Critical
Publication of EP2570840B1 publication Critical patent/EP2570840B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/12—Condensers affording bright-field illumination
    • G02B21/125—Condensers affording bright-field illumination affording both dark- and bright-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/364—Projection microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/368—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements details of associated display arrangements, e.g. mounting of LCD monitor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/26—Optical coupling means
    • G02B6/35—Optical coupling means having switching means
    • G02B6/3502—Optical coupling means having switching means involving direct waveguide displacement, e.g. cantilever type waveguide displacement involving waveguide bending, or displacing an interposed waveguide between stationary waveguides
    • G02B6/3508—Lateral or transverse displacement of the whole waveguides, e.g. by varying the distance between opposed waveguide ends, or by mutual lateral displacement of opposed waveguide ends

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
EP11780359.3A 2010-05-10 2011-04-28 Digitalmikroskop Active EP2570840B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010108404A JP5501848B2 (ja) 2010-05-10 2010-05-10 デジタル顕微鏡
PCT/JP2011/002498 WO2011142099A1 (ja) 2010-05-10 2011-04-28 デジタル顕微鏡

Publications (3)

Publication Number Publication Date
EP2570840A1 EP2570840A1 (de) 2013-03-20
EP2570840A4 true EP2570840A4 (de) 2014-01-15
EP2570840B1 EP2570840B1 (de) 2018-03-07

Family

ID=44914160

Family Applications (1)

Application Number Title Priority Date Filing Date
EP11780359.3A Active EP2570840B1 (de) 2010-05-10 2011-04-28 Digitalmikroskop

Country Status (7)

