Classifications

• • G—PHYSICS
  • G07—CHECKING-DEVICES
  • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
  • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
  • G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
• • G—PHYSICS
  • G07—CHECKING-DEVICES
  • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
  • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
  • G07D5/08—Testing the magnetic or electric properties

Definitions

• the invention relates to a coin validator for testing different coin thicknesses or diameter measurements.
• the coin thickness or the coin diameter is one of several variables influencing the result of the check in the previous i- ⁇ in test; it cannot be checked independently of the other variables (coin diameter or coin thickness, coin alloy) and identical test results can be obtained for coins of different thicknesses or different diameters if the other variables (coin diameter or coin thickness, mint alloy) differ Influence of the coin thickness or. of the coin diameter compensate.
• the object of the invention is to achieve this . 'to check the thickness or the diameter of the coins independently of the other mint properties (mint diameter or mint thickness, electrical and magnetic properties of the coin alloy or the coin metal).
• FIG. 1 shows a longitudinal section through a section of a coin channel, on which a sensing element and a mechanical-electrical converter for coin thickness testing are arranged,
• Fig. 3 is a rear view in the direction of the arrow
• Fig. 4 is a plan view in the direction of the arrow
• FIG. 5 shows a circuit diagram of a circuit containing the mechanical-electrical converter for checking the coin thickness.
• the coin validator who developed the test device shown in the drawing for checking the coin thickness holds is part of the self-cashier of a coin operated telephone.
• the self-cashier has a coin slot (not shown) which is common to all acceptable coins and inclined to the horizontal, which is provided with a device for the removal of elongated objects and in Switzerland which does not belong to the prior art. Patent application No. is described.
• Connected to the coin insertion channel is the vertical section 1 of the coin channel shown in FIG. 1, in which the thickness of the coins is checked by means of the checking device of the coin validator described in more detail below.
• the section of the coin channel (not shown) following section 1 the knurling of the coin edge, the diameter of the coins and. the electrical properties of the coin alloy or the coin metal were checked.
• test device for the knurling of the coin rim is in the European.
• the test devices for the diameter of the coins and the electrical properties of the coin alloy or the coin metal are in the European.
• the coin channel section 1 shown in FIG. 1 is delimited by two narrow and two wide walls; the latter two are designated 2 and 3.
• the test device for checking the coin thickness has a sensing element which consists of a sheet metal plate 4, the length of which corresponds approximately to the diameter of the largest acceptable coin type and the width approximately corresponds to the diameter of a medium-sized acceptable coin type.
• the wall 3 has a rectangular recess 5 adapted to the plate 4.
• the longitudinal edges 6 of the plate 4 are from Coin channel bent away and carry an axis 7 to which a flap 8 is articulated.
• the flap 8 is pivotally mounted about an axis 9 seated in bearing blocks 12 on the side of the wall 3 facing away from the coin channel.
• the transverse edges of the plate have a Z-profile (a folded edge) with flanges 10, 11 parallel to the plate surface 21.
• a fork-shaped spiral spring 14 presses with its fork ends 15, 16 the axis 7 in the direction of the coin channel 1, whereby the plate. 4 is held in a rest position. In this rest position, the flanges 10, 11 of the plate 4 are pressed onto the edge surfaces 17, 18 of the wall 3 facing away from the coin channel 1 and the plate 4 lies at a distance parallel to the wall 2 which is less than • the thickness of the thinnest acceptable coin type .
• the front end part 20 of the plate 4 in the direction of coin movement 19 is to form a run-up surface for the coins at an angle of approximately 20 ° from the rest of the plate surface parallel to the wall 2 in the rest position
• the axis 7 carries the movable plate set 25 of a capacitor 26 with continuously variable capacitance, which forms a mechanical-electrical converter of the testing device.
• the stationary plate set 27 of the capacitor 26 is firmly connected to the wall 3.
• Set 27 ensures that the two sets of plates do not touch each other.
