EP0165144B1 - Elektronisches Chronometersystem mit hoher Auflösung - Google Patents

Elektronisches Chronometersystem mit hoher Auflösung Download PDF

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Publication number
EP0165144B1
EP0165144B1 EP85400976A EP85400976A EP0165144B1 EP 0165144 B1 EP0165144 B1 EP 0165144B1 EP 85400976 A EP85400976 A EP 85400976A EP 85400976 A EP85400976 A EP 85400976A EP 0165144 B1 EP0165144 B1 EP 0165144B1
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EP
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Prior art keywords
duration
values
clock
instant
parameter
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Expired
Application number
EP85400976A
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English (en)
French (fr)
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EP0165144A1 (de
Inventor
Gilbert Charles
Assad Assadoullah
Jean-Marie Bernet
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Thales SA
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Thomson CSF SA
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    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/10—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time

Definitions

  • the present invention relates to an electronic chronometry system including the time measurement method and the corresponding chronometer apparatus.
  • the invention is addressed, in this technical field, to measurement systems having a high resolution, better than 100 picoseconds.
  • Electronic chronometers for non-repetitive phenomena which measure the time interval between a start pulse and a stop pulse, very often proceed by counting the periods of a clock with a well-known frequency.
  • this time base circuit is formed using a quartz oscillator of high stability compensated in temperature.
  • the time T to be measured is then equal to N ⁇ T at ⁇ ⁇ / 2 meadows, T being the clock period, N being the number present in the counter which is started by the start pulse and stopped by the pulse stop.
  • the stop pulse causes this linear variation to block.
  • the quantification of time can be done in several possible ways.
  • One of the most used is the multiplication of time t by a factor K, the time Kt being measured by the method already mentioned of clock counting.
  • the starting pulse causes the start of a voltage in the form of a ramp V (t) which is stopped, after a time T1, by the first clock pulse which follows.
  • the phase between the starting pulse and the clock being a priori arbitrary, the time T1 will be between 0 and ⁇ .
  • the voltage V (T1) is then converted into the form of an expanded time as indicated above and is digitized (time expansion and analog-digital conversion).
  • the stop pulse in turn causes a ramp to start; like the start pulse, it is stopped by the first clock pulse which follows after a time T2.
  • the stop pulse only blocks the main counter after taking this same clock pulse into account.
  • the counter indicates N.
  • the measured time is then given by: ⁇ being the clock period, T1 * and T2 * then being the quantized values of T1 and T2.
  • the quantum is equal to ⁇ / K.
  • the ramp stops are produced on the second pulse following (or on the second edge of given direction, said active edge, by a clock signal formed by pulses of a certain width). Verniers work in a time domain between ⁇ and 2 ⁇ . The principle of measurement remains unchanged.
  • documents EP-A-0 092 676 and FR-A-2 437 648 disclose high-precision electronic chronometry systems comprising fine counting means, coarse counting means and means for compensating the measured.
  • An object of the invention is to overcome the above limitations by using a method which makes it possible to compensate for the defects resulting from the non-linearity of the ramp and, in so doing, to correct the measurement; the resolution reached is less than 50 picoseconds.
  • an electronic chronometry system using, for measuring a duration T between a start instant t1 and a stop instant t2, fine counting means of the vernier ramp type with time expansion to measure the duration T1 between the instant t1 and a subsequent edge of a clock signal and the duration T2 between the instant t2 and a subsequent edge of the clock, and large counting means for counting the number N of clock periods of duration between said edges.
  • the system is characterized in that it further comprises means for compensating for errors of non-linearity of the ramp in order to determine, in magnitude and in sign, whatever the duration T to be measured, the corrective term to be applied for obtaining the corrected measurement, said corrective term being determined during a calibration cycle as a function of the parameters T1 and (T1-T2) measured;
