EP0633602A3 - Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle, mit hoher Empfindlichkeit und grossem dynamischem Bereich. - Google Patents
Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle, mit hoher Empfindlichkeit und grossem dynamischem Bereich. Download PDFInfo
- Publication number
- EP0633602A3 EP0633602A3 EP94110273A EP94110273A EP0633602A3 EP 0633602 A3 EP0633602 A3 EP 0633602A3 EP 94110273 A EP94110273 A EP 94110273A EP 94110273 A EP94110273 A EP 94110273A EP 0633602 A3 EP0633602 A3 EP 0633602A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- mass spectrometer
- ion source
- flight mass
- dynamic range
- high sensitivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/403—Time-of-flight spectrometers characterised by the acceleration optics and/or the extraction fields
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4322102 | 1993-07-02 | ||
DE4322102A DE4322102C2 (de) | 1993-07-02 | 1993-07-02 | Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0633602A2 EP0633602A2 (de) | 1995-01-11 |
EP0633602A3 true EP0633602A3 (de) | 1995-11-22 |
EP0633602B1 EP0633602B1 (de) | 2000-05-24 |
Family
ID=6491836
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP94110273A Expired - Lifetime EP0633602B1 (de) | 1993-07-02 | 1994-07-01 | Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle, mit hoher Empfindlichkeit und grossem dynamischem Bereich |
Country Status (7)
Country | Link |
---|---|
US (1) | US5496998A (de) |
EP (1) | EP0633602B1 (de) |
JP (1) | JPH07176291A (de) |
AT (1) | ATE193398T1 (de) |
AU (2) | AU685113B2 (de) |
CA (1) | CA2127183A1 (de) |
DE (2) | DE4322102C2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4441972C2 (de) * | 1994-11-25 | 1996-12-05 | Deutsche Forsch Luft Raumfahrt | Verfahren und Vorrichtung zum Nachweis von Probenmolekülen in einem Trägergas |
US5744797A (en) * | 1995-11-22 | 1998-04-28 | Bruker Analytical Instruments, Inc. | Split-field interface |
GB9525507D0 (en) * | 1995-12-14 | 1996-02-14 | Fisons Plc | Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source |
DE19655304B8 (de) * | 1995-12-14 | 2007-05-31 | Micromass Uk Ltd. | Massenspektrometer und Verfahren zur Massenspektrometrie |
DE19631161A1 (de) * | 1996-08-01 | 1998-02-12 | Bergmann Thorald | Flugzeit-Flugzeit-Massenspektrometer mit differentiell gepumpter Kollisionszelle |
GB0021902D0 (en) * | 2000-09-06 | 2000-10-25 | Kratos Analytical Ltd | Ion optics system for TOF mass spectrometer |
US6675660B1 (en) * | 2002-07-31 | 2004-01-13 | Sandia National Laboratories | Composition pulse time-of-flight mass flow sensor |
EP1726945A4 (de) * | 2004-03-16 | 2008-07-16 | Idx Technologies Kk | Laserionisationsmassenspektroskop |
DE102005005333B4 (de) * | 2005-01-28 | 2008-07-31 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Verfahren zur Probennahme und Aerosol-Analyse |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0231131A2 (de) * | 1986-01-31 | 1987-08-05 | Vg Instruments Group Limited | Massenspektrometer mit induktiv angekoppelter Plasmaquelle |
WO1989012313A1 (en) * | 1988-06-03 | 1989-12-14 | Vg Instruments Group Limited | High resolution plasma mass spectrometer |
WO1992004728A1 (en) * | 1990-08-29 | 1992-03-19 | Brigham Young University | Apparatus and methods for trace component analysis |
EP0503748A2 (de) * | 1991-03-13 | 1992-09-16 | Bruker-Franzen Analytik GmbH | Verfahren zum Erzeugen von Ionen, insbesondere für ein Massenspektrometer, wie Flugzeitmassenspektrometer, aus thermisch instabilen, nichtflüchtigen grossen Molekülen |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3577165A (en) * | 1968-05-31 | 1971-05-04 | Perkin Elmer Corp | Linear scanning arrangement for a cycloidal mass spectrometer |
US3553452A (en) * | 1969-02-17 | 1971-01-05 | Us Air Force | Time-of-flight mass spectrometer operative at elevated ion source pressures |
GB1302193A (de) * | 1969-04-18 | 1973-01-04 | ||
WO1989006044A1 (en) * | 1987-12-24 | 1989-06-29 | Unisearch Limited | Mass spectrometer |
JP2913924B2 (ja) * | 1991-09-12 | 1999-06-28 | 株式会社日立製作所 | 質量分析の方法および装置 |
-
1993
- 1993-07-02 DE DE4322102A patent/DE4322102C2/de not_active Expired - Fee Related
-
1994
- 1994-06-30 CA CA002127183A patent/CA2127183A1/en not_active Abandoned
- 1994-07-01 EP EP94110273A patent/EP0633602B1/de not_active Expired - Lifetime
- 1994-07-01 AT AT94110273T patent/ATE193398T1/de active
- 1994-07-01 US US08/269,544 patent/US5496998A/en not_active Expired - Fee Related
- 1994-07-01 AU AU66153/94A patent/AU685113B2/en not_active Ceased
- 1994-07-01 DE DE59409371T patent/DE59409371D1/de not_active Expired - Fee Related
- 1994-07-01 AU AU66152/94A patent/AU685112B2/en not_active Ceased
- 1994-07-04 JP JP6152489A patent/JPH07176291A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0231131A2 (de) * | 1986-01-31 | 1987-08-05 | Vg Instruments Group Limited | Massenspektrometer mit induktiv angekoppelter Plasmaquelle |
WO1989012313A1 (en) * | 1988-06-03 | 1989-12-14 | Vg Instruments Group Limited | High resolution plasma mass spectrometer |
WO1992004728A1 (en) * | 1990-08-29 | 1992-03-19 | Brigham Young University | Apparatus and methods for trace component analysis |
EP0503748A2 (de) * | 1991-03-13 | 1992-09-16 | Bruker-Franzen Analytik GmbH | Verfahren zum Erzeugen von Ionen, insbesondere für ein Massenspektrometer, wie Flugzeitmassenspektrometer, aus thermisch instabilen, nichtflüchtigen grossen Molekülen |
Non-Patent Citations (1)
Title |
---|
