EP1506455A2 - Verfahren zur gezielten deformation eines optischen elements - Google Patents
Verfahren zur gezielten deformation eines optischen elementsInfo
- Publication number
- EP1506455A2 EP1506455A2 EP03730047A EP03730047A EP1506455A2 EP 1506455 A2 EP1506455 A2 EP 1506455A2 EP 03730047 A EP03730047 A EP 03730047A EP 03730047 A EP03730047 A EP 03730047A EP 1506455 A2 EP1506455 A2 EP 1506455A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical element
- optical
- manipulators
- image
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 118
- 238000000034 method Methods 0.000 title claims abstract description 37
- 230000008569 process Effects 0.000 claims abstract description 7
- 230000003071 parasitic effect Effects 0.000 claims description 14
- 230000000694 effects Effects 0.000 claims description 9
- 238000004458 analytical method Methods 0.000 claims description 7
- 230000007547 defect Effects 0.000 claims description 7
- 230000008859 change Effects 0.000 claims description 6
- 238000004422 calculation algorithm Methods 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 4
- 230000001939 inductive effect Effects 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 230000004075 alteration Effects 0.000 claims description 2
- 238000012067 mathematical method Methods 0.000 claims description 2
- 238000001393 microlithography Methods 0.000 claims description 2
- 238000004377 microelectronic Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 230000009471 action Effects 0.000 abstract description 3
- 238000012937 correction Methods 0.000 description 9
- 201000009310 astigmatism Diseases 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 206010010071 Coma Diseases 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 241000597800 Gulella radius Species 0.000 description 1
- 230000001154 acute effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000001900 extreme ultraviolet lithography Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003702 image correction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70233—Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0825—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
- G02B27/0068—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration having means for controlling the degree of correction, e.g. using phase modulators, movable elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70258—Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
Definitions
- the invention relates to a method for the targeted deformation of an optical element, in particular a mirror, which is arranged in an optical system, the optical element or a carrier element to which the optical element is applied such that forces acting on the carrier element cause a Cause deformation of the optical element itself, is connected directly to a fixed structure via fastening means or via connecting links.
- the invention also relates to a method for adjusting an optical element according to the preamble of claim 8.
- Image errors for example caused by heat, ambient conditions, position deviations of mirrors, deviation of the shape of the optical surface from the target shape, by layer tensions and tightening torques of screws, deformations induced in frames and by manufacturing errors, impair the image quality of an optical system, e.g. a projection exposure system significant for icrolithography.
- This problem is particularly acute in the EUV area, where manipulators and optics no longer have sufficient decoupling.
- An image error correction for example to compensate for inaccuracies in production of the projection objective, is carried out by manipulating the optical elements using special manipulators or actuators.
- the disadvantage here is that the manipulator movements themselves generally do not act on the optical element without deformation.
- the present invention is therefore based on the object of providing methods of the type mentioned at the outset which solve the disadvantages of the prior art, in particular a targeted correction of image errors in an optical system in a simple and short adjustment process by means of precise manipulations or targeted deformations of the optical elements are made possible, for which purpose the use of special and complex actuators is to be dispensed with.
- This object is achieved by the characterizing features of claim .1. It is also solved by the characterizing features of claim 8.
- the image of the optical system in the image plane or on a substrate table is influenced by the targeted deformation of the optical element and image errors of the optical system in the image plane or on the substrate table by the targeted deformation of the optical element be at least approximately eliminated.
- a mirror is used as the optical element. Both coated and uncoated mirrors can be deformed to correct the image defects of an optical system. Furthermore, a reticle mask can also be used as the optical element.
- optical element can advantageously be adjusted more accurately and quickly, taking into account the additional parasitic effects to be expected from the manipulation itself.
- Figure 1 is a schematic representation of an optical system with six mirrors
- Figure 2 is a plan view of a mirror with a support element
- FIG. 3 shows a side view of a mirror with a connection to a fixed structure in a first embodiment
- FIG. 4a shows a side view of a mirror with a connection to a fixed structure in a second embodiment by means of a manipulator
- FIG. 4b shows a further side view of a mirror with a connection to a fixed structure in a second embodiment by means of a manipulator
- FIG. 5 shows a graphic representation of a possible deformation of the optical surface of a mirror
- FIG. 6a shows a basic illustration of a parasitic movement of a Z manipulator
- FIG. 6b compensation of the parasitic movement of the Z manipulator from FIG. 6a by movement in the x and red x directions
- FIG. 7 shows a basic structure of an EUV projection exposure system with a light source, an illumination system and a projection lens.
- an optical system 1 has six mirrors 2a, 2b, 2c, 2d, 2e, 2f.
- the beam path 3 of the light is sketched in principle.
- Such an optical system 1 can, as shown in FIG. 7, be used as a projection objective 1 in an EUV projection exposure system 11 for microlithography.