  • these compensation means include a management and calculation processor circuit and a programmable delay generator circuit for producing local signals at variable start and stop times to vary the parameters T1 and possibly T1-T2 so as to traverse a clock period, these compensation means producing a local starting signal whose phase with respect to the reference clock signal is random.
  • the main means constituting the system appear on the functional diagram of FIG. 1. They already include, according to the aforementioned prior art, a time base circuit called clock 1 to produce a clock signal SH, a main counter circuit 2 for perform the rough measurement, and ramp circuits 3 and 4 to perform the fine measurement.
  • a time base circuit called clock 1 to produce a clock signal SH
  • main counter circuit 2 for perform the rough measurement
  • ramp circuits 3 and 4 to perform the fine measurement.
  • FIG. 2 shows the corresponding essential signals: a clock signal SH of determined stable period ⁇ , the pulses S1 and S2 which represent the start and stop times of the duration T to be measured, and the ramps SR1 and SR2 of duration T1 and T2 respectively.
  • the duration T is given by N ⁇ + (T1-T2), N being the large counting and Tt and T2 the fine values obtained with temporal expansion.
  • the falling edge of the clock SH is the active edge.
  • the values N, T1 and T2 obtained are transmitted in digital form to a management and calculation processor 5 which may consist of a microprocessor with associated read and write memories and interface circuits.
  • Circuit 5 calculates the time phase AT of duration T with respect to the clock signal, this phase being constituted by the value (T1-T2) representing the fine measurement which exceeds the integer number N of clock periods.
  • the other circuits shown are constituted by a programmable delay generator 6 and a communication circuit 7 and are used to perform the calibration.
  • the processor circuit 5 controls the generator 6 to produce local signals S10 and S20, and the switch 7 to transmit these signals to the verniers 3 and 4 in place of the actual measurement signals S1 and S2.
  • the programming of circuit 5 is made to control at least one series of measurements with a constant delay (t2-t1) between signals S10 and S20 and by varying the start time each time, that is to say the time phase of S10, with respect to the clock SH.
  • the constant delay is produced by the circuit 6 by means, for example, of an assembly of temperature compensated delay lines.
  • a complete calibration cycle will include several series of measurements so as to also cover the delay variation range by modifying its value from one series of measurements to the next.
  • Figure 4 is a diagram corresponding to the previous one but transposed to the time T m measured by the vernier as a function of the real time T ⁇ .
  • the difference in charge dV variable as a function of the operating point and therefore of the parameter T1 which corresponds to the time phase of time t 1 is replaced there by the time difference on the measurement of T1, (and of T2 for the other vernier).
  • the shape of the variation in Tm is similar to that of the ramp.
  • a series of measurements is produced with (t 2 ⁇ t 1 ) equal to a constant value of R by varying the phase t, to traverse the range 0- ⁇ in a uniform manner.
  • the number of samples per slice is equal, or substantially, and the average value Tmj of these samples is determined which will characterize this slice.
  • a distribution of P average values Tm1 to TmP is thus obtained for the P slices Tr1 to TrP as shown in FIG. 6, each of them distant from the theoretical linear response value by a quantity dt, with corresponding dtp equal to the average value of the dt deviations for the tranche in question.
  • L be the number of measurement series; we denote by R1, R2, ... R k , ... R L the L values of R used.
  • R1, R2, ... R k the L values of R used.
  • the delay generator 6 can be equipped with delay devices connected in series to give the successive steps ⁇ / L.
  • the table in figure 9 shows the values finally memorized in the random access memories of the processor 5.
  • T1m measured by the starting vernier 3 indicates the section j to be assigned, to which now corresponds either 1 but L values dm 1d to dm Lj as a function of the phase ⁇ T of the time T to be measured.
  • the corresponding calculated value T 1m ⁇ T 2m defines the channel k to be affected and it is therefore possible to extract the corrective term dm kj to apply for the measurement and obtain the corrected quantity which corresponds very substantially to the real quantity of T.
  • the range 0 ⁇ ⁇ will be covered by a maximum of 400 distinct values of T1 and therefore of the variable phase t.
