EP1011919A4 - Verbesserte polierkissen und darauf bezogene verfahren - Google Patents

Verbesserte polierkissen und darauf bezogene verfahren

Info

Publication number
EP1011919A4
EP1011919A4 EP98938386A EP98938386A EP1011919A4 EP 1011919 A4 EP1011919 A4 EP 1011919A4 EP 98938386 A EP98938386 A EP 98938386A EP 98938386 A EP98938386 A EP 98938386A EP 1011919 A4 EP1011919 A4 EP 1011919A4
Authority
EP
European Patent Office
Prior art keywords
pad
polishing
features
small scale
hydrophilic material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP98938386A
Other languages
English (en)
French (fr)
Other versions
EP1011919A1 (de
EP1011919B1 (de
Inventor
John V H Roberts
Charles W Jenkins
David B James
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm and Haas Electronic Materials CMP Holdings Inc
Original Assignee
Rodel Inc
Rodel Holdings Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rodel Inc, Rodel Holdings Inc filed Critical Rodel Inc
Publication of EP1011919A1 publication Critical patent/EP1011919A1/de
Publication of EP1011919A4 publication Critical patent/EP1011919A4/de
Application granted granted Critical
Publication of EP1011919B1 publication Critical patent/EP1011919B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/22Rubbers synthetic or natural
    • B24D3/26Rubbers synthetic or natural for porous or cellular structure
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28Resins or natural or synthetic macromolecular compounds

