EP2283968A2 - Polishing method for a workpiece and polishing tool used for the polishing method - Google Patents

Polishing method for a workpiece and polishing tool used for the polishing method Download PDF

Info

Publication number
EP2283968A2
EP2283968A2 EP10171593A EP10171593A EP2283968A2 EP 2283968 A2 EP2283968 A2 EP 2283968A2 EP 10171593 A EP10171593 A EP 10171593A EP 10171593 A EP10171593 A EP 10171593A EP 2283968 A2 EP2283968 A2 EP 2283968A2
Authority
EP
European Patent Office
Prior art keywords
polishing
polishing body
workpiece
outer peripheral
tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10171593A
Other languages
German (de)
French (fr)
Other versions
EP2283968A3 (en
Inventor
Kenichi Masuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of EP2283968A2 publication Critical patent/EP2283968A2/en
Publication of EP2283968A3 publication Critical patent/EP2283968A3/en
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/0076Other grinding machines or devices grinding machines comprising two or more grinding tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/002Grinding heads
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D13/00Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor
    • B24D13/02Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by their periphery
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D13/00Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor
    • B24D13/20Mountings for the wheels
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D5/00Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor
    • B24D5/06Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
    • B24D5/066Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental with segments mounted axially one against the other
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D5/00Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor
    • B24D5/10Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting only by their periphery; Bushings or mountings therefor with cooling provisions, e.g. with radial slots

Definitions

  • the present invention relates to a polishing method and a polishing tool used for polishing workpieces including an optical element such as a lens or a mirror, and a die for molding an optical element.
  • the polishing-processing is performed with use of a polishing tool having a contact area smaller than an area of a surface of the workpiece.
  • the polishing tool has a configuration having a disk-like polishing body provided onto a rotation shaft, and is mounted to a polishing apparatus.
  • r represents a polishing removal amount
  • P represents a pressure
  • V represents a relative speed between the polishing tool and the surface of the workpiece
  • K represents a process variable (including a material and an outer peripheral surface state of the polishing tool)
  • T represents a standstill period of time.
  • polishing-processing is performed again with use of a different polishing tool, or the same polishing tool is scanned in a Y axis direction orthogonal to the X axis direction to polish the surface of the workpiece, to thereby smooth the waviness (see Japanese Patent Application Laid-Open No. H11-090806 ).
  • the surface of the workpiece is polishing-processed multiple times with the same polishing body.
  • a target shape is not sometimes obtained so that the quality of the surface of the workpiece such as the optical element is degraded.
  • polishing liquid does not enter uniformly between the polishing body and the workpiece so that polishing removal is sometimes proceeded at variable speed in contact surfaces between the polishing body and the workpiece.
  • a finished surface having polishing removal depths different from point to point is formed, and thus the quality of the surface of the workpiece is sometimes degraded.
  • a polishing tool for polishing-processing a surface of a workpiece including; a rotation shaft, a disk-like first polishing body, which is provided to the rotation shaft and includes an outer peripheral surface serving as a work surface, and a disk-like second polishing body, which is provided to the rotation shaft so as to be adjacent to the first polishing body and includes an outer peripheral surface serving as a work surface, in which; the outer peripheral surface of the first polishing body is formed into a shape having a porosity higher than a porosity of the outer peripheral surface of the second polishing body, and the second polishing body includes a material more rigid than a material for the first polishing body.
  • a workpiece processing method for polishing-processing a surface of a workpiece including; bringing a disk-like first polishing body and a disk-like second polishing body into press-contact with the workpiece, the first polishing body and the second polishing body being adjacently provided to the same rotation shaft and each including an outer peripheral surface serving as a work surface, and moving the first polishing body and the second polishing body relative to the workpiece in a direction parallel to the rotation shaft, to thereby process the surface of the workpiece, in which; the outer peripheral surface of the first polishing body is formed into a shape having a porosity higher than a porosity of the outer peripheral surface of the second polishing body, the second polishing body includes a material more rigid than a material for the first polishing body, and the second polishing body removes a waviness formed through processing performed by the first polishing body.
  • the outer peripheral surface of the first polishing body is formed into the shape having the high porosity, and hence a film of polishing liquid is less likely to be formed between the surface of the workpiece and the outer peripheral surface of the first polishing body.
  • a film of polishing liquid is less likely to be formed between the surface of the workpiece and the outer peripheral surface of the first polishing body.
  • the second polishing body different from the first polishing body includes the material more rigid than a material for the first polishing body, and hence the outer peripheral surface of the second polishing body is less likely to be held in contact with a valley portion of the waviness, but more likely to be held in contact with a peak portion of the waviness, whereby the second polishing body has a high performance in smoothing the waviness.
  • the first polishing body and the second polishing body which have different functions from each other, are adjacently provided to the rotation shaft, and hence it is possible to perform polishing removal and smoothing of the waviness at one time. As a result, it is possible to obtain a high-quality surface of the workpiece for a short period of time.
  • FIG. 1 is an explanation view of a polishing tool according to a first embodiment of the present invention.
  • FIGS. 2A and 2B are explanations view of a polishing tool according to a second embodiment of the present invention.
  • FIGS. 3A, 3B , and 3C are each an explanation view of a polishing tool according to another embodiment of the present invention.
  • a polishing apparatus 100 illustrated in FIG. 1 performs processing, with use of a polishing tool 10 mounted to a polishing apparatus main body, on a surface of a workpiece W placed on an XY stage (not shown).
  • the workpiece W has a surface Wa, which is a flat surface, a spherical surface, or a non-horizontal surface such as a non-axisymmetric free-form surface.
  • the workpiece W is, for example, an optical element such as a lens or a mirror, or a die for molding an optical element.
  • the polishing tool 10 includes a rotation shaft 1, and at least two disk-like polishing bodies 7, 8 provided to the rotation shaft 1 so as to be adjacent to each other.
  • the rotation shaft 1 of the polishing tool 10 is fixed to a tool rotating device 3 of the polishing apparatus 100, whereby the polishing tool 10 is supported to be rotatable relative to the polishing apparatus main body.
  • the first polishing body 8 and the second polishing body 7 respectively have outer peripheral surfaces serving as working surfaces 8a, 7a.
  • the first polishing body 8 and the second polishing body 7 are fixed onto the rotation shaft 1 passing through a center portion of each disk-like surface of each of the polishing bodies. With this configuration, the first polishing body 8 and the second polishing body 7 are fixed onto the rotation shaft 1 so as to be adjacent to each other.
  • the polishing tool 10 is fixed to the tool rotating device 3, and is driven by the tool rotating device 3 to rotate about the rotation shaft 1.
  • polishing tool 10 is brought into press-contact with the workpiece W, and the first polishing body 8 and the second polishing body 7 are moved relative to the workpiece W in a direction parallel to the rotation shaft, whereby processing is performed.
  • Moving of the polishing bodies is executed, for example, through moving of the workpiece W with the XY stage (not shown).
  • the polishing apparatus 100 includes a Z column (not shown) for moving, in upward and downward directions, a support member 4 coupled to the tool rotating device 3.
  • the upward direction is referred to as a Z axis direction
  • the downward direction is referred to as a -Z axis direction.
  • the polishing apparatus 100 operates in such a manner that the Z column is lowered in the -Z axis direction while the rotation shaft 1 of the polishing tool 10 is rotated at a constant rpm, and thus the outer peripheral surfaces 7a, 8a of the respective polishing bodies 7, 8 of the polishing tool 10, which serve as the working surfaces, are brought into press-contact with the surface Wa of the workpiece W.
  • the polishing apparatus 100 regulates a press-contact force applied onto the surface Wa of the workpiece W, and a relative speed and a standstill period of time of the outer peripheral surfaces 7a, 8a of the polishing bodies 7, 8 with respect to the surface Wa, and thus controls indentation depths of the respective polishing bodies 7, 8 with respect to the surface Wa of the workpiece W.
  • the polishing tool 10 or the workpiece W is sent in a sending direction S which is a moving direction parallel to the rotation shaft, and thus the following groove is formed in the surface Wa.
  • the groove has a predetermined cut depth extending straight in the sending direction S and a predetermined width.
  • the rotation shaft 1 of the polishing tool 10 is arranged in parallel to the moving direction relative to the workpiece W serving as an object to be polished.
  • Each of the polishing bodies 7, 8 is fixed onto the rotation shaft 1 passing through the center portion of each disk-like surface of each of the polishing bodies, and is rotated integrally with the rotation shaft 1 about the center portion.
  • the polishing body 8 is a first polishing body made of a foamed resin, and a large number of pores are formed in the outer peripheral surface 8a of the polishing body 8. It is preferred that the foamed resin include a foamed polyurethane resin.
  • the polishing body 7 is a second polishing body made of a non-foamed resin, and few pores are formed in the outer peripheral surface 7a of the polishing body 7.
  • the outer peripheral surface 8a of the polishing body 8 is formed into a shape having a porosity higher than that of the outer peripheral surface 7a of the polishing body 7.
  • the non-foamed resin include a non-foamed polyurethane resin.
  • the polishing body 7 includes the non-foamed polyurethane resin, and hence is more rigid and less likely to be elastically deformed than the polishing body 8 made of the foamed polyurethane resin. In other words, the polishing body 8 is less rigid and more likely to be elastically deformed than the polishing body 7.
  • the polishing body 7 is arranged so as to be adjacent to the polishing body 8, and the polishing body 7 is arranged so as to be positioned on an upstream side with respect to the polishing body 8 when the relative moving direction between the polishing tool 10 and the workpiece is along the sending direction (X axis direction). Further, the polishing body 8 is formed to have a diameter slightly larger than that of the polishing body 7. In other words, the polishing body 8 is formed to have a radius larger than that of the polishing body 7 by an amount corresponding to a difference between an elastic deformation amount of the polishing body 7 and an elastic deformation amount of the polishing body 8 caused by a pressing pressure applied onto the surface Wa of the workpiece W. With this shape, the polishing body 7 and the polishing body 8 are pressed under the same load onto the workpiece W when the pressure is applied.
  • a thickness of the polishing body 7 range from 1.0 mm to 1.5 mm.
  • the thickness is less than 1.0 mm, rigidity of the polishing body 7 is low, and hence the polishing body 7 is deformed along the shape of the surface Wa of the workpiece W. Thus, it is impossible to remove the waviness.
  • the thickness is more than 1.5 mm, a length including the thickness of the polishing body 7, the thickness of the polishing body 8, and an interval between the polishing body 7 and the polishing body 8 exceeds 4 mm so that a size of a removal trace is larger than 4 mm. Thus, it is impossible to correct a shape having a short wavelength, and to obtain necessary processing accuracy.
  • a thickness of the polishing body 8 be larger than that of the polishing body 7 and that the length including the thickness of the polishing body 7, the thickness of the polishing body 8, and the interval between the polishing body 7 and the polishing body 8 be 4 mm or less.
  • the polishing body 7 is thicker than the polishing body 8
  • the polishing body 8 cannot smooth the waviness generated by the polishing body 7.
  • the polishing body 8 is formed to be thicker than the polishing body 7.
  • the thickness of the polishing body refers to a distance between disk-like surfaces that are side surfaces of the polishing body crossing perpendicularly to the rotation shaft. Further, in the first embodiment, it is preferred that an interval between the adjacent polishing bodies 7, 8 be 0.5 mm or less.
  • the polishing bodies 7, 8 are arranged onto the rotation shaft 1 with the interval.
  • the polishing bodies 7, 8 are lowered in the -Z axis direction while being rotated in a rotating direction of the rotation shaft 1, and then the outer peripheral surfaces 7a, 8a of the polishing bodies 7, 8 are brought into press-contact with the surface Wa of the workpiece W.
  • the polishing body 8 includes the foamed polyurethane resin, and hence is rotated while being elastically deformed and held in close contact with the surface of the workpiece W.
  • the polishing body 8 includes the foamed polyurethane resin, and hence the large number of pores are formed in the outer peripheral surface 8a.
  • polishing liquid abrasive grain
  • the large number of pores can hold a large amount of abrasive grains so that the number of the abrasive grains supplied between the outer peripheral surface 8a of the polishing body 8 and the surface Wa of the workpiece W is increased. As a result, polishing removal efficiency is increased.
  • the surface Wa of the workpiece W is polished by the polishing body 8 effectively in this way, a periodic waviness is sometimes formed by the polishing body 8 on the surface Wa of the workpiece W.
  • the polishing body 7 includes the non-foamed polyurethane resin, and hence is more rigid than the polishing body 8 and less likely to be elastically deformed than the polishing body 8 even when being brought into press-contact with the surface Wa of the workpiece W.
  • the outer peripheral surface 7a of the polishing body 7 is less likely to be held in contact with a valley portion of the waviness, but more likely to be held in contact with a peak portion of the waviness, and hence the polishing body 7 has a high performance in smoothing the waviness.
  • the polishing body 7 removes the peak portion of the waviness formed on the surface Wa of the workpiece W, and effectively smoothes the surface Wa of the workpiece W.
  • FIG. 2A illustrates a polishing tool 11 according to the second embodiment. Portions identical to those of FIG. 1 are denoted by the same symbols, and description thereof is omitted.
  • the polishing tool 11 includes the rotation shaft 1, and three disk-like polishing bodies 7, 8, and 9 provided to the rotation shaft 1 so as to be adjacent to each other.
  • the rotation shaft 1 of the polishing tool 11 is fixed to the tool rotating device 3 of the polishing apparatus 100, whereby the polishing tool 11 is supported to be rotatable relative to the polishing apparatus main body.
  • the first polishing body 8, the second polishing body 7, and the third polishing body 9 respectively have outer peripheral surfaces serving as working surfaces 8a, 7a, and 9a.
  • the first polishing body 8, the second polishing body 7, and the third polishing body 9 are fixed onto the rotation shaft 1 passing through the center portion of each disk-like surface of each of the polishing bodies. With this configuration, the first polishing body 8, the second polishing body 7, and the third polishing body 9 are fixed onto the rotation shaft 1 so as to be adjacent to each other, and are each rotated integrally with the rotation shaft 1 about the center portion.
  • the polishing body 9 includes the non-foamed resin, and few pores are formed in the outer peripheral surface 9a of the polishing body 9.
  • the outer peripheral surface 8a of the polishing body 8 is formed into a shape having a porosity higher than that of the outer peripheral surface 9a of the polishing body 9.
  • the non-foamed resin include the non-foamed polyurethane resin.
  • the polishing body 9 includes the non-foamed polyurethane resin, and hence is more rigid and less likely to be elastically deformed than the polishing body 8 made of the foamed polyurethane resin. In other words, the polishing body 8 is less rigid and more likely to be elastically deformed than the polishing body 9.
  • the polishing tool 11 After the polishing tool 11 forms a groove in the surface Wa of the workpiece W in the X axis direction, the polishing tool 11 is shifted by a constant pitch P (sending pitch) in a Y axis direction orthogonal to the sending direction S (X axis direction), and is moved in a returning direction (-X axis direction) while being overlapped to part of the groove which has been already formed.
  • P sending pitch
  • the moving direction of the polishing tool 11 with respect to the workpiece is switched alternately between the sending direction (X axis direction) and the returning direction (-X axis direction), and an entire surface of the workpiece W is polishing-processed into an arbitrary shape.
  • the workpiece W may be moved relative to the polishing tool 11, or the polishing tool 11 may be moved relative to the workpiece W.
  • the polishing body 9 is arranged so as to be adjacent to the polishing body 8, and the polishing body 9 is arranged on the upstream side with respect to the polishing body 8 when the moving direction of the polishing tool 11 with respect to the workpiece is along the returning direction (-X axis direction).
  • the polishing body 9 includes the non-foamed polyurethane resin, and hence, similarly to the polishing body 7, the polishing body 9 is more rigid and has a higher performance in smoothing the waviness than the polishing body 8, to thereby effectively smooth the surface Wa of the workpiece W. Therefore, in the second embodiment, the polishing bodies 7, 9 more rigid than the polishing body 8 are arranged adjacently on both sides of the polishing body 8.
  • the polishing body 7 smoothes the waviness of the surface Wa after the polishing body 8 performs polishing removal on the surface Wa.
  • the polishing body 9 smoothes the waviness of the surface Wa after the polishing body 8 performs polishing removal on the surface Wa.
  • the polishing tool 11 is shifted by the pitch P each time in a direction orthogonal to the moving direction of the polishing tool 11 with respect to the workpiece, the polishing tool 11 is moved under alternate switching of the moving direction, and thus it is possible to perform polishing removal of the entire surface of the workpiece W and smoothing of the waviness at one time.
  • one-time scanning of the polishing tool 11 with respect to the surface Wa of the workpiece W enables the polishing tool 11 to perform the polishing removal and the smoothing of the waviness.
  • the polishing bodies have different functions from each other, and hence it is possible to obtain a high-quality surface of the workpiece for a short period of time when polishing a free-form surface shape.
  • FIG. 3A illustrates a polishing tool 12 according to the third embodiment. Portions identical to those of FIG. 2 are denoted by the same symbols, and description thereof is omitted.
  • multiple grooves 9b with a depth (for example, 0.35 mm) of from 0.1 mm to a size corresponding to the thickness of the polishing body 9 are formed in the outer peripheral surface 9a of the polishing body 9 at intervals of 2° or less in a direction parallel to the rotation shaft.
  • the depth of each of the grooves is extremely shallow, when the polishing body 9 is pressed, the polishing body 9 is deformed so that bottoms of the grooves are brought into contact with the surface Wa of the workpiece W. Thus, the polishing body 9 cannot exert an effect of the grooves.
  • the multiple grooves 9b are formed in the outer peripheral surface 9a of the polishing body 9, and hence it is possible to suppress formation of a film of the polishing liquid between the outer peripheral surface 9a of the polishing body 9 and the surface Wa of the workpiece W, and thus possible to suppress floating of the polishing body 9 from the surface Wa. Therefore, the performance in smoothing the waviness formed on the surface Wa of the workpiece W is further improved.
  • the grooves may be formed also in the polishing body 7, or may be formed only in the polishing body 7 but not in the polishing body 9. The polishing body with the grooves has the improved performance in smoothing the waviness, and hence it is possible to determine whether to form the grooves depending on the required accuracy.
  • FIG. 3B illustrates a polishing tool 13 according to the fourth embodiment. Portions identical to those of FIG. 2 are denoted by the same symbols, and description thereof is omitted.
  • the polishing tool 13 includes the polishing body 8 serving as the first polishing body, and disk-like support members 21a, 21b provided for deformation prevention, the support members 21a, 21b being respectively provided to be held in contact with (both) side surfaces 7c, 7c of the polishing body 7 serving as the second polishing body and being formed of a metal plate such as a stainless steel plate.
  • each of the support members 21a, 21b is set to have a radius smaller than that of the polishing body 7.
  • An elastic deformation amount of each of the support members 21a, 21b is set to be smaller by 0.1 mm than the elastic deformation amount of the polishing body 7.
  • each of the support members 21a, 21b is set to have a thickness of from 0.1 mm to 0.5 mm. In the case where the thickness is more than 0.5 mm, the support members 21a, 21b are brought into contact with another polishing body. In the case where the thickness is less than 0.1 mm, the support members 21a, 21b cannot obtain the rigidity enough to support the polishing body 7.
  • the polishing body 7 even if the polishing body 7 receives a force in the sending direction S during polishing-processing, the polishing body 7 is supported by the support members 21a, 21b, and hence it is possible to prevent deformation of the polishing body 7. With this configuration, it is possible to suppress unevenness generated during polishing removal due to the deformation of the polishing body 7, and thus possible to obtain a higher-quality surface of the workpiece. Further, owing to the support members 21a, 21b, it is possible to select a less rigid material in terms of rigidity of the polishing body 7. The support members may be formed also in the polishing body 9, or may be formed only in the polishing body 9 but not in the polishing body 7.
  • the support members are formed only in one of the polishing body 7 and the polishing body 9, it is possible to suppress the unevenness generated during polishing removal by the polishing body including the support members.
  • the support members are formed both in the polishing body 7 and the polishing body 9, it is possible to suppress the unevenness generated during polishing removal by both the polishing bodies. Thus, it is possible to obtain a higher-quality surface of the workpiece.
  • FIG. 3C illustrates a polishing tool 14 according to the fifth embodiment. Portions identical to those of FIG. 2 are denoted by the same symbols, and description thereof is omitted.
  • the polishing tool 14 includes three disk-like polishing bodies 22, 23, and 24.
  • the polishing body 23 serves as the first polishing body made of the foamed polyurethane resin exemplified as the foamed resin, and a large number of pores are formed in an outer peripheral surface 23a of the polishing body 23.
  • the polishing body 22 serves as the second polishing body made of the non-foamed polyurethane resin exemplified as the non-foamed resin
  • the polishing body 24 serves as the third polishing body made of the non-foamed polyurethane resin exemplified as the non-foamed resin.
  • the outer peripheral surface 23a of the polishing body 23 is formed into a shape having a porosity higher than that of the outer peripheral surface 22a of the polishing body 22 and that of the outer peripheral surface 24a of the polishing body 24.
  • each of the polishing bodies 22, 24 includes the non-foamed polyurethane resin, and hence is more rigid and less likely to be elastically deformed than the polishing body 23 made of the foamed polyurethane resin. In other words, the polishing body 23 is less rigid and more likely to be elastically deformed than the polishing bodies 22, 24.
  • Each of the polishing bodies 22, 24 is arranged so as to be adjacent to the polishing body 23. The polishing body 22 is arranged upstream in the moving direction with respect to the polishing body 23 when the moving direction of the polishing tool with respect to the workpiece is along the sending direction S (X axis direction).
  • the polishing body 24 is arranged upstream in the moving direction with respect to the polishing body 23 when the moving direction is along the returning direction (-X axis direction).
  • the polishing body 23 is formed to have a diameter slightly larger than that of the polishing body 22 and that of the polishing body 24.
  • a thickness of each of the polishing body 22 and the polishing body 24 is, for example, 1.0 mm.
  • a thickness of the polishing body 23 is, for example, 2.0 mm.
  • the polishing body 23 is formed to be thicker than the polishing body 22 and the polishing body 24.
  • a total thickness of the polishing body 22, the polishing body 23, and the polishing body 24 is set to be as small as possible (to be, for example, 4 mm or less) so that the size of the removal trace is 4 mm or less.
  • multiple grooves 22b with a depth of 0.35 mm are formed in the outer peripheral surface 22a of the polishing body 22 at intervals of 2° or less in the direction parallel to the rotation shaft.
  • multiple grooves 24b with a depth of 0.35 mm are formed in the outer peripheral surface 24a of the polishing body 24 at intervals of 4° in the direction parallel to the rotation shaft.
  • the depth of each of the grooves is 0.1 mm or less, when the polishing body 9 is pressed, the polishing body 9 is deformed so that the bottoms of the grooves are brought into contact with the surface Wa of the workpiece W. Thus, the polishing body 9 cannot exert an effect of the grooves.
  • an interval between the adjacent polishing bodies 22, 23 and an interval between the adjacent polishing bodies 23, 24 are set to 0 mm, and the polishing bodies 22, 23, and 24 are arranged onto the rotation shaft 1. Without the intervals, the removal trace generated by the entire tool is reduced, and hence it is possible to correct and process even a shape having a shorter wavelength. As a result, it is possible to obtain a high-quality surface of the workpiece.
  • the polishing body 22 and the polishing body 24 are made of the same material and formed into the same shape (with the same diameter, the same width, and the same groove intervals), and are configured to be symmetric with respect to the polishing body 23. Therefore, in the fifth embodiment, the same operation and effect as those of the first embodiment are provided.
  • the grooves 22b, 24b are formed in the polishing bodies 22, 24, respectively.
  • the shape of the support members 21a, 21b is set to a disk-like shape, and the material of the support members 21a, 21b is set to stainless steel.
  • the polishing body 7 is provided with the support members 21a, 21b.
  • the polishing body 8 or the polishing body 9 may be provided with support members (that is, at least one of the first polishing body and the second polishing body may be provided with support members). Also in this case, the same effect is provided.
  • the interval between the adjacent polishing bodies 7, 8 is set to 0.5 mm.
  • the interval may be set arbitrarily, and the same effect is provided even when any interval is set.
  • the interval between the polishing bodies 22, 23 and the interval between the polishing bodies 23, 24 are set to 0 mm.
  • the intervals may be set arbitrarily as long as the polishing bodies are arranged symmetrically, and the same effect is provided even when any intervals are set.
  • the present invention is not limited thereto.
  • the case where the moving direction of the polishing tool with respect to the workpiece is switched alternately between the X axis direction and the -X axis direction is described.
  • the moving direction is along one direction, it is possible to omit the polishing body situated downstream in the sending direction with respect to the polishing body 8 (polishing body 23).
  • another polishing body may be interposed between the polishing body 8 and the polishing body 7, and still another polishing body may be interposed between the polishing body 8 and the polishing body 9.
  • another polishing body may be interposed between the polishing body 23 and the polishing body 22, and still another polishing body may be interposed between the polishing body 23 and the polishing body 24.
  • the polishing body 7, 22 or the polishing body 9, 23 passes the surface of the workpiece last, and thus it is possible to effectively smooth the waviness.
  • the foamed polyurethane resin is exemplified as the foamed resin.
  • the foamed resin may include a foamed epoxy resin and a foamed phenolic resin.
  • the non-foamed polyurethane resin is exemplified as the non-foamed resin.
  • the non-foamed resin may include a non-foamed epoxy resin and a non-foamed phenolic resin.
  • a polishing tool capable of forming a high-quality surface of a workpiece for a short period of time.
  • a polishing tool (10) includes: a rotation shaft (1) arranged parallel to a sending direction (S) of moving the polishing tool relative to a workpiece (W); and at least two polishing bodies (7, 8).
  • the polishing body (8) includes a foamed resin such as a foamed polyurethane resin, and has an outer peripheral surface (8a) having a porosity higher than that of the polishing body (7).
  • the polishing body (7) includes a non-foamed resin such as a non-foamed polyurethane resin being a material more rigid than that for the polishing body (8).

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)

Abstract

Provided is a polishing tool capable of forming a high-quality surface of a workpiece in a short period of time. The polishing tool (10) comprises a rotation shaft (1) arranged parallel to a feed direction (S) of the polishing tool relative to a workpiece (W) and at least two polishing bodies (7,8). The first polishing body (8) includes a foamed resin such as a foamed polyurethane resin, and has an outer peripheral surface (8a) having a porosity higher than the porosity of the second polishing body (7). The second polishing body (7) comprises a non-foamed resin such as a non-foamed polyurethane resin being a material more rigid than the material used for the first polishing body (8). During polishing, the first polishing body (8) removes material from the surface (Wa) of the workpiece (W), and the second polishing body (7) smoothes an unevenness resulting from the material removal with the first polishing body (8).

Description

    BACKGROUND OF THE INVENTION Field of the Invention
  • The present invention relates to a polishing method and a polishing tool used for polishing workpieces including an optical element such as a lens or a mirror, and a die for molding an optical element.
  • Description of the Related Art
  • Nowadays, in a case of finish-polishing a surface shape of a so-called non-axisymmetric free-form surface different in curvature at each point of a workpiece including an optical element such as a lens or a mirror, and a die for molding an optical element, the polishing-processing is performed with use of a polishing tool having a contact area smaller than an area of a surface of the workpiece. The polishing tool has a configuration having a disk-like polishing body provided onto a rotation shaft, and is mounted to a polishing apparatus. When the polishing-processing is performed by the polishing tool of this type, an outer peripheral surface of the polishing body is brought into press-contact with the surface of the workpiece at a constant pressure while the polishing body is rotated at a constant rpm, and then a sending speed in a forwarding direction is changed based on a standstill period of time calculated in accordance with a removal depth, to thereby partially remove the surface of the workpiece to an arbitrary depth while forming a straight groove. Then, the workpiece or the polishing tool is shifted by a sending pitch in a direction orthogonal to the sending direction, and portions to be removed in this way are partially overlapped to each other, whereby an entire surface of the workpiece is polishing-processed into an arbitrary shape. At this time, a polishing removal amount r is varied as shown in the following Preston's empirical formula. r = P × V × K × T
    Figure imgb0001
  • Note that, r represents a polishing removal amount, P represents a pressure, V represents a relative speed between the polishing tool and the surface of the workpiece, K represents a process variable (including a material and an outer peripheral surface state of the polishing tool), and T represents a standstill period of time. It is known that, when polishing removal is performed based on the above-mentioned formula, due to the pressure, the speed, and a distribution of a tool surface property in one-rotation cycle of the polishing tool, a waviness in the one-rotation cycle of the polishing tool is generated on the surface of the workpiece and thus quality of the surface of the workpiece such as the optical element is degraded. This is because, due to the pressure, a tool rotation speed, a pore area distribution of a polishing body surface, and a thickness distribution during one-rotation of the tool, process variation in one-rotation cycle of the tool occurs. For that reason, conventionally, degrading of the quality of the surface of the workpiece such as the optical element is suppressed in the following manner. Specifically, after the polishing tool is scanned in an X axis direction and the surface of the workpiece is polished, polishing-processing is performed again with use of a different polishing tool, or the same polishing tool is scanned in a Y axis direction orthogonal to the X axis direction to polish the surface of the workpiece, to thereby smooth the waviness (see Japanese Patent Application Laid-Open No. H11-090806 ).
  • However, in the above-mentioned conventional method, in order to smooth the waviness formed on the surface of the workpiece after performing the polishing-processing by the polishing tool, it is necessary to perform the polishing-processing again with use of a different polishing tool, and hence a polishing period of time is extended. As a result, productivity of the workpiece such as the optical element is reduced, and manufacturing cost of the workpiece is adversely affected.
  • Further, in the above-mentioned conventional method, though it is possible to reduce the waviness formed on the surface of the workpiece, the surface of the workpiece is polishing-processed multiple times with the same polishing body. Thus, a target shape is not sometimes obtained so that the quality of the surface of the workpiece such as the optical element is degraded. For example, depending on a processing condition, polishing liquid does not enter uniformly between the polishing body and the workpiece so that polishing removal is sometimes proceeded at variable speed in contact surfaces between the polishing body and the workpiece. As a result, a finished surface having polishing removal depths different from point to point is formed, and thus the quality of the surface of the workpiece is sometimes degraded.
  • Therefore, it is an object of the present invention to provide a polishing tool capable of forming a high-quality surface of a workpiece for a short period of time.
  • SUMMARY OF THE INVENTION
  • According to the present invention, there is provided a polishing tool for polishing-processing a surface of a workpiece, including; a rotation shaft, a disk-like first polishing body, which is provided to the rotation shaft and includes an outer peripheral surface serving as a work surface, and a disk-like second polishing body, which is provided to the rotation shaft so as to be adjacent to the first polishing body and includes an outer peripheral surface serving as a work surface, in which; the outer peripheral surface of the first polishing body is formed into a shape having a porosity higher than a porosity of the outer peripheral surface of the second polishing body, and the second polishing body includes a material more rigid than a material for the first polishing body.
  • Further, according to the present invention, there is provided a workpiece processing method for polishing-processing a surface of a workpiece, including; bringing a disk-like first polishing body and a disk-like second polishing body into press-contact with the workpiece, the first polishing body and the second polishing body being adjacently provided to the same rotation shaft and each including an outer peripheral surface serving as a work surface, and moving the first polishing body and the second polishing body relative to the workpiece in a direction parallel to the rotation shaft, to thereby process the surface of the workpiece, in which; the outer peripheral surface of the first polishing body is formed into a shape having a porosity higher than a porosity of the outer peripheral surface of the second polishing body, the second polishing body includes a material more rigid than a material for the first polishing body, and the second polishing body removes a waviness formed through processing performed by the first polishing body.
  • According to the present invention, the outer peripheral surface of the first polishing body is formed into the shape having the high porosity, and hence a film of polishing liquid is less likely to be formed between the surface of the workpiece and the outer peripheral surface of the first polishing body. As a result, floating of the first polishing body caused by the film is suppressed, and thus it is possible to achieve high polishing removal efficiency. Further, the second polishing body different from the first polishing body includes the material more rigid than a material for the first polishing body, and hence the outer peripheral surface of the second polishing body is less likely to be held in contact with a valley portion of the waviness, but more likely to be held in contact with a peak portion of the waviness, whereby the second polishing body has a high performance in smoothing the waviness. Further, the first polishing body and the second polishing body, which have different functions from each other, are adjacently provided to the rotation shaft, and hence it is possible to perform polishing removal and smoothing of the waviness at one time. As a result, it is possible to obtain a high-quality surface of the workpiece for a short period of time.
  • Further features of the present invention will become apparent from the following description of exemplary embodiments with reference to the attached drawings.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is an explanation view of a polishing tool according to a first embodiment of the present invention.
  • FIGS. 2A and 2B are explanations view of a polishing tool according to a second embodiment of the present invention.
  • FIGS. 3A, 3B, and 3C are each an explanation view of a polishing tool according to another embodiment of the present invention.
  • DESCRIPTION OF THE EMBODIMENTS
  • In the following, embodiments for carrying out the present invention are described in detail with reference to the drawings.
  • First Embodiment
  • A polishing apparatus 100 illustrated in FIG. 1 performs processing, with use of a polishing tool 10 mounted to a polishing apparatus main body, on a surface of a workpiece W placed on an XY stage (not shown). The workpiece W has a surface Wa, which is a flat surface, a spherical surface, or a non-horizontal surface such as a non-axisymmetric free-form surface. The workpiece W is, for example, an optical element such as a lens or a mirror, or a die for molding an optical element. The polishing tool 10 includes a rotation shaft 1, and at least two disk- like polishing bodies 7, 8 provided to the rotation shaft 1 so as to be adjacent to each other. The rotation shaft 1 of the polishing tool 10 is fixed to a tool rotating device 3 of the polishing apparatus 100, whereby the polishing tool 10 is supported to be rotatable relative to the polishing apparatus main body. The first polishing body 8 and the second polishing body 7 respectively have outer peripheral surfaces serving as working surfaces 8a, 7a. The first polishing body 8 and the second polishing body 7 are fixed onto the rotation shaft 1 passing through a center portion of each disk-like surface of each of the polishing bodies. With this configuration, the first polishing body 8 and the second polishing body 7 are fixed onto the rotation shaft 1 so as to be adjacent to each other. The polishing tool 10 is fixed to the tool rotating device 3, and is driven by the tool rotating device 3 to rotate about the rotation shaft 1. Then, the polishing tool 10 is brought into press-contact with the workpiece W, and the first polishing body 8 and the second polishing body 7 are moved relative to the workpiece W in a direction parallel to the rotation shaft, whereby processing is performed. Moving of the polishing bodies is executed, for example, through moving of the workpiece W with the XY stage (not shown).
  • The polishing apparatus 100 includes a Z column (not shown) for moving, in upward and downward directions, a support member 4 coupled to the tool rotating device 3. Herein, as illustrated in FIG. 1, the upward direction is referred to as a Z axis direction, and the downward direction is referred to as a -Z axis direction. The polishing apparatus 100 operates in such a manner that the Z column is lowered in the -Z axis direction while the rotation shaft 1 of the polishing tool 10 is rotated at a constant rpm, and thus the outer peripheral surfaces 7a, 8a of the respective polishing bodies 7, 8 of the polishing tool 10, which serve as the working surfaces, are brought into press-contact with the surface Wa of the workpiece W. Then, the polishing apparatus 100 regulates a press-contact force applied onto the surface Wa of the workpiece W, and a relative speed and a standstill period of time of the outer peripheral surfaces 7a, 8a of the polishing bodies 7, 8 with respect to the surface Wa, and thus controls indentation depths of the respective polishing bodies 7, 8 with respect to the surface Wa of the workpiece W. Then, under a state in which the respective polishing bodies 7, 8 are rotated in a pressing direction parallel to the -Z axis direction while being held in press-contact with the surface Wa of the workpiece W, the polishing tool 10 or the workpiece W is sent in a sending direction S which is a moving direction parallel to the rotation shaft, and thus the following groove is formed in the surface Wa. Specifically, the groove has a predetermined cut depth extending straight in the sending direction S and a predetermined width. As a method of moving the polishing tool 10 relative to the surface Wa of the workpiece W, the workpiece W may be moved relative to the polishing tool 10, or the polishing tool 10 may be moved relative to the workpiece W.