  • the range 0- T divided into 20 slices of 500 ps, i.e. distinct values measurable by slice we can decide to carry out, for example, 800 measurements per channel (series of measurements at constant R) to produce with a distribution substantially uniform 40 values per range, giving a 2/1 probability of producing the different measurable values.
  • the complete calibration cycle will include 8000 measurements for the case considered.
  • these measurements are preferably triggered randomly in order to regularly cover the range of variation and reveal an almost continuous spectrum of the variation of T lm as a function of T1.
  • the number of slices will be quantitatively determined, depending on whether one is able to carry out a greater or lesser number of measurements and as a function of the fineness of the correction to which one wishes to achieve.
  • Random triggering of the measurement can be produced in various ways; one of them consists in producing at the microprocessor a second local clock of frequency different from that very stable SH delivered by the circuit 1, the frequencies being chosen in an irrational ratio, so that the phase presented by the front active of this local clock vis-à-vis that of reference SH is arbitrary, practically changing value each time.
  • This local clock thus gives successive T1 values varying randomly.
  • the processor circuit 5 will have to temporarily store the values T1 and T2 measured by the verniers before proceeding to a classification in ascending order of the values T1 measured to then determine the means T1 mj slice by slice. Care should be taken to ensure that the values T1 and T2 of the same measurement are followed during these operations so as to find in each slice ( Figure 7) the values (T1 T2), called ⁇ R m , measured and corresponding to the T1 m values of this section so that the determination of mean deviation dmj retains all its meaning.
  • the proposed chronometry apparatus puts into practice the process which has just been described using the processor circuit 5 programmed to perform the various calculations and to control during the calibration the switching of the switches 7 to connect the outputs S10 and S20 of the generator 6 on the vernier circuits in place of the inputs S1 and S2; it also controls the generator circuit 6 to produce the desired series of measurements.
  • Circuit 6 produces a start pulse S10 and a stop pulse S20 whose delay, relative to the start pulse, is low noise (that is to say practically without fluctuations) and is programmable over a space of time substantially equal to T.
  • the vernier circuit 3 comprises a threshold comparator 31 which produces reshaping of the input pulse S1 or S10; the following circuit 32 is a flip-flop whose state change will control through a gate circuit 33 and a diode 34 the linear charge of the capacitor 35.
  • the clock signal SH then controls, via the circuit 36 consisting of rocker circuits and via the gate circuit 37 followed by the diode 38, the discharge of the capacitor 35.
  • the circuits 39 and 40 represent amplifiers.
  • the start of the charge and the end of the discharge are determined respectively to obtain the desired expansion coefficient, for example 400 T1, thanks to the threshold comparator 41 at the output which causes the circuit 32 to return to the initial position.
  • the counter 42 measures the total duration of charge and discharge and this information, measured in number of clock periods SH is transferred to the processor 5 which calculates the corresponding duration T1.
  • the stop vernier 4 is similarly constructed to allow T2 to be calculated.
  • the processor circuit 5 is represented in a conventional structure with a microprocessor 51, input 52 and output interface circuits 53, read-only memories 54 and read-only memories 55 and the control buses C, of addressing A and of data D.
  • a microprocessor 51 input 52 and output interface circuits 53, read-only memories 54 and read-only memories 55 and the control buses C, of addressing A and of data D.
  • random access memories 55 an organization corresponding to that of FIG. 9 has been considered with L address lines according to the channel and P address columns according to the section, to store the different measurement differences dm kj .
  • processor 5 The programming of processor 5 is made to accomplish the various successive phases of the method which has been previously described. This technique responds to known, relatively simple measurements, which do not require the software to be reported here in more detail. The result of the measurement after correction is transmitted to an annex 10 operating unit.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)