- Figure 2 shows the mirror 2d, which is attached to a support member 4.
- the carrier element 4 is direct via screws 5, 5a, 5b, 5c with a fixed structure 6, which is shown in detail in FIGS. 3, 4a and 4b, for example, which can be a fixed part of the projection exposure lens (FIG. 3) or connected via manipulators 10 (FIGS. 4a and 4b).
- a fixed structure 6 which is shown in detail in FIGS. 3, 4a and 4b, for example, which can be a fixed part of the projection exposure lens (FIG. 3) or connected via manipulators 10 (FIGS. 4a and 4b).
- the use of a single-block mirror would be optimal, but it is also possible to glue the mirror 2d to the carrier element 4, even though there is a corresponding damping of the forces.
- the mirror 2d is applied to the carrier element 4 and connected to the fixed structure 6 via screws 5, 5a by means of a socket 7.
- Piezo elements 8 are inserted between metal washers 9 around the screws 5, 5a in such a way that when the length of the piezo elements 8 changes in the direction of the carrier element 4, the pressure exerted thereon increases the holding or clamping force of the screws 5, 5a and thus an entry of forces on the support element 4 with the mirror 2d.
- other means can of course be used instead of piezo elements 8 in another embodiment.
- the electrical connections of the piezo elements 8 are not shown. As a result, the force in the area of the screws 5, 5a which are required anyway for fastening the carrier element 4 with the mirror 2d to the mount 7 or the fixed structure 6 can be carried out in a simple and advantageous manner.
- a manipulator 10 ensures the connection of the carrier element 4 with the mirror 2d to the fixed structure 6.
- Manipulators 10 enable the carrier element 4 to be moved in a translatory and rotary manner with the mirror 2d.
- the manipulator 10 can also be used to exert forces or torques on the screws 5, 5a or on the carrier element 4 and thus on the mirror 2d.
- FIG. 4b shows a side view of the embodiment shown in FIG. 4a.
- a possible form of the deformation of the optically effective surface of the mirror 2d after the input of forces is shown as an example in FIG. 5.
- FIG. 6a shows parasitic movements of a Z manipulator 10a, undesired movements occur in the X direction P x and in the rotX direction P rotx .
- an X manipulator 10b and a rotX manipulator 10c are used to compensate for this parasitic movements P x , P rotx used ( Figure 6b).
- the EUV projection exposure system 11 has a light source 12, an EUV lighting system 13 for illuminating a field in a plane 14 in which a structure-bearing mask is arranged, and the projection lens 1 for imaging the structure-bearing one Mask in the plane 14 on a photosensitive substrate 15.
- EUV lighting system 13 reference is made to EP 1 123 195 AI.
- the main aim of the deformations and movements caused by the input of forces or torques via the screws 5, 5a, 5b, 5c or the manipulators 10 is to compensate for image errors in the optical system 1.
- image errors arise, for example, from manufacturing inaccuracies (fitting errors - deviation of the shape of the optical surface from the desired shape, deformations induced by layer stresses, deformations caused by screw tightening torques), positional deviations, heat and ambient conditions.
- This main aim is to be achieved by applying forces to the mirror 2d or its support element 4 or the mirror 2d or its support element 4 from the manipulators 10 can be moved in all 6 degrees of freedom.
- the resulting deformations of the optical surface of the mirror 2d and any tilting / change in position influence the image of the optical system 1 in the image plane or on a substrate table in order to correct image errors. It is also possible to correct short-term image errors due to heat or temperature changes in the area.
- the deformations induced by the manipulators 10 or the screws 5, 5a, 5b, 5c also represent faults in the optical system 1, but these, so to speak, artificial faults or their strength or amplitude can be controlled. For these reasons, these controlled deformations represent a very effective means of improving the image quality or adapting the properties of the optical system 1.
- these controlled deformations are caused by the tightening torque of the screws 5, 5a, 5b, 5c and by the action of force or Torque action of the manipulators 10, degrees of freedom for correcting the image errors in the optical system 1. It is conceivable to use the described method both for correcting static image errors in the adjustment of the optical system 1 and also for dynamically occurring image errors (for example due to heat, temperature drifts, oa). So-called parasitic effects of the manipulators 10, which occur in addition to the targeted movements, force and torque effects, are still problematic - as already mentioned above. These are both additional induced deformations and movements along other directions. The image errors caused by the parasitic deformation of the surface of the optical elements could even be larger in some cases than the image errors that should actually be corrected by the movement.
- the deformations specifically created on the optical surface are in the nanometer range (for a force of 1 N and moments of 10 Nmm at manipulators 10) and allow almost all types of image error corrections.
- the manipulators 10 or by varying the screws 5 5, 5a, 5b, 5c, which, as shown in FIG. 2, are arranged approximately symmetrically around the mirror 2d on the carrier element 4, e.g. Generate rotationally symmetrical deformations.
- These are e.g. Radius changes in the x or y direction by radial compression of the carrier element 4 with the mirror 2d (for the correction of the image offset, astigmatism).
- the correction of three-ripple can be carried out, for example, by torques introduced on the mirror 2d.
- a symmetrical arrangement is of course not absolutely necessary. With the aid of an asymmetrical arrangement of the manipulators 10 or the screws 5, 5a, 5b, 5c, asymmetrical image errors could also be corrected.
- the following method is used to correct the image errors in the optical system 1: 0
- a first step an analysis is carried out by the screws 5, 5a, 5b, 5c and also by the manipulators 10 in the image plane or on the substrate table of the optical system 1 inducible changes with regard to the image or image errors; 5
- a second step an analysis (by calculation, measurement or simulation) of the current disturbances of the optical system 1 in the image plane; and in a third step the image errors determined in step two are minimized by a linear combination of the inducible image changes determined in step 1 with the aid of suitable mathematical methods (eg SVD or the like), after which the image errors caused by the disturbances of the optical system 1 are corrected by the changes in the forces or torques on the screws 5, 5a, 5b, 5c, the respective intensities or amplitudes of the respective forces or torques to be used being indicated by the coefficients of the linear combination ,
- suitable mathematical methods eg SVD or the like
- the following exemplary embodiment shows that with the aid of the variation of the tightening torque of the screws 5a, 5b, 5c of the mirror 2d on the carrier element 4, image errors of the optical system 1 can be corrected and the optical quality of the system can be improved.
- the change in the tightening torque of the screws 5a, 5b, 5c is equivalent to a change in the pressure on the contact point of the screw 5a, 5b, 5c with the carrier element 4 or with the mirror 2d.
- only three screws 5a, 5b, 5c were used, as it were, as adjustable degrees of freedom; if all screws 5, 5a, 5b, 5c were used, nine degrees of freedom could be available.
- the number of options for reducing image errors naturally increases with the use of as many degrees of freedom as possible.
- DIST. distortion
- BFK Field curvature
- AST astigmatism
- WFF wavefront error
- coma coma
- SPA spherical aberration
- the above method was used as follows in a first exemplary embodiment:
- the tightening torques of the screws 5a, 5b, 5c (see FIG. 2) of the mirror 2d of the optical system 1 were temporarily increased by 500 N each in order to determine the image errors that could be induced thereby.
- the image errors of the optical system 1 were then determined in the second step by induced interference.
- a linear combination of the inducible image changes determined in step one by varying the tightening torque of the screws 5a, 5b, 5c by -500 N minimized the image errors of the optical system 1 determined in step two.
- the factor indicates the reduction of the respective image error through the linear combination.
- the coefficients in front of the reference symbols of the screws 5a, 5b, 5c indicate the linear coefficient which is necessary in order to achieve a minimal image error.
- the image errors are minimized for screw 5a when the tightening torque is increased by 2.9 x 500 N, screw 5b by 3.3 x 500 N and screw 5c by 2.5 x 500 N.
- the linear combination again minimized the error determined in step two using the results from step 1.
- the factor indicates the reduction in the respective image error.
- image error corrections were introduced by manipulators 10 according to FIGS. 4a and 4b.
- Eight degrees of freedom in the form of manipulators 10 were used, which point to the points of the screws 5a, 5b Act. Only eight degrees of freedom were used here, if twelve degrees of freedom per mirror 2a, 2b, 2c, 2d, 2e, 2f are taken as a basis, this results in a total of a maximum of 72 degrees of freedom for the optical system 1, which in principle are used for the correction of image errors Are available, but not all of them can be used due to mechanical or physical reasons.
- the effects of the variation of the force effects of the manipulators on the points formed by the screws 5a and 5b of the mirror 2d on the carrier element 4 were again measured.
- the following forces and torques were applied to the mirror 2f: radial force (RF), radial moment (RM), tangential moment (TM), moment along or in the direction of the optical axis (ZM).
- the current disturbances of the image of the optical system 1 were determined, these were induced by a deformation of the mirror 2d.
- the optimal image corrections were determined based on the manipulations shown in step one. telt.
- Targeted movements of the manipulators can produce approximate radius changes of 5 x 10 ⁇ 8 m ⁇ r / r per mirror 2a, 2b, 2c, 2d, 2e, 2f and thus correct the following image errors in the following orders of magnitude:
- 2d 200 nm DELAY, 300 nm BFK and AST, 2 nm WFF, 1 nm coma,
- the sensitivity matrix A v only takes into account the effects of the additional deformations.
- the correction of these deformation-dependent image errors b v requires several degrees of freedom, which can be achieved either by an additional movement of the same manipulator or by the movement of one or more other manipulators.
