EP0633602A3 - High sensitivity, wide dynamic range time-of-flight mass spectrometer provided with a gas phase ion source. - Google Patents

High sensitivity, wide dynamic range time-of-flight mass spectrometer provided with a gas phase ion source. Download PDF

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Publication number
EP0633602A3
EP0633602A3 EP94110273A EP94110273A EP0633602A3 EP 0633602 A3 EP0633602 A3 EP 0633602A3 EP 94110273 A EP94110273 A EP 94110273A EP 94110273 A EP94110273 A EP 94110273A EP 0633602 A3 EP0633602 A3 EP 0633602A3
Authority
EP
European Patent Office
Prior art keywords
mass spectrometer
ion source
flight mass
dynamic range
high sensitivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP94110273A
Other languages
German (de)
French (fr)
Other versions
EP0633602A2 (en
EP0633602B1 (en
Inventor
Thorald Dr Bergmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of EP0633602A2 publication Critical patent/EP0633602A2/en
Publication of EP0633602A3 publication Critical patent/EP0633602A3/en
Application granted granted Critical
Publication of EP0633602B1 publication Critical patent/EP0633602B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/403—Time-of-flight spectrometers characterised by the acceleration optics and/or the extraction fields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

A high particle density in the exhaust volume of a gas-phase ion source and simultaneously a very low particle density in the flight path of the time-of-flight mass spectrometer results in a high sensitivity while simultaneously maintaining a large dynamic range of the intensity display. In order to achieve this, it is necessary to divide the time-of-flight mass spectrometer into two or more regions of different pressure, the different regions being separated by a gas-flow impedance. A maximum particle density in the exhaust volume while simultaneously maintaining a minimum particle density in the flight path can be obtained by integrating the gas-flow impedances (3, 6) directly into the electrodes (1, 2) of the ion source. <IMAGE>
EP94110273A 1993-07-02 1994-07-01 High sensitivity, wide dynamic range time-of-flight mass spectrometer provided with a gas phase ion source Expired - Lifetime EP0633602B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4322102A DE4322102C2 (en) 1993-07-02 1993-07-02 Time-of-flight mass spectrometer with gas phase ion source
DE4322102 1993-07-02

Publications (3)

Publication Number Publication Date
EP0633602A2 EP0633602A2 (en) 1995-01-11
EP0633602A3 true EP0633602A3 (en) 1995-11-22
EP0633602B1 EP0633602B1 (en) 2000-05-24

Family

ID=6491836

Family Applications (1)

Application Number Title Priority Date Filing Date
EP94110273A Expired - Lifetime EP0633602B1 (en) 1993-07-02 1994-07-01 High sensitivity, wide dynamic range time-of-flight mass spectrometer provided with a gas phase ion source

Country Status (7)

Country Link
US (1) US5496998A (en)
EP (1) EP0633602B1 (en)
JP (1) JPH07176291A (en)
AT (1) ATE193398T1 (en)
AU (2) AU685112B2 (en)
CA (1) CA2127183A1 (en)
DE (2) DE4322102C2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4441972C2 (en) * 1994-11-25 1996-12-05 Deutsche Forsch Luft Raumfahrt Method and device for the detection of sample molecules in a carrier gas
US5744797A (en) * 1995-11-22 1998-04-28 Bruker Analytical Instruments, Inc. Split-field interface
DE19655304B8 (en) * 1995-12-14 2007-05-31 Micromass Uk Ltd. Mass spectrometers and methods for mass spectrometry
GB9525507D0 (en) * 1995-12-14 1996-02-14 Fisons Plc Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
DE19631161A1 (en) * 1996-08-01 1998-02-12 Bergmann Thorald Time of flight time of flight mass spectrometer with differentially pumped collision cell
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
US6675660B1 (en) * 2002-07-31 2004-01-13 Sandia National Laboratories Composition pulse time-of-flight mass flow sensor
WO2005088294A1 (en) * 2004-03-16 2005-09-22 Kabushiki Kaisha Idx Technologies Laser ionization mass spectroscope
DE102005005333B4 (en) * 2005-01-28 2008-07-31 Deutsches Zentrum für Luft- und Raumfahrt e.V. Method for sampling and aerosol analysis

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0231131A2 (en) * 1986-01-31 1987-08-05 Vg Instruments Group Limited Inductively coupled plasma mass spectrometer
WO1989012313A1 (en) * 1988-06-03 1989-12-14 Vg Instruments Group Limited High resolution plasma mass spectrometer
WO1992004728A1 (en) * 1990-08-29 1992-03-19 Brigham Young University Apparatus and methods for trace component analysis
EP0503748A2 (en) * 1991-03-13 1992-09-16 Bruker-Franzen Analytik GmbH Method for generating ions, specially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally instable, non-volatile, large molecules

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3577165A (en) * 1968-05-31 1971-05-04 Perkin Elmer Corp Linear scanning arrangement for a cycloidal mass spectrometer
US3553452A (en) * 1969-02-17 1971-01-05 Us Air Force Time-of-flight mass spectrometer operative at elevated ion source pressures
GB1302193A (en) * 1969-04-18 1973-01-04
JPH03503815A (en) * 1987-12-24 1991-08-22 ユニサーチ　リミテッド mass spectrometer
JP2913924B2 (en) * 1991-09-12 1999-06-28 株式会社日立製作所 Method and apparatus for mass spectrometry

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0231131A2 (en) * 1986-01-31 1987-08-05 Vg Instruments Group Limited Inductively coupled plasma mass spectrometer
WO1989012313A1 (en) * 1988-06-03 1989-12-14 Vg Instruments Group Limited High resolution plasma mass spectrometer
WO1992004728A1 (en) * 1990-08-29 1992-03-19 Brigham Young University Apparatus and methods for trace component analysis
EP0503748A2 (en) * 1991-03-13 1992-09-16 Bruker-Franzen Analytik GmbH Method for generating ions, specially for a mass spectrometer such as a time-of-flight mass spectrometer, from thermally instable, non-volatile, large molecules

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CHUNG HANG SIN ET AL: "ATMOSHERIC PRESSURE IONIZATION TIME-OF-FLIGHT MASS SPECTROMETRY WITH A SUPERSONIC ION BEAM", ANALYTICAL CHEMISTRY, vol. 63, no. 24, 15 December 1991 (1991-12-15), COLUMBUS US, pages 2897 - 2900, XP000242058, DOI: doi:10.1021/ac00024a018 *

Also Published As

Publication number Publication date
JPH07176291A (en) 1995-07-14
AU6615294A (en) 1995-01-12
DE4322102C2 (en) 1995-08-17
US5496998A (en) 1996-03-05
DE59409371D1 (en) 2000-06-29
DE4322102A1 (en) 1995-01-19
ATE193398T1 (en) 2000-06-15
EP0633602A2 (en) 1995-01-11
AU685113B2 (en) 1998-01-15
AU685112B2 (en) 1998-01-15
EP0633602B1 (en) 2000-05-24
CA2127183A1 (en) 1995-01-03
AU6615394A (en) 1995-01-12

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