Claims (6)

1. Elektronisches Chronometersystem, das zur Messung einer Zeitdauer T zwischen einem Beginnzeitpunkt t1 und einem Endzeitpunkt t2 Feinzähleinrichtungen vom Noniustyp mit Rampe mit zeitlicher Streckung verwendet, um die Zeitdauer T1 zwischen dem Beginn t, und einer Hinterflanke eines Taktsignals und die Zeitdauer T2 zwischen dem Endzeitpunkt t2 und einer Hinterflanke eines Taktsignals zu messen, und die Grobzähleinrichtungen verwendet, um die Anzahl N von Taktperioden der Dauer T zwischen den genannten Flanken zu zählen, dadurch gekennzeichnet, daß das System weiterhin Einrichtungen zur Kompensation von Nichtlinearitätsfehlern der Rampe enthält, um hinsichtlich Größe und Vorzeichen bei beliebiger zu messender Zeitdauer T den Korrekturterm (dm) zu bestimmen, der anzuwenden ist, um den korrigierten Wert (Nτ+T1―T2+dm) zu erhalten, wobei der Korrekturterm im Verlauf eines Eichzyklus in Abhängigkeit von den gemessenen Parametern T1 und (T1-T2) bestimmt wird, wobei die Kompensationseinrichtungen eine Steuer- und Rechenprozessorschaltung (5) und eine programmierbare Verzögerungsschaltung (6) enthalten, um örtliche Signale (S10-S20) zu variablen Beginn- und Endzeitpunkten zu erzeugen, um die Parameter T1 und ggf. T1-T2 derart zu verändern, daß eine Taktperiode durchlaufen wird, wobei die Kompensationseinrichtungen ein örtliches Beginnsignal erzeugen, dessen Phase gegenüber dem Bezugstaktsignal (SH) zufallsbedingt ist.
2. System nach Anspruch 1, dadurch gekennzeichnet, daß die Steuer- und Recheneinrichtungen derart programmiert sind, daß sie den Verzögerungsgenerator so steuern, daß die Eichung gemäß wenigstens einer Meßserie mit einer konstanten Dauer (R) zwischen den genannten örtlichen Signalen (S10, S20) ausgeführt wird und indem jedesmal der Beginnzeitpunkt (t1) modifiziert wird, um den Variationsbereich des Parameters T1 gemäß einer regelmäßigen Verteilung unterschiedlicher Werte zu durchlaufen.
3. System nach Anspruch 2, dadurch gekennzeichnet, daß der Variationbereich von T1 in P Teilbereiche der Dauer T/P unterteilt sind, und daß für jeden von ihnen man einerseits den Mittelwert (Tlmj) der Werte T1 berechnet, die als in diesen Teilbereich fallend gemessen wurden, und andererseits den Mittelwert (ARmj) der zugehörigen Werte (T1-T2) berechnet, wobei die Rechnung dann die des Mittelwertes (ΔR m) der Mittelwerte (ΔR m1 bis ΔR mR) des Parameters (T1-T2) und der entsprechenden zugehörigen Abweichung (dmj = ΔR mj-△R) enthält, die dem anzuwendenden Korrekturterm entspricht, Teilbereich für Teilbereich in Abhängigkeit von T1.
4. System nach Anspruch 3, dadurch gekennzeichnet, daß die Eichung mehrere Meßserien der Anzahl L umfaßt, um L Kanäle zu bestimmen, die den Bereich T der Parameterabweichung (T1-T2) regelmäßig abdecken, indem L aufeinanderfolgende Werte der konstanten Zeitdauer T = R zwischen den genannten örtlichen Signalen verwendet werden, um so ein Inkrement T/L jedesmal zu erzeugen und den anzuwendenden Korrekturterm (dmki) in Abhängigkeit sowohl vom Wert T1 als auch von (T1-T2) zu bestimmen.
5. System nach Anspruch 4, dadurch gekennzeichnet, daß die Steuer- und Recheneinrichtungen (5) Speichereinrichtungen (55) enthalten, um die verschiedenen Werte des anzuwendenden Korrekturterms (dmkj) in einer Tabelle mit zwei Eingängen zu speichern, einerseits in Abhängigkeit vom Parameter T1 verteilt auf P Teilbereiche und andererseits in Abhängigkeit vom Parameter (T1-T2) verteilt auf L Kanäle.
6. System nach einem der Ansprüche 1 bis 5, dadurch gekennzeichnet, daß die Kompensationseinrichtungen weiterhin Umschaltschaltungen (7) enthalten, um die Eingänge der Noniusschaltungen (3, 4) mit dem Verzögerungsgenerator (6) während der Eichung zu verbinden, um den Nonien die zwei örtlichen Signale (S10, S20) zuzuführen.
EP85400976A 1984-05-17 1985-05-17 Elektronisches Chronometersystem mit hoher Auflösung Expired EP0165144B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8407652 1984-05-17
FR8407652A FR2564613B1 (fr) 1984-05-17 1984-05-17 Systeme de chronometrie electronique de haute resolution

