EP0108375A3 - Inspection method for electron beam engraved printing surfaces - Google Patents
Inspection method for electron beam engraved printing surfaces Download PDFInfo
- Publication number
- EP0108375A3 EP0108375A3 EP83110891A EP83110891A EP0108375A3 EP 0108375 A3 EP0108375 A3 EP 0108375A3 EP 83110891 A EP83110891 A EP 83110891A EP 83110891 A EP83110891 A EP 83110891A EP 0108375 A3 EP0108375 A3 EP 0108375A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- electron beam
- inspection method
- printing surfaces
- cups
- printing form
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41C—PROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTING SURFACES
- B41C1/00—Forme preparation
- B41C1/02—Engraving; Heads therefor
- B41C1/04—Engraving; Heads therefor using heads controlled by an electric information signal
- B41C1/05—Heat-generating engraving heads, e.g. laser beam, electron beam
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT83110891T ATE49534T1 (en) | 1982-11-04 | 1983-11-02 | METHOD OF INSPECTION OF ELECTRON BEAM ENGRAVED PRINTING FORM SURFACES. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3240653 | 1982-11-04 | ||
DE19823240653 DE3240653A1 (en) | 1982-11-04 | 1982-11-04 | METHOD FOR CONTROLLING PRINTING FORM SURFACES BY MEANS OF ELECTRON BEAM |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0108375A2 EP0108375A2 (en) | 1984-05-16 |
EP0108375A3 true EP0108375A3 (en) | 1987-04-01 |
EP0108375B1 EP0108375B1 (en) | 1990-01-17 |
Family
ID=6177236
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP83110891A Expired - Lifetime EP0108375B1 (en) | 1982-11-04 | 1983-11-02 | Inspection method for electron beam engraved printing surfaces |
Country Status (6)
Country | Link |
---|---|
US (1) | US4549067A (en) |
EP (1) | EP0108375B1 (en) |
JP (2) | JPS5998848A (en) |
AT (1) | ATE49534T1 (en) |
DE (2) | DE3240653A1 (en) |
SU (1) | SU1240347A3 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT386297B (en) * | 1985-09-11 | 1988-07-25 | Ims Ionen Mikrofab Syst | ION RADIATION DEVICE AND METHOD FOR CARRYING OUT CHANGES, IN PARTICULAR. REPAIRS ON SUBSTRATES USING AN ION RADIATOR |
AT392857B (en) * | 1987-07-13 | 1991-06-25 | Ims Ionen Mikrofab Syst | DEVICE AND METHOD FOR INSPECTING A MASK |
DE4031547A1 (en) * | 1990-10-05 | 1992-04-09 | Hell Rudolf Dr Ing Gmbh | METHOD AND DEVICE FOR PRODUCING TEXTURE ROLLERS |
US5515182A (en) * | 1992-08-31 | 1996-05-07 | Howtek, Inc. | Rotary scanner |
DE19840926B4 (en) * | 1998-09-08 | 2013-07-11 | Hell Gravure Systems Gmbh & Co. Kg | Arrangement for material processing by means of laser beams and their use |
JP4178741B2 (en) | 2000-11-02 | 2008-11-12 | 株式会社日立製作所 | Charged particle beam apparatus and sample preparation apparatus |
DE102006032303B4 (en) * | 2006-07-11 | 2010-08-19 | Ellcie Maintenance Gmbh | Surface treatment device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2354323A1 (en) * | 1972-10-30 | 1974-05-09 | Crosfield Electronics Ltd | PROCESS FOR PRODUCING AN ENGRAVED PRINTING SURFACE AND DEVICE FOR CARRYING OUT THE PROCESS |
US3881108A (en) * | 1972-10-30 | 1975-04-29 | Hitachi Ltd | Ion microprobe analyzer |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE55965C (en) * | AKTIENGESELLSCHAFT „FABRIK LEIPZIGER MUSIKWERKE", VORM. PAUL EHRLICH & Co. in Gohlis bei Leipzig | Drive device for mechanical musical works | ||
DE1119428B (en) * | 1958-08-30 | 1961-12-14 | Zeiss Carl Fa | Device for object observation in devices for material processing by means of a charge carrier beam |
NL268860A (en) * | 1959-04-17 | |||
DE1299498B (en) * | 1964-07-24 | 1969-07-17 | Steigerwald Strahltech | Device for monitoring the beam impact area in corpuscular beam processing devices |
US3404254A (en) * | 1965-02-26 | 1968-10-01 | Minnesota Mining & Mfg | Method and apparatus for engraving a generally cross-sectionally circular shaped body by a corpuscular beam |
US4041311A (en) * | 1976-07-12 | 1977-08-09 | Iowa State University Research Foundation, Inc. | Scanning electron microscope with color image display |
JPS57132657A (en) * | 1981-02-06 | 1982-08-17 | Akashi Seisakusho Co Ltd | Inclined moving body tube type scanning electron microscope and its similar apparatus |
JPS57135172A (en) * | 1981-02-13 | 1982-08-20 | Hell Rudolf Dr Ing Gmbh | Electron beam-working method |
-
1982
- 1982-11-04 DE DE19823240653 patent/DE3240653A1/en not_active Withdrawn
-
1983
- 1983-11-02 EP EP83110891A patent/EP0108375B1/en not_active Expired - Lifetime
- 1983-11-02 DE DE8383110891T patent/DE3381109D1/en not_active Expired - Lifetime
- 1983-11-02 AT AT83110891T patent/ATE49534T1/en not_active IP Right Cessation
- 1983-11-03 SU SU833663179A patent/SU1240347A3/en active
- 1983-11-03 US US06/548,518 patent/US4549067A/en not_active Expired - Lifetime
- 1983-11-04 JP JP58206069A patent/JPS5998848A/en active Pending
-
1992
- 1992-11-02 JP JP1992075919U patent/JPH088102Y2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2354323A1 (en) * | 1972-10-30 | 1974-05-09 | Crosfield Electronics Ltd | PROCESS FOR PRODUCING AN ENGRAVED PRINTING SURFACE AND DEVICE FOR CARRYING OUT THE PROCESS |
US3881108A (en) * | 1972-10-30 | 1975-04-29 | Hitachi Ltd | Ion microprobe analyzer |
Non-Patent Citations (1)
Title |
---|
APPLIED PHYSICS LETTERS, Band 34, Nr. 5, 1. März 1979, Seiten 310-312, American Institute of Physics, New York, US; R.L. SELIGER et al.: "A high-intensity scanning ion probe with submicrometer spot size" * |
Also Published As
Publication number | Publication date |
---|---|
EP0108375A2 (en) | 1984-05-16 |
US4549067A (en) | 1985-10-22 |
EP0108375B1 (en) | 1990-01-17 |
SU1240347A3 (en) | 1986-06-23 |
DE3381109D1 (en) | 1990-02-22 |
DE3240653A1 (en) | 1984-05-10 |
JPS5998848A (en) | 1984-06-07 |
ATE49534T1 (en) | 1990-02-15 |
JPH067933U (en) | 1994-02-01 |
JPH088102Y2 (en) | 1996-03-06 |
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