EP0393205A4 - Pattern generator - Google Patents

Pattern generator

Info

Publication number
EP0393205A4
EP0393205A4 EP19890911094 EP89911094A EP0393205A4 EP 0393205 A4 EP0393205 A4 EP 0393205A4 EP 19890911094 EP19890911094 EP 19890911094 EP 89911094 A EP89911094 A EP 89911094A EP 0393205 A4 EP0393205 A4 EP 0393205A4
Authority
EP
European Patent Office
Prior art keywords
pattern generator
generator
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP19890911094
Other languages
English (en)
Other versions
EP0393205A1 (de
Inventor
Kazuhiko Satoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of EP0393205A1 publication Critical patent/EP0393205A1/de
Publication of EP0393205A4 publication Critical patent/EP0393205A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
EP19890911094 1988-10-11 1989-10-09 Pattern generator Withdrawn EP0393205A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1988133189U JPH0255331U (de) 1988-10-11 1988-10-11
JP133189/88U 1988-10-11

Publications (2)

Publication Number Publication Date
EP0393205A1 EP0393205A1 (de) 1990-10-24
EP0393205A4 true EP0393205A4 (en) 1992-07-01

Family

ID=15098781

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19890911094 Withdrawn EP0393205A4 (en) 1988-10-11 1989-10-09 Pattern generator

Country Status (4)

Country Link
US (1) US5127010A (de)
EP (1) EP0393205A4 (de)
JP (1) JPH0255331U (de)
WO (1) WO1990004228A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0429673B1 (de) * 1989-06-16 1996-11-13 Advantest Corporation Prüfmustergenerator
JPH0758320B2 (ja) * 1990-06-18 1995-06-21 株式会社東芝 情報処理装置の自己診断回路および自己診断方法
JPH05119122A (ja) * 1991-10-25 1993-05-18 Fujitsu Ltd スキヤン回路のテストパターン生成方法
US5357523A (en) * 1991-12-18 1994-10-18 International Business Machines Corporation Memory testing system with algorithmic test data generation
JP3150611B2 (ja) * 1996-03-29 2001-03-26 株式会社東芝 パターン発生装置
US6061815A (en) * 1996-12-09 2000-05-09 Schlumberger Technologies, Inc. Programming utility register to generate addresses in algorithmic pattern generator
US5883905A (en) * 1997-02-18 1999-03-16 Schlumberger Technologies, Inc. Pattern generator with extended register programming
US7839146B2 (en) * 2003-06-24 2010-11-23 Medtronic, Inc. Magnetic resonance imaging interference immune device
US7523367B2 (en) * 2005-06-30 2009-04-21 International Business Machines Corporation Method and apparatus to verify non-deterministic results in an efficient random manner
US8607111B2 (en) * 2006-08-30 2013-12-10 Micron Technology, Inc. Sub-instruction repeats for algorithmic pattern generators
US8006114B2 (en) * 2007-03-09 2011-08-23 Analog Devices, Inc. Software programmable timing architecture

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4293950A (en) * 1978-04-03 1981-10-06 Nippon Telegraph And Telephone Public Corporation Test pattern generating apparatus
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
JPS58774A (ja) * 1981-06-25 1983-01-05 Toshiba Corp 高速パタ−ン発生器
JPS5854774A (ja) * 1981-09-28 1983-03-31 Ricoh Co Ltd フアクシミリ−ｏｃｒシステムにおける受信認知方法
JPS5994086A (ja) * 1982-11-19 1984-05-30 Advantest Corp 論理回路試験装置
JPS5997065A (ja) * 1982-11-25 1984-06-04 Advantest Corp 論理回路試験装置の試験パタ−ン発生装置
US4635096A (en) * 1983-04-08 1987-01-06 Sony Corporation Test signal generator
JPH0641966B2 (ja) * 1984-02-15 1994-06-01 株式会社アドバンテスト パタ−ン発生装置
JPS60247942A (ja) * 1984-05-23 1985-12-07 Advantest Corp 半導体メモリ試験装置
JPS61201343A (ja) * 1985-03-05 1986-09-06 Hitachi Ltd テストパタ−ン発生制御方法及びその装置
DE3515802A1 (de) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Anordnung zur schnellen erzeugung von grossen pruefdatenwortmengen in einer pruefeinrichtung
US4696005A (en) * 1985-06-03 1987-09-22 International Business Machines Corporation Apparatus for reducing test data storage requirements for high speed VLSI circuit testing
JPS62118272A (ja) * 1985-11-19 1987-05-29 Ando Electric Co Ltd パタ−ン発生装置
JPS62140299A (ja) * 1985-12-13 1987-06-23 Advantest Corp パタ−ン発生装置
US4718065A (en) * 1986-03-31 1988-01-05 Tandem Computers Incorporated In-line scan control apparatus for data processor testing

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EP0 160 789 (TAKEDA RIKEN KOGYO K.K.) *

Also Published As

Publication number Publication date
US5127010A (en) 1992-06-30
EP0393205A1 (de) 1990-10-24
JPH0255331U (de) 1990-04-20
WO1990004228A1 (en) 1990-04-19

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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18D Application deemed to be withdrawn

Effective date: 19940607