EP0961288A1 - Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen - Google Patents

Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen Download PDF

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Publication number
EP0961288A1
EP0961288A1 EP98830332A EP98830332A EP0961288A1 EP 0961288 A1 EP0961288 A1 EP 0961288A1 EP 98830332 A EP98830332 A EP 98830332A EP 98830332 A EP98830332 A EP 98830332A EP 0961288 A1 EP0961288 A1 EP 0961288A1
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EP
European Patent Office
Prior art keywords
circuit
voltage
node
terminal
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP98830332A
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English (en)
French (fr)
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EP0961288B1 (de
Inventor
Alessandro Manstretta
Andrea Pierin
Guido Torelli
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
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STMicroelectronics SRL
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Publication date
Application filed by STMicroelectronics SRL filed Critical STMicroelectronics SRL
Priority to DE69823982T priority Critical patent/DE69823982D1/de
Priority to EP98830332A priority patent/EP0961288B1/de
Priority to JP14849699A priority patent/JP2000067592A/ja
Priority to US09/321,961 priority patent/US6242971B1/en
Publication of EP0961288A1 publication Critical patent/EP0961288A1/de
Application granted granted Critical
Publication of EP0961288B1 publication Critical patent/EP0961288B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits

Definitions

  • This invention relates to high and low voltage selection circuits for non-volatile memories, and in particular to a high-speed selector switch integrated monolithically to a CMOS technology circuit.
  • the wordline bias voltage during the read phase is a higher value than the supply voltage V dd (being usually of 3V or 5V).
  • V dd supply voltage
  • the range of possible cell currents must be stretched to values of 100 to 120 ⁇ A; such current values can only be obtained, however, by using gate voltages in the 5V to 6V range.
  • the wordline of the selected cell is to be brought to an analog voltage ranging from 0 to V pp for DMA (Direct Memory Access) reading, as the skilled ones in the art will recognize.
  • integrated circuits that are to operate in this way must be provided internally with a selector switch, to each time pick up and distribute an appropriate voltage to the working blocks, under control by suitable control signals.
  • the selector switch is mainly concerned with biasing the wordlines.
  • the selector switch will switch the power supply to the final decoding stages, as shown in Figure 1 of the drawings, between the low voltage LV and the high voltage HV, according to whether the addressed cell is to be read or programmed, respectively.
  • the present invention is aimed to solve this problem by an arrangement which is effective to each time find out the highest voltage present within the circuit and bias the well regions thereto.
  • a first simple circuit diagram of the selector switch is shown in Figure 2 to include just two p-channel transistors (P1 and P2) which are driven by a control signal PH for turning on either transistor to the exclusion of the other.
  • This node evolves, because of the great difference in capacitive load between it and the output terminal OUT (up to approximately 800 pF in a 4096-row memory), toward the voltage HV, upon switching the output node OUT from LV to HV (P1 and P3 being both turned on), at a definitely higher rate than the output node, so that the n-p junction formed of the N region and the well of P3 becomes forward biased.
  • P1 should be turned off first (in order to isolate the node N from HV), and P3 only turned off after a while (i.e., once the voltage at OUT has attained the value of LV). In this way, N and OUT are "equalized" during the transient through the transistor P3, still on.
  • phase edges of the control signals PH and PH' must have an interval (on the order of a few ⁇ s) of non-overlap, thereby introducing unavoidable delay in the overall switching time.
  • the underlying technical problem of this invention is to provide a monolithically integrated selector switch for devices comprising electrically programmable memory cells, which can combine versatility of application with circuit simplicity and operability.
  • a voltage selecting switch combines the construction and operation simplicity of the two-transistor selector switch with the versatility afforded by multi-transistor structures.
  • a structure including but two transistors creates no problems of intermediate node control, as no such nodes exist therein, and is highly advantageous in terms of switching speed of the selector switch.
  • a selector switch comprises two transistors P1 and P2 which are used as pass transistors (and form the HV/LV selector switch proper), and a WBC (Well Biasing Circuit) capable of each time biasing the transistor wells (connected together at the node BODY) to the higher of the two instant voltages HV and LV.
  • WBC Well Biasing Circuit
  • the transistors P1, P2 are made to conduct at non-overlapping phases by control signals PH and /PH.
