EP2170012A1 - Dispositif pour contrôler l'activation/désactivation d'un phare de véhicule - Google Patents

Dispositif pour contrôler l'activation/désactivation d'un phare de véhicule Download PDF

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Publication number
EP2170012A1
EP2170012A1 EP09012268A EP09012268A EP2170012A1 EP 2170012 A1 EP2170012 A1 EP 2170012A1 EP 09012268 A EP09012268 A EP 09012268A EP 09012268 A EP09012268 A EP 09012268A EP 2170012 A1 EP2170012 A1 EP 2170012A1
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EP
European Patent Office
Prior art keywords
detection
period
semiconductor light
timing
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP09012268A
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German (de)
English (en)
Other versions
EP2170012B1 (fr
Inventor
Kentarou Murakami
Masayasu Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koito Manufacturing Co Ltd
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Koito Manufacturing Co Ltd
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Application filed by Koito Manufacturing Co Ltd filed Critical Koito Manufacturing Co Ltd
Publication of EP2170012A1 publication Critical patent/EP2170012A1/fr
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Publication of EP2170012B1 publication Critical patent/EP2170012B1/fr
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/40—Details of LED load circuits
    • H05B45/44—Details of LED load circuits with an active control inside an LED matrix
    • H05B45/46—Details of LED load circuits with an active control inside an LED matrix having LEDs disposed in parallel lines
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits

Definitions

  • the present disclosure relates to a device for controlling the turning on and off of a vehicular lamp, and more particularly, to a device for controlling the turning on and off of a vehicular lamp that includes a control part for determining the abnormality of a semiconductor light source.
  • a device for controlling the turning on and off of a vehicular lamp includes a plurality of light source units and a control unit.
  • Each light source unit includes a semiconductor light source, and a current control part that controls drive current for driving the semiconductor light source.
  • the control unit is connected to the plurality of light source units through power supply lines, respectively (see e.g., JP-A-2006-73400 ).
  • the control unit includes a plurality of abnormality detecting parts that detect the abnormalities of the plurality of light source units, and a control part that determines whether an abnormality occurs in each of the light source units.
  • the abnormality detecting parts detect the values of the current or voltages that are supplied through the power supply lines, respectively.
  • the abnormality detecting parts send the detected values of the current or voltages to the control part as detection signals, respectively.
  • Each of the detection signals is input to the control unit at regular detection periods.
  • the respective input detection signals are detected at different detection timings for every detection signal, and the detection timings of the respective detection signals at the respective periods are the same. Whether abnormality occurs in each light source unit is determined on the basis of the corresponding detected detection signal.
  • a detection processing program which is previously stored in a Central Processing Unit (CPU) built in the control part of the control unit, runs, so that the detection of each of the detection signals is performed.
  • CPU Central Processing Unit
  • a detection signal (hereinafter, referred to as a “detection signal A1”) is sent to the control part from a first abnormality detecting part corresponding to one semiconductor light source (hereinafter, referred to as a "first semiconductor light source”).
  • a detection signal (hereinafter, referred to as a “detection signal A2”), which is sent from the first abnormality detecting part at the second or later detection period, includes the noise. Accordingly, a detection signal including noise is repeatedly detected.
  • the detection signal A2 that is affected by noise, it is erroneously determined that an abnormality has occurred in the corresponding semiconductor light source.
  • the semiconductor light source is temporarily turned off, which causes a problem in that safety deteriorates during the driving of a vehicle.
  • a device for controlling turning on and off of a vehicular lamp comprises: a plurality of semiconductor light sources; a plurality of abnormality detecting parts, one abnormality detecting part provided for each semiconductor light source, that detect currents or voltages supplied to the plurality of semiconductor light sources so as to output detection signals used to detect abnormalities of the respective semiconductor light sources; and a control part that detects the respective detection signals at a regular detection period at a different detection timing for each of the detection signals.
  • a time period between a detection timing of the detection signal in one detection period and a detection timing of the detection signal in a next detection period is defined as an acquisition period for the respective semiconductor light sources
  • the acquisition period of at least one semiconductor light source is different from the other acquisition periods for the other semiconductor light sources.
  • detection is performed by the control part so that at least one acquisition period is different from the other acquisition periods for every semiconductor light source.
  • At least one acquisition period is different from the other acquisition periods, it may be possible to prevent the false detection that is caused by the influence of the noise of the detection signal.
  • a plurality of semiconductor light sources is provided, and a signal detected at the last detection timing of an arbitrary detection period is detected at the first detection timing of the next detection period. Therefore, it may be possible to prevent the false detection that is caused by the influence of the noise on each detection signal.
  • FIG. 1 is a view showing an example of a configuration of a device for controlling the turning on and off according to a first exemplary embodiment of the invention.
  • Fig. 2 is a flowchart illustrating operation of the device of Fig. 1 according to the first exemplary embodiment.
  • Fig. 3 is a view showing an example of a detection period and detection timing.
  • a device 1 for controlling the turning on and off includes a control unit 2 and a plurality of light source units 3-1 to 3-3.
  • the control unit 2 is electrically coupled to the light source units 3-1 to 3-3 through power supply lines S1-1 to S1-3.
  • the control unit 2 includes an input circuit 4, abnormality detecting parts 5-1 to 5-3 that detect abnormalities of the LEDs (to be described below) provided in the respective light source units 3-1 to 3-3, a control part 6, and switch parts SW1-1 to SW1-3 that control the turning on and off of the respective light source units 3-1 to 3-3.
  • the input circuit 4 includes a noise filter and a surge protection element, for example, a surge absorber or a power zener diode such as a dump surge.
  • a surge protection element for example, a surge absorber or a power zener diode such as a dump surge.
  • Each of the abnormality detecting parts 5-1 to 5-3 includes a current detecting circuit (not shown) and a voltage detecting circuit (not shown).
  • the switch parts SW1-1 to SW1-3 are electrically coupled to the input sides of the abnormality detecting parts 5-1 to 5-3, respectively.
  • the light source units 3-1 to 3-3 are electrically coupled to the output sides of the abnormality detecting parts 5-1 to 5-3 through the power supply lines S1-1 to S1-3, respectively.
  • the respective current detecting circuits include shunt resistors that are electrically coupled to the switch parts SW1-1 to SW1-3 in series, and PNP transistors of which the bases are electrically coupled to one another. Collectors of the PNP transistors are electrically coupled to the control part 6.
  • the voltage detecting circuit includes two resistors, and a node between the two resistors is electrically coupled to the control part 6.
  • a switch element such as a PMOS transistor is used as each of the switch parts SW1-1 to SW1-3.
  • the respective light source units 3-1 to 3-3 respectively include switching regulators 10-1 to 10-3 that are used as current control parts, control circuits 11-1 to 11-3, resonant circuits (noise filters) 12-1 to 12-3, and LEDs 13-1 to 13-3 that are used as semiconductor light sources.
  • Each of the resonant circuits 12-1 to 12-3 includes at least a coil and a capacitor.
  • the LEDs 13-1 to 13-3 are turned on and off by controlling a DC voltage, which is applied to the light source units 3-1 to 3-3, through the turning on and off of the respective switch parts SW1-1 to SW1-3.
  • the abnormality detecting parts 5-1 to 5-3 detect the values of the current or voltages that are supplied to the LEDs 13-1 to 13-3 through the power supply lines S1-1 to S1-3, respectively.
  • the detected values of the current or voltages are sent to a CPU (not shown), which is built in the control part 6, as detection signals that are used to detect the abnormalities of the LEDs 13-1 to 13-3, respectively.
  • the CPU determines whether abnormalities occur in the LEDs 13-1 to 13-3 on the basis of the detection signals detected by the respective abnormality detecting parts 5-1 to 5-3.
  • the determination of the abnormalities of the LEDs 13-1 to 13-3 which is performed by the CPU, is performed by running a detection processing program that detects a corresponding detection signal, and an abnormality determining program that determines whether an abnormality exists on the basis of each detected detection signal, every detection period.
  • the detection period may be predetermined.
  • the control of the turning on and off of, for example, two LEDs 13-1 and 13-2 will be described below with reference to Figs. 2 and 3 .
  • the switch parts SW1-1 and SW1-2 are turned on and the switch part SW1-3 is turned off.
  • the detection signals output from the abnormality detecting parts 5-1 and 5-2 are referred to as detection signals A and B, respectively.
  • Detection Processing A and “Detection Processing B” denote the detection of detection signals A and B, respectively.
  • the sections which are denoted by "A” and "B” in Fig. 3 , are sections during which the detection processing programs for detecting the detection signals A and B run, respectively.