CHUNG HANG SIN ET AL: "ATMOSHERIC PRESSURE IONIZATION TIME-OF-FLIGHT MASS SPECTROMETRY WITH A SUPERSONIC ION BEAM", ANALYTICAL CHEMISTRY, vol. 63, no. 24, 15 December 1991 (1991-12-15), COLUMBUS US, pages 2897 - 2900, XP000242058, DOI: doi:10.1021/ac00024a018 * |
Also Published As
Publication number | Publication date |
---|---|
AU685113B2 (en) | 1998-01-15 |
JPH07176291A (ja) | 1995-07-14 |
DE59409371D1 (de) | 2000-06-29 |
EP0633602B1 (de) | 2000-05-24 |
CA2127183A1 (en) | 1995-01-03 |
EP0633602A2 (de) | 1995-01-11 |
DE4322102C2 (de) | 1995-08-17 |
US5496998A (en) | 1996-03-05 |
DE4322102A1 (de) | 1995-01-19 |
AU6615394A (en) | 1995-01-12 |
AU6615294A (en) | 1995-01-12 |
AU685112B2 (en) | 1998-01-15 |
ATE193398T1 (de) | 2000-06-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5291494A (en) | Mass spectrometer | |
CA2103038A1 (en) | Tandem time-of-flight mass spectrometer | |
CA2124344A1 (en) | Corona discharge ionisation source | |
CA2081572A1 (en) | High Voltage Spark Excitation and Ionization Detector System | |
WO1995012894A3 (en) | Micromachined mass spectrometer | |
EP0633602A3 (de) | Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle, mit hoher Empfindlichkeit und grossem dynamischem Bereich. | |
CA2162856A1 (en) | Method of plasma mass analysis with reduced space charge effects | |
CA2382823A1 (en) | Rapid response mass spectrometer system | |
CA2045484A1 (en) | Plasma mass spectrometer having a hollow tapered member | |
Belchamber et al. | Correlation study of internal standardization in inductively coupled plasma atomic emission spectrometry | |
SE332458B (de) | ||
AU3638093A (en) | Sample nebulizer and evaporation chamber for ICP and MIP emission or mass spectrometry and spectrometers comprising the same | |
AU7092396A (en) | Ion source for generating ions of a gas or vapour | |
WO2004025249A3 (en) | Spectrograph time of flight system for low energy neutral particles | |
JPS55133740A (en) | Secondary ion mass spectrometer | |
FR2408972A1 (fr) | Source de plasma a flux eleve, et notamment accelerateur de particules comportant un telle source | |
JPS5732637A (en) | Dry etching apparatus | |
Okochi | Ultra-Trace Element in Determination of Metals--State of the Art | |
JPS5326189A (en) | Ion source | |
JPS571952A (en) | Particle densitometer | |
VONDADELSZEN et al. | UV sustained glow discharge opening switch(Final Report, 1 Jul. 1982- 31 Dec. 1984) | |
JPS5740932A (en) | Device for plasma processing | |
JPS563958A (en) | Fan type electrode device | |
JPS5687671A (en) | Dry etching apparatus | |
JPS52122283A (en) | Sputtering device having bias mechanism |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AT BE CH DE DK FR GB LI NL SE |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AT BE CH DE DK FR GB LI NL SE |
|
17P | Request for examination filed |
Effective date: 19960319 |
|
17Q | First examination report despatched |
Effective date: 19970321 |
|
GRAG | Despatch of communication of intention to grant |
Free format text: ORIGINAL CODE: EPIDOS AGRA |
|
GRAG | Despatch of communication of intention to grant |
Free format text: ORIGINAL CODE: EPIDOS AGRA |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): AT BE CH DE DK FR GB LI NL SE |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20000524 |
|
REF | Corresponds to: |
Ref document number: 193398 Country of ref document: AT Date of ref document: 20000615 Kind code of ref document: T |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
REF | Corresponds to: |
Ref document number: 59409371 Country of ref document: DE Date of ref document: 20000629 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: AT Payment date: 20000714 Year of fee payment: 7 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: BE Payment date: 20000717 Year of fee payment: 7 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: NV Representative=s name: RITSCHER & SEIFERT |
|
ET | Fr: translation filed | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20000824 Ref country code: DK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20000824 |
|
GBT | Gb: translation of ep patent filed (gb section 77(6)(a)/1977) |
Effective date: 20000818 |
|
NLV1 | Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act | ||
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
26N | No opposition filed | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: AT Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20010701 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: CH Payment date: 20010726 Year of fee payment: 8 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20010731 |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: IF02 |
|
BERE | Be: lapsed |
Owner name: BERGMANN THORALD Effective date: 20010731 Owner name: BERGMANN EVA MARTINA Effective date: 20010731 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20020703 Year of fee payment: 9 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20020730 Year of fee payment: 9 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20020731 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20020731 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20020731 Year of fee payment: 9 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20030701 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040203 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20030701 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040331 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST |