EP2315233B1 - Spectromètre de masse quadripôle - Google Patents

Spectromètre de masse quadripôle Download PDF

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Publication number
EP2315233B1
EP2315233B1 EP10195573.0A EP10195573A EP2315233B1 EP 2315233 B1 EP2315233 B1 EP 2315233B1 EP 10195573 A EP10195573 A EP 10195573A EP 2315233 B1 EP2315233 B1 EP 2315233B1
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EP
European Patent Office
Prior art keywords
mass
scan
quadrupole
voltage
ion
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Not-in-force
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EP10195573.0A
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German (de)
English (en)
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EP2315233A2 (fr
EP2315233A3 (fr
Inventor
Kazuo Mukaibatake
Shigenobu Nakano
Minoru Fujimoto
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Shimadzu Corp
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Shimadzu Corp
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Priority to EP10195573.0A priority Critical patent/EP2315233B1/fr
Priority claimed from PCT/JP2008/001307 external-priority patent/WO2009144765A1/fr
Publication of EP2315233A2 publication Critical patent/EP2315233A2/fr
Publication of EP2315233A3 publication Critical patent/EP2315233A3/fr
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency

Definitions

  • the present invention relates to a quadrupole mass spectrometer using a quadrupole mass filter as a mass separator for separating ions in accordance with their mass (or m/z, to be exact).
  • FIG. 6 is a schematic configuration diagram of a general quadrupole mass spectrometer.
  • a sample molecule is ionized in an ion source 1.
  • the generated ions are converged (and simultaneously accelerated in some cases) by an ion transport optical system 2, such as an ion lens, and injected into a longitudinal space of a quadrupole mass filter 3.
  • the quadrupole mass filter 3 is composed of four rod electrodes (only two electrodes are shown in Fig. 6 ) arrange in parallel around an ion optical axis C.
  • a voltage of ⁇ (U+V•cos ⁇ t) is applied to each of the rod electrodes, in which a direct-current voltage ⁇ U and a radio-frequency voltage ⁇ V•cos ⁇ t are added.
  • a detector 4 provides electric signals in accordance with the amount of ions which have passed through the quadrupole mass filter 3.
  • the mass of the ions which pass through the quadrupole mass filter 3 changes in accordance with the voltage applied to the rod electrodes. Therefore, by varying this application voltage, the mass of the ions that arrive at the detector 4 can be scanned across a given mass range. This is the scan measurement in a quadrupole mass spectrometer.
  • a quadrupole mass spectrometer For example, in a gas chromatograph mass spectrometer (GC/MS) and a liquid chromatograph mass spectrometer (LC/MS), sample components injected into the mass spectrometer change as time progresses. In such a case, by repeating the scan measurement, a variety of components which sequentially appear can be almost continuously detected.
  • Fig. 7 is a diagram schematically illustrating the change in the mass of the ions which arrive at the detector 4.
  • the voltage applied to the rod electrodes is gradually increased from a voltage corresponding to the smallest mass M1, and when the voltage reaches a voltage corresponding to the largest mass M2, the voltage is immediately returned to the voltage corresponding to the smallest mass M1. Since such a rapid change in the voltage inevitably causes an overshoot (undershoot), a waiting time (settling time) is needed for allowing the voltage to stabilize after the change.
  • Patent Document 1 discloses that it is inevitable to provide a settling time in a selected ion monitoring (SIM) measurement, and this is also true for the scan measurement.
  • SIM selected ion monitoring
  • a settling time is provided for every mass scan.
  • a mass analysis of a component injected into the ion source 1 is not performed. Therefore, the longer the settling time is, the longer the time interval is between the mass scans, I.e. the longer the cycle of the mass scan is, which decreases the temporal resolution.
  • a mass range that a user wants to monitor (M1 through M2 in the example of Fig. 7 ) is specified in a mass spectrometer
  • a mass spectrum for the range is created.
  • a mass scan is performed across a mass range extended above and below the specified mass range by a predetermined width. That is, even when a mass range of M1 through M2 is specified, a mass scan is performed in which M1- ⁇ M1 is the initiation point of the mass scan and M2+ ⁇ M2 is the end point thereof.
  • the time period of such a scan margin for stably performing a measurement which is provided outside the mass range necessary for creating a mass spectrum, does not substantially contribute to the mass analysis, just like the settling time. Therefore, in order to Increase the temporal resolution of an analysis, it is preferable that the scan margin width is also as small as possible.
  • a mass spectrometry device is known from the prior art document JP 4 289 652 A .
  • a mass number is optionally set with a personal computer, and mass spectrometry conditions (mass number range, mass number, scan block, step waiting time, and scan block waiting time) are edited with a CPU to be memorized in a scan memory via a sleeve CPU.
  • the step waiting time and the scan block waiting time are automatically variable-adjusted according to voltage differences between mass spectrometry steps and between scan blocks with the CPU.
  • the step voltage of a scan electrode of a mass spectrometry part is scanned according to a set mass number, and passing ions are detected every mass number with a detector. A detected value is taken in by opening a gate after the above waiting timed.
  • Patent Document 1 Japanese Unexamined Patent Application Publication No. 2000-195464
  • the present invention has been developed to solve the aforementioned problems and the main objective thereof is to provide a quadrupole mass spectrometer capable of increasing the temporal resolution, when a mass scan across a predetermined mass range is repeated or a process in which a predetermined plurality of masses are sequentially set is repeated, by shortening the time which does not substantially contribute to the mass analysis as much as possible to shorten the cycle period.
  • This object is solved by a quadrupole mass spectrometer according to claim 1.
  • Further advantageous embodiments of the claimed invention are the subject-matter of the dependent claims. Aspects of the invention are set out below.
  • the first aspect of the present invention provides a quadrupole mass spectrometer which includes a quadrupole mass filter for selectively allowing an ion having a specific mass to pass through and a detector for detecting the ion which has passed through the quadrupole mass filter and which performs a scan measurement in which a cycle of scanning the mass of ions which pass through the quadrupole mass filter across a predetermined mass range is repeated or a measurement in which a cycle of sequentially setting a plurality of masses is repeated, the quadrupole mass spectrometer including:
  • the measurement in which a cycle of sequentially setting a plurality of masses is repeated may be, for example, a selected ion monitoring (SIM) measurement, or a multiple reaction monitoring (MRM) measurement in an MS/MS analysis, which provides higher selectivity.
  • SIM selected ion monitoring
  • MRM multiple reaction monitoring
  • the waiting time from the point in time when a mass scan is terminate to the point in time when the next mass scan is started is constant regardless of the analysis conditions, such as the mass range specified in a scan measurement.
  • the controller sets a shorter waiting time (or settling time) for a smaller difference between the scan initiation mass and the scan termination mass in a scan measurement.
  • the overshoot (undershoot), which occurs when the voltage applied to the electrodes composing the quadrupole mass filter is returned to the voltage corresponding to the scan initiation mass, is also relatively small. That is, the time required for the voltage to stabilize is short. Therefore, even though the waiting time is shortened, the subsequent mass scan can be started from the state where the voltage is sufficiently stable. This shortens the wasted waiting time which does not contribute to the collection of the mass analysis data, thereby shortening the cycle period of the mass scan in a scan measurement. This holds true not only for a scan measurement in which a predetermined mass range is exhaustively scanned, but also for an SIM measurement and an MRM measurement in which the number of masses set in a cycle is much smaller than in a scan measurement.
  • the second aspect of the present invention provides a quadrupole mass spectrometer which includes a quadrupole mass filter for selectively allowing an ion having a specific mass to pass through and a detector for detecting the ion which has passed through the quadrupole mass filter and which performs a scan measurement in which a cycle of scanning the mass of ions which pass through the quadrupole mass filter across a predetermined mass range is repeated, the quadrupole mass spectrometer including:
  • the mass width of the scan margin (which will be hereinafter called the "scan margin width") is constant regardless of the conditions such as the scan rate.
  • the controller sets a smaller scan margin when a lower (or slower) scan rate is specified. Lowering the scan rate results in a longer scan time for the same scan margin width. In other words, in the case where the scan rate is low, even though the scan margin width is small, it is possible to assure as much temporal margin as in the case where the scan rate is high and the scan margin width is large. During the period of this temporal margin, unnecessary ions remaining inside the quadrupole mass filter are eliminated, after which the first target ion is allowed to pass through the quadrupole mass filter.
  • an excessive temporal margin is taken even in the case where the scan rate is low, whereas in the quadrupole mass spectrometer according to the second aspect of the present invention, such an excessive temporal margin is reduced to shorten the cycle period of a mass scan.
  • the controller changes the mass width of the scan margin further in accordance with the scan initiation mass.
  • a smaller mass width of the scan margin can be set for a smaller scan initiation mass.
  • the time required for an ion to pass through the quadrupole mass filter also depends on the kinetic energy that the ion has at the point in time when it is injected into the quadrupole mass filter. The larger the kinetic energy is, the faster the ion can pass through. Given this factor, it is preferable that the controller further changes the mass width of the scan margin in accordance with the acceleration voltage for an ion or ions injected into the quadrupole mass filter. In particular, a smaller mass width of the scan margin can be set for a higher acceleration voltage.
  • the acceleration voltage corresponds to the direct-current potential difference between the ion transport optical system and the quadrupole mass filter.
  • the mass width of the scan margin may be changed in accordance with the direct-current bias voltage (which is different from the voltage for mass selection of an ion) applied to the quadrupole mass filter.
  • an excessive and useless waiting time that arises when the voltage applied to the quadrupole mass filter is changed among the adjacent cycles in a scan measurement, an SIM measurement, or an MRM measurement can be shortened. Therefore, for example, the cycle period of a mass scan can be shortened even for the same scan rate. This shortens what is called the dead time, i.e. a period of time when no mass analysis data can be obtained, thereby increasing the temporal resolution.
  • the mass width of the scan margin for stabilizing a measurement which is set outside the mass range in a scan measurement can be decreased. Therefore, in the case where, for example, the scan rate is low or the mass range is located in a relatively low region, the cycle period of the mass scan can be shortened. This shortens what is called the dead time, i.e. a period of time when no mass analysis data can be obtained, thereby increasing the temporal resolution.
  • Fig. 1 is a configuration diagram of the main portion of the quadrupole mass spectrometer according to this embodiment. The same components as in Fig. 6 which have been already described are indicated with the same numerals.
  • a gaseous sample is injected into the ion source 1, and a gas chromatograph can be connected in the previous stage of the mass spectrometer.
  • a liquid sample may also be analyzed by using an atmospheric pressure ion source (such as an electrospray ion source) as the ion source 1, and maintaining this ion source 1 at an atmosphere of approximate atmospheric pressure while placing the quadrupole mass filter 3 and the detector 4 in a high vacuum atmosphere by a multistage differential pumping system.
  • an atmospheric pressure ion source such as an electrospray ion source
  • a liquid chromatograph can be connected in the previous stage of the mass spectrometer.
  • the quadrupole mass filter 3 has four rod electrodes 3a, 3b, 3c. and 3d provided in such a manner as to internally touch a cylinder having a predetermined radius centering on the ion optical axis C.
  • rod electrodes 3a, 3b, 3c, and 3d two rod electrodes facing across the ion optical axis C, i.e. the rod electrodes 3a and 3c as well as the rod electrodes 3b and 3d, are connected to each other.
  • the quadrupole driver as a means for applying voltages to these four rod electrodes 3a, 3b, 3c, and 3d is composed of the ion selection voltage generator 13, the bias voltage generator 18, and the bias adders 19 and 20.
  • the ion selection voltage generator 13 includes a direct-current (DC) voltage generator 16, a radio-frequency (RF) voltage generator 15, and a radio-frequency/direct-current (RF/DC) adder 17.
  • the ion optical system voltage generator 21 applies a direct-current voltage Vdcl to the ion transport optical system 2 in the previous stage of the quadrupole mass filter 3.
  • the controller 10 is for controlling the operations of the ion optical system voltage generator 21, the ion selection voltage generator 13, the bias voltage generator 18, and other units.
  • the voltage control data memory 12 is connected to the controller 10 in order to perform this operation.
  • An input unit 11 which is operated by an operator is also connected to the controller 10.
  • the function of the controller 10 is realized mainly by a computer including a central processing unit (CPU), a memory, and other units.
  • the direct-current voltage generator 16 In the ion selection voltage generator 13, the direct-current voltage generator 16 generates direct-current voltages ⁇ U having a polarity different from each other under the control by the controller 10.
  • the radio-frequency voltage generator 15 generates, similarly under the control of the controller 10, radio-frequency voltages ⁇ V ⁇ cos ⁇ t having a phase difference of 180 degrees.
  • the radio-frequency/direct-currcnt adder 17 adds the direct-current voltages ⁇ U and the radio-frequency voltages ⁇ V ⁇ cos ⁇ t to generate two types of voltages of U+V ⁇ cosrot and -(U+V ⁇ cos ⁇ t). These are ion selection voltages which determined the mass (or m/z to be exact) of the ions which pass through.
  • the bias voltage generator 18 In order to form, in front of the quadrupole mass filter 3, a direct-current electric field in which ions are efficiently injected into the longitudinal space of the quadrupole mass filter 3, the bias voltage generator 18 generates a common direct-current bias voltage Vac2 to be applied to each of the rod electrodes 3a through 3d so as to achieve an appropriate voltage difference from the direct-current voltage Vdcl applied to the ion transport optical system 2.
  • the bias adder 19 adds the ion selection voltage U+V ⁇ cos ⁇ t and the direct-current bias voltage Vdc2, and applies the voltage of Vdc2+U+V ⁇ cos ⁇ t to the rod electrodes 3a and 3c.
  • the bias adder 20 adds the ion selection voltage (U+V ⁇ cos ⁇ t) and the direct-current bias voltage Vdc2, and applies the voltage of Vdc2-(U+V ⁇ cos ⁇ t) to the rod electrodes 3b and 3d.
  • the values of the direct-current bias voltages Vdc1 and Vdc2 may be appropriately set based on an automated tuning performed by using a standard sample or other measures.
  • a scan measurement is performed, in which a mass scan across a mass range set by a user is repeated, by changing the voltage (to be more precise, the direct-current voltage U and the amplitude V of the radio-frequency voltage) applied to each of the rod electrodes 3a through 3d of the quadrupole mass filter. 3.
  • a characterizing voltage control is performed. Hereinafter, this control operation will be described.
  • the applied voltage is gradually increased from the voltage corresponding to the scan initiation mass M1.
  • the applied voltage is immediately returned to the voltage corresponding to the scan initiation mass M1.
  • the rapid decrease in the voltage causes an undershoot and a certain amount of time is required until the voltage value stabilizes. Therefore, the operation waits until the voltage stabilizes, and then a voltage scan for the next mass scan, i.e. the next cycle, is initiated.
  • the larger the preceding change in the voltage is, i.e.
  • the voltage stabilization time the voltage stabilization time
  • Fig. 3 is a graph of the result of an actual measurement of the relationship between the mass difference ⁇ M and the voltage stabilization time. This result shows that, for example, a voltage stabilization time of 0.5 [msec] is sufficient for a mass difference ⁇ M of 200 [u], while a voltage stabilization time of 5 [msec] is required for a mass difference ⁇ M of 2000 [u].