Definitions

  • the present invention relates generally to polishing pads useful in the manufacture of semiconductor devices or the like. More particularly, the polishing pads of the present invention comprise an advantageous hydrophilic material having an innovative surface topography which generally improves predictability and polishing performance.
  • Integrated circuit fabrication generally requires polishing of one or more substrates, such as silicon, silicon dioxide, tungsten or aluminum. Such polishing is generally accomplished, using a polishing pad in combination with a polishing fluid.
  • substrates such as silicon, silicon dioxide, tungsten or aluminum.
  • polishing pad in combination with a polishing fluid.
  • the semiconductor industry has a need for precision polishing to narrow tolerances, but unwanted "pad to pad" variations in polishing performance are quite common. A need therefore exists in the semiconductor industry for polishing pads which exhibit more predictable performance during high precision polishing operations.
  • the present invention is directed to thermoformed (or embossed) polishing pads having an innovative polishing surface formed from an innovative hydrophilic material.
  • the pads of the present invention comprise a hydrophilic material having: i. a density greater than 0.5g/cm 3 ; ii. a critical surface tension greater than or equal to 34 milliNewtons per meter; iii. a tensile modulus of .02 to 5 GigaPascals; iv. a ratio of tensile modulus at 30°C to tensile modulus at 60° C of 1.0 to 2.5; v. a hardness of 25 to
  • the polishing layer further comprises a plurality of soft domains and hard domains.
  • the polishing materials of the present invention do not include felt-based polishing pads created by coalescing a polymer onto a fiber substrate, as described in U.S. Pat. No. 4,927,432 to Budinger, et al.
  • the polishing surface has a topography produced by a thermoforming process.
  • the topography consists of large and small features that facilitate the flow of polishing fluid and facilitate smoothing and planarizing.
  • the present invention is directed to polishing pads formed from an innovative hydrophilic polishing material and having an innovative polishing surface. More specifically, the present invention is directed to an improved polishing pad useful in the polishing of substrates, particularly substrates for the manufacture of semiconductor devices or the like.
  • the compositions and methods of the present invention may also be useful in other industries and can be applied to any one of a number of workpiece materials, including but not limited to silicon, silicon dioxide, metal, dielectrics, ceramics and glass. It should be noted that the term "polish” (and any form thereof) as used throughout this application, is intended to include “planarize” (and any corresponding forms).
  • the present invention is innovative because it; 1) recognizes the detrimental effect on precision polishing that occurs from damage caused by the incorporation of surface features into prior art pads; 2) recognizes how the damage is created during the fabrication of polishing pads; 3) teaches how to manufacture pads having low levels of damage; 4) teaches how to manufacture pads with highly reproducible surface features and therefore more predictable pad performance relative to conventional pads produced by cutting or skiving; and 5) teaches novel means to incorporate surface features into a pad during manufacture. None of these aspects of the present invention were heretofore appreciated in the art and are truly a significant contribution to the art of precision polishing.
  • polishing pads of the present invention comprise a highly reproducible and advantageous surface topography with a minimum of surface damage such as indentations and protrusions often created during pad fabrication.
  • Pad fabrication that includes cutting or skiving creates damage that tends to vary from pad to pad.
  • Prior art pad fabrication may include cutting sections of a polymer cake to form pads. As a blade cuts through the cake it typically leaves directional surface damage, including indentations and protrusions from the pad surface. The damage generally varies from pad to pad as the cutting edge dulls.
  • Another step in pad fabrication is the incorporation of channels or other features into the pad surface to facilitate polishing fluid flow.
  • Prior art pads generally have these features cut or machined into the pad. This also generally, tends to leave damage on the pad surface and within the cuts. Other factors, such as temperature, humidity and line speed changes cause variations in the pad surface characteristics. These variations cause performance variations from pad to pad, making it difficult to delineate optimum polishing parameters.
  • the pads of the present invention are created with little or no cutting, machining or similar type fracturing of the polishing surface. Unwanted directional patterns such as those generated by skiving are generally eliminated. Surface features or a portion thereof are applied onto (or into) the pad, also without fracturing of the polishing surface. This eliminates the problems associated with prior art techniques.
  • thermoforming is any process whereby the surface of the pad is heated and is permanently deformed by some means such as pressure or stress. Thermoforming reduces the extent of damage relative to conventional pads. Thermoforming also provides more reproducible features than cutting or machining because of the consistency of the surface of the thermoforming die. Therefore, pads of the present invention exhibit more predictable performance and allow for optimum polishing parameters to be delineated.
  • surface features are incorporated into the surface of the polishing pad, by heating the pad surface until it softens and then forming, or shaping it, utilizing a die and pressure.
  • the features preferably comprise one or more indentations having an average depth and/or width of greater than about 0.05 millimeters and preferably greater than about 0.1 millimeters. These features facilitate the flow of polishing fluid and thereby enhance polishing performance.
  • pads are extruded to create a sheet of material.
  • the material may be formed into a polishing belt by creating a seam from the two ends of the sheet, or in an alternative embodiment, the sheet may be cut to form pads of any shape or size.
  • compression molding is employed hereby a pliable polymer is placed in a die. The polymer is then compressed which causes it to spread throughout the mold. It then solidifies and is released from the mold.
  • the pad material is extruded upon a second solid or semi- solid material, thereby causing the extruded material to be bonded to the second material after it has solidified.
  • the second material can provide reinforcement to the pad so that the solidified, extruded material need not be self-supporting.
  • the second material can provide structural integrity to the pad, thereby providing improved performance, longevity and/or greater flexibility in manufacturing.
  • surface features are embossed with a chilled roller employed to ensure that plastic flow subsequent to embossing is eliminated or significantly reduced. This creates very reproducible embossed indentations, generally reducing pad-to-pad variations typically found in pads produced by many conventional methods. This reproducibility is also a result of the embossing die surface remaining generally the same for each pad produced by it. This translates to more predictable pad performance. Predictability of performance is an important aspect of a precision polishing pad. Pad consistency allows for more exacting standard operating procedures and, therefore, more productive polishing operations.
  • polishing pads of the present invention generally require less reconditioning during use relative to conventional polishing pads. This is yet further evidence that the pads of the present invention are generally superior to conventional pads.
  • Pads of the present invention may be conditioned with an abrasive material.
  • the small scale features may be created by moving the polishing surface against the surface of an abrasive material.
  • the abrasive material is a rotating structure (the abrasive material can be round, square, rectangular, oblong or of any geometric configuration) having a plurality of rigid particles embedded (and preferably, permanently affixed) upon the surface.
  • the movement of the rigid particles against the pad surface causes the pad surface to undergo plastic flow, fragmentation or a combination thereof (at the point of contact with the particles).
  • the abrasive surface need not rotate against the pad surface; the abrasive surface can move against the pad in any one of a number of ways, including vibration, linear movement, random orbitals, rolling or the like.
  • the resulting plastic flow, fragmentation or combination thereof creates small scale features upon the pad's outer surface.
  • the small scale features can comprise an indentation with a protrusion adjacent to at least one side.
  • the protrusions provide at least 0.1 percent of the surface area of the pad's polishing surface, and the indentations have an average depth of less than 50 microns, more preferably less than 10 microns, and the protrusions have an average height of less than 50 microns and more preferably less than 10 microns.
  • such surface modification with an abrasive surface will cause minimal abrasion removal of the polishing surface, but rather merely plows furrows into the pad without causing a substantial amount, if any, of pad material to separate from the polishing surface.
  • abrasion removal of pad material is acceptable, so long as small scale features are produced.
  • the preferred abrasive surface for conditioning is a disk which is preferably metal and which is preferably embedded with diamonds of a size in the range of 1 micron to 0.5 millimeters.
  • the pressure between the conditioning disk and the polishing pad is preferably between 0.1 and about 25 pounds per square inch.
  • the disk's speed of rotation is preferably in the range of 1 to 1000 revolutions per minute.
  • a preferred conditioning disk is a four inch diameter, 100 grit diamond disk, such as the RESITM Disk manufactured by R. E. Science, Inc. Optimum conditioning was attained when the downforce was 10 lb. per square inch, platen speed was 75 rpm, the sweep profile was bell-shaped, the number of conditioning sweeps prior to use was 15 and the number of re-conditioning sweeps between wafers was 15.
  • conditioning can be conducted in the presence of a conditioning fluid, preferably a water based fluid containing abrasive particles.
  • a conditioning fluid preferably a water based fluid containing abrasive particles.
  • all or some of the small scale features may be created during a thermoforming process by use of an innovative thermoforming die.
  • the thermoforming die has a differential affinity for the pad material. Portions of low affinity allow release of the pad with little or no disruption to the surface. Other portions of higher affinity inhibit release of the pad from the die, thereby causing plastic flow or fracturing of the surface in those areas. This process creates the desired small scale features.
  • the differential affinity can be achieved by use of different materials, different die coatings or physical features of the die.
  • thermoforming die is comprised of two or more materials having different affinities to the pad material. Upon release, portions of the pad surface adjacent to areas of high affinity are disrupted causing desirable surface features.
  • the die surface is coated to create areas of low and high affinity.
  • protrusions are incorporated into the die that have a shape that grabs the pad material in certain areas, causing creation of small scale features. In yet another embodiment, this grabbing effect is created by the protrusion material as opposed to the protrusion shape. Formation of surface features during the fabrication of the pad can diminish or even negate the necessity for preconditioning. Such formation also provides more controlled and faithful replication of the small scale features as compared to surface modification by abrasive means.