- n to a represent the determined factors for describing the relationship between the travel paths to be traversed and the resulting image errors.
- the actual adjustment problem can be solved in a known manner using the SVD method (singular value analysis).
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10222331 | 2002-05-18 | ||
| DE10222331A DE10222331A1 (de) | 2002-05-18 | 2002-05-18 | Verfahren zur gezielten Deformation eines optischen Elements |
| PCT/EP2003/005113 WO2003098350A2 (de) | 2002-05-18 | 2003-05-15 | Verfahren zur gezielten deformation eines optischen elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP1506455A2 true EP1506455A2 (de) | 2005-02-16 |
Family
ID=29285604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP03730047A Withdrawn EP1506455A2 (de) | 2002-05-18 | 2003-05-15 | Verfahren zur gezielten deformation eines optischen elements |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20050280910A1 (de) |
| EP (1) | EP1506455A2 (de) |
| JP (1) | JP2005526388A (de) |
| AU (1) | AU2003240653A1 (de) |
| DE (1) | DE10222331A1 (de) |
| WO (1) | WO2003098350A2 (de) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10220324A1 (de) | 2002-04-29 | 2003-11-13 | Zeiss Carl Smt Ag | Projektionsverfahren mit Pupillenfilterung und Projektionsobjektiv hierfür |
| US7436484B2 (en) | 2004-12-28 | 2008-10-14 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP5022914B2 (ja) * | 2005-01-26 | 2012-09-12 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 光学アセンブリ |
| US7283289B2 (en) * | 2005-07-30 | 2007-10-16 | Hewlett-Packard Development Company, L.P. | Projection system modulator reducing distortion and field curvature effects of projection system lens |
| DE102005044716A1 (de) * | 2005-09-19 | 2007-04-05 | Carl Zeiss Smt Ag | Aktives optisches Element |
| EP2219077A1 (de) | 2009-02-12 | 2010-08-18 | Carl Zeiss SMT AG | Projektionsbelichtungsverfahren, Projektionsbelichtungssystem und Projektionsobjektiv |
| KR101668984B1 (ko) | 2013-09-14 | 2016-10-24 | 칼 짜이스 에스엠티 게엠베하 | 마이크로리소그래피 투영 장치의 동작 방법 |
| JP2017538156A (ja) * | 2014-12-02 | 2017-12-21 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ方法及び装置 |
| US10429749B2 (en) | 2015-09-24 | 2019-10-01 | Asml Netherlands B.V. | Method of reducing effects of reticle heating and/or cooling in a lithographic process |
| DE102015220537A1 (de) * | 2015-10-21 | 2016-10-27 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsanlage mit mindestens einem Manipulator |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60256109A (ja) * | 1984-06-01 | 1985-12-17 | Asahi Optical Co Ltd | レンズ保持枠 |
| US5311362A (en) * | 1989-04-20 | 1994-05-10 | Nikon Corporation | Projection exposure apparatus |
| US5089915A (en) * | 1989-07-25 | 1992-02-18 | Chromex, Inc. | Fabrication of aspheric surfaces through controlled deformation of the figure of spherical reflective surfaces |
| US5923482A (en) * | 1997-03-14 | 1999-07-13 | Waters Investments Limited | Changing astigmatism in an optical system |
| JP4809987B2 (ja) * | 2000-03-30 | 2011-11-09 | キヤノン株式会社 | 光学要素の支持構造、それを用いた露光装置及び半導体デバイスの製造方法 |
| DE10046379A1 (de) * | 2000-09-20 | 2002-03-28 | Zeiss Carl | System zur gezielten Deformation von optischen Elementen |
-
2002
- 2002-05-18 DE DE10222331A patent/DE10222331A1/de not_active Withdrawn
-
2003
- 2003-05-15 EP EP03730047A patent/EP1506455A2/de not_active Withdrawn
- 2003-05-15 AU AU2003240653A patent/AU2003240653A1/en not_active Abandoned
- 2003-05-15 WO PCT/EP2003/005113 patent/WO2003098350A2/de not_active Ceased
- 2003-05-15 JP JP2004505807A patent/JP2005526388A/ja not_active Withdrawn
-
2004
- 2004-11-18 US US10/992,310 patent/US20050280910A1/en not_active Abandoned
Non-Patent Citations (1)
| Title |
|---|
| See references of WO03098350A2 * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE10222331A1 (de) | 2003-11-27 |
| AU2003240653A1 (en) | 2003-12-02 |
| WO2003098350A2 (de) | 2003-11-27 |
| WO2003098350A3 (de) | 2004-11-04 |
| US20050280910A1 (en) | 2005-12-22 |
| JP2005526388A (ja) | 2005-09-02 |
| AU2003240653A8 (en) | 2003-12-02 |
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