  • the other sections are sections during which the abnormality determining programs, which determine whether abnormalities occur in the LEDs 13-1 and 13-2, run and sections during which other control programs run.
  • the detection processing program shown in Fig. 2 runs.
  • the detection processing program runs at the n-th or later detection periods (n being an integer of 2 or more).
  • a counter built in the CPU is initialized (Operation S100) and counts up (Operation S101), and it is determined whether a count is larger than 1 (Operation S102).
  • the detection signal A is detected (Operation S103).
  • the detection timing at this time is t1 shown in Fig. 3 .
  • the detection signal B is detected (Operation S104).
  • the detection timing at this time is t2.
  • Operations S103 and S104 are performed at the first detection period and Operations S105 and S 106 are performed at the second detection period. After that, the following processing is repeated even at the n-th or later detection periods.
  • the time between the detection timing of the detection signal A at an arbitrary detection period and the detection timing at the next detection period is referred to as an acquisition period.
  • the time between the detection timing of the detection signal A at the first detection period and the detection timing at the second detection period is an acquisition period Ta1
  • the time between the detection timing of the detection signal A at the second detection period and the detection timing of the detection signal A at the third detection period is an acquisition period Ta2.
  • the acquisition period Ta1 and the acquisition period Ta2 are alternately repeatedly perfromed even at the n-th or later detection periods.
  • the time between the detection timing of the detection signal B at the first detection period and the detection timing of he detection signal B at the second detection period is an acquisition period Tb1
  • the time between the detection timing of the detection signal B at the second detection period and the detection timing of the detection signal B at the third detection period is an acquisition period Tb2.
  • the acquisition period Tb1 and the acquisition period Tb2 are alternately repeatedly performed even at the n-th or later detection periods.
  • the time Ta which is obtained by dividing the time, which is obtained by adding the acquisition period Ta1 to the acquisition period Ta2, by the number of the detection periods, i.e. two, is referred to as the time per detection period.
  • the time Tb which is obtained by dividing the time, which is obtained by adding the acquisition period Tb1 to the acquisition period Tb2, by the number of the detection periods, i.e. two, is also referred to as the time per detection period.
  • the time Tb is equal to the time Ta.
  • the acquisition periods Ta1 and Ta2 or the acquisition periods Tb1 and Tb2, having different lengths, are alternately repeatedly performed as described above. Accordingly, for example, even if the detection signal A of the first detection period includes noise that is substantially synchronized with the length of the detection period, the detection signal A of the second or later detection period is not affected by the noise. Accordingly, it may be possible to prevent the false detection that is caused by the influence of the noise of the detection signal A.
  • FIG. 4 is a flowchart illustrating operation of the device according to a second exemplary embodiment.
  • Fig. 5 is a view showing another example of a detection period and detection timing.
  • the second exemplary embodiment relates to the control of the turning on and off of, for example, five LEDs.
  • detection signals which detect whether abnormalities occur in the five LEDs, are referred to as detection signals A, B, C, D, and E, respectively.
  • detection signals A, B, C, D, and E denote the detection of the detection signals A to E, respectively.
  • the sections, which are denoted by "A” to "E” in Fig. 5 are sections during which the detection processing programs for detecting the detection signals A to E run, respectively.
  • the other sections are sections during which the abnormality determining programs which determine whether abnormalities occur in the LEDs run and sections during which other control programs run.
  • t1 to t5 are the detection timings of the detection signals A to E, respectively.
  • the detection processing program shown in Fig. 4 runs.
  • the detection processing program runs at an n-th detection period (n is an integer of 2 or more).
  • a counter (not shown) built in the CPU is initialized (Operation S200) and counts up (Operation S201), and the present count (Operation S202) is determined. Since the count is 1 (Operation S203) at the first detection period, the detection signals A, B, C, D, and E are detected in this order (Operation S204). The detection timings of the detection signals A to E at this time are t1 to t5 as shown in Fig. 5 , respectively.
  • Operations S203 and S204 are performed at the first detection period
  • Operations S205 and S206 are performed at the second detection period
  • Operations S207 and S208 are performed at the third detection period
  • Operations S209 and S210 are performed at the fourth detection period
  • Operations S211 and 212 are performed at the fifth detection period.
  • the detection signal A which has been detected at the detection timing t1 of the first detection period, is detected at the detection timing t2 of the second detection period. Further, the detection signal E, which has been detected at the detection timing t5 of the first detection period, is detected at the detection timing t1 of the second detection period, and so on.
  • the detection processing program runs, at least one acquisition period is different from the other acquisition periods for each LED as described above.
  • the detection signal A of the first detection period includes noise that is substantially synchronized with the length of the detection period
  • the detection signal A of the second detection period is not affected by the noise. Accordingly, it may be possible to prevent the false detection that is caused by the influence of the noise of the detection signal A.
  • FIG. 6 is a flowchart illustrating the operation of the device for controlling the turning on and off according to a third exemplary embodiment.
  • Fig. 7 is a view showing yet another example of a detection period and detection timing.
  • the third exemplary embodiment is the same as the second exemplary embodiment in that the turning on and off of five LEDs is controlled. However, the third exemplary embodiment is different from the second exemplary embodiment in terms of the detection order of the detection signals A to E after the second detection period.
  • the detection processing program shown in Fig. 6 runs.
  • the detection processing program runs at an n-th detection period (n being an integer of 2 or more).
  • a counter built in the CPU counts up (Operation S301), and the present count is determined (Operation S302). Since the count is 1 (Operation S303) at the first detection period, the detection signals A, B, C, D, and E are detected in this order (Operation S304).
  • the detection timings of the detection signals A to E at this time are t1 to t5 as shown in Fig. 7 , respectively.
  • Operations S303 and S304 are performed at the first detection period
  • Operations S305 and S306 are performed at the second detection period
  • Operations S307 and S308 are performed at the third detection period
  • Operations S309 and S310 are performed at the fourth detection period
  • Operations S311 and S312 are performed at the fifth detection period.
  • the detection where the detection timings of the first to m-th detection signals at one detection period are t1 to tm is repeated n times.
  • the detection signal which has been detected at the detection timing tm of an arbitrary detection period, is detected at the detection timing tm-1 of the next detection period.
  • the detection signal which is detected at the detection timing t1 of the arbitrary detection period, is detected at the detection timing tm of the next detection period.
  • the detection signal E which has been detected at the detection timing t5 of the first detection period, is detected at the detection timing t4 of the second detection period. Further, the detection signal A, which has been detected at the detection timing t1 of the first detection period, is detected at the detection timing t5 of the second detection period.
  • the detection processing program runs, at least one acquisition period is different from the other acquisition periods for each LED.
  • the detection signal A of the first detection period includes noise that is substantially synchronized with the length of the detection period
  • the detection signal A of the second detection period is not affected by the noise. Accordingly, it may be possible to prevent the false detection that is caused by the influence of the noise of the detection signal A.