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EP0165144A1 EP0165144A1 (de) 1985-12-18
EP0165144B1 true EP0165144B1 (de) 1989-03-22

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US (1) US4637733A (de)
EP (1) EP0165144B1 (de)
DE (1) DE3569051D1 (de)
FR (1) FR2564613B1 (de)

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US4772843A (en) * 1986-06-06 1988-09-20 Yokogawa Electric Corporation Time measuring apparatus
US4704036A (en) * 1986-06-23 1987-11-03 Tektronix, Inc. Pulse measurement circuit
JPS636483A (ja) * 1986-06-27 1988-01-12 Hamamatsu Photonics Kk 時間間隔測定装置
JP2582250B2 (ja) * 1986-10-03 1997-02-19 日本電信電話株式会社 タイミング信号遅延回路装置
JPH0820473B2 (ja) * 1987-02-04 1996-03-04 株式会社 アドバンテスト 連続的周期−電圧変換装置
US4908784A (en) * 1987-08-04 1990-03-13 Wave Technologies, Inc. Method and apparatus for asynchronous time measurement
US5033012A (en) * 1989-02-22 1991-07-16 Wohld Peter R Motor-operated valve evaluation unit
US4982349A (en) * 1989-06-29 1991-01-01 At&T Bell Laboratories Response time analysis system
US5020038A (en) * 1990-01-03 1991-05-28 Motorola, Inc. Antimetastable state circuit
US5150337A (en) * 1990-02-21 1992-09-22 Applied Magnetics Corporation Method and apparatus for measuring time elapsed between events
US5325313A (en) * 1990-07-20 1994-06-28 H & S Technical Systems, Inc. System for measuring timepiece beat interval accuracy
US5566139A (en) * 1993-09-20 1996-10-15 The United States Of America As Represented By The United States National Aeronautics And Space Administration Picosecond resolution sampling time interval unit
FR2745668B1 (fr) * 1996-03-01 1998-04-17 Commissariat Energie Atomique Dispositif de mesure precise de la duree d'un intervalle de temps
SE9703134L (sv) * 1997-09-01 1999-03-02 Ifunga Test Equipment Bv Metod och anordning för inmätning och sammanställning av statistiska tidsvariationer för en optisk databärare
US6621275B2 (en) * 2001-11-28 2003-09-16 Optonics Inc. Time resolved non-invasive diagnostics system
US6819117B2 (en) * 2002-01-30 2004-11-16 Credence Systems Corporation PICA system timing measurement & calibration
US6753760B2 (en) * 2002-11-12 2004-06-22 Adam L. Schwartz Random offset alarm clock

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Publication number Priority date Publication date Assignee Title
DE2842450C2 (de) * 1978-09-29 1982-08-19 MITEC Moderne Industrietechnik GmbH, 8012 Ottobrunn Verfahren zur Messung der zeitlichen Abstände von jeweils zwei elektrischen Signalen
JPS57151888A (en) * 1981-03-16 1982-09-20 Advantest Corp Time measuring device
DE3215847C2 (de) * 1982-04-28 1985-10-31 MTC, Meßtechnik und Optoelektronik AG, Neuenburg/Neuchâtel Zeitmeßverfahren und Vorrichtung zu seiner Durchführung

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EP0165144A1 (de) 1985-12-18
FR2564613B1 (fr) 1987-04-30
DE3569051D1 (en) 1989-04-27
US4637733A (en) 1987-01-20
FR2564613A1 (fr) 1985-11-22

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