EP2263260A2 - Substrat transparent comportant un revetement antireflet - Google Patents
Substrat transparent comportant un revetement antirefletInfo
- Publication number
- EP2263260A2 EP2263260A2 EP09722088A EP09722088A EP2263260A2 EP 2263260 A2 EP2263260 A2 EP 2263260A2 EP 09722088 A EP09722088 A EP 09722088A EP 09722088 A EP09722088 A EP 09722088A EP 2263260 A2 EP2263260 A2 EP 2263260A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- substrate
- layer
- stack
- snzno
- index
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 47
- 238000000576 coating method Methods 0.000 title claims abstract description 21
- 239000011248 coating agent Substances 0.000 title claims abstract description 15
- 239000011521 glass Substances 0.000 claims abstract description 38
- 239000011701 zinc Substances 0.000 claims abstract description 32
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 15
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 15
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 15
- 229910052718 tin Inorganic materials 0.000 claims description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 11
- 230000005540 biological transmission Effects 0.000 claims description 8
- 229920000642 polymer Polymers 0.000 claims description 7
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical compound [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 claims description 5
- 239000003989 dielectric material Substances 0.000 claims description 5
- 238000004544 sputter deposition Methods 0.000 claims description 5
- 229910052951 chalcopyrite Inorganic materials 0.000 claims description 4
- 239000003795 chemical substances by application Substances 0.000 claims description 4
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 3
- 238000000151 deposition Methods 0.000 claims description 3
- 239000000377 silicon dioxide Substances 0.000 claims description 3
- 235000012239 silicon dioxide Nutrition 0.000 claims description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 2
- 229910004613 CdTe Inorganic materials 0.000 claims 2
- 229910052681 coesite Inorganic materials 0.000 claims 2
- 229910052906 cristobalite Inorganic materials 0.000 claims 2
- 229910052682 stishovite Inorganic materials 0.000 claims 2
- 229910052905 tridymite Inorganic materials 0.000 claims 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 abstract description 9
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 abstract description 3
- 229910001887 tin oxide Inorganic materials 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 68
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 13
- 238000012360 testing method Methods 0.000 description 11
- 239000000463 material Substances 0.000 description 6
- 239000002250 absorbent Substances 0.000 description 5
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 4
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 4
- 230000002745 absorbent Effects 0.000 description 4
- 239000006096 absorbing agent Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 150000004767 nitrides Chemical class 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 229910052738 indium Inorganic materials 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- OANVFVBYPNXRLD-UHFFFAOYSA-M propyromazine bromide Chemical compound [Br-].C12=CC=CC=C2SC2=CC=CC=C2N1C(=O)C(C)[N+]1(C)CCCC1 OANVFVBYPNXRLD-UHFFFAOYSA-M 0.000 description 3
- 238000010791 quenching Methods 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000005038 ethylene vinyl acetate Substances 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 235000013980 iron oxide Nutrition 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 230000000171 quenching effect Effects 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 239000011780 sodium chloride Substances 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- 229910005091 Si3N Inorganic materials 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 239000003463 adsorbent Substances 0.000 description 1
- -1 aliphatic isocyanate Chemical class 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 1
- 239000000378 calcium silicate Substances 0.000 description 1
- 229960003340 calcium silicate Drugs 0.000 description 1
- 229910052918 calcium silicate Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011796 hollow space material Substances 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- VBMVTYDPPZVILR-UHFFFAOYSA-N iron(2+);oxygen(2-) Chemical class [O-2].[Fe+2] VBMVTYDPPZVILR-UHFFFAOYSA-N 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 239000005340 laminated glass Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- KYKLWYKWCAYAJY-UHFFFAOYSA-N oxotin;zinc Chemical compound [Zn].[Sn]=O KYKLWYKWCAYAJY-UHFFFAOYSA-N 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- 229910021426 porous silicon Inorganic materials 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000005478 sputtering type Methods 0.000 description 1
- 229940071182 stannate Drugs 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- GZCWPZJOEIAXRU-UHFFFAOYSA-N tin zinc Chemical compound [Zn].[Sn] GZCWPZJOEIAXRU-UHFFFAOYSA-N 0.000 description 1
- 239000005341 toughened glass Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000010200 validation analysis Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- BNEMLSQAJOPTGK-UHFFFAOYSA-N zinc;dioxido(oxo)tin Chemical compound [Zn+2].[O-][Sn]([O-])=O BNEMLSQAJOPTGK-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/02168—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
- G02B1/115—Multilayers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- the invention relates to a transparent substrate, in particular glass, and provided on at least one of its faces with an antireflection coating.