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  • Lighting Device Outwards From Vehicle And Optical Signal (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
EP09012268A 2008-09-29 2009-09-28 Dispositif pour contrôler l'activation/désactivation d'un phare de véhicule Not-in-force EP2170012B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008251144A JP2010086667A (ja) 2008-09-29 2008-09-29 車両用灯具の点消灯制御装置

Publications (2)

Publication Number Publication Date
EP2170012A1 true EP2170012A1 (fr) 2010-03-31
EP2170012B1 EP2170012B1 (fr) 2011-05-18

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EP09012268A Not-in-force EP2170012B1 (fr) 2008-09-29 2009-09-28 Dispositif pour contrôler l'activation/désactivation d'un phare de véhicule

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EP (1) EP2170012B1 (fr)
JP (1) JP2010086667A (fr)
AT (1) ATE510444T1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12094430B2 (en) 2020-02-27 2024-09-17 Nippon Seiki Co., Ltd. Field-sequential projector device, head-up display device, program, and voltage measurement method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5879132B2 (ja) * 2012-01-12 2016-03-08 シャープ株式会社 発光装置の異常検出装置および発光装置の異常検出方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060055244A1 (en) * 2004-09-03 2006-03-16 Koito Manufacturing Co., Ltd. Lighting control circuit for vehicle lighting equipment
WO2007096868A1 (fr) * 2006-02-23 2007-08-30 Microsemi Corp. - Analog Mixed Signal Group Ltd. Pilote de rétroéclairage à tension contrôlée

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060055244A1 (en) * 2004-09-03 2006-03-16 Koito Manufacturing Co., Ltd. Lighting control circuit for vehicle lighting equipment
JP2006073400A (ja) 2004-09-03 2006-03-16 Koito Mfg Co Ltd 車両用灯具の点灯制御回路
WO2007096868A1 (fr) * 2006-02-23 2007-08-30 Microsemi Corp. - Analog Mixed Signal Group Ltd. Pilote de rétroéclairage à tension contrôlée

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12094430B2 (en) 2020-02-27 2024-09-17 Nippon Seiki Co., Ltd. Field-sequential projector device, head-up display device, program, and voltage measurement method

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Publication number Publication date
JP2010086667A (ja) 2010-04-15
ATE510444T1 (de) 2011-06-15
EP2170012B1 (fr) 2011-05-18

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