EP2396795A1 - Keramisches elektronisches mehrschichtbauelement und verfahren zu dessen herstellung - Google Patents

Keramisches elektronisches mehrschichtbauelement und verfahren zu dessen herstellung

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Publication number
EP2396795A1
EP2396795A1 EP10703456A EP10703456A EP2396795A1 EP 2396795 A1 EP2396795 A1 EP 2396795A1 EP 10703456 A EP10703456 A EP 10703456A EP 10703456 A EP10703456 A EP 10703456A EP 2396795 A1 EP2396795 A1 EP 2396795A1
Authority
EP
European Patent Office
Prior art keywords
varistor
dielectric
multilayer component
layer
ceramic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10703456A
Other languages
German (de)
English (en)
French (fr)
Inventor
Pavol Dudesek
Günter PUDMICH
Hannes Schiechl
Edmund Payr
Thomas Feichtinger
Werner Salz
Christian Hoffmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Electronics AG
Original Assignee
Epcos AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Epcos AG filed Critical Epcos AG
Publication of EP2396795A1 publication Critical patent/EP2396795A1/de
Withdrawn legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/018Dielectrics
    • H01G4/06Solid dielectrics
    • H01G4/08Inorganic dielectrics
    • H01G4/12Ceramic dielectrics
    • H01G4/1209Ceramic dielectrics characterised by the ceramic dielectric material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B18/00Layered products essentially comprising ceramics, e.g. refractory products
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
    • C04B35/453Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
    • C04B35/495Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on vanadium, niobium, tantalum, molybdenum or tungsten oxides or solid solutions thereof with other oxides, e.g. vanadates, niobates, tantalates, molybdates or tungstates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C7/00Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
    • H01C7/18Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material comprising a plurality of layers stacked between terminals
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3231Refractory metal oxides, their mixed metal oxides, or oxide-forming salts thereof
    • C04B2235/3241Chromium oxides, chromates, or oxide-forming salts thereof
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3231Refractory metal oxides, their mixed metal oxides, or oxide-forming salts thereof
    • C04B2235/3251Niobium oxides, niobates, tantalum oxides, tantalates, or oxide-forming salts thereof
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/327Iron group oxides, their mixed metal oxides, or oxide-forming salts thereof
    • C04B2235/3275Cobalt oxides, cobaltates or cobaltites or oxide forming salts thereof, e.g. bismuth cobaltate, zinc cobaltite
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/327Iron group oxides, their mixed metal oxides, or oxide-forming salts thereof
    • C04B2235/3279Nickel oxides, nickalates, or oxide-forming salts thereof
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3284Zinc oxides, zincates, cadmium oxides, cadmiates, mercury oxides, mercurates or oxide forming salts thereof
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3294Antimony oxides, antimonates, antimonites or oxide forming salts thereof, indium antimonate
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3298Bismuth oxides, bismuthates or oxide forming salts thereof, e.g. zinc bismuthate
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/34Oxidic
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/34Oxidic
    • C04B2237/345Refractory metal oxides
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H1/00Constructional details of impedance networks whose electrical mode of operation is not specified or applicable to more than one type of network
    • H03H2001/0021Constructional details
    • H03H2001/0085Multilayer, e.g. LTCC, HTCC, green sheets