  • a constant settling time has been set to achieve the largest voltage stabilization time.
  • a time period of 4.5 [msec] is wasted in the case where the mass difference AM is 200 [u].
  • the shaded triangular area in Fig. 3 corresponds to the wasted time period in conventional apparatuses.
  • the "wasted time” used herein is the time when the process is waiting without initiating the next mass scan even though the voltage is already stable.
  • the settling time determiner 101 included in the controller 10 holds a set of information prepared for deriving an appropriate settling time from the mass difference ⁇ M.
  • This information includes, for example, a computational expression, table, or the like, which represents the line showing the relationship between the voltage stabilization time and the mass difference ⁇ M as illustrated in Fig. 3 .
  • the user beforehand sets the analysis conditions including the mass range, the scan rate, and other parameters through the input unit 11. Then, the settling time determiner 101 in the controller 10 computes the mass difference ⁇ M from the specified mass range and obtains the settling time corresponding to the mass difference ⁇ M by using the aforementioned information for deriving the settling time. Thereby, a longer settling time is set for a larger mass difference ⁇ M.
  • the controller 10 sets the waiting time after one mass scan is terminated and before the next mass scan is initiated, to the settling time that has been determined by the settling time determiner 101. Consequently, as illustrated in Fig. 2(b) , the settling time t2 becomes short for a small mass difference ⁇ M, which practically shortens the cycle of the mass scan. Although no mass analysis data are obtained during the settling time, the shortened settling times increase the temporal resolution.
  • the scan margin width ⁇ Ms in a mass scan is changed in accordance with the analysis conditions.
  • the scan margin width ⁇ Ms is, as shown in Fig. 2(c) , the mass difference between the specified scan initiation mass Ms and the mass with which the mass scan is actually initiated.
  • this scan margin width ⁇ Ms should be zero; however, in reality, a certain amount of scan margin width ⁇ Ms is required so as to eliminate the influence of unnecessary ions remaining inside the quadruple mass filter 3 before a mass scan is initiated.
  • a scan margin is set not only for the range equal to or less than the scan initiation mass Ms, but also for the range equal to or more than the scan termination mass Me.
  • Fig. 5 is a graph showing the result of an actual measurement of the relationship among the scan rate, the scan initiation mass, and the scan margin width ⁇ Ms.
  • the change of the signal intensities was observed while the scan initiation mass and the scan margin width were each changed to examine the scan margins width with which a reliable signal intensity could be obtained.
  • a slow scan rate such as 1000 [Da/sec]
  • the scan margin width ⁇ Ms can be considerably decreased.
  • a fast scan rate such as 15000 [Da/sec]
  • the scan margin width ⁇ Ms is required to be increased. This is because, the larger the mass of an ion is, the longer it takes for the ion to pass through the quadruple mass filter 3.
  • the scan rate is 15000 [Da/sec] and the scan initiation mass is 1048 [u]
  • a scan margin width ⁇ Ms of 3 [u] is required. That is, even though the lower end mass of the mass spectrum is m/z 1048, it is practically necessary to initiate the mass scan from m/z 1045.
  • Fig. 5 shows a result obtained under the condition that the ion acceleration voltage is constant, i.e. the voltage difference is constant between the direct-current bias voltage Vdc2 which is applied to the quadrupole mass filter 3 and the direct-current bias voltage Vdc1 which is applied to the ion transport optical system 2.
  • the constant k is also dependent on the length of the rod electrodes 3a through. 3d of the quadrupole mass filter 3, this length is not important because it is not an analysis condition set by a user.
  • the scan margin width ⁇ Ms is also set to be a fixed value selected in the light of the worst case condition. Wherefore, in the case where the scan rate is slow, where the scan initiation mass is small, or in other cases, the scan margin width is too large, and some of this time period for scanning this mass range falls under the aforementioned "wasted time.”
  • the scan margin width ⁇ Ms is changed in accordance with the scan rate, the scan initiation mass, and the ion acceleration voltage.
  • the scan margin width determiner 102 included in the controller 10 holds a set of information prepared for deriving an appropriate scan margin width ⁇ Ms from the scan rate, the scan initiation mass, and the ion acceleration voltage.
  • This information includes, for example, a computational expression, table, or the like, which represents the line showing the relationship among the scan rate, the scan initiation mass, and the scan margin width as illustrated in Fig. 5 .
  • different computational expressions and tables are prepared for each bias direct-current voltage which determines the ion acceleration voltage.
  • the scan margin width determiner 102 in the controller 10 obtains a scan margin width ⁇ Ms that corresponds to the specified scan rate, the specified scan initiation mass, and the acceleration voltage which is determined by the bias direct-current voltages Vdc1 and Vdc2.
  • the bias direct-current voltages Vdc1 and Vdc2 do not depend on the analysis conditions set by the user but are normally determined as a result of a tuning automatically performed so as to maximize the ion intensity.
  • the controller 10 determines the actual mass scan range to be M3- ⁇ Ms through M4+ ⁇ MS, based on the scan margin width ⁇ Ms determined by the scan margin width determiner 102.
  • the scan margin width becomes relatively small. Therefore, the cycle period of the mass scan practically becomes short.

Claims (4)

  1. Spectromètre de masse quadripolaire qui comprend un filtre de masse quadripolaire (3) destiné à permettre sélectivement à un ion ayant une masse spécifique de le traverser et un détecteur (4) destiné à détecter l'ion qui a traversé le filtre de masse quadripolaire (3) et qui effectue une mesure de balayage dans laquelle un cycle de balayage d'une masse d'ions qui traversent le filtre de masse quadripolaire (3) sur une plage de masses prédéfinie est répété ou une mesure dans laquelle un cycle consistant à établir séquentiellement une pluralité de masses est répété, le spectromètre de masse quadripolaire comprenant :
    a) un pilote quadripolaire (13, 18, 19, 20) destiné à appliquer une tension prédéfinie à chacune des électrodes (3a, 3b, 3c, 3d) composant le filtre de masse quadripolaire (3) ; et
    b) un dispositif de commande (10) destiné à commander le pilote quadripolaire (13, 18, 19, 20) de manière à changer la tension appliquée à chacune des électrodes (3a, 3b, 3c, 3d) composant le filtre de masse quadripolaire (3) conformément à une masse au cours de ladite mesure de balayage ou ladite mesure, tout en changeant un temps d'attente entre la fin d'un cycle à le lancement d'un cycle suivant conformément à une différence de masse entre une masse de lancement de ladite plage de masses prédéfinie et une masse de fin de ladite plage de masses prédéfinie dans un cycle, caractérisé en ce que, lors de la réalisation de la mesure de balayage, le dispositif de commande (10) est conçu pour établir une marge de balayage au moins au-dessus ou au-dessous de ladite plage de masses prédéfinie, pour commander le pilote quadripolaire (13, 18, 19, 20) de manière à changer la tension appliquée à chacune des électrodes (3a, 3b, 3c, 3d) composant le filtre de masse quadripolaire (3) de manière à balayer une plage de masses qui est plus large que ladite plage de masses prédéfinie par la marge de balayage, et pour changer une largeur de masse de la marge de balayage conformément à une vitesse de balayage.
  2. Spectromètre de masse quadripolaire selon la revendication 1, dans lequel le dispositif de commande (10) est conçu pour diminuer la largeur de masse de la marge de balayage quand la vitesse de balayage diminue.
  3. Spectromètre de masse quadripolaire selon la revendication 1 ou 2, dans lequel le dispositif de commande (10) est en outre conçu pour changer la largeur de masse de la marge de balayage conformément à une masse de lancement de balayage.
  4. Spectromètre de masse quadripolaire selon la revendication 3, dans lequel le dispositif de commande (10) est en outre conçu pour changer la largeur de masse de la marge de balayage conformément à une tension d'accélération pour un ion injecté dans le filtre de masse quadripolaire (3).
EP10195573.0A 2008-05-26 2008-05-26 Spectromètre de masse quadripôle Not-in-force EP2315233B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP10195573.0A EP2315233B1 (fr) 2008-05-26 2008-05-26 Spectromètre de masse quadripôle

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PCT/JP2008/001307 WO2009144765A1 (fr) 2008-05-26 2008-05-26 Analyseur de masse quadripolaire
EP08763907A EP2299471B1 (fr) 2008-05-26 2008-05-26 Spectrometre de masse quadripolaire
EP10195573.0A EP2315233B1 (fr) 2008-05-26 2008-05-26 Spectromètre de masse quadripôle

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EP2315233A2 EP2315233A2 (fr) 2011-04-27
EP2315233A3 EP2315233A3 (fr) 2012-01-04
EP2315233B1 true EP2315233B1 (fr) 2013-10-16

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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1042118A (fr) * 1974-05-16 1978-11-07 Robert D. Villwock Systeme de spectrometrie de masse pour l'identification automatique et specifique rapide, et la quantification de composes
JP3147914B2 (ja) * 1991-03-18 2001-03-19 株式会社日立製作所 質量分析方法及び質量分析装置
JP3896714B2 (ja) 1998-12-25 2007-03-22 株式会社島津製作所 四重極質量分析計
US7482580B2 (en) * 2005-10-20 2009-01-27 Agilent Technologies, Inc. Dynamic adjustment of ion monitoring periods
US8445844B2 (en) * 2006-01-20 2013-05-21 Shimadzu Corporation Quadrupole mass spectrometer

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EP2315233A3 (fr) 2012-01-04

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