  • any prepolymer chemistry can be used in accordance with the present invention, including polymer systems other than urethanes, provided the final product exhibits the following properties: a density of greater than 0.5g/cm 3 , more preferably greater than 0.7g/cm 3 and yet more preferably greater than about 0.9g/cm 3 ; a critical surface tension greater than or equal to 34 milliNewtons per meter; a tensile modulus of 0.02 to 5 GigaPascals; a ratio of the tensile modulus at 30° C to the modulus at 60° C in the range of 1.0 to 2.5; hardness of 25 to 80 Shore D; a yield stress of 300 to 6000 psi; a tensile strength of 500 to 15,000 psi, and an elongation to break up to 500%.
  • the pad material is sufficiently hydrophilic to provide a critical surface tension greater than or equal to 34 milliNewtons per meter, more preferably greater than or equal to 37 milliNewtons per meter and most preferably greater than or equal to 40 milliNewtons per meter.
  • Critical surface tension defines the wettability of a solid surface by noting the lowest surface tension a liquid can have and still exhibit a contact angle greater than zero degrees on that solid. Thus, polymers with higher critical surface tensions are more readily wet and are therefore more hydrophilic.
  • Critical surface tension of common polymers are provided below:
  • the pad matrix is derived from at least: 1. an acrylated urethane
  • Preferred pad materials comprise urethane, carbonate, amide, sulfone, vinyl chloride, acrylate, methacrylate, vinyl alcohol, ester or acrylamide moieties.
  • the pad material can be porous or non-porous.
  • the matrix is non-porous; in another embodiment, the matrix is non-porous and free of fiber reinforcement.
  • the pad material may also contain abrasives.
  • the polishing material comprises: 1. a plurality of rigid domains which resists plastic flow during polishing; and 2. a plurality of less rigid domains which is less resistant to plastic flow during polishing.
  • the rigid phase size in any dimension is preferably less than 100 microns, more preferably less than 50 microns, yet more preferably less than 25 microns and most preferably less than 10 microns.
  • the non-rigid phase is also preferably less than 100 microns, more preferably less than 50 microns, more preferably less than 25 microns and most preferably less than 10 microns.
  • Preferred dual phase materials include polyurethane polymers having a soft segment (which provides the non- rigid phase) and a hard segment (which provides the rigid phase). The domains are produced as the material is formed by a phase separation, due to incompatibility between the two (hard and soft) polymer segments.
  • Hard and soft domains within the pad material can also be created: 1. by hard and soft segments along a polymer backbone; 2. by crystalline regions and non-crystalline regions within the pad material; 3. by alloying a hard polymer with a soft polymer; or 4. by combining a polymer with an organic or inorganic filler.
  • the polishing materials of the present invention do not include felt-based polishing pads created by coalescing a polymer onto a fiber substrate, as described in U.S. Pat. No. 4,927,432 to Budinger, et al.
  • the pads of the present invention are preferably used in combination with a polishing fluid, which may include abrasive particles.
  • a polishing fluid which may include abrasive particles.
  • the polishing fluid is placed between the pad's polishing surface and the workpiece to be polished.
  • the surface features allow for improved polishing fluid flow along the interface between the pad and the substrate to be polished and facilitate smoothing and planarizing.
  • the improved flow of polishing fluid and interaction between the pad and workpiece generally allows for more efficient and effective polishing performance.
  • the pads of the present invention are preferably attached to a platen and then brought sufficiently proximate with a workpiece to be polished.
  • Surface irregularities are removed from the workpiece at a rate which is dependent upon a number of parameters, including: pad pressure on the workpiece surface (or vice versa); the speed at which the pad and workpiece move in relation to one another; and the components of the polishing fluid.
  • the pressure between the workpiece and the polishing pad surface is greater than 0.1 kilograms per square meter.
  • the polishing fluid is preferably water based and may or may not require the presence of abrasive particles, depending upon the composition of the pad material.
  • a material comprising abrasive particles may not require abrasive particles in the polishing fluid.
  • Example 1 shows the utility of polishing pads wherein the polishing surfaces are embossed.
  • This example illustrates the utility of an embossed pad of low hardness for polishing a soft metal such as aluminum.
  • thermoplastic polyurethane (MP-1880 from J. P. Stevens) of hardness 85 Shore A was extruded at temperature into a 25 mil sheet of material. This sheet was then subsequently embossed at elevated temperature with a hexagonal pattern such that the surface of the sheet consisted of raised hexagonal areas. In order to facilitate slurry flow across the surface each hexagonal area also contained finer grooves. The hexagonal areas were approximately 5 mm across and separated by 0.5 mm channels. The embossed sheet of polyurethane was laminated to pressure sensitive adhesive and cut into a circle shape, thus enabling it to be used as a polishing pad. The resulting pad was used for aluminum CMP polishing on a Westech 372U polisher.
  • Example 2 This example illustrates the utility of an embossed pad of high hardness for polishing an oxide inner-layer dielectric.
  • thermoplastic polyurethane (Texin 470D from Miles Inc.) of hardness 70 Shore D was extruded at temperature into a 50 mil sheet of material. This sheet was then subsequently embossed at elevated temperature using a similar pattern to that described in Example 1.
  • the embossed sheet of polyurethane was laminated to pressure sensitive adhesive and cut into a circle shape, thus enabling it to be used as a polishing pad.
  • the resulting pad in conjunction with ILD1300 slurry (made by Rodel Inc.), was used for Thermal Oxide CMP polishing on a Westech 372U polisher. Using typical polishing conditions of downforce, carrier and platen speeds, oxide removal rate was greater than 2000A/min and non-uniformity across the wafer less than 10%.