Definitions

  • the invention relates to a ceramic multilayer component with a varistor and its manufacture
  • Discrete components with varistor function can be used as protective components against ESD (electrostatic discharge).
  • ESD electrostatic discharge
  • One possible use is z.
  • high-frequency filters for example, for mobile, in the frequency range of 0.5 - 5 GHz to protect these filters or to protect downstream or upstream electronics such as SignalVerproofrn.
  • these devices can also provide EMI protection. It is therefore a so-called EMI-ESD protection device.
  • the object of the present invention is therefore to specify a monolithic ceramic multilayer component in which, in addition to a varistor function, at least one other component function is integrated, without the varistor functionality being unduly impaired as a result.
  • a dielectric ceramic material was found which can be co-sintered with a varistor ceramic to form a monolithic multilayer component according to the invention.
  • the multilayer component therefore comprises at least a layer of a varistor ceramic and another layer of a dielectric. Both layers can be arranged directly adjacent in the multilayer component. At sintering, interdiffusion between the layers limited to a narrow reaction zone of typically 1 ⁇ m between the two layers occurs at best, which at best negligibly negatively affects the electrical properties of the varistor.
  • the critical varistor properties such as low reverse current and high pulse stability are retained in the multilayer component.
  • metallizations are arranged on or between the ceramic layers, which are structured into conductor sections and metallized surfaces.
  • the metallizations form together with the ceramic in addition to a varistor at least one further component which is selected from at least one of the component functions capacitance, resistance and inductance.
  • the inner metallizations are introduced prior to sintering, metallizations arranged on outer layers or side surfaces can also be produced or applied after the sintering of the multilayer component.
  • Conductor portions and metallized areas disposed in different levels of the multi-layer device may be electrically interconnected by vias through one or more layers.
  • all integrated individual components can be electrically interconnected and together result in a functional circuit, for. B. an RF filter circuit.
  • the dielectric consists of different proportions of the following three stoichiometric compounds: Zn 3 TaO 8 , Zn 2 TaO 6 and Bi 2 Zn 2 / 3Ta 4 / 3 ⁇ 7 .
  • the mixture contains at least one of the compounds mentioned.
  • individual ions may be partially replaced stoichiometrically in the compounds.
  • the Zn may be partially replaced by one or more of Ni, Co, Fe, Cu, Mg and Ca.
  • Zn is advantageously up to a maximum of about 30 atom% replaced by one or more of said ions.
  • Zn can also be replaced by Ca and Mg up to 100%.
  • Ta may be partially replaced by Nb.
  • compounds are preferred in which only a smaller part of the Ta is replaced. With too much Nb there is a risk in individual cases that the sintering temperature is too low and the diffusion becomes too great.
  • the Bi may be partially replaced by one or more rare earths, selected in particular from La and Nd. Bi is advantageously up to a maximum of about 30 atom% replaced by one or more of said ions.
  • M stands for Ni, Co or Ca.
  • SE stands for one or more rare earths.
  • index x, y and z which in each case gives the proportion of the ions replaced in each case relative to the starting compound, independently of one another 0 ⁇ x, y, z ⁇ 1 applies. This means that not all portions of the parent ions are replaced or absolutely none.
  • X and z are advantageous as already mentioned above to max. 0.3 and y to max. 0.5 limited.
  • the varistor ceramic may be based on a doped zinc oxide. This can be doped with Bi and Sb as Hauptdotierstoff to each about 3-5 atom%. At least one of Ni, Co and Cr may also be present in a proportion of up to about 0.5 atom% as secondary dopants.
  • varistor ceramics based on doped zinc and praseodymium oxide are compatible with are the dielectric and can also be sintered without substantial restriction of the varistor functionality together with the proposed dielectric.
  • a dielectric constant of about 400 results.
  • the dielectric constant of the dielectric is generally between 20 and 100, and thus by a factor of 5 to 10 lower. This results in a broad selection range for the component functions that can be realized with them, with which virtually all useful values for the component functions can be set.
  • the variability in the design of circuits is substantially increased and therefore improved.
  • the structured metallizations that form the integrated L and C elements can be arranged on one and both sides adjacent to a layer of the dielectric and use this as a dielectric.
  • components which use the varistor ceramic as a dielectric can also be formed in the multilayer component.
  • the multi-layer component requires a sintering temperature of 950-1300 0 C.
  • the metallizations can be made of a conductive paste whose metallic components z. Ag / Pd alloy or Au. Pure silver is not suitable because of the high sintering temperature.
  • the layers with the varistor ceramic and the dielectric can be arranged directly adjacent to one another or in the stack of the multilayer component one above the other.
  • a multilayer component may have a sandwich structure, in which a respective other of the dielectric or the varistor ceramic is arranged between two identical layers of the varistor ceramic or of the dielectric, wherein the layers are arranged directly above one another in sandwich construction.
  • one or more further foreign layers of other materials may be included as partial layers, if it is excluded that they are in direct contact with the varistor ceramic.
  • various passive components can be integrated, wherein in addition to a varistor nor R and C, L and C, or R, L and C elements are integrated.
  • an RF filter circuit made of R, C or L elements can be integrated in the monolithic block, wherein the varistor can be connected as a protective component parallel to the RF filter circuit to ground.
  • the varistor fulfills two functions as ESD and as EMI protection. Through its varistor function, it can harmlessly derive harmful current pulses, which are typical for ESD.
  • a varistor usually has a capacity due to its design. With a capacity in a parallel branch to ground he therefore fulfills a rudimentary filter function with a stopband. By suitable dimensioning or by a suitably selected capacitance value of the varistor, this blocking region can be suitably selected or set become.
  • the varistor can also function as an EMI protection device.
  • first green sheets for the layer (s) of varistor ceramic and second green sheets for the dielectric are produced with the aid of a binder, preferably an organic material of corresponding viscosity, for example by film casting.
  • the metallizations are printed on the green sheets on one side and on both sides with a sinterable conductive paste, for example by means of
  • At least one first and second green sheets are placed one above the other, aligned with respect to the metallizations and laminated together to form a film composite. Then the film composite is sintered together.
  • Vias are punched into the green sheets at corresponding points provided for through-contacts and filled with a conductive material before the sheets are laminated to the film composite.
  • FIG. 1 shows a first monolithic layer composite with two layers
  • FIG. 2 shows a second monolithic layer composite of three layers
  • FIG. 4 shows an equivalent circuit diagram for a functional circuit integrated in the multilayer component
  • FIG. 5 shows a multilayer component with a varistor in cross section
  • FIG. 6 shows a multilayer component with a variant of a varistor in cross section
  • FIG. 7 shows a multilayer component with a further variant of a varistor in cross section.
  • FIG. 1 shows a monolithic layer composite of a
  • Multilayer component with two layers: one layer of a varistor ceramic VK and another layer a dielectric D.
  • VK varistor ceramic
  • D dielectric
  • external contacts are provided on one of the outwardly facing surfaces of one of the layers, in particular the dielectric, with which the multilayer component and the interconnection contained therein with the outside world, in particular a circuit environment, for. B. can be connected to a PCB.
  • FIG. 2 shows a monolithic layer composite of a multilayer component with at least three alternating layers: a first layer of a dielectric D1, a layer of a varistor ceramic VK and a second layer of a dielectric D2.
  • FIG. 3 likewise shows a monolithic layer composite of a multilayer component with at least three alternating layers: a first layer of a varistor ceramic VK, a layer of a dielectric D 1 and a second layer of a varistor ceramic VK.
  • FIG. 4 shows an equivalent circuit diagram for a functional circuit integrated in the multilayer component.
  • a serial signal path is connected, which comprises a filter circuit FS.
  • This is z. B. in LC technique or another embodied in a ceramic multilayer component technology.
  • Parallel to the signal path is a transverse branch against
  • varistor V Ground connected, in which a varistor V is arranged.
  • the varistor with its varistor function as ESD Protective device and function with its filter function as EMI protection device.
  • FIG. 5 shows a layer of varistor ceramic VK with a simple exemplary metallization with which a
  • Varistor V shows. For this purpose, overlapping electrodes El and El in the form of a baked conductive paste are formed at the top and bottom of the layer of the varistor ceramic VK. It can be seen that this varistor V forms a significant capacity.
  • the further layers of the multilayer structure MS of the multilayer component are indicated by further lines.
  • FIG. 6 shows a layer of varistor ceramic VK with an exemplary metallization with which a varistor V can be represented. Above and / or below on the layer of the varistor VK are spaced apart but formed on the same layer surface electrodes El and El in the form of a baked conductive paste. It can be seen that this varistor V is not worth mentioning
  • the multilayer structure MS can comprise further layers, which are indicated by further lines.
  • FIG. 7 shows a layer of varistor ceramic VK with an exemplary metallization with which a varistor V can be represented.
  • two electrodes Ell and E21 or E12 and E22 in the form of a baked-in conductive paste are formed on one layer surface at a distance from one another. Belonging to the same electrode metallizations Ell and E21 or E12 and E22 are interconnected by a feedthrough DK.
  • the varistor functionality can now act on two electrode pairs.
  • each layer can comprise a plurality of similar sublayers, between each of which structured metallizations are arranged.

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Power Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Inorganic Chemistry (AREA)
  • Thermistors And Varistors (AREA)
  • Compositions Of Oxide Ceramics (AREA)
EP10703456A 2009-02-12 2010-02-08 Keramisches elektronisches mehrschichtbauelement und verfahren zu dessen herstellung Withdrawn EP2396795A1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102009008737 2009-02-12
DE102009014542A DE102009014542B3 (de) 2009-02-12 2009-03-24 Mehrschichtbauelement und Verfahren zur Herstellung
PCT/EP2010/051518 WO2010092027A1 (de) 2009-02-12 2010-02-08 Keramisches elektronisches mehrschichtbauelement und verfahren zu dessen herstellung

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Publication Number Publication Date
EP2396795A1 true EP2396795A1 (de) 2011-12-21

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Country Link
US (1) US8970324B2 (zh)
EP (1) EP2396795A1 (zh)
JP (1) JP5912533B2 (zh)
CN (1) CN102318017B (zh)
DE (1) DE102009014542B3 (zh)
TW (1) TWI454378B (zh)
WO (1) WO2010092027A1 (zh)

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DE102016107497B4 (de) * 2016-03-24 2020-01-30 Tdk Electronics Ag Multi-LED System und Verfahren zu seiner Herstellung
DE102016107495B4 (de) * 2016-04-22 2022-04-14 Tdk Electronics Ag Vielschicht-Trägersystem, Verfahren zur Herstellung eines Vielschicht-Trägersystems und Verwendung eines Vielschicht-Trägersystems
JP6249260B1 (ja) * 2016-11-22 2017-12-20 ナガセケムテックス株式会社 レジスト剥離液及びレジストの剥離方法
DE102017108384A1 (de) * 2017-04-20 2018-10-25 Epcos Ag Vielschichtbauelement und Verfahren zur Herstellung eines Vielschichtbauelements
CN114566337B (zh) * 2022-01-23 2024-04-16 中国电子科技集团公司第十三研究所 一种热测试芯片

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Publication number Publication date
JP5912533B2 (ja) 2016-04-27
CN102318017A (zh) 2012-01-11
TWI454378B (zh) 2014-10-01
CN102318017B (zh) 2013-05-29
WO2010092027A1 (de) 2010-08-19
DE102009014542B3 (de) 2010-12-02
TW201040020A (en) 2010-11-16
US8970324B2 (en) 2015-03-03
JP2012517710A (ja) 2012-08-02
US20120032757A1 (en) 2012-02-09

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