  • In the first embodiment, the rotation shaft 1 of the polishing tool 10 is arranged in parallel to the moving direction relative to the workpiece W serving as an object to be polished. Each of the polishing bodies 7, 8 is fixed onto the rotation shaft 1 passing through the center portion of each disk-like surface of each of the polishing bodies, and is rotated integrally with the rotation shaft 1 about the center portion.
  • The polishing body 8 is a first polishing body made of a foamed resin, and a large number of pores are formed in the outer peripheral surface 8a of the polishing body 8. It is preferred that the foamed resin include a foamed polyurethane resin. In contrast, the polishing body 7 is a second polishing body made of a non-foamed resin, and few pores are formed in the outer peripheral surface 7a of the polishing body 7. In other words, the outer peripheral surface 8a of the polishing body 8 is formed into a shape having a porosity higher than that of the outer peripheral surface 7a of the polishing body 7. It is preferred that the non-foamed resin include a non-foamed polyurethane resin. The polishing body 7 includes the non-foamed polyurethane resin, and hence is more rigid and less likely to be elastically deformed than the polishing body 8 made of the foamed polyurethane resin. In other words, the polishing body 8 is less rigid and more likely to be elastically deformed than the polishing body 7.
  • The polishing body 7 is arranged so as to be adjacent to the polishing body 8, and the polishing body 7 is arranged so as to be positioned on an upstream side with respect to the polishing body 8 when the relative moving direction between the polishing tool 10 and the workpiece is along the sending direction (X axis direction). Further, the polishing body 8 is formed to have a diameter slightly larger than that of the polishing body 7. In other words, the polishing body 8 is formed to have a radius larger than that of the polishing body 7 by an amount corresponding to a difference between an elastic deformation amount of the polishing body 7 and an elastic deformation amount of the polishing body 8 caused by a pressing pressure applied onto the surface Wa of the workpiece W. With this shape, the polishing body 7 and the polishing body 8 are pressed under the same load onto the workpiece W when the pressure is applied.
  • Note that, it is preferred that a thickness of the polishing body 7 range from 1.0 mm to 1.5 mm. When the thickness is less than 1.0 mm, rigidity of the polishing body 7 is low, and hence the polishing body 7 is deformed along the shape of the surface Wa of the workpiece W. Thus, it is impossible to remove the waviness. When the thickness is more than 1.5 mm, a length including the thickness of the polishing body 7, the thickness of the polishing body 8, and an interval between the polishing body 7 and the polishing body 8 exceeds 4 mm so that a size of a removal trace is larger than 4 mm. Thus, it is impossible to correct a shape having a short wavelength, and to obtain necessary processing accuracy. Further, it is preferred that a thickness of the polishing body 8 be larger than that of the polishing body 7 and that the length including the thickness of the polishing body 7, the thickness of the polishing body 8, and the interval between the polishing body 7 and the polishing body 8 be 4 mm or less. When the polishing body 7 is thicker than the polishing body 8, the polishing body 8 cannot smooth the waviness generated by the polishing body 7. In other words, the polishing body 8 is formed to be thicker than the polishing body 7. The thickness of the polishing body refers to a distance between disk-like surfaces that are side surfaces of the polishing body crossing perpendicularly to the rotation shaft. Further, in the first embodiment, it is preferred that an interval between the adjacent polishing bodies 7, 8 be 0.5 mm or less. This is to secure the necessary processing accuracy through setting a total length of the thickness of the polishing body 7, the thickness of the polishing body 8, and the interval between the polishing body 7 and the polishing body 8 to be 4 mm or less so as to set the size of the removal trace to be 4 mm or less. In this way, the polishing bodies 7, 8 are arranged onto the rotation shaft 1 with the interval.
  • With the above-mentioned configuration, when polishing-processing the surface Wa of the workpiece W with use of the polishing tool 10, the polishing bodies 7, 8 are lowered in the -Z axis direction while being rotated in a rotating direction of the rotation shaft 1, and then the outer peripheral surfaces 7a, 8a of the polishing bodies 7, 8 are brought into press-contact with the surface Wa of the workpiece W. The polishing body 8 includes the foamed polyurethane resin, and hence is rotated while being elastically deformed and held in close contact with the surface of the workpiece W.
  • Further, the polishing body 8 includes the foamed polyurethane resin, and hence the large number of pores are formed in the outer peripheral surface 8a. Thus, polishing liquid (abrasive grain) easily enters the formed pores. Therefore, it is possible to suppress formation of a film of the polishing liquid between the outer peripheral surface 8a of the polishing body 8 and the surface Wa of the workpiece W, and thus possible to suppress floating of the polishing body 8 from the surface Wa. Further, the large number of pores can hold a large amount of abrasive grains so that the number of the abrasive grains supplied between the outer peripheral surface 8a of the polishing body 8 and the surface Wa of the workpiece W is increased. As a result, polishing removal efficiency is increased. Though the surface Wa of the workpiece W is polished by the polishing body 8 effectively in this way, a periodic waviness is sometimes formed by the polishing body 8 on the surface Wa of the workpiece W.
  • As illustrated in FIG. 1, in a case where the moving direction of the polishing tool 10 with respect to the workpiece W is along the sending direction S (X axis direction), the waviness formed by the polishing body 8 on the surface Wa of the workpiece W is smoothed by the polishing body 7 passing the workpiece W subsequently to the polishing body 8 (or last). Specifically, the polishing body 7 includes the non-foamed polyurethane resin, and hence is more rigid than the polishing body 8 and less likely to be elastically deformed than the polishing body 8 even when being brought into press-contact with the surface Wa of the workpiece W. Therefore, the outer peripheral surface 7a of the polishing body 7 is less likely to be held in contact with a valley portion of the waviness, but more likely to be held in contact with a peak portion of the waviness, and hence the polishing body 7 has a high performance in smoothing the waviness. The polishing body 7 removes the peak portion of the waviness formed on the surface Wa of the workpiece W, and effectively smoothes the surface Wa of the workpiece W.
  • Second Embodiment
  • Next, a second embodiment of the present invention is described. FIG. 2A illustrates a polishing tool 11 according to the second embodiment. Portions identical to those of FIG. 1 are denoted by the same symbols, and description thereof is omitted. The polishing tool 11 includes the rotation shaft 1, and three disk- like polishing bodies 7, 8, and 9 provided to the rotation shaft 1 so as to be adjacent to each other. The rotation shaft 1 of the polishing tool 11 is fixed to the tool rotating device 3 of the polishing apparatus 100, whereby the polishing tool 11 is supported to be rotatable relative to the polishing apparatus main body. The first polishing body 8, the second polishing body 7, and the third polishing body 9 respectively have outer peripheral surfaces serving as working surfaces 8a, 7a, and 9a. The first polishing body 8, the second polishing body 7, and the third polishing body 9 are fixed onto the rotation shaft 1 passing through the center portion of each disk-like surface of each of the polishing bodies. With this configuration, the first polishing body 8, the second polishing body 7, and the third polishing body 9 are fixed onto the rotation shaft 1 so as to be adjacent to each other, and are each rotated integrally with the rotation shaft 1 about the center portion.
  • Similarly to the polishing body 7, the polishing body 9 includes the non-foamed resin, and few pores are formed in the outer peripheral surface 9a of the polishing body 9. In other words, the outer peripheral surface 8a of the polishing body 8 is formed into a shape having a porosity higher than that of the outer peripheral surface 9a of the polishing body 9. It is preferred that the non-foamed resin include the non-foamed polyurethane resin. The polishing body 9 includes the non-foamed polyurethane resin, and hence is more rigid and less likely to be elastically deformed than the polishing body 8 made of the foamed polyurethane resin. In other words, the polishing body 8 is less rigid and more likely to be elastically deformed than the polishing body 9.
  • Next, a workpiece processing method according to this embodiment performed with use of the polishing tool 11 is described with reference to FIG. 2B.
  • After the polishing tool 11 forms a groove in the surface Wa of the workpiece W in the X axis direction, the polishing tool 11 is shifted by a constant pitch P (sending pitch) in a Y axis direction orthogonal to the sending direction S (X axis direction), and is moved in a returning direction (-X axis direction) while being overlapped to part of the groove which has been already formed. In this embodiment, as described above, the polishing tool 11 is slid by the constant pitch P in the Y axis direction each time. The moving direction of the polishing tool 11 with respect to the workpiece is switched alternately between the sending direction (X axis direction) and the returning direction (-X axis direction), and an entire surface of the workpiece W is polishing-processed into an arbitrary shape. Note that, as a method of moving the polishing tool 11 relative to the surface Wa of the workpiece W, the workpiece W may be moved relative to the polishing tool 11, or the polishing tool 11 may be moved relative to the workpiece W.
  • The polishing body 9 is arranged so as to be adjacent to the polishing body 8, and the polishing body 9 is arranged on the upstream side with respect to the polishing body 8 when the moving direction of the polishing tool 11 with respect to the workpiece is along the returning direction (-X axis direction).
  • Further, in a case where the polishing tool 11 is moved in the returning direction (-X axis direction) relative to the workpiece W, the waviness formed by the polishing body 8 on the surface Wa of the workpiece W is smoothed by the polishing body 9 passing the workpiece W subsequently to the polishing body 8 (or last). That is, the polishing body 9 includes the non-foamed polyurethane resin, and hence, similarly to the polishing body 7, the polishing body 9 is more rigid and has a higher performance in smoothing the waviness than the polishing body 8, to thereby effectively smooth the surface Wa of the workpiece W. Therefore, in the second embodiment, the polishing bodies 7, 9 more rigid than the polishing body 8 are arranged adjacently on both sides of the polishing body 8. Thus, in a case where the moving direction of the polishing tool 11 with respect to the workpiece is switched alternately between the sending direction S (X axis direction) and the returning direction (-X axis direction), it is possible to smooth the waviness in any directions after polishing removal.
  • As described above, in the case where the moving direction of the polishing tool 11 with respect to the workpiece is along the sending direction (X axis direction), the polishing body 7 smoothes the waviness of the surface Wa after the polishing body 8 performs polishing removal on the surface Wa. Meanwhile, in the case where the moving direction of the polishing tool 11 with respect to the workpiece is along the returning direction (-X axis direction), the polishing body 9 smoothes the waviness of the surface Wa after the polishing body 8 performs polishing removal on the surface Wa. Therefore, while the polishing tool 11 is shifted by the pitch P each time in a direction orthogonal to the moving direction of the polishing tool 11 with respect to the workpiece, the polishing tool 11 is moved under alternate switching of the moving direction, and thus it is possible to perform polishing removal of the entire surface of the workpiece W and smoothing of the waviness at one time. In other words, one-time scanning of the polishing tool 11 with respect to the surface Wa of the workpiece W enables the polishing tool 11 to perform the polishing removal and the smoothing of the waviness. As described above, the polishing bodies have different functions from each other, and hence it is possible to obtain a high-quality surface of the workpiece for a short period of time when polishing a free-form surface shape.
  • Third Embodiment
  • Next, a third embodiment of the present invention is described. FIG. 3A illustrates a polishing tool 12 according to the third embodiment. Portions identical to those of FIG. 2 are denoted by the same symbols, and description thereof is omitted.
  • In FIG. 3A, multiple grooves 9b with a depth (for example, 0.35 mm) of from 0.1 mm to a size corresponding to the thickness of the polishing body 9 are formed in the outer peripheral surface 9a of the polishing body 9 at intervals of 2° or less in a direction parallel to the rotation shaft. In the case where the depth of each of the grooves is extremely shallow, when the polishing body 9 is pressed, the polishing body 9 is deformed so that bottoms of the grooves are brought into contact with the surface Wa of the workpiece W. Thus, the polishing body 9 cannot exert an effect of the grooves. The multiple grooves 9b are formed in the outer peripheral surface 9a of the polishing body 9, and hence it is possible to suppress formation of a film of the polishing liquid between the outer peripheral surface 9a of the polishing body 9 and the surface Wa of the workpiece W, and thus possible to suppress floating of the polishing body 9 from the surface Wa. Therefore, the performance in smoothing the waviness formed on the surface Wa of the workpiece W is further improved. The grooves may be formed also in the polishing body 7, or may be formed only in the polishing body 7 but not in the polishing body 9. The polishing body with the grooves has the improved performance in smoothing the waviness, and hence it is possible to determine whether to form the grooves depending on the required accuracy.
  • Fourth Embodiment
  • Next, a fourth embodiment of the present invention is described. FIG. 3B illustrates a polishing tool 13 according to the fourth embodiment. Portions identical to those of FIG. 2 are denoted by the same symbols, and description thereof is omitted.
  • In FIG. 3B, in the fourth embodiment, the polishing tool 13 includes the polishing body 8 serving as the first polishing body, and disk-like support members 21a, 21b provided for deformation prevention, the support members 21a, 21b being respectively provided to be held in contact with (both) side surfaces 7c, 7c of the polishing body 7 serving as the second polishing body and being formed of a metal plate such as a stainless steel plate. In order to prevent contact with the surface Wa of the workpiece W, each of the support members 21a, 21b is set to have a radius smaller than that of the polishing body 7. An elastic deformation amount of each of the support members 21a, 21b is set to be smaller by 0.1 mm than the elastic deformation amount of the polishing body 7. In the case where the difference is more than 0.1 mm, when the polishing body 7 is deformed, the support members 21a, 21b are brought into contact with the surface Wa of the workpiece W. In the case where the difference is less than 0.1 mm, the support members 21a, 21b cannot obtain rigidity enough to support the polishing body 7. Note that, each of the support members 21a, 21b is set to have a thickness of from 0.1 mm to 0.5 mm. In the case where the thickness is more than 0.5 mm, the support members 21a, 21b are brought into contact with another polishing body. In the case where the thickness is less than 0.1 mm, the support members 21a, 21b cannot obtain the rigidity enough to support the polishing body 7.
  • With the above-mentioned configuration, even if the polishing body 7 receives a force in the sending direction S during polishing-processing, the polishing body 7 is supported by the support members 21a, 21b, and hence it is possible to prevent deformation of the polishing body 7. With this configuration, it is possible to suppress unevenness generated during polishing removal due to the deformation of the polishing body 7, and thus possible to obtain a higher-quality surface of the workpiece. Further, owing to the support members 21a, 21b, it is possible to select a less rigid material in terms of rigidity of the polishing body 7. The support members may be formed also in the polishing body 9, or may be formed only in the polishing body 9 but not in the polishing body 7. When the support members are formed only in one of the polishing body 7 and the polishing body 9, it is possible to suppress the unevenness generated during polishing removal by the polishing body including the support members. When the support members are formed both in the polishing body 7 and the polishing body 9, it is possible to suppress the unevenness generated during polishing removal by both the polishing bodies. Thus, it is possible to obtain a higher-quality surface of the workpiece.
  • Fifth Embodiment
  • Next, a fifth embodiment of the present invention is described. FIG. 3C illustrates a polishing tool 14 according to the fifth embodiment. Portions identical to those of FIG. 2 are denoted by the same symbols, and description thereof is omitted.
  • In FIG. 3C, the polishing tool 14 includes three disk- like polishing bodies 22, 23, and 24. The polishing body 23 serves as the first polishing body made of the foamed polyurethane resin exemplified as the foamed resin, and a large number of pores are formed in an outer peripheral surface 23a of the polishing body 23. In contrast, the polishing body 22 serves as the second polishing body made of the non-foamed polyurethane resin exemplified as the non-foamed resin, and the polishing body 24 serves as the third polishing body made of the non-foamed polyurethane resin exemplified as the non-foamed resin. Few pores are formed in an outer peripheral surface 22a of the polishing body 22 and an outer peripheral surface 24a of the polishing body 24. In other words, the outer peripheral surface 23a of the polishing body 23 is formed into a shape having a porosity higher than that of the outer peripheral surface 22a of the polishing body 22 and that of the outer peripheral surface 24a of the polishing body 24.
  • Further, each of the polishing bodies 22, 24 includes the non-foamed polyurethane resin, and hence is more rigid and less likely to be elastically deformed than the polishing body 23 made of the foamed polyurethane resin. In other words, the polishing body 23 is less rigid and more likely to be elastically deformed than the polishing bodies 22, 24. Each of the polishing bodies 22, 24 is arranged so as to be adjacent to the polishing body 23. The polishing body 22 is arranged upstream in the moving direction with respect to the polishing body 23 when the moving direction of the polishing tool with respect to the workpiece is along the sending direction S (X axis direction). Meanwhile, the polishing body 24 is arranged upstream in the moving direction with respect to the polishing body 23 when the moving direction is along the returning direction (-X axis direction). The polishing body 23 is formed to have a diameter slightly larger than that of the polishing body 22 and that of the polishing body 24.
  • Note that, a thickness of each of the polishing body 22 and the polishing body 24 is, for example, 1.0 mm. A thickness of the polishing body 23 is, for example, 2.0 mm. In other words, the polishing body 23 is formed to be thicker than the polishing body 22 and the polishing body 24. With this configuration, a total thickness of the polishing body 22, the polishing body 23, and the polishing body 24 is set to be as small as possible (to be, for example, 4 mm or less) so that the size of the removal trace is 4 mm or less. Thus, it is possible to obtain the necessary processing accuracy. Further, multiple grooves 22b with a depth of 0.35 mm are formed in the outer peripheral surface 22a of the polishing body 22 at intervals of 2° or less in the direction parallel to the rotation shaft. Similarly, multiple grooves 24b with a depth of 0.35 mm are formed in the outer peripheral surface 24a of the polishing body 24 at intervals of 4° in the direction parallel to the rotation shaft. In the case where the depth of each of the grooves is 0.1 mm or less, when the polishing body 9 is pressed, the polishing body 9 is deformed so that the bottoms of the grooves are brought into contact with the surface Wa of the workpiece W. Thus, the polishing body 9 cannot exert an effect of the grooves. Further, when the interval angle is larger than 2°, the film of polishing liquid is generated to inhibit the polishing body from being held in contact with the surface of the workpiece, and thus processing efficiency is significantly decreased. Further, in the fifth embodiment, an interval between the adjacent polishing bodies 22, 23 and an interval between the adjacent polishing bodies 23, 24 are set to 0 mm, and the polishing bodies 22, 23, and 24 are arranged onto the rotation shaft 1. Without the intervals, the removal trace generated by the entire tool is reduced, and hence it is possible to correct and process even a shape having a shorter wavelength. As a result, it is possible to obtain a high-quality surface of the workpiece.
  • In the fifth embodiment, the polishing body 22 and the polishing body 24 are made of the same material and formed into the same shape (with the same diameter, the same width, and the same groove intervals), and are configured to be symmetric with respect to the polishing body 23. Therefore, in the fifth embodiment, the same operation and effect as those of the first embodiment are provided. In addition, in each of the polishing bodies 22, 24, when the moving direction of the polishing tool with respect to the workpiece is along any of the +X axis direction and the -X axis direction, it is possible to similarly smooth the waviness generated by the polishing body 23. Therefore, it is possible to obtain a higher-quality surface of the workpiece for a short period of time when polishing a free-form surface shape. Further, in the fifth embodiment, the grooves 22b, 24b are formed in the polishing bodies 22, 24, respectively. Thus, when the moving direction of the polishing tool with respect to the workpiece is along any of the +X axis direction and the -X axis direction, it is possible to suppress floating of each of the polishing bodies 22, 24, and to effectively smooth the waviness.
  • Note that, though the present invention is described based on the above-mentioned embodiments, the present invention is not limited thereto.
  • Further, in the fourth embodiment, the shape of the support members 21a, 21b is set to a disk-like shape, and the material of the support members 21a, 21b is set to stainless steel. However, as long as it is possible to prevent the deformation of the polishing body 7, the shape and the material thereof may be set arbitrarily. Further, in the fourth embodiment, the polishing body 7 is provided with the support members 21a, 21b. However, similarly, the polishing body 8 or the polishing body 9 may be provided with support members (that is, at least one of the first polishing body and the second polishing body may be provided with support members). Also in this case, the same effect is provided.
  • Further, in the first embodiment, the interval between the adjacent polishing bodies 7, 8 is set to 0.5 mm. However, the interval may be set arbitrarily, and the same effect is provided even when any interval is set. Further, in the fifth embodiment, the interval between the polishing bodies 22, 23 and the interval between the polishing bodies 23, 24 are set to 0 mm. However, the intervals may be set arbitrarily as long as the polishing bodies are arranged symmetrically, and the same effect is provided even when any intervals are set.
  • Further, in the second to fifth embodiments, the case where the three polishing bodies are used is described. However, the present invention is not limited thereto. In the second to fifth embodiments, the case where the moving direction of the polishing tool with respect to the workpiece is switched alternately between the X axis direction and the -X axis direction is described. However, in a case where the moving direction is along one direction, it is possible to omit the polishing body situated downstream in the sending direction with respect to the polishing body 8 (polishing body 23).
  • Further, another polishing body may be interposed between the polishing body 8 and the polishing body 7, and still another polishing body may be interposed between the polishing body 8 and the polishing body 9. Similarly, another polishing body may be interposed between the polishing body 23 and the polishing body 22, and still another polishing body may be interposed between the polishing body 23 and the polishing body 24. In this case, the polishing body 7, 22 or the polishing body 9, 23 passes the surface of the workpiece last, and thus it is possible to effectively smooth the waviness. Note that, in this case, it is preferred that the same number of polishing bodies be provided on each side of the polishing body 8, 23 so as to be symmetric with respect to the polishing body 8, 23.
  • Further, in the first to fifth embodiments, the case where the foamed polyurethane resin is exemplified as the foamed resin is described. However, the foamed resin may include a foamed epoxy resin and a foamed phenolic resin. Similarly, the case where the non-foamed polyurethane resin is exemplified as the non-foamed resin is described. However, the non-foamed resin may include a non-foamed epoxy resin and a non-foamed phenolic resin.
  • While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
    Provided is a polishing tool capable of forming a high-quality surface of a workpiece for a short period of time. A polishing tool (10) includes: a rotation shaft (1) arranged parallel to a sending direction (S) of moving the polishing tool relative to a workpiece (W); and at least two polishing bodies (7, 8). The polishing body (8) includes a foamed resin such as a foamed polyurethane resin, and has an outer peripheral surface (8a) having a porosity higher than that of the polishing body (7). The polishing body (7) includes a non-foamed resin such as a non-foamed polyurethane resin being a material more rigid than that for the polishing body (8). When polishing-processing, the polishing body (8) performs polishing removal on a surface (Wa) of the workpiece (W), and the polishing body (7) smoothes a waviness formed on the surface (Wa) through the polishing removal.

