EP0688879B1 - Hochvakuumanlage - Google Patents

Hochvakuumanlage Download PDF

Info

Publication number
EP0688879B1
EP0688879B1 EP19950107446 EP95107446A EP0688879B1 EP 0688879 B1 EP0688879 B1 EP 0688879B1 EP 19950107446 EP19950107446 EP 19950107446 EP 95107446 A EP95107446 A EP 95107446A EP 0688879 B1 EP0688879 B1 EP 0688879B1
Authority
EP
European Patent Office
Prior art keywords
vacuum
ppm
vacuum apparatus
oxygen
hydrogen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP19950107446
Other languages
English (en)
French (fr)
Other versions
EP0688879A1 (de
Inventor
Norikazu C/O Chuo-Kenkyusho Ishida
Yoshiharu C/O Chuo-Kenkyusho Mae
Kenji C/O Chuo-Kenkyusho Yajima
Takuro Iwamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Publication of EP0688879A1 publication Critical patent/EP0688879A1/de
Application granted granted Critical
Publication of EP0688879B1 publication Critical patent/EP0688879B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper

Definitions

  • the invention relates to the use of a material for the manufacture of high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking.
  • a material for the manufacture of high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking.
  • materials or members for the manufacture of high-vacuum apparatuses have generally been made of high-purity oxygen-free copper which satisfies required excellent electrical conductivity and thermal conductivity and includes low residual gas for preventing reduction in the degree of vacuum in a vacuum apparatus due to residual gas in the material from which the apparatus is made.
  • Such low-residual-gas including high-purity oxygen-free copper is manufactured by degassing normal oxygen-free copper in a reducing or vacuum atmosphere, or by addition of phophorus for deoxygenation.
  • High-purity oxygen-free copper produced in this manner contains 3 ppm or less of oxygen and 0.2 to 0.5 ppm of hydrogen, and vacuum apparatuses made of such high-purity oxygen-fee copper are subjected to dehydrogenation by vacuum annealing, called "baking", before use to guard against reduction in the degree of vacuum in a vacuum apparatus due to an out-gas from the material of the apparatus in a high vacuum.
  • the object of the present invention is the use of high-purity copper alloy material as high vacuum apparatuses which have, after baking, a reduced residual hydrogen content.
  • the inventors have conducted research aimed at producing a material suitable as vacuum apparatus member made of a copper alloy from which hydrogen is easily removed by baking, conventionally high-purity oxygen-free copper, which does not lead to a reduced degree of vacuum due to out-gassing hydrogen when used in a high vacuum, as well as a vacuum apparatus comprising such a vacuum apparatus member, and have found that a copper alloy prepared by adding 1 to 15 ppm of zirconium (Zr) to normal high-purity oxygen-free copper allows easy removal of hydrogen by baking and has a very low level of out-gassing of residual hydrogen from the material in a high vacuum, thus preventing reduction in the degree of vacuum.
  • Zr zirconium
  • the present invention has been accomplished on the basis of this finding, and is based upon the use of a material having a composition of high-purity oxygen-free copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen as high vacuum apparatuses.
  • a Zr content of less than 1 ppm is not preferred since this is insufficient for combining with the residual oxygen in the copper alloy, and conversely a Zr content of more than 15 ppm is not preferred since this reduces the hydrogen-removing effect during baking.
  • the range of the Zr content is therefore established to be 1 to 15 ppm.
  • a more preferred range of the Zr content is 3 to 10 ppm.
  • the oxygen content of the vacuum apparatus member of the present invention is preferably up to 3 ppm.
  • electrolytic copper with a purity of 99.99 wt% or greater is melted in a melting furnace under constant protection with CO + N 2 gas, and the resulting molten metal is poured into a ladle while Zr is added to the flow of the molten metal for adjustement of the components to a prescribed composition.
  • the apparatus shown in the drawings comprises a melting furnace 1, a spout 2, a tundish 3, an addition apparatus 4, a nozzle 5, a mold 6, a covering 7 of graphite particles and a sealing gas source 8 in order to produce an ingot 9.
  • Table 1 below shows the composition of the ingot obtained in this manner as determined by measurement of the Zr and oxygen contents. Specimens of 25 mm length, 25 mm width and 8 mm thickness were cut out from the ingot, and further lathed to prepare vacuum apparatus members of the present invention (1 to 10 of Table 1), vacuum apparatus members for comparison (1 to 3 of Table 1) and vacuum apparatus members of the conventional art (1 to 3 of Table 1), each having a diameter of 20 mm and a thickness of 4 mm.
  • the vacuum apparatus material or members used in the present invention 1 to 10, vacuum apparatus members for comparison 1 to 3 and vacuum apparatus members of the conventional art 1 to 3 were subjected to baking for one hour at a temperature of 500 °C in a vacuum atmosphere of 266 x 10 -5 Pa (2 x 10 -5 Torr) and these baked vacuum apparatus members of the present invention, vacuum apparatus members for comparison and vacuum apparatus members of the conventional art were further charged into an out-gas measuring apparatus to measure the out-gassing rate of hydrogen gas in a high-vacuum atmosphere of 133 x 10 -10 Pa (1 x 10 -10 Torr) while at a temperature of 500 °C.
  • Table 1 The results are given in Table 1.
  • Vacuum apparatus member Composition Out-gassing rate (Torr ⁇ 1/sec. ⁇ cm 2 ) Electrolytic copper purity (%) Zr (ppm) Oxygen (ppm) P (ppm) Present invention 1 99.998 3 1.8 - 1.33 x 10 -11 2 99.998 4 2.0 - 2.17 x 10 -11 3 99.998 3 1.7 - 2.34 x 10 -11 4 99.998 1 0.7 - 6.75 x 10 -12 5 99.998 7 1.8 - 8.98 x 10 -12 6 99.998 12 2.0 - 1.10 x 10 -11 7 99.998 14 2.7 - 2.14 x 10 -11 8 99.998 6 1.2 - 9.77 x 10 -12 9 99.998 11 1.5 - 7.29 x 10 -12 10 99.998 10 2.0 - 1.01 x 10 -11 Comparison 1 99.998 7 5.0 * - 6.21 x 10 -10 2 99.998 0.6 * 1.8 - 2.70 x 10 -10 3 99.998 18 * 1.2
  • use of a material as high vacuum apparatus members according to the present invention offers easier removal of hydrogen during baking than vacuum apparatus members of the ceonventional art, and therefore it produces the excellent industrial effect with superior performance.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manufacture And Refinement Of Metals (AREA)

