EP0941496A1 - Phasenring zur realisierung eines positiven phasenkontrastes - Google Patents

Phasenring zur realisierung eines positiven phasenkontrastes

Info

Publication number
EP0941496A1
EP0941496A1 EP98948715A EP98948715A EP0941496A1 EP 0941496 A1 EP0941496 A1 EP 0941496A1 EP 98948715 A EP98948715 A EP 98948715A EP 98948715 A EP98948715 A EP 98948715A EP 0941496 A1 EP0941496 A1 EP 0941496A1
Authority
EP
European Patent Office
Prior art keywords
phase
layer
substrate
putty
refractive index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP98948715A
Other languages
German (de)
English (en)
French (fr)
Inventor
Sabine Alt-Nedvidek
Claus Gunkel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Microsystems CMS GmbH
Original Assignee
Leica Microsystems Wetzlar GmbH
Leica Microsystems CMS GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Microsystems Wetzlar GmbH, Leica Microsystems CMS GmbH filed Critical Leica Microsystems Wetzlar GmbH
Publication of EP0941496A1 publication Critical patent/EP0941496A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/14Condensers affording illumination for phase-contrast observation
EP98948715A 1997-09-29 1998-08-03 Phasenring zur realisierung eines positiven phasenkontrastes Withdrawn EP0941496A1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19743027 1997-09-29
DE19743027A DE19743027A1 (de) 1997-09-29 1997-09-29 Phasenring zur Realisierung eines positiven Phasenkontrastes
PCT/DE1998/002228 WO1999017145A1 (de) 1997-09-29 1998-08-03 Phasenring zur realisierung eines positiven phasenkontrastes

Publications (1)

Publication Number Publication Date
EP0941496A1 true EP0941496A1 (de) 1999-09-15

Family

ID=7844023

Family Applications (1)

Application Number Title Priority Date Filing Date
EP98948715A Withdrawn EP0941496A1 (de) 1997-09-29 1998-08-03 Phasenring zur realisierung eines positiven phasenkontrastes

Country Status (6)

Country Link
US (1) US6212009B1 (ja)
EP (1) EP0941496A1 (ja)
JP (1) JP4199833B2 (ja)
CN (2) CN1267761C (ja)
DE (1) DE19743027A1 (ja)
WO (1) WO1999017145A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5285306B2 (ja) * 2008-03-06 2013-09-11 豊 末永 光学部品及び光学部品を用いた位相差顕微鏡
DE102011006018A1 (de) 2011-03-24 2012-09-27 Hilti Aktiengesellschaft Befestigungssystem
WO2019235511A1 (ja) * 2018-06-05 2019-12-12 株式会社ニコン 位相板、対物レンズ、及び観察装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE45855C (de) * TH. OTTO in Schkeuditz Selbstthätiger Kuppelungsapparat mit Daumen für Seilbahnen
US2427689A (en) * 1942-08-28 1947-09-23 American Optical Corp Microscope with special light modifiers
US2616334A (en) 1947-11-25 1952-11-04 Zernike Frits Phase microscopy
AT180745B (de) * 1953-06-17 1955-01-10 Optische Werke C Reichert Ag Kontrastmikroskop
AT187704B (de) * 1953-09-23 1956-11-26 Optische Werke C Reichert Ag Phasenkontrastmikroskop
DE2261780C2 (de) * 1972-12-16 1979-09-20 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Verfahren zur Herstellung von unmittelbar nebeneinander liegenden Strukturen
DE3412958A1 (de) * 1984-04-06 1985-10-17 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Phasengitter
US5144362A (en) * 1990-11-14 1992-09-01 Mitsubishi Denki Kabushiki Kaisha Projection aligner
JP3413238B2 (ja) 1993-03-31 2003-06-03 オリンパス光学工業株式会社 位相制御膜構造体

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO9917145A1 *

Also Published As

Publication number Publication date
CN1179226C (zh) 2004-12-08
JP2001508557A (ja) 2001-06-26
CN1244264A (zh) 2000-02-09
DE19743027A1 (de) 1999-05-12
JP4199833B2 (ja) 2008-12-24
US6212009B1 (en) 2001-04-03
WO1999017145A1 (de) 1999-04-08
CN1534324A (zh) 2004-10-06
CN1267761C (zh) 2006-08-02

Similar Documents

Publication Publication Date Title
DE10301665B4 (de) Optische Vorrichtung mit Sperrschicht, optisches System und Projektor
EP2173571B2 (de) Sicherheitselement
EP1894736B1 (de) Sicherheitselement mit farbkippender Motivschicht und Verfahren zu dessen Herstellung
CH664533A5 (de) Vorrichtung zum authentizitaetsnachweis.
DE3148447A1 (de) Fluessigkristall-anzeigevorrichtung mit zwei verdrillten nematischen schichten
DE2903866A1 (de) Anzeigevorrichtung
DE102006019118A1 (de) Element mit optischer Markierung, Verfahren zur Herstellung und Verwendung
DE102010055688A1 (de) Optisch variables Element
EP0535324A1 (de) Flüssigkristallanzeige
DE2843327A1 (de) Magnetooptische phasenmodulationseinrichtung
DE3040953A1 (de) Bildanzeigeeinrichtung unter verwendung der doppelbrechungseigenschaften von ferroelektrischem keramikmaterial
EP0941496A1 (de) Phasenring zur realisierung eines positiven phasenkontrastes
DE102017105372B4 (de) Transparentes Element mit einer Antireflex-Beschichtung und Verfahren zu dessen Herstellung
DE4307519C2 (de) Spiegel für Synchrotronstrahlung
DE1901977A1 (de) Perot-Fabry-Interferenzfilter
EP3405838B1 (de) Reflektives optisches element und optisches system für die euv-lithographie
DE3435750A1 (de) Verfahren zum erzielen einer konstanten masshaltigkeit von leiterbahnen in integrierten schaltkreisen
DE10319005A1 (de) Reflektives optisches Element, optisches System und EUV-Lithographievorrichtung
EP1119848A2 (de) Optische datenspeicherscheibe
DE112019006494T5 (de) Optischer Modulator
DE3402258A1 (de) Farbenzerlegendes bauelement
DE2445775A1 (de) Polarisator
DE3401914A1 (de) Interferenzfilter mit einem durchlassband
DE2921178A1 (de) Reflexminderungs-schicht auf hochreflektierenden oberflaechen und verfahren zu deren herstellung
DE102017211502A1 (de) Polarisationseinheit mit einer schaltbaren Polarisationsfilterstruktur

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 19990518

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): CH DE FR GB LI

RIN1 Information on inventor provided before grant (corrected)

Inventor name: GUNKEL, CLAUS

Inventor name: ALT-NEDVIDEK, SABINE

17Q First examination report despatched

Effective date: 20040414

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: LEICA MICROSYSTEMS CMS GMBH

17Q First examination report despatched

Effective date: 20040414

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20071026