Claims (6)

  1. A polishing tool for polishing-processing a surface of a workpiece, comprising:
    a rotation shaft;
    a disk-like first polishing body, which is provided to the rotation shaft and includes an outer peripheral surface serving as a work surface; and
    a disk-like second polishing body, which is provided to the rotation shaft so as to be adjacent to the first polishing body and includes an outer peripheral surface serving as a work surface, wherein:
    the outer peripheral surface of the first polishing body is formed into a shape having a porosity higher than a porosity of the outer peripheral surface of the second polishing body; and
    the second polishing body comprises a material more rigid than a material for the first polishing body.
  2. The polishing tool according to claim 1, further comprising a support member provided for deformation prevention on a side surface of at least one of the first polishing body and the second polishing body.
  3. The polishing tool according to claim 1, wherein the first polishing body comprises a foamed resin.
  4. The polishing tool according to claim 1, wherein the outer peripheral surface of the second polishing body comprises multiple grooves formed parallel to a direction of the rotation shaft.
  5. A workpiece processing method for polishing-processing a surface of a workpiece, comprising:
    bringing a disk-like first polishing body and a disk-like second polishing body into press-contact with a workpiece, the first polishing body and the second polishing body being adjacently provided to a same rotation shaft and each including an outer peripheral surface serving as a work surface; and
    moving the first polishing body and the second polishing body relative to the workpiece in a direction parallel to the rotation shaft, to thereby process the surface of the workpiece, wherein:
    the outer peripheral surface of the first polishing body is formed into a shape having a porosity higher than a porosity of the outer peripheral surface of the second polishing body;
    the second polishing body comprises a material more rigid than a material for the first polishing body; and
    the second polishing body removes a waviness formed through processing performed by the first polishing body.
  6. The workpiece processing method according to claim 5, wherein the second polishing body is arranged, with respect to the first polishing body, upstream in a direction of moving the first polishing body and the second polishing body.
EP10171593.6A 2009-08-03 2010-08-02 Polishing method for a workpiece and polishing tool used for the polishing method Withdrawn EP2283968A3 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009181085 2009-08-03

Publications (2)

Publication Number Publication Date
EP2283968A2 true EP2283968A2 (en) 2011-02-16
EP2283968A3 EP2283968A3 (en) 2013-11-27

Family

ID=43033624

Family Applications (1)

Application Number Title Priority Date Filing Date
EP10171593.6A Withdrawn EP2283968A3 (en) 2009-08-03 2010-08-02 Polishing method for a workpiece and polishing tool used for the polishing method

Country Status (3)

Country Link
US (1) US20110028074A1 (en)
EP (1) EP2283968A3 (en)
JP (1) JP5780719B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202013002062U1 (en) 2013-03-05 2013-10-07 Christian Vogt System and device for grinding format parts
DE102020120617A1 (en) 2020-08-05 2022-02-10 Egon Evertz Kg (Gmbh & Co) Process and device for cylindrical grinding

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150167652A1 (en) * 2013-12-18 2015-06-18 General Electric Company Submersible pumping system and method
EP3085491B1 (en) * 2015-04-24 2017-04-12 ARKU Maschinenbau GmbH Device for grinding and deburring of a planar workpiece
CN108838802B (en) * 2018-06-12 2023-11-21 江苏金鼎建设集团有限公司 Woodwork grinding device
JP7317532B2 (en) * 2019-03-19 2023-07-31 キオクシア株式会社 Polishing device and polishing method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1652134A1 (en) * 1966-03-11 1971-04-15 Norton Abrasives Ltd Grinding process and grinding wheel
DE8810148U1 (en) * 1988-08-10 1988-09-29 Gebr. Hegner Kg Werkzeug- Und Maschinenfabrik, 7730 Villingen-Schwenningen, De
JPH1190806A (en) 1997-09-12 1999-04-06 Ricoh Co Ltd Curved surface polishing device and method thereof

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB523879A (en) * 1939-02-13 1940-07-24 James Henry Fletcher Improvements relating to abrasive wheels for surface, former and other grinding
DE2331646A1 (en) * 1972-08-08 1974-02-28 Evertz Egon SANDING BODY
NL8007032A (en) * 1980-01-21 1981-08-17 Braasch Gerd DEVICE FOR GRINDING WOOD SURFACES.
US4504283A (en) * 1982-07-22 1985-03-12 Superior Finishers, Incorporated Cushioned abrasive articles, and method of manufacture
JP2798347B2 (en) * 1993-07-08 1998-09-17 信越半導体株式会社 Wafer notch polishing machine
US5954566A (en) * 1995-04-03 1999-09-21 Bauer; Jason Method and apparatus for reconditioning digital recording discs
DE19527222C2 (en) * 1995-07-26 1997-09-04 Wernicke & Co Gmbh System for grinding at least the peripheral edge of spectacle lenses and method for mathematically taking into account the position of a spectacle lens blank held on a holding head of the system
JPH09277148A (en) * 1996-04-17 1997-10-28 Topcon Corp Method of lens peripheral edge grinding and device thereof
CN1146866C (en) * 1998-11-17 2004-04-21 阿尔卑斯电气株式会社 Crown forming method of flying head and its crown forming device
JP4136283B2 (en) * 2000-07-07 2008-08-20 オリンパス株式会社 Polishing equipment
DE10064163C2 (en) * 2000-12-22 2003-04-17 Wernicke & Co Gmbh Arrangement for releasably attaching a grinding wheel or a grinding wheel package to a grinding spindle
JP3731522B2 (en) * 2001-10-09 2006-01-05 日本ミクロコーティング株式会社 Cleaning sheet
JP4170204B2 (en) * 2003-12-03 2008-10-22 株式会社リコー Polishing method
KR100949560B1 (en) * 2005-05-17 2010-03-25 도요 고무 고교 가부시키가이샤 Polishing pad
JP5142548B2 (en) * 2006-02-14 2013-02-13 Hoya株式会社 Manufacturing method of glass substrate for magnetic disk and polishing pad
US7204244B1 (en) * 2006-03-02 2007-04-17 Luminare Supply Corporation Diamond core drill bit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1652134A1 (en) * 1966-03-11 1971-04-15 Norton Abrasives Ltd Grinding process and grinding wheel
DE8810148U1 (en) * 1988-08-10 1988-09-29 Gebr. Hegner Kg Werkzeug- Und Maschinenfabrik, 7730 Villingen-Schwenningen, De
JPH1190806A (en) 1997-09-12 1999-04-06 Ricoh Co Ltd Curved surface polishing device and method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202013002062U1 (en) 2013-03-05 2013-10-07 Christian Vogt System and device for grinding format parts
DE102020120617A1 (en) 2020-08-05 2022-02-10 Egon Evertz Kg (Gmbh & Co) Process and device for cylindrical grinding
WO2022028643A1 (en) * 2020-08-05 2022-02-10 Egon Evertz Kg (Gmbh & Co) Method and device for cylindrical grinding

Also Published As

Publication number Publication date
JP2011051089A (en) 2011-03-17
US20110028074A1 (en) 2011-02-03
EP2283968A3 (en) 2013-11-27
JP5780719B2 (en) 2015-09-16

Similar Documents

Publication Publication Date Title
EP2283968A2 (en) Polishing method for a workpiece and polishing tool used for the polishing method
US8152598B2 (en) Substrate treating method and substrate treating apparatus
JP5208087B2 (en) Apparatus for processing both sides of a flat workpiece and method for simultaneously cutting a plurality of semiconductor wafers on both sides
KR101209271B1 (en) Apparatus for double side polishing and Carrier for double side polishing apparatus
KR101715407B1 (en) Method of polishing object to be polished and polishing pad
KR101143290B1 (en) Method and device for polishing plate-like body
US20060258268A1 (en) Manufacturing method for semiconductor wafers, slicing method for slicing work and wire saw used for the same
EP2428984B1 (en) Semiconductor wafer polishing method
US10646976B2 (en) Method for producing substrate
US20080293337A1 (en) Methods and apparatus for polishing a notch of a substrate by substrate vibration
TW201044453A (en) Method for forming a chamfer on wafer
KR101925616B1 (en) Laminated sheet polishing method and apparatus performing the same
US6881126B2 (en) Traction drive rolling element and method of forming the same
JP5057325B2 (en) Polishing pad
JP4781654B2 (en) Polishing cloth and wafer polishing equipment
JP5258484B2 (en) Lens polishing device and aspheric polishing plate
KR102110919B1 (en) Double side polishing machine
JP2006075922A (en) Dressing tool for abrasive cloth
EP1125688A1 (en) Polishing apparatus and a semiconductor manufacturing method using the same
JP7104909B1 (en) Semiconductor crystal wafer manufacturing method and manufacturing apparatus
KR100886603B1 (en) Apparatus for polishing wafer and process for polishing wafer
JP7210307B2 (en) Method for manufacturing metal parts
JP4481070B2 (en) Edge grinding method and grinding apparatus for sheet metal ring
JP6888753B2 (en) Polishing equipment and dressing method for polishing pads
JP2009142959A (en) Cam shaft machining method

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME RS

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME RS

RIC1 Information provided on ipc code assigned before grant

Ipc: B24D 5/06 20060101AFI20131024BHEP

Ipc: B24B 27/00 20060101ALI20131024BHEP

Ipc: B24B 41/00 20060101ALI20131024BHEP

Ipc: B24D 13/20 20060101ALI20131024BHEP

Ipc: B24D 5/10 20060101ALI20131024BHEP

Ipc: B24D 13/02 20060101ALI20131024BHEP

17P Request for examination filed

Effective date: 20140318

RBV Designated contracting states (corrected)

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

17Q First examination report despatched

Effective date: 20180213

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN

18W Application withdrawn

Effective date: 20180604