EP1532225A1 - Ätzpasten für titanoxid-oberflächen - Google Patents
Ätzpasten für titanoxid-oberflächenInfo
- Publication number
- EP1532225A1 EP1532225A1 EP03790830A EP03790830A EP1532225A1 EP 1532225 A1 EP1532225 A1 EP 1532225A1 EP 03790830 A EP03790830 A EP 03790830A EP 03790830 A EP03790830 A EP 03790830A EP 1532225 A1 EP1532225 A1 EP 1532225A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- etching
- acid
- crystalline
- amorphous
- total amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
- C09K13/08—Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/311—Coatings for devices having potential barriers for photovoltaic cells
- H10F77/315—Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- the present invention relates to new etching media in the form of printable and dispensable etching pastes for etching titanium oxide surfaces of the general composition Ti x O y , and the use of these etching pastes.
- glasses are understood to mean materials containing titanium and oxygen which are present in the solid amorphous state without crystallization and which have a high degree of disorder in the microstructure due to the lack of long-range order.
- Layers of such amorphous materials can be produced, for example, by hydrolysis of titanium halides such as TiCl 4 , hydrolysis or pyrolysis of organic titanium precursors such as tetraisopropyl orthotitanate in an APCVD process [1], the low-pressure or plasma-assisted CVD process (LP or PE-CVD) [2].
- APCVD process APCVD
- LP or PE-CVD plasma-assisted CVD process
- Crystalline compounds are the Ti0 2 modifications rutile, anatase and brookite, the TiO modification isotype of the rock salt and the Ti 2 0 3 crystallizing in a corundum lattice structure.
- the invention relates both to the etching of titanium and oxygen-containing crystalline, partially crystalline or amorphous surfaces Ti x O y uniform solid non-porous and porous solids, and to the etching of surfaces of non-porous and porous Ti x O y layers of variable thickness on other substrates (eg ceramics, metal sheets, silicon wafers) by various methods known to the person skilled in the art (for example, CVD, PVD, spray / spin-on / off of Ti-O containing precursors) dire g, were.
- Highly efficient crystalline silicon solar cells with efficiencies> 16% usually have a textured, passivated, anti-reflective front with a two-stage emitter and a passivated back with reflective rear contacts and local back surface field (BSF).
- BSF back surface field
- any structure can be selectively etched in surfaces and layers directly by laser-assisted etching processes [3] or after masking has been carried out wet-chemically [4, 5] or by dry etching processes [6].
- the laser beam scans the entire etching pattern point by point on the surface, which in addition to a high degree of precision also requires considerable adjustment and time.
- optical microlenses arranged in arrays are used to split the laser beam and to produce a row of punctiform openings in the antireflection layer designed in accordance with the array [7].
- the wet chemical and dry etching processes involve material inks. ve, time and costly process steps:
- Photolithography production of a negative or positive of the etching structure (depending on the lacquer), lacquering of the substrate surface (e.g. by spin coating with a liquid photoresist), drying of the photoresist, exposure of the lacquered substrate surface, development, rinsing, drying if necessary
- Immersion process eg wet etching in wet chemical banks: immersing the substrates in the etching bath, etching process, multiple rinsing in H 2 0
- etching solution is applied to a rotating substrate or sprayed onto a substrate, etching process without / with energy input (e.g. photo etching, rinsing, drying)
- Dry etching processes such as Plasma etching in expensive vacuum systems or etching with reactive gases in flow reactors
- etching pastes have proven successful in solar technology for etching silicon nitride or silicon dioxide layers.
- the pastes used are pressure-capable and dispensable, homogeneous particle-free etching pastes with non-Newtonian flow behavior.
- these pastes have not proven to be optimal for the etching of titanium oxide layers in terms of etching rate, selectivity and edge sharpness.
- the object of the present invention is also to provide a simple method for etching titanium oxide layers.
- a printable and dispensable etching medium in the form of an etching paste with non-Newtonian; preferably thixotropic flow behavior for the etching of amorphous, crystalline or partially crystalline surfaces from titanium oxides, which is effective at 15-50 ° C.
- the present invention therefore also relates to an etching medium which contains ammonium hydrogen difluoride as an etching component for oxidic surfaces, ethylene glycol monobutyl ether, triethylene glycol monomethyl ether, propylene carbonate and water as a solvent, formic acid as an organic acid and polyvinylpyrolidone as a thickening agent.
- Amorphous, crystalline or semi-crystalline surfaces made of titanium oxides can be etched according to the invention in a process which is simple to carry out, in that such an etching medium is applied to a surface to be etched and is removed again after an exposure time of 0.1-15 min.
- the etching medium can be applied over the whole area or, according to the etching structure template, only at the locations where an etching is desired and, after the etching has been carried out, rinsed with a solvent or solvent mixture or burned in the oven.
- the etching media can be applied to the surfaces to be etched using screen, stencil, tampon, stamp, ink-jet and manual printing processes and dispenser technology.
- the etching media according to the invention can be used to produce markings and markings and to improve the adhesion of Ti x O y glasses, ceramics and other Ti x O y-based systems with other materials by roughening.
- the etching media according to the invention can advantageously be used for etching amorphous, partially crystalline and crystalline Ti x O y systems in the form of uniform solid non-porous and porous solids or corresponding non-porous and porous layers of variable thickness which have been produced on other substrates.
- the etching pastes according to the invention can be used with particularly good results in the production process of solar cells for removing amorphous, partially crystalline and crystalline Ti x O y layers, for selectively opening anti-reflective layers from Ti x O y systems for producing two-stage selective emitters and / or locally Use p + back surface fields.
- the present invention thus also relates to amorphous, partially crystalline or crystalline surfaces made of titanium oxides which have been treated with the etching media according to the invention having the composition mentioned above.
- the invention relates to printable and dispensable etching pastes which are suitable for etching titanium oxide surfaces, the general formula Ti x O y and their layers of variable thickness, and their use in a - in comparison to the usual wet and dry etching processes - inexpensive, continuous, suitable for high throughputs, as well as technologically simple, printing, dispensing / etching processes.
- the printable and dispensable etching pastes described according to the invention are - compared to liquid etching agents for Ti x O y -based systems such as inorganic mineral acids (hydrofluoric acid, hot concentrated sulfuric acid) and alkaline / basic etching agents (molten alkali metal). droxides and carbonates) - much easier, safer and easier to handle.
- liquid etching agents for Ti x O y -based systems such as inorganic mineral acids (hydrofluoric acid, hot concentrated sulfuric acid) and alkaline / basic etching agents (molten alkali metal). droxides and carbonates) - much easier, safer and easier to handle.
- a technique with a high degree of automation and throughput that is suitable for the transfer of the etching paste to the area to be etched is the printing and dispensing technique.
- the screen, stencil, tampon, stamp, ink-jet printing processes are printing processes known to the person skilled in the art.
- etching structure template Depending on the sieve, template, cliché, stamp design or cartridge and dispenser control, it is possible to selectively apply the printable and dispensable etching pastes described in accordance with the invention according to the etching structure template only at those locations where etching is desired or can also be applied over the entire surface. All masking and lithography steps as described under A) are eliminated by the selective application.
- the etching process takes place with or without additional energy input, e.g. in the form of heat radiation (with IR lamp, up to approx. 300 ° C lamp temperature) instead.
- the printable and dispensable etching pastes are rinsed off from the etched surface with a suitable solvent or burned out.
- the etching depth in Ti x O y -based systems and their layers of variable thickness can be adjusted by varying the following sizes and, in the case of selective structure etching, the edge sharpness of the etching structures can also be set:
- Additives such as defoamers, thixotropic agents, leveling agents, deaerators, adhesion promoters
- the etching time can be between a few seconds and several minutes.
- the printable and dispensable etching pastes are composed of:
- additives such as Defoamers, thixotropic agents, leveling agents, deaerators, adhesion promoters
- etching effect of the printable and dispensable etching pastes described according to the invention on surfaces of Ti x O y -based systems is based on the use of solutions of ammonium hydrogen difluoride with or without the addition of acid. These etching pastes are already at room temperature or become effective through additional energy input (eg heat radiation from an IR lamp, up to approx. 300 ° C lamp temperature).
- the proportion of the etching component used is in a concentration range of 8.5-9.5% by weight based on the total amount of the etching paste.
- Suitable inorganic and / or organic solvents and / or mixtures of these can be:
- ethers such as ethylene glycol monobutyl ether, triethylene glycol monomethyl ether
- carbonic acid esters such as propylene carbonate
- organic acids such as formic acid, acetic acid, lactic acid or similar
- the proportion of solvents is in the range of 52-57% by weight based on the total amount of the etching paste.
- the viscosity of the printable and dispensable etching pastes described according to the invention is achieved by network-forming thickeners which swell in the liquid phase and can be varied depending on the desired field of use.
- the printable and dispensable etching pastes described according to the invention include all etching pastes that do not have a constant viscosity of the shear rate, in particular etching pastes with a shear-thinning effect.
- the network created by thickeners breaks down under shear stress. The network can be restored without a time delay (structurally viscous etching pastes with plastic or pseudoplastic flow behavior) or with a time delay (etching pastes with thixotropic flow behavior).
- the thickeners polyvinyl pyrolidone (PVP) or various celluloses can be used individually and / or in combinations with one another.
- the proportion of the thickeners which is required for the targeted adjustment of the viscosity range and in principle for the formation of a printable and dispensable paste is in the range from 10.5 to 11.5% by weight, based on the total amount of the etching paste.
- Organic and inorganic acids whose pK a value between 0 - 5. li. gene, can be added to the printable and dispensable etching pastes described according to the invention.
- Inorganic mineral acids such as hydrochloric acid, phosphoric acid, sulfuric acid, nitric acid as well as organic acids, especially formic acid, improve the etching effect of the printable and dispensable etching pastes.
- acid is added, the proportion of acid / s is 24-26% by weight, based on the total amount of the etching paste.
- Additives with properties that are advantageous for the desired purpose are defoamers (e.g. TEGO® Foamex N), thixotropic agents (e.g. BYK® 410, Borchigel® Thixo2), leveling agents (e.g. TEGO® Glide ZG 400), deaerators (e.g. TEGO® Airex 985) and adhesion promoters (e.g. Bayowet® FT 929). These can have a positive effect on the printability of the etching paste.
- the proportion of additives is in the range of 0-0.5% by weight based on the total amount of the etching paste.
- Areas of application for the etching pastes according to the invention can be found in the solar cell industry, in particular in the production of photovoltaic components such as solar cells or photodiodes.
- etching pastes which are printable and dispensable according to the invention can in particular be used wherever a full-area and / or structured etching of surfaces of Ti x O y -based systems is desired.
- etching pastes which can be printed according to the invention can be used in particular wherever a full-area and / or structured etching of Ti x O y layers is desired.
- the screen, stencil, tampon, ink-jet printing processes and dispenser technology are suitable techniques for applying the etching pastes in the desired manner.
- a manual order is also possible.
- the solvent mixture and acid are placed in a PE beaker.
- the NH 4 HF 2 solution is then added.
- the thickener is added successively with stirring (approx. 900 rpm). Filling into containers takes place after a short standstill. This service life is necessary so that the bubbles formed in the etching paste can dissolve.
- the etching rates determined on a Ti x O y layer produced with APCVD depend on the salt and acid concentration and are between 20-150 nm / min in the case of a linear application. For example, with a selective application (line width of 250 ⁇ m) of Example 1 at room temperature 70 nm / min, at 50 ° C etching temperature 140 nm / min.
- the etching paste obtained is stable in storage, easy to handle and printable. It can e.g. with water from the printed material or from the paste carrier (sieve, squeegee, stencil, stamp, cliché, cartridge, dispenser etc.) or burned out in the oven.
- the paste carrier sieve, squeegee, stencil, stamp, cliché, cartridge, dispenser etc.
- Example 2 The following etching pastes can be produced analogously to the etching paste described in Example 1: Example 2
- Example 4 24 g triethylene glycol monomethyl ether 50 g 20% NH 4 HF 2 solution 8 g formic acid 1.5 g tylose 4000 (hydroxyethyl cellulose)
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Printing Plates And Materials Therefor (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10239656A DE10239656A1 (de) | 2002-08-26 | 2002-08-26 | Ätzpasten für Titanoxid-Oberflächen |
| DE10239656 | 2002-08-26 | ||
| PCT/EP2003/008395 WO2004020551A1 (de) | 2002-08-26 | 2003-07-30 | Ätzpasten für titanoxid-oberflächen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP1532225A1 true EP1532225A1 (de) | 2005-05-25 |
Family
ID=31502076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP03790830A Withdrawn EP1532225A1 (de) | 2002-08-26 | 2003-07-30 | Ätzpasten für titanoxid-oberflächen |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US20060118759A1 (de) |
| EP (1) | EP1532225A1 (de) |
| JP (1) | JP2005536614A (de) |
| KR (1) | KR20050058410A (de) |
| CN (1) | CN1678714A (de) |
| AU (1) | AU2003255325A1 (de) |
| DE (1) | DE10239656A1 (de) |
| TW (1) | TW200407463A (de) |
| WO (1) | WO2004020551A1 (de) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030148024A1 (en) * | 2001-10-05 | 2003-08-07 | Kodas Toivo T. | Low viscosity precursor compositons and methods for the depositon of conductive electronic features |
| US6951666B2 (en) * | 2001-10-05 | 2005-10-04 | Cabot Corporation | Precursor compositions for the deposition of electrically conductive features |
| US20030108664A1 (en) * | 2001-10-05 | 2003-06-12 | Kodas Toivo T. | Methods and compositions for the formation of recessed electrical features on a substrate |
| JP4763237B2 (ja) * | 2001-10-19 | 2011-08-31 | キャボット コーポレイション | 基板上に導電性電子部品を製造する方法 |
| EP2032291A2 (de) * | 2006-06-19 | 2009-03-11 | Cabot Corporation | Metallhaltige nanopartikel, ihre synthese und verwendung |
| DE102006051735A1 (de) * | 2006-10-30 | 2008-05-08 | Merck Patent Gmbh | Druckfähiges Medium zur Ätzung von oxidischen, transparenten, leitfähigen Schichten |
| US8017505B2 (en) * | 2006-11-30 | 2011-09-13 | Seiko Epson Corporation | Method for manufacturing a semiconductor device |
| ES2556127T3 (es) * | 2007-08-31 | 2016-01-13 | The Procter & Gamble Company | Composición limpiadora de superficies duras ácida líquida |
| MY152748A (en) * | 2008-09-01 | 2014-11-28 | Merck Patent Gmbh | Edge deletion of thin-layer solar modules by etching |
| CN101768445B (zh) * | 2010-01-29 | 2014-02-19 | 东莞市亚马电子有限公司 | 一种环保型氧化物薄膜蚀刻膏 |
| SG186343A1 (en) | 2010-06-14 | 2013-01-30 | Merck Patent Gmbh | Cross-linking and multi-phase etch pastes for high resolution feature patterning |
| EP2651841A1 (de) | 2010-12-15 | 2013-10-23 | Sun Chemical Corporation | Bedruckbare ätzmittelzusammensetzungen zum ätzen von transparenten, leitfähigen folien auf silbernanodrahtbasis |
| CN102363885B (zh) * | 2011-10-12 | 2013-08-21 | 常州大学 | 选择性剥离银镀层及银镀层中元素定量分析的前处理溶液 |
| WO2013169884A1 (en) * | 2012-05-10 | 2013-11-14 | Corning Incorporated | Glass etching media and methods |
| CN107814491A (zh) * | 2017-12-14 | 2018-03-20 | 天津美泰真空技术有限公司 | 一种平板玻璃基板蚀刻液 |
| CN108585530A (zh) * | 2018-04-20 | 2018-09-28 | 广东红日星实业有限公司 | 一种玻璃蚀刻液及其制备方法 |
| CN112430815B (zh) * | 2020-11-23 | 2023-06-30 | 南通卓力达金属科技有限公司 | 一种蚀刻液及其制备方法和应用 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3326803A (en) * | 1964-04-27 | 1967-06-20 | Wyandotte Chemicals Corp | Aluminum brightener composition |
| DD153360A1 (de) * | 1980-10-01 | 1982-01-06 | Heinz Schicht | Mattierungspaste fuer glas |
| US4759823A (en) * | 1987-06-02 | 1988-07-26 | Krysalis Corporation | Method for patterning PLZT thin films |
| JP3337622B2 (ja) * | 1997-07-16 | 2002-10-21 | 松下電器産業株式会社 | 選択的エッチング液及びそのエッチング液を用いた半導体装置の製造方法 |
| US6670281B2 (en) * | 1998-12-30 | 2003-12-30 | Honeywell International Inc. | HF etching and oxide scale removal |
| US6287890B1 (en) * | 1999-10-18 | 2001-09-11 | Thin Film Module, Inc. | Low cost decal material used for packaging |
| DE10101926A1 (de) * | 2000-04-28 | 2001-10-31 | Merck Patent Gmbh | Ätzpasten für anorganische Oberflächen |
| US20030160026A1 (en) * | 2000-04-28 | 2003-08-28 | Sylke Klein | Etching pastes for inorganic surfaces |
| US6777380B2 (en) * | 2000-07-10 | 2004-08-17 | Ekc Technology, Inc. | Compositions for cleaning organic and plasma etched residues for semiconductor devices |
-
2002
- 2002-08-26 DE DE10239656A patent/DE10239656A1/de not_active Withdrawn
-
2003
- 2003-07-30 JP JP2004531831A patent/JP2005536614A/ja active Pending
- 2003-07-30 CN CNA038200813A patent/CN1678714A/zh active Pending
- 2003-07-30 EP EP03790830A patent/EP1532225A1/de not_active Withdrawn
- 2003-07-30 US US10/524,847 patent/US20060118759A1/en not_active Abandoned
- 2003-07-30 KR KR1020057002920A patent/KR20050058410A/ko not_active Withdrawn
- 2003-07-30 AU AU2003255325A patent/AU2003255325A1/en not_active Abandoned
- 2003-07-30 WO PCT/EP2003/008395 patent/WO2004020551A1/de not_active Ceased
- 2003-08-22 TW TW092123222A patent/TW200407463A/zh unknown
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2004020551A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE10239656A1 (de) | 2004-03-11 |
| TW200407463A (en) | 2004-05-16 |
| AU2003255325A1 (en) | 2004-03-19 |
| US20060118759A1 (en) | 2006-06-08 |
| JP2005536614A (ja) | 2005-12-02 |
| WO2004020551A1 (de) | 2004-03-11 |
| KR20050058410A (ko) | 2005-06-16 |
| CN1678714A (zh) | 2005-10-05 |
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| RIN1 | Information on inventor provided before grant (corrected) |
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