Claims (3)

  1. Verwendung eines hochreinen Kupfermaterials, das vor dem Glühen (Wärmebehandlung) Wasserstoff, 3 ppm oder weniger Sauerstoff und 1 bis 15 ppm Zr enthält und eine Reinheit von 99,99 Gew.-% oder höher besitzt, als Material für die Herstellung von Hochvakuumapparaturen.
  2. Verwendung des Materials nach Anspruch 1, das 3 bis 10 ppm Zr enthält, für den gleichen Zweck wie in Anspruch 1.
  3. Verwendung des Materials nach Anspruch 1 oder 2 zur Herstellung von Energietransmitterröhren, Außenanoden, die auch als Vakuumbehälter für Mikrowellenröhren dienen, Vakuumbeschichtungsapparaturen, Kathodenzerstäubungsapparaturen und Beschleunigungshohlraumbehältern für Beschleuniger.
EP19950107446 1994-06-20 1995-05-17 Hochvakuumanlage Expired - Lifetime EP0688879B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16059694A JPH083664A (ja) 1994-06-20 1994-06-20 真空装置用部材および真空装置
JP160596/94 1994-06-20

Publications (2)

Publication Number Publication Date
EP0688879A1 EP0688879A1 (de) 1995-12-27
EP0688879B1 true EP0688879B1 (de) 1998-02-04

Family

ID=15718373

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19950107446 Expired - Lifetime EP0688879B1 (de) 1994-06-20 1995-05-17 Hochvakuumanlage

Country Status (3)