- Antireflection coatings are usually made up, for the simplest, of a thin interferential layer whose refractive index is between that of the substrate and that of air, or, for the most complex, of a stack of thin layers. (In general, alternating layers based on dielectric materials with high and low refractive indices). In their most conventional applications, they are used to reduce the light reflection of the substrates, to increase the light transmission. This is for example glazing intended to protect paintings, to make counters or shop windows. Their optimization is therefore taking into account only the wavelengths in the visible range.
- elements capable of collecting light of the photovoltaic solar cell type comprise an absorbing agent ensuring the conversion of light into electrical energy.
- Ternary chalcopyrite compounds that can act as absorbers generally contain copper, indium and selenium. These are so-called CISe2 absorbent layers. It is also possible to add aluminum (ex: Cu (In, Ga) Se2 or CuGaSe2) to the absorbent layer of gallium. Cu (In, Al) Se2), or sulfur (eg CuIn (Se, S)) and are generally referred to herein as "chalcopyrite adsorbent layers".
- Another family of absorbent agent, in a thin layer, is either based on silicon, the latter may be amorphous or microcrystalline, or based on cadmium telluride (CdTe).
- CdTe cadmium telluride
- adsorbing agent based on polycrystalline silicon wafers, deposited in a thick layer, with a thickness of between 50 ⁇ m and 250 ⁇ m, unlike the amorphous or microcrystalline silicon die, which is deposited in a thin layer.
- a first solution was to use extra-clear glasses with very low iron oxide (s) content.
- glasses with very low iron oxide (s) content.
- These include, for example, glasses sold in the "DIAMANT” range by Saint-Gobain Glass or glasses marketed in the “ALBARINO” range by Saint-Gobain Glass.
- Another solution was to provide the glass, on the outside, with an antireflection coating consisting of a porous silicon oxide monolayer, the porosity of the material making it possible to lower the refractive index.
- this one-layer coating is not very efficient. It also has a durability, especially vis-à-vis moisture, insufficient.
- Another solution consisted in providing the glass, on the outer side, with an antireflection coating of thin layers of dielectric materials of alternately strong and weak refractive indices, such as those described in applications WO01 / 94989 and WO04 / 05210.
- anti-reflective coatings of this type whose high refractive index layers are based on oxide mixed tin and zinc and whose low refractive index layers are based on silicon dioxide have the major disadvantage of separating from the substrate when soaked under certain conditions and exposed to certain climatic conditions (in particular high humidity relative).
- the object of the invention is therefore the development of a new antireflection coating which is mechanically robust, whatever the conditions of the heat treatment, and which is capable of further increasing the transmission (of further reducing the reflection) through the transparent substrate that carries it, and this in a wide band of wavelengths, especially both in the visible, in the infrared, even in the ultraviolet.
- the object of the invention is the development of a new antireflection coating suitable for solar cells.
- the object of the invention is to develop such coatings which are furthermore capable of undergoing heat treatments, this being the case in particular in the case where the carrier substrate is made of glass which, in its final application, must be annealed or quenched .
- the object of the invention is to develop such coatings which are sufficiently durable for outdoor use.
- the invention therefore firstly relates to a transparent substrate, in particular a glass substrate, comprising on at least one of its faces an antireflection coating, in particular at least in the visible and in the near infrared, made of a stack of thin layers. in dielectric materials with alternately high and low refractive indices, the stack comprising successively:
- a high-index first refractive index layer at 550 nm between 1.8 and 2.3 and a geometric thickness of between 15 and 35 nm; a second low-index layer; of refractive index n2 at 550 nm between 1, 30 and 1, 70 and geometric thickness & 2 between
- a high-index third layer having a refractive index n3 at 550 nm of between 1.8 and 2.3 and a geometric thickness e3 of between 130 and 160 nm,
- a fourth layer with a low index, of refractive index n 4 at 550 nm between 1.30 and 1.70 and with a geometrical thickness e 4 between
- the second low-index layer and / or the fourth low-index layer being based on silicon oxide, silicon oxynitride and / or oxycarbide or a mixed oxide of silicon and silicon oxide.
- layer is understood to be either a single layer or a superposition of layers where each of them respects the indicated refractive index and the sum of their geometrical thicknesses also remains the value indicated for the layer in question.
- the layers are made of dielectric material, in particular of the oxide or nitride type, as will be detailed later. However, it is not excluded that at least one of them is modified so as to be at least a little conductive, for example by doping a metal oxide, this for example to possibly give the antireflection stack also a antistatic function.
- the invention is preferably interested in glass substrates, but can also be applied to transparent substrates based on polymer, for example polycarbonate.
- the invention therefore relates to a four-layer type antireflection stack. This is a good compromise because the number of layers is large enough that their interferential interaction can achieve an important antireflection effect. However, this number remains reasonable enough to be able to manufacture the product on a large scale, on an industrial line, on large substrates, for example by using a vacuum deposition technique of the sputtering type (magnetic field assisted). .
- composition selection criteria in the material forming the high refractive index layers used in the invention make it possible to obtain a broadband robust anti-reflective effect, with a significant increase in the transmission of the substrate-carrier, not only in the visible domain, but also beyond, from the ultraviolet to the near infrared. This is an anti-glare performing over a range of wavelengths extending at least between 300 and 1200 nm.
- the most suitable materials for constituting the first and / or the third layer are based on metal oxide (s) chosen from zinc oxide ZnO, tin SnO2. It may especially be a mixed Zn and Sn oxide, of the zinc stannate type, and according to a Sn / Zn ratio (expressed as an atomic percentage) greater than 1 They may also be based on nitride (s) silicon SiaN 4 .
- a nitride layer for one or other of the high index layers, in particular the third at least, makes it possible to add a feature to the stack, namely an ability to better withstand heat treatments without any noticeable deterioration of its optical properties for thicknesses less than 100 nm.
- the first and / or the third layer may in fact consist of several superimposed layers superimposed. It may especially be a bilayer SnZnO / Si3N type 4 or Si ⁇ lNU / SnZnO.
- the first high-index layer and / or the third high-index layer may consist exclusively of a mixed oxide of zinc and tin or a bilayer of the type previously mentioned, with a ratio expressed as an atomic percentage between tin and zinc greater than 1.
- the advantage is as follows: the S13N4 is substantially less absorbent than the mixed oxide of tin and zinc, which allows, at identical total thickness, to combine both the advantages of robustness of the stack and optical properties.
- the third layer which is the thickest and most important to protect the stack from possible damage resulting from a heat treatment
- the most suitable materials for constituting the second and / or the fourth layer are based on silicon oxide, oxynitride and / or silicon oxycarbide or based on a mixed oxide silicon and aluminum.
- a mixed oxide tends to have a better durability, especially chemical, than pure SiO 2 (an example is given in patent EP-791 562).
- the respective proportion of the two oxides can be adjusted to achieve the expected improvement in durability without greatly increasing the refractive index of the layer.
- the glass chosen for the substrate coated with the stack according to the invention or for the other substrates associated with it to form a glazing may be particular, for example extra-clear of the "diamond” type (low in particular iron oxides ), or for example an extra-clear laminated glass of the "Albarino” type or a standard clear-calcium-silicate glass of the "Planilux” type (three types of glass marketed by Saint-Gobain Vitrage).
- coatings according to the invention comprise the following sequences of layers: for a stack with four layers: SnZnO x / SiO 2 / SnZnO x / SiO 2 , with Sn / Zn> 1 expressed as an atomic percentage,
- Substrates of glass type, especially extra-clear, having this type of stack can thus achieve integrated transmission values between 300 and 1200 nm of at least 90%, especially for thicknesses between 2 mm and 8 mm.
- the subject of the invention is also the substrates coated according to the invention as external substrates for solar cells of the absorber type based on Si or CdTe or on the chalcopyrite agent (CIS in particular).
- This type of product is generally marketed in the form of solar cells mounted in series and arranged between two transparent rigid substrates of the glass type.
- the cells are held between the substrates by a polymeric (or more) material.
- the solar cells can be placed between the two substrates, then the hollow space between the substrates is filled with a cast polymer capable of hardening, while particularly polyurethane based on the reaction of an aliphatic isocyanate prepolymer and a polyether polyol.
- the polymer may be cured at high temperature (30 to 50 ° C.) and possibly at a slight overpressure, for example in an autoclave.
- Other polymers can be used, such as EVA ethylene vinyl acetate, and other mountings are possible (for example, laminating between the two cell glasses using one or more sheets of thermoplastic polymer) .
- the invention therefore also relates to said modules.
- the solar modules can increase their yield by a few percent at least 1, 1.5 or 2% or more (expressed in integrated current density) compared to modules using the same substrate but without the coating.
- the electric power delivered approximately, we can estimate that a square meter of solar cell can provide about 130 Watt
- each percent of additional yield increases the performance electric, and therefore the price, of a solar module of given dimensions.
- the subject of the invention is also the process for manufacturing glass substrates with antireflection coating (A) according to the invention.
- One method consists of depositing all the layers, successively, by a vacuum technique, in particular magnetic field assisted cathode sputtering or corona discharge.
- the oxide layers can be deposited by reactive sputtering of the metal in question in the presence of oxygen and the nitride layers in the presence of nitrogen.
- SiO 2 or SiaN 4 one can start from a silicon target that is slightly doped with a metal such as aluminum to make it sufficiently conductive.
- FIG. 1 a substrate provided with a four-layer antireflection stack A according to the invention
- FIG. 2 a solar module integrating the substrate according to FIG. 1.
- FIG. 1 very diagrammatic, shows in section a glass 6 surmounted by a four-layer antireflection stack (A) 1, 2, 3, 4.
- A four-layer antireflection stack
- the antireflection stack used is the following
- This example 1 is a first example of the prior art.
- This example 2 constitutes a second example of the prior art with a Sn / Zn ratio (expressed as an atomic percentage) equal to 0.18.
- This example 3 constitutes a third example of the prior art with a Sn / Zn ratio (expressed as an atomic percentage) equal to 0.55
- the 4-layer antireflection stack of these examples is deposited on a substrate 6 made of extra-clear glass 4 mm thick, of the aforementioned DIAMANT range.
- the antireflection stack used is the following
- This example 4 is an example according to the invention with a Sn / Zn ratio (expressed as an atomic percentage) equal to 1.65.
- the antireflection stack used is the following
- This example 5 is another example according to the invention with a Sn / Zn ratio (expressed as an atomic percentage) equal to 1.65.
- the third layer is a bi-layer comprising a layer of silicon nitride coated with a mixed zinc-tin oxide layer according to the Sn / Zn ratio previously expressed.
- the antireflection stack used is the following
- This example 6 is yet another example according to the invention with a Sn / Zn ratio (expressed as an atomic percentage) equal to 1.65.
- the third layer is a bi layer comprising an oxide layer mixed zinc and tin according to the Sn / Zn ratio previously expressed coated with a layer of coated silicon nitride.
- the layer (3) comprises 100 nm of SnZnO and 50 nm of Si 3 N 4 .
- This test is a test of resistance to moist heat. It determines whether the sample is able to withstand the effects of long-term moisture penetration.
- FIG. 2 very schematically represents a solar module 10 according to the invention.
- the module 10 is constituted as follows: the glass 6 provided with the antireflection coating (A) is associated with a glass 8, said "inner” glass.
- This glass 8 is tempered glass, 4 mm thick, and clear extra-clear type ("Planidur DIAMANT").
- the solar cells 9 are placed between the two glasses, then a polyurethane-based curable polymer 7 is poured into the window according to the teaching of the aforementioned patent EP 0 739 042.
- Each solar cell 9 consists, in known manner, of silicon wafers forming a p / n junction and printed front and rear electrical contacts. Silicon solar cells can be replaced by solar cells using other semiconductors (such as based on chalcopyrite agent of the type for example based on CIS, CdTe, a-Si, GaAs, GaInP).
- the present substrate constitutes an improvement of the inventions described in international patent applications WO0003209 and WOO 194989 which relate to antireflection coatings adapted for optimizing the antireflection effect with non-perpendicular incidence in the visible (in particular aimed at applications for the windshields of vehicles). Characteristics (nature of layers, index, thickness) are indeed close to those previously described.
- the coatings according to the present invention have layers whose thicknesses are more restricted and in particular selected for an advantageous application in the field of solar modules.
- a third thicker layer (generally at least 120 nm and not at most 120 nm) and whose composition, in particular an Sn / Zn ratio of the mixed oxide of zinc and tin, expressed as a percentage atomic, greater than 1, makes it possible to obtain more robust stacks.
- this particular selection it becomes possible to obtain layers that do not delaminate over time, even after undergoing quenching.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Sustainable Development (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Sustainable Energy (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Optics & Photonics (AREA)
- Surface Treatment Of Glass (AREA)
- Laminated Bodies (AREA)
- Surface Treatment Of Optical Elements (AREA)
- Photovoltaic Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0851510A FR2928461B1 (fr) | 2008-03-10 | 2008-03-10 | Substrat transparent comportant un revetement antireflet |
PCT/FR2009/050387 WO2009115757A2 (fr) | 2008-03-10 | 2009-03-10 | Substrat transparent comportant un revetement antireflet |
Publications (1)
Publication Number | Publication Date |
---|---|
EP2263260A2 true EP2263260A2 (fr) | 2010-12-22 |
Family
ID=40329394
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP09722088A Withdrawn EP2263260A2 (fr) | 2008-03-10 | 2009-03-10 | Substrat transparent comportant un revetement antireflet |
Country Status (12)
Country | Link |
---|---|
US (1) | US20110100424A1 (zh) |
EP (1) | EP2263260A2 (zh) |
JP (1) | JP2011513101A (zh) |
KR (1) | KR20100133378A (zh) |
CN (1) | CN102027599A (zh) |
AU (1) | AU2009227775A1 (zh) |
BR (1) | BRPI0909650A2 (zh) |
CA (1) | CA2715714A1 (zh) |
EA (1) | EA017400B1 (zh) |
FR (1) | FR2928461B1 (zh) |
MX (1) | MX2010009557A (zh) |
WO (1) | WO2009115757A2 (zh) |
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KR101223033B1 (ko) * | 2011-07-29 | 2013-01-17 | 엘지전자 주식회사 | 태양 전지 |
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WO2014159015A1 (en) * | 2013-03-12 | 2014-10-02 | Ppg Industries Ohio, Inc. | Photovoltaic cell having an antireflective coating |
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WO2016145574A1 (zh) * | 2015-03-13 | 2016-09-22 | 华为技术有限公司 | 二氧化锆陶瓷外观件及其制造方法 |
KR101795142B1 (ko) * | 2015-07-31 | 2017-11-07 | 현대자동차주식회사 | 눈부심 방지 다층코팅을 구비한 투명기판 |
JP2018536177A (ja) | 2015-09-14 | 2018-12-06 | コーニング インコーポレイテッド | 高光線透過性かつ耐擦傷性反射防止物品 |
CN105585253A (zh) * | 2016-02-02 | 2016-05-18 | 深圳新晶泉技术有限公司 | 减反膜玻璃及其制备方法 |
TWI821234B (zh) | 2018-01-09 | 2023-11-11 | 美商康寧公司 | 具光改變特徵之塗覆製品及用於製造彼等之方法 |
CN108706889A (zh) * | 2018-05-08 | 2018-10-26 | 北京汉能光伏投资有限公司 | 一种镀膜板及其制备方法和一种太阳能组件 |
CN109166931A (zh) * | 2018-07-30 | 2019-01-08 | 南京航空航天大学 | 一种具有太阳能全光谱高效吸收的膜层结构 |
KR102591065B1 (ko) | 2018-08-17 | 2023-10-19 | 코닝 인코포레이티드 | 얇고, 내구성 있는 반사-방지 구조를 갖는 무기산화물 물품 |
CN109887837A (zh) * | 2019-03-05 | 2019-06-14 | 常州工程职业技术学院 | 一种晶硅电池正表面氧化膜的制备方法 |
US11718070B2 (en) * | 2019-05-20 | 2023-08-08 | Pilkington Group Limited | Laminated window assembly |
US20220009824A1 (en) | 2020-07-09 | 2022-01-13 | Corning Incorporated | Anti-glare substrate for a display article including a textured region with primary surface features and secondary surface features imparting a surface roughness that increases surface scattering |
CN112713203A (zh) * | 2021-01-19 | 2021-04-27 | 天合光能股份有限公司 | 一种新型太阳能电池叠层钝化结构 |
CN113502451B (zh) * | 2021-06-18 | 2022-10-25 | 华南理工大学 | 一种基于磁控溅射的GaAs太阳能电池用减反射膜及其制备方法与应用 |
CN117836674A (zh) * | 2021-07-02 | 2024-04-05 | 康宁股份有限公司 | 具有带延伸红外透射的薄、耐久性抗反射涂层的制品 |
CN116705865A (zh) * | 2021-09-10 | 2023-09-05 | 上海晶科绿能企业管理有限公司 | 太阳能电池及其制备方法、光伏组件 |
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DE19848751C1 (de) * | 1998-10-22 | 1999-12-16 | Ver Glaswerke Gmbh | Schichtsystem für transparente Substrate |
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FR2810118B1 (fr) * | 2000-06-07 | 2005-01-21 | Saint Gobain Vitrage | Substrat transparent comportant un revetement antireflet |
CN100575068C (zh) * | 2002-02-11 | 2009-12-30 | Ppg工业俄亥俄公司 | 阳光控制涂层 |
FR2858816B1 (fr) * | 2003-08-13 | 2006-11-17 | Saint Gobain | Substrat transparent comportant un revetement antireflet |
FR2898295B1 (fr) * | 2006-03-10 | 2013-08-09 | Saint Gobain | Substrat transparent antireflet presentant une couleur neutre en reflexion |
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2008
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- 2009-03-10 CN CN2009801084730A patent/CN102027599A/zh active Pending
- 2009-03-10 CA CA2715714A patent/CA2715714A1/fr not_active Abandoned
- 2009-03-10 BR BRPI0909650A patent/BRPI0909650A2/pt not_active IP Right Cessation
- 2009-03-10 KR KR1020107020133A patent/KR20100133378A/ko not_active Application Discontinuation
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- 2009-03-10 EP EP09722088A patent/EP2263260A2/fr not_active Withdrawn
- 2009-03-10 US US12/921,898 patent/US20110100424A1/en not_active Abandoned
- 2009-03-10 MX MX2010009557A patent/MX2010009557A/es active IP Right Grant
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN108828697A (zh) * | 2018-08-30 | 2018-11-16 | 厦门美澜光电科技有限公司 | 一种埃米抗氧化抗反射耐腐蚀镜片及其制备方法 |
Also Published As
Publication number | Publication date |
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KR20100133378A (ko) | 2010-12-21 |
WO2009115757A3 (fr) | 2010-10-07 |
US20110100424A1 (en) | 2011-05-05 |
BRPI0909650A2 (pt) | 2015-09-22 |
EA017400B1 (ru) | 2012-12-28 |
MX2010009557A (es) | 2010-09-24 |
EA201071052A1 (ru) | 2011-02-28 |
FR2928461B1 (fr) | 2011-04-01 |
AU2009227775A1 (en) | 2009-09-24 |
CN102027599A (zh) | 2011-04-20 |
JP2011513101A (ja) | 2011-04-28 |
WO2009115757A2 (fr) | 2009-09-24 |
CA2715714A1 (fr) | 2009-09-24 |
FR2928461A1 (fr) | 2009-09-11 |
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