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
EP98938386A 1997-08-06 1998-08-05 Verfahren zum herstellen von einem polierkissen Expired - Lifetime EP1011919B1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US5490697P 1997-08-06 1997-08-06
US54906P 1997-08-06
PCT/US1998/016289 WO1999007515A1 (en) 1997-08-06 1998-08-05 Improved polishing pads and methods relating thereto

Publications (3)

Publication Number Publication Date
EP1011919A1 EP1011919A1 (de) 2000-06-28
EP1011919A4 true EP1011919A4 (de) 2000-11-02
EP1011919B1 EP1011919B1 (de) 2004-10-20

Family

ID=21994291

Family Applications (1)

Application Number Title Priority Date Filing Date
EP98938386A Expired - Lifetime EP1011919B1 (de) 1997-08-06 1998-08-05 Verfahren zum herstellen von einem polierkissen

Country Status (6)

Country Link
EP (1) EP1011919B1 (de)
JP (1) JP2001513450A (de)
KR (1) KR100499601B1 (de)
CN (1) CN1265618A (de)
DE (1) DE69827147T2 (de)
WO (1) WO1999007515A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998045087A1 (en) * 1997-04-04 1998-10-15 Rodel Holdings, Inc. Improved polishing pads and methods relating thereto
JP3918359B2 (ja) * 1998-05-15 2007-05-23 Jsr株式会社 研磨パッド用重合体組成物および研磨パッド
JP4954377B2 (ja) * 2000-02-04 2012-06-13 東洋ゴム工業株式会社 研磨パッド及びその製造方法
DE60109601T2 (de) * 2000-05-27 2006-02-09 Rohm and Haas Electronic Materials CMP Holdings, Inc., Wilmington Rillen-polierkissen zum chemisch-mechanischen planarisieren
US6477926B1 (en) 2000-09-15 2002-11-12 Ppg Industries Ohio, Inc. Polishing pad
US6679769B2 (en) 2000-09-19 2004-01-20 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
SG131737A1 (en) * 2001-03-28 2007-05-28 Disco Corp Polishing tool and polishing method and apparatus using same
US6568997B2 (en) 2001-04-05 2003-05-27 Rodel Holdings, Inc. CMP polishing composition for semiconductor devices containing organic polymer particles
US7214623B2 (en) * 2003-10-13 2007-05-08 International Business Machines Corporation Planarization system and method using a carbonate containing fluid
CN101115779B (zh) 2005-03-08 2012-09-19 东洋橡胶工业株式会社 研磨垫及其制造方法
US8304467B2 (en) 2005-05-17 2012-11-06 Toyo Tire & Rubber Co., Ltd. Polishing pad
JP4884725B2 (ja) 2005-08-30 2012-02-29 東洋ゴム工業株式会社 研磨パッド
JP4898172B2 (ja) * 2005-09-08 2012-03-14 日本ミクロコーティング株式会社 研磨パッド及びその製造方法並びに研磨方法
JP5031236B2 (ja) 2006-01-10 2012-09-19 東洋ゴム工業株式会社 研磨パッド
US20070197132A1 (en) 2006-02-15 2007-08-23 Applied Materials, Inc. Dechuck using subpad with recess
US7963827B2 (en) 2006-07-14 2011-06-21 Saint-Gobain Abrastives, Inc. Backingless abrasive article
CN101489721B (zh) 2006-08-28 2014-06-18 东洋橡胶工业株式会社 抛光垫
JP5008927B2 (ja) 2006-08-31 2012-08-22 東洋ゴム工業株式会社 研磨パッド
JP5078000B2 (ja) 2007-03-28 2012-11-21 東洋ゴム工業株式会社 研磨パッド
JP5314353B2 (ja) * 2008-08-05 2013-10-16 旭ダイヤモンド工業株式会社 超砥粒チップ及び超砥粒工具
US8512427B2 (en) * 2011-09-29 2013-08-20 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Acrylate polyurethane chemical mechanical polishing layer
FR3025741B1 (fr) * 2014-09-15 2019-05-24 Airbus Group Sas Film adhesif multifonctionnel pour la protection de surface de pieces
CN104889874B (zh) * 2015-06-25 2017-08-04 蓝思科技(长沙)有限公司 一种蓝宝石抛光用吸附垫及其制备方法
US10562149B2 (en) 2015-09-25 2020-02-18 Cabot Microelectronics Corporation Polyurethane CMP pads having a high modulus ratio
JP6380333B2 (ja) * 2015-10-30 2018-08-29 株式会社Sumco ウェーハ研磨装置およびこれに用いる研磨ヘッド
CN105538047B (zh) * 2015-12-11 2017-09-22 中国航空工业集团公司北京航空材料研究院 一种航空有机透明制件的表面研抛方法
US20180134918A1 (en) * 2016-11-11 2018-05-17 Jh Rhodes Company, Inc. Soft polymer-based material polishing media
SG11202000259RA (en) * 2017-07-11 2020-02-27 3M Innovative Properties Co Abrasive articles including conformable coatings and polishing system therefrom
CN109794863A (zh) * 2019-03-05 2019-05-24 北京国瑞升精机科技有限公司 一种亲水性抛光膜及其制备方法
CN110744444B (zh) * 2019-10-29 2022-02-15 武汉新芯集成电路制造有限公司 研磨垫及研磨装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994004599A1 (en) * 1992-08-19 1994-03-03 Rodel, Inc. Polymeric substrate with polymeric microelements

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4129457A (en) * 1977-05-23 1978-12-12 International Business Machines Corporation Post-polishing cleaning of semiconductor surfaces
US4581287A (en) * 1984-06-18 1986-04-08 Creative Products Resource Associates, Ltd. Composite reticulated foam-textile cleaning pad
US4787732A (en) * 1986-04-24 1988-11-29 Nick Siviglia Contact lens and method of making same
US5396737B1 (en) * 1989-01-18 1997-12-23 Minnesota Mining & Mfg Compound glazing or polishing pad
US5007128B1 (en) * 1989-01-18 1993-12-07 Minnesota Mining And Manufacturing Company Compounding,glazing or polishing pad
JP2632738B2 (ja) * 1990-04-27 1997-07-23 信越半導体 株式会社 パッキングパッド、および半導体ウェーハの研磨方法
US5157877A (en) * 1990-04-27 1992-10-27 Shin-Etsu Handotai Co., Ltd. Method for preparing a semiconductor wafer
US5704987A (en) * 1996-01-19 1998-01-06 International Business Machines Corporation Process for removing residue from a semiconductor wafer after chemical-mechanical polishing

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994004599A1 (en) * 1992-08-19 1994-03-03 Rodel, Inc. Polymeric substrate with polymeric microelements

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO9907515A1 *

Also Published As

Publication number Publication date
CN1265618A (zh) 2000-09-06
WO1999007515A1 (en) 1999-02-18
KR20010022571A (ko) 2001-03-26
DE69827147T2 (de) 2006-03-02
KR100499601B1 (ko) 2005-07-07
DE69827147D1 (de) 2004-11-25
JP2001513450A (ja) 2001-09-04
EP1011919A1 (de) 2000-06-28
EP1011919B1 (de) 2004-10-20

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