Country Link
US (1) US9766444B2 (de)
EP (1) EP2570840B1 (de)
JP (1) JP5501848B2 (de)
KR (1) KR101822671B1 (de)
CN (1) CN102754010B (de)
RU (1) RU2559133C2 (de)
WO (1) WO2011142099A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9429744B2 (en) * 2013-04-04 2016-08-30 Datacolor Holding Ag System and method for color correction of a microscope image with a built-in calibration slide
DE102013006996A1 (de) * 2013-04-19 2014-10-23 Carl Zeiss Microscopy Gmbh Verfahren zur Beleuchtung eines Objektes in einem digitalen Lichtmikroskop, digitales Lichtmikroskop und Hellfeld-Auflichtbeleuchtungsvorrichtung für ein digitales Lichtmikroskop
CN103268009B (zh) * 2013-06-07 2015-05-06 北京师范大学 垂直照明暗场显微镜
US9638644B2 (en) * 2013-08-08 2017-05-02 Camtek Ltd. Multiple mode inspection system and method for evaluating a substrate by a multiple mode inspection system
JP2015219261A (ja) * 2014-05-14 2015-12-07 株式会社ミツトヨ 照明装置および顕微鏡ユニット
CN104317042B (zh) * 2014-09-30 2016-11-02 无锡微焦科技有限公司 一种照明光路系统
IL254325B2 (en) * 2015-03-13 2024-03-01 Genea Ltd Method and device for microscopy
JP6508995B2 (ja) * 2015-03-20 2019-05-08 オリンパス株式会社 顕微鏡装置
CN106019552B (zh) * 2016-06-23 2019-01-11 中国科学院西安光学精密机械研究所 消除被测物体表面盲点的显微镜辅助装置
US10783624B2 (en) * 2016-07-18 2020-09-22 Instrumental, Inc. Modular optical inspection station
KR102358724B1 (ko) * 2020-07-30 2022-02-07 주식회사 이룸인더스트리 투인원 광학 현미경
KR102404070B1 (ko) 2020-09-25 2022-06-02 고려대학교 산학협력단 광섬유 번들을 이용하는 반사 내시현미경 및 이를 이용한 이미지 획득 방법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0486614A (ja) * 1990-07-27 1992-03-19 Olympus Optical Co Ltd 顕微鏡用照明装置
JPH0530823U (ja) * 1991-10-03 1993-04-23 オリンパス光学工業株式会社 システム顕微鏡
JP2004170574A (ja) * 2002-11-19 2004-06-17 Keyence Corp 拡大観察用照明装置
JP2009128881A (ja) * 2007-11-28 2009-06-11 Keyence Corp 拡大観察装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02242214A (ja) 1989-03-16 1990-09-26 Nippon Telegr & Teleph Corp <Ntt> 顕微鏡装置
IL94368A (en) * 1990-05-11 1993-07-08 Orbot Systems Ltd Optic inspection apparatus and illumination system particularly useful therein
JPH0593869A (ja) 1991-03-22 1993-04-16 Olympus Optical Co Ltd 顕微鏡の照明装置
US5325231A (en) 1991-03-22 1994-06-28 Olympus Optical Co., Ltd. Microscope illuminating apparatus
JPH0530821U (ja) 1991-09-30 1993-04-23 コニカ株式会社 ズームレンズ鏡胴
JPH05341200A (ja) 1992-06-08 1993-12-24 Nikon Corp 顕微鏡用照明装置
DE19903486C2 (de) * 1999-01-29 2003-03-06 Leica Microsystems Verfahren und Vorrichtung zur optischen Untersuchung von strukturierten Oberflächen von Objekten
TW554177B (en) * 2000-03-24 2003-09-21 Olympus Optical Co Microscope unit
JP4671463B2 (ja) 2000-03-24 2011-04-20 オリンパス株式会社 照明光学系及び照明光学系を備えた顕微鏡
DE10239548A1 (de) 2002-08-23 2004-03-04 Leica Microsystems Semiconductor Gmbh Vorrichtung und Verfahren zur Inspektion eines Objekts
JP4579554B2 (ja) * 2004-02-12 2010-11-10 オリンパス株式会社 顕微鏡用照明装置
JP2006301523A (ja) * 2005-04-25 2006-11-02 Olympus Medical Systems Corp 医療用顕微鏡
JP2006323075A (ja) * 2005-05-18 2006-11-30 Olympus Corp 顕微鏡システム
JP5479733B2 (ja) * 2005-07-15 2014-04-23 オーバーン ユニバーシティ 顕微鏡照明装置及びアダプタ
DE102005047593A1 (de) * 2005-10-05 2007-04-12 Carl Zeiss Jena Gmbh Vorrichtung zur Variation und Einstellung der Durchlichtbeleuchtung für Mikroskope
JP2007178661A (ja) 2005-12-27 2007-07-12 Olympus Corp 顕微鏡装置
US20070242336A1 (en) * 2006-02-20 2007-10-18 Vitaly Vodyanoy Applications for mixing and combining light utilizing a transmission filter, iris, aperture apparatus
JP4993587B2 (ja) 2007-03-16 2012-08-08 株式会社ハイロックス 光学機器におけるレンズ倍率自動認識装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0486614A (ja) * 1990-07-27 1992-03-19 Olympus Optical Co Ltd 顕微鏡用照明装置
JPH0530823U (ja) * 1991-10-03 1993-04-23 オリンパス光学工業株式会社 システム顕微鏡
JP2004170574A (ja) * 2002-11-19 2004-06-17 Keyence Corp 拡大観察用照明装置
JP2009128881A (ja) * 2007-11-28 2009-06-11 Keyence Corp 拡大観察装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2011142099A1 *

Also Published As

Publication number Publication date
JP5501848B2 (ja) 2014-05-28
US9766444B2 (en) 2017-09-19
KR20130069540A (ko) 2013-06-26
KR101822671B1 (ko) 2018-01-26
EP2570840B1 (de) 2018-03-07
JP2011237574A (ja) 2011-11-24
US20130044202A1 (en) 2013-02-21
EP2570840A1 (de) 2013-03-20
RU2012138165A (ru) 2014-06-20
CN102754010B (zh) 2015-09-30
RU2559133C2 (ru) 2015-08-10
CN102754010A (zh) 2012-10-24
WO2011142099A1 (ja) 2011-11-17

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