  • the inventive solution can likewise be applied to two- or multi-level EPROM storage devices.
  • the implementation of the proposed solution for multi-level applications involves, in the program mode, biasing the wells to a systematically varying voltage.
  • the generator of the PH and negated PH phases requires to be supplied each time with the higher of voltages HV and LV and must, therefore, be powered through the node BODY.
  • the transistor P1 can be connected to the line of the voltage HV, while the block WBC is coupled directly to the high-voltage terminal HV'' (whereto P1 is actually also connected indirectly). In two-level applications, HV and HV'' would obviously be the same.
  • the bias circuit block includes a comparator COMP having a non-inverting (+) input terminal, an inverting (-) input terminal, and an output terminal.
  • Third P3 and fourth P4 field-effect transistors have respective control terminals connected to the comparator output terminal, with the control terminal of the third transistor P3 being so connected through an inverter circuit INV.
  • the bias circuit block further includes an input circuit block IN_COMP, whereby the non-inverting input terminal of the comparator is coupled to the first voltage generator HV''.
  • the third P3 and fourth P4 transistors are series connected together through respective first and second terminals, between said input circuit block IN_COMP, also having a supply terminal of the comparator connected thereto, and the second generator of voltage LV, having the inverting (-) input terminal of the comparator connected thereto. These transistors are connected together at the body circuit node BODY.
  • the input circuit block IN_COMP comprises fifth P5 and sixth P6 field-effect transistors of the complementary type which are connected, in series with each other through respective first and second terminals, between a power supply line V dd and a ground GND of the circuit whereto the selector switch is integrated. They have a respective control terminal connected to a linking circuit node in series between the fifth transistor P5 and the sixth P6.
  • Seventh P7 and eighth P8 field-effect transistors of the complementary type are connected, in series with each other through respective first and second terminals, between the voltage generator HV'' and the ground GND. They have respective control terminals connected to the series linking circuit node, and are connected in series with each other at a circuit node which forms an output node of the input circuit block.
  • This output node of the input circuit block is connected directly to the non-inverting (+) terminal of the comparator, and via a voltage step-up interface ELEVATOR, to the supply terminal of the comparator.
  • the construction of the voltage step-up circuit is well within the capabilities of skilled ones in the art.
  • a resistive element R10 is connected between the first voltage generator HV'' and the third transistor P3.
  • the comparator COMP can output a logic zero in the presence of a voltage HV'' ⁇ V dd (as in the read mode), or otherwise, a value same as HV'' (as in the program mode).
  • WBC unavoidably introduces a delay in input-to-output propagation, and accordingly, the activation of the comparator is to take place substantially in advance of the crossing time of HV'' with respect to LV.
  • the block IN_COMP has three outputs, each dedicated to generating a different signal: one output will relate to the comparator input signal (V + ), another to the comparator supply (V alcomp ), and the third to the local HV signal (HV loc ) used to bias the wells.
  • the three signals will be coincident, but become different upon HV'' crossing LV.
  • the non-inverting input V + of the comparator will keep evolving toward the steady-state value of 12V (following HV''), without undergoing any delay within the range of LV (with substantial advantages in terms of unbalance of the comparator inputs, and hence of comparator switching speed).
  • the local HV loc will be slowed down considerably within the very range of the trigger voltage LV, with substantial advantages in terms of limitation to possible well/diffusion forward biasings.
  • HV loc will suffer no voltage drop in its steady state from the current draw of the comparator, since this current is supplied from an independent leg (the leg V alcomp ).
  • the invention has an important advantage in that the switching rate of the selector switch is high (switching time at the node OUT on the order of 100 ns, as against some ⁇ s of conventional designs having 3 or 4 transistors).
  • the high switching rate results in an important reduction of the programming times, in view of the programming involving continual HV/LV and LV/HV switching of the addressed wordline (by the program-and-verify technique).
  • a second, highly conductive path may be added in parallel with a resistor R10 which would be activated with delay from the time when LV is crossed.
  • the transient RC time constant (as set by R10) would be quite unrelated to the impedance (as set by the second path) presented by HV loc in the steady-state condition.

Landscapes

  • Read Only Memory (AREA)
  • Electronic Switches (AREA)
EP98830332A 1998-05-29 1998-05-29 Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen Expired - Lifetime EP0961288B1 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE69823982T DE69823982D1 (de) 1998-05-29 1998-05-29 Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen
EP98830332A EP0961288B1 (de) 1998-05-29 1998-05-29 Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen
JP14849699A JP2000067592A (ja) 1998-05-29 1999-05-27 モノリシックに集積化されたセレクタスイッチおよび電気的にプログラミング可能な不揮発性メモリセル装置
US09/321,961 US6242971B1 (en) 1998-05-29 1999-05-28 Monolithically integrated selector for electrically programmable memory cell devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP98830332A EP0961288B1 (de) 1998-05-29 1998-05-29 Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen

Publications (2)

Publication Number Publication Date
EP0961288A1 true EP0961288A1 (de) 1999-12-01
EP0961288B1 EP0961288B1 (de) 2004-05-19

Family

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EP98830332A Expired - Lifetime EP0961288B1 (de) 1998-05-29 1998-05-29 Monolithisch integrierter Umschalter für elektrisch programmierbare Speicherzellenvorrichtungen

Country Status (4)

Country Link
US (1) US6242971B1 (de)
EP (1) EP0961288B1 (de)
JP (1) JP2000067592A (de)
DE (1) DE69823982D1 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1143454A1 (de) * 2000-03-29 2001-10-10 STMicroelectronics S.r.l. Spannungsauswahlschaltung für nichtflüchtigen Speicher
EP1532634A1 (de) * 2002-06-18 2005-05-25 Atmel Corporation Zeilendecoderschaltung zur verwendung bei der programmierung eines speicherbausteins
EP2091153A1 (de) * 2006-11-08 2009-08-19 Seiko Instruments Inc. Spannungsschaltnetzwerk

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004235499A (ja) * 2003-01-31 2004-08-19 Toshiba Corp 半導体装置
US6847249B1 (en) * 2003-10-09 2005-01-25 Analog Devices, Inc. Highest available voltage selector circuit
KR100564033B1 (ko) * 2003-12-05 2006-03-23 삼성전자주식회사 단일 버퍼 선택 입력 단자를 가지는 반도체 메모리 및반도체 메모리 테스트 방법
JP4143054B2 (ja) * 2004-08-19 2008-09-03 株式会社東芝 電圧生成回路
US7536357B2 (en) * 2007-02-13 2009-05-19 International Business Machines Corporation Methodologies and analytics tools for identifying potential licensee markets
US8129862B2 (en) * 2009-10-23 2012-03-06 Analog Devices, Inc. Scalable highest available voltage selector circuit
TWI459188B (zh) * 2012-03-09 2014-11-01 Phison Electronics Corp 具智慧卡功能的記憶卡及其電源控制方法與電源控制電路

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0322002A2 (de) * 1987-12-01 1989-06-28 STMicroelectronics S.r.l. Speisespannungsschalteranordnung für nichtflüchtige Speicher in MOS-Technologie
EP0499110A2 (de) * 1991-02-13 1992-08-19 Texas Instruments Incorporated Schalter zur Verwendung in einer integrierten Schaltung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4617473A (en) * 1984-01-03 1986-10-14 Intersil, Inc. CMOS backup power switching circuit
JP2733796B2 (ja) * 1990-02-13 1998-03-30 セイコーインスツルメンツ株式会社 スイッチ回路
US5517153A (en) * 1995-06-07 1996-05-14 Sgs-Thomson Microelectronics, Inc. Power supply isolation and switching circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0322002A2 (de) * 1987-12-01 1989-06-28 STMicroelectronics S.r.l. Speisespannungsschalteranordnung für nichtflüchtige Speicher in MOS-Technologie
EP0499110A2 (de) * 1991-02-13 1992-08-19 Texas Instruments Incorporated Schalter zur Verwendung in einer integrierten Schaltung

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1143454A1 (de) * 2000-03-29 2001-10-10 STMicroelectronics S.r.l. Spannungsauswahlschaltung für nichtflüchtigen Speicher
US6476664B2 (en) 2000-03-29 2002-11-05 Stmicroelectronics, S.R.L. Integrated device with voltage selector
EP1532634A1 (de) * 2002-06-18 2005-05-25 Atmel Corporation Zeilendecoderschaltung zur verwendung bei der programmierung eines speicherbausteins
EP1532634A4 (de) * 2002-06-18 2006-05-10 Atmel Corp Zeilendecoderschaltung zur verwendung bei der programmierung eines speicherbausteins
EP2091153A1 (de) * 2006-11-08 2009-08-19 Seiko Instruments Inc. Spannungsschaltnetzwerk
EP2091153A4 (de) * 2006-11-08 2011-06-08 Seiko Instr Inc Spannungsschaltnetzwerk

Also Published As

Publication number Publication date
US6242971B1 (en) 2001-06-05
JP2000067592A (ja) 2000-03-03
EP0961288B1 (de) 2004-05-19
DE69823982D1 (de) 2004-06-24

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