Country Link
EP (1) EP0688879B1 (de)
JP (1) JPH083664A (de)
DE (1) DE69501569T2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4943095B2 (ja) * 2006-08-30 2012-05-30 三菱電機株式会社 銅合金及びその製造方法
JP6720087B2 (ja) * 2015-05-21 2020-07-08 Jx金属株式会社 銅合金スパッタリングターゲット及びその製造方法
JP7131376B2 (ja) * 2018-12-27 2022-09-06 三菱マテリアル株式会社 スパッタリングターゲット用銅素材
CN113290217B (zh) * 2021-05-28 2022-09-23 金川集团股份有限公司 高纯无氧铜杆的真空连铸工艺

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2175009B (en) * 1985-03-27 1990-02-07 Mitsubishi Metal Corp Wire for bonding a semiconductor device and process for producing the same
JPS62207834A (ja) * 1986-03-10 1987-09-12 Nippon Mining Co Ltd 高真空雰囲気中で使用する銅材
JPS62243727A (ja) * 1986-04-16 1987-10-24 Hitachi Cable Ltd プリント基板用圧延銅箔
JPS63312934A (ja) * 1987-06-16 1988-12-21 Hitachi Cable Ltd 半導体用リ−ドフレ−ム材
JPS643903A (en) * 1987-06-25 1989-01-09 Furukawa Electric Co Ltd Thin copper wire for electronic devices and manufacture thereof
JP2726939B2 (ja) * 1989-03-06 1998-03-11 日鉱金属 株式会社 加工性,耐熱性の優れた高導電性銅合金

Also Published As

Publication number Publication date
JPH083664A (ja) 1996-01-09
DE69501569D1 (de) 1998-03-12
DE69501569T2 (de) 1998-06-10
EP0688879A1 (de) 1995-12-27

Similar Documents

Publication Publication Date Title
EP2494084B1 (de) Zr-basierte amorphe legierung und herstellungsverfahren dafür
KR930012001B1 (ko) 세라믹 구조체의 제조 방법
KR102556685B1 (ko) 항산화 내열 합금 및 제조 방법
US7153376B2 (en) Yttrium modified amorphous alloy
US3548948A (en) Procedure for chill casting beryllium composite
US3548915A (en) New procedure for chill casting beryllium composite
JPS62280335A (ja) 薄膜形成用高純度チタン材、それを用いて形成されてなるターゲットおよび薄膜、および薄膜形成用高純度チタン材の製造方法
CN112725658B (zh) 一种钛铝合金靶材的制备方法
EP0688879B1 (de) Hochvakuumanlage
CN110983080B (zh) 一种采用真空熔炼设备制备超低硫白铜的方法
CA1175661A (en) Process for aluminothermic production of chromium and chromium alloys low in nitrogen
CN110777263A (zh) 一种低氧纯银熔体材料熔铸制备方法
EP1875978B1 (de) Verfahren zum schmelzen von legierungen mit metall mit hohem dampfdruck
EP3279366B1 (de) Cu-ga-legierung-sputtertarget und verfahren zur herstellung davon
JPH0639635B2 (ja) 銅及び銅合金のエレクトロスラグ再溶融方法
EP0067634B1 (de) Verfahren zum Schmelzen einer Legierung in einem Induktionsofen
CN106893903A (zh) 一种换流站通电流金具用抗氧化铝镁锰铬铪合金材料及其制备方法
CN110923476A (zh) 三步法生产高纯金属钒锭的方法
JPS6345339A (ja) 軟化温度の低い高導電用銅合金
US5006306A (en) Process for alloying uranium and niobium
JP2000100755A (ja) 半導体装置のバリア膜形成用Ti−Al合金スパッタリングターゲット
US3488833A (en) Copper alloys for vacuum switches
US923152A (en) Silicon alloy.
JPH0468370B2 (de)
EP0097906A1 (de) Kontakte für Vakuumschalter

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): DE FR GB

17P Request for examination filed

Effective date: 19960529

17Q First examination report despatched

Effective date: 19961120

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: MITSUBISHI MATERIALS CORPORATION

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB

REF Corresponds to:

Ref document number: 69501569

Country of ref document: DE

Date of ref document: 19980312

ET Fr: translation filed
PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 19980525

Year of fee payment: 4

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 19980713

Year of fee payment: 4

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 19990517

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 19990517

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20000131

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20000301

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST