EP1751526A1 - Procede et dispositif pour detecter des rayures - Google Patents
Procede et dispositif pour detecter des rayuresInfo
- Publication number
- EP1751526A1 EP1751526A1 EP05707360A EP05707360A EP1751526A1 EP 1751526 A1 EP1751526 A1 EP 1751526A1 EP 05707360 A EP05707360 A EP 05707360A EP 05707360 A EP05707360 A EP 05707360A EP 1751526 A1 EP1751526 A1 EP 1751526A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- light
- scan line
- material surface
- diffuse
- scratches
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000000034 method Methods 0.000 title claims abstract description 12
- 239000000463 material Substances 0.000 claims abstract description 41
- 238000005286 illumination Methods 0.000 claims abstract description 19
- 239000011521 glass Substances 0.000 claims abstract description 12
- 238000001514 detection method Methods 0.000 claims description 12
- 230000007547 defect Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims 1
- 239000012780 transparent material Substances 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000005299 abrasion Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 230000011514 reflex Effects 0.000 description 2
- 238000010845 search algorithm Methods 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 230000004446 light reflex Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
Definitions
- the light bar can simply have an optic through which the light beams are aligned in parallel.
- the optics can be followed by a diffuser, in particular a lenticular, for generating the light which is diffuse in the direction of the scan line.
- a matt screen could also be used to even out the emerging light, but this would result in transmission losses. thats why a lenticular consisting of micro-cylindrical lenses is advantageous, in which the micro-cylindrical lenses distribute the light evenly with high transparency.
- the invention relates to a method for the detection of scratches on a material surface, which can be carried out in particular with the device described above.
- the material surface is illuminated with an illumination device and recorded with a recording device along a predetermined scan line.
- the lighting device is arranged in such a way that when the material surface is free of defects, no light from the lighting device falls into the receiving device.
- the recording device can look into a light trap when the surface of a transparent material is examined.
- scratch sections can also be displayed so that they are recognizable as coherent scratches.
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
L'invention concerne un dispositif et un procédé associé pour détecter des rayures sur la surface d'un matériau (2), notamment du verre, au moyen d'un dispositif d'éclairage (3) et d'un dispositif d'enregistrement (4), lesquels sont mobiles relativement à la surface du matériau (2) et saisissent une ligne de balayage (6). Afin de détecter des rayures avec une grande fiabilité, le dispositif d'éclairage (3) est pourvu d'au moins une bande lumineuse (20), qui génère de la lumière diffuse ou quasi diffuse parallèle en direction de la ligne de balayage (6) et transversalement à celle-ci, et de préférence d'au moins une source lumineuse (16) qui émet de la lumière diffuse ou quasi diffuse transversalement à la ligne de balayage (6).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004026375A DE102004026375B4 (de) | 2004-05-29 | 2004-05-29 | Vorrichtung und Verfahren zur Detektion von Kratzern |
PCT/EP2005/001440 WO2005116616A1 (fr) | 2004-05-29 | 2005-02-12 | Procede et dispositif pour detecter des rayures |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1751526A1 true EP1751526A1 (fr) | 2007-02-14 |
Family
ID=34960486
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP05707360A Withdrawn EP1751526A1 (fr) | 2004-05-29 | 2005-02-12 | Procede et dispositif pour detecter des rayures |
Country Status (10)
Country | Link |
---|---|
US (1) | US7453563B2 (fr) |
EP (1) | EP1751526A1 (fr) |
JP (1) | JP4918032B2 (fr) |
KR (1) | KR100907247B1 (fr) |
CN (1) | CN100590426C (fr) |
CA (1) | CA2567061C (fr) |
DE (1) | DE102004026375B4 (fr) |
IL (1) | IL179385A (fr) |
NO (1) | NO20065925L (fr) |
WO (1) | WO2005116616A1 (fr) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006042117A1 (de) * | 2006-09-07 | 2008-03-27 | Dr. Schenk Gmbh Industriemesstechnik | Vorrichtung zur optischen Detektion eines Oberflächenfehlers eines Substrats |
US8242477B2 (en) | 2007-01-12 | 2012-08-14 | Synergx Technologies Inc. | Bright field and dark field channels, used for automotive glass inspection systems |
US7551274B1 (en) | 2007-02-28 | 2009-06-23 | Lite Sentry Corporation | Defect detection lighting system and methods for large glass sheets |
DE102007037812B4 (de) | 2007-08-10 | 2023-03-16 | Carl Zeiss Optotechnik GmbH | Verfahren und Vorrichtung zur Detektion von Oberflächenfehlern eines Bauteils |
DE102007045323A1 (de) * | 2007-09-21 | 2009-04-09 | Siemens Ag | Anordnung und Verfahren zur optischen Detektion von Unebenheiten einer Glasscheibe |
EP2335047A4 (fr) * | 2008-09-12 | 2012-02-22 | Ceramicam Ltd | Dispositif de balayage de surface |
DE102010021853B4 (de) | 2010-05-28 | 2012-04-26 | Isra Vision Ag | Einrichtung und Verfahren zur optischen Überprüfung eines Gegenstands |
CN101995412B (zh) * | 2010-08-30 | 2012-09-05 | 中国科学院计算技术研究所 | 一种鲁棒的玻璃划伤缺陷检测方法及其装置 |
CN102401802A (zh) * | 2010-09-08 | 2012-04-04 | 上海宝钢工业检测公司 | 轧辊表面磨削质量光检查方法 |
KR20140108712A (ko) * | 2011-12-31 | 2014-09-12 | 쌩-고벵 글래스 프랑스 | 투명 기판 내의 결함을 검출하기 위한 조명 시스템 및 상기 조명 시스템을 포함하는 검출 시스템 |
CN103868929B (zh) * | 2013-11-29 | 2017-01-25 | 中广核研究院有限公司 | 密封面缺陷三维检测方法 |
CN105300884A (zh) * | 2015-11-05 | 2016-02-03 | 苏州威盛视信息科技有限公司 | 一种散射线性光源检测装置 |
CN113376164A (zh) * | 2020-03-10 | 2021-09-10 | 觉芯电子(无锡)有限公司 | 一种表面划痕检测方法及装置 |
JP2022003325A (ja) * | 2020-06-23 | 2022-01-11 | 株式会社小糸製作所 | 表面検査装置および表面検査システム |
CN113916908A (zh) * | 2021-09-03 | 2022-01-11 | 苏州鑫格雅电子科技有限公司 | 一种提高玻璃物性表面处理后用划痕检测装置及其检测方法 |
CN114310395B (zh) * | 2022-01-13 | 2022-12-06 | 广东韶钢松山股份有限公司 | 一种检测金属工件表面划痕深度的装置及方法 |
US11867630B1 (en) | 2022-08-09 | 2024-01-09 | Glasstech, Inc. | Fixture and method for optical alignment in a system for measuring a surface in contoured glass sheets |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6211135A (ja) * | 1985-06-24 | 1987-01-20 | Hitachi Electronics Eng Co Ltd | 透明試料板の表面検査装置 |
DE19838410A1 (de) * | 1997-08-25 | 1999-03-25 | Nippon Maxis Co | Montageplattform für transparentes Substrat, Kratzerinspektionsvorrichtung für transparentes Substrat, Vorrichtung und Verfahren für die Abschrägungsinspektion eines transparenten Substrats und Verfahren zur Inspektion eines transparenten Substrats |
WO2000011400A1 (fr) * | 1998-08-24 | 2000-03-02 | Intelligent Reasoning Systems, Inc. | Systeme de dome lumineux et procede d'illumination d'objets visualises par des systemes d'imagerie |
WO2000026647A1 (fr) * | 1998-10-30 | 2000-05-11 | Image Processing Systems Inc. | Systeme d'inspection de verre |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3814946A (en) * | 1972-12-04 | 1974-06-04 | Asahi Glass Co Ltd | Method of detecting defects in transparent and semitransparent bodies |
DE2261460A1 (de) * | 1972-12-15 | 1974-06-20 | Asahi Glass Co Ltd | Verfahren und vorrichtung zum aufzeigen von optischen, fehlerhaften stellen in einem durchlaessigen oder halbdurchlaessigen koerper |
JPH0640076B2 (ja) * | 1988-10-20 | 1994-05-25 | 三菱レイヨン株式会社 | ライン状光源を用いた欠陥検査装置 |
JPH03210460A (ja) * | 1990-01-13 | 1991-09-13 | Matsushita Electric Works Ltd | 表面検査装置 |
FR2697086B1 (fr) * | 1992-10-20 | 1994-12-09 | Thomson Csf | Procédé et dispositif d'inspection de matériau transparent. |
JP3379805B2 (ja) * | 1993-05-13 | 2003-02-24 | オリンパス光学工業株式会社 | 表面欠陥検査装置 |
JP3659952B2 (ja) * | 1993-05-13 | 2005-06-15 | オリンパス株式会社 | 表面欠陥検査装置 |
JP3170598B2 (ja) * | 1995-03-16 | 2001-05-28 | 株式会社サキコーポレーション | 外観検査装置 |
US5745176A (en) * | 1995-10-12 | 1998-04-28 | Ppt Vision, Inc. | Machine-vision illumination system and method for delineating a lighted volume from an unlighted volume |
JP3726150B2 (ja) * | 1997-06-12 | 2005-12-14 | 株式会社ダイレクトコミュニケーションズ | 微細領域の照明装置 |
JP4189061B2 (ja) * | 1998-07-10 | 2008-12-03 | 株式会社Ihi | コンクリート表面のクラック検出方法 |
JP2001165864A (ja) * | 1999-12-10 | 2001-06-22 | Fuji Photo Film Co Ltd | 表面検査装置及び方法 |
JP2001221745A (ja) * | 2000-02-10 | 2001-08-17 | Nippon Steel Corp | 疵検査用照明装置 |
JP2002014058A (ja) * | 2000-06-30 | 2002-01-18 | Matsushita Electric Ind Co Ltd | 検査方法及び装置 |
JP3580493B2 (ja) * | 2000-08-11 | 2004-10-20 | 株式会社サキコーポレーション | 走査ヘッドおよびそれを利用可能な外観検査方法および装置 |
JP4030716B2 (ja) * | 2000-11-01 | 2008-01-09 | シーケーディ株式会社 | 錠剤の外観検査装置およびptp包装機 |
JP2002214144A (ja) * | 2001-01-15 | 2002-07-31 | Nippon Steel Corp | 疵検査用照明装置 |
JP2004045592A (ja) * | 2002-07-10 | 2004-02-12 | Matsushita Electric Ind Co Ltd | 球状体の観察装置 |
JP4387089B2 (ja) * | 2002-08-30 | 2009-12-16 | 株式会社日立製作所 | 欠陥検査装置および欠陥検査方法 |
JP2004233189A (ja) * | 2003-01-30 | 2004-08-19 | Fujitsu Ltd | 照明装置及び検査装置 |
-
2004
- 2004-05-29 DE DE102004026375A patent/DE102004026375B4/de not_active Expired - Fee Related
-
2005
- 2005-02-12 JP JP2007513700A patent/JP4918032B2/ja not_active Expired - Fee Related
- 2005-02-12 US US11/578,220 patent/US7453563B2/en active Active
- 2005-02-12 WO PCT/EP2005/001440 patent/WO2005116616A1/fr active Application Filing
- 2005-02-12 CN CN200580017521A patent/CN100590426C/zh not_active Expired - Fee Related
- 2005-02-12 KR KR1020067027896A patent/KR100907247B1/ko active IP Right Grant
- 2005-02-12 EP EP05707360A patent/EP1751526A1/fr not_active Withdrawn
- 2005-02-12 CA CA2567061A patent/CA2567061C/fr active Active
-
2006
- 2006-11-16 IL IL179385A patent/IL179385A/en active IP Right Grant
- 2006-12-20 NO NO20065925A patent/NO20065925L/no not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6211135A (ja) * | 1985-06-24 | 1987-01-20 | Hitachi Electronics Eng Co Ltd | 透明試料板の表面検査装置 |
DE19838410A1 (de) * | 1997-08-25 | 1999-03-25 | Nippon Maxis Co | Montageplattform für transparentes Substrat, Kratzerinspektionsvorrichtung für transparentes Substrat, Vorrichtung und Verfahren für die Abschrägungsinspektion eines transparenten Substrats und Verfahren zur Inspektion eines transparenten Substrats |
WO2000011400A1 (fr) * | 1998-08-24 | 2000-03-02 | Intelligent Reasoning Systems, Inc. | Systeme de dome lumineux et procede d'illumination d'objets visualises par des systemes d'imagerie |
WO2000026647A1 (fr) * | 1998-10-30 | 2000-05-11 | Image Processing Systems Inc. | Systeme d'inspection de verre |
Also Published As
Publication number | Publication date |
---|---|
CA2567061A1 (fr) | 2005-12-08 |
CA2567061C (fr) | 2015-06-16 |
KR20070083397A (ko) | 2007-08-24 |
KR100907247B1 (ko) | 2009-07-10 |
JP2008501105A (ja) | 2008-01-17 |
CN1961208A (zh) | 2007-05-09 |
DE102004026375B4 (de) | 2007-03-22 |
JP4918032B2 (ja) | 2012-04-18 |
US20070252996A1 (en) | 2007-11-01 |
CN100590426C (zh) | 2010-02-17 |
US7453563B2 (en) | 2008-11-18 |
WO2005116616A1 (fr) | 2005-12-08 |
DE102004026375A1 (de) | 2005-12-22 |
NO20065925L (no) | 2007-02-23 |
IL179385A0 (en) | 2007-03-08 |
IL179385A (en) | 2011-02-28 |
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Legal Events
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17Q | First examination report despatched |
Effective date: 20120124 |
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
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18W | Application withdrawn |
Effective date: 20180831 |