• the guide member 28 also has two lateral projections 29, which limit the deflection of the plate 4 from the rest position by striking the supports 31 of the plate set 27 when they face the coin channel.
• guide means are arranged which guide the coins to the wall 2 and prevent the coins from being flipped back and forth between the walls 2 and 3.
• the guide means consist of a row of tongues 35 which are mounted next to one another and can be rotated side by side on an axis 34 on the wall 3, each by a spring 36 (one of these springs is shown in FIG. 4) in the direction of the wall 2 are pressed so that they run from the wall 3 obliquely to the coin direction 19 through the coin channel section 1 to the wall 2 and push the coins passing through to the wall 2 and dampen movements of the coins transverse to the coin direction 19.
• the tongues 35 are made of smooth plastic, along which the coins can slide well. In the embodiment shown with the springs 36, they are useful rigid tongues 35 used. Of course, the springs 36 could also be omitted and tongues made of elastic material could be used.
• a coil 37 of an oscillator 38 is also arranged in the coin running direction directly in front of the plate 4.
• the oscillations of the oscillator 38 cease and the triggering device 39 containing it emits a trigger signal to a program control device of the coin validator, which is formed by a microprocessor 40 and which controls the coin controller shown in FIG shown, in the following explained circuit of the test device for checking the coin thickness controls.
• a port (input and output module) 42 and two pulse counters 43, 44 are connected to the microprocessor 40.
• the output of port 42 is connected to the D input of a D flip-flop (D flip-flop) 45.
• a "Zero Detecf output" of the counter 43 is connected to the R input of the D flip-flop 45 and to the input of the port 42 C-input with flank control, a downward counter input of counter 43 connected to the output of an AND gate 47, the counter reading of counter 43 being reduced by the number one at each zero-one transition at the counter input the up-counter input of the counter 44, which is designed as a C input with edge control, is connected to the output of an AND gate 48, the counter reading of the counter 44 being increased by the number one at each zero-one transition at the counter input.
• the flip-flop 45 is with its Q output to one of the two Inputs of the AND gates 47 and 48 and connected to the driver stage 50 of a first oscillator 51 with its C input designed as a clock input with edge control.
• the D input is subordinate to the C input of flip-flop 45, ie the value of the variable at the D input is only stored in the flip-flop when there is a zero-to-transition at the C input.
• the oscillator 51 is a so-called "two-gate RC oscillator” with two CM0S inverter gates (type MM 74C04), two resistors and a capacitor; it generates a rectangular pulse sequence.
• the capacitor 26 serves as the capacitor, the capacitance of which is changed in proportion to the deflection of the plate 4 from the rest position.
• the capacitance of the capacitor 26 is smallest when the plate 4 is in the rest position.
• the oscillator frequency is then, for example, approximately 100 kHz. With the maximum deflection of the plate 4 from the rest position, the capacitance of the capacitor 26 is greatest and the oscillator frequency is then, for example, approximately 60 kHz.
• the oscillator 51 with its driver stage 50 is also connected to the other input of the AND gate 47.
• a second oscillator 52 with a fixed frequency of approximately 2 MHz is connected to the other input of the AND gate 48 and also generates a square-wave pulse train.
• the coin validator works as follows: When a coin or another metallic body passes the coil 37, the triggering device 39 sends a trigger signal to the microprocessor 40. The latter controls it immediately and then at two predetermined time intervals to be explained in more detail below 5 in each case as follows: the counter 43 is set to a predetermined number, for example 6, and the counter 44 is reset to zero. posed. Furthermore, the D input of the flip-flop 45 is set to the value one via the port 42.
• the counter reading of the counter 43 is zero, the variable am , r zero Detect "output of the counter 43 assumes the value one and accordingly the value one is at the input of the port 42 and at the R input of the flip-flop 45. As a result, the flip-flop 45 is reset to the reset state, the Q output of the flip-flop assumes the value zero and the AND gates 47 and 48 are no longer permeable.
• the level of the counter 44 indicates how many pulses the oscillator 52 has delivered during the six-pulse cycle of the oscillator 51. The one indicated by the counter 44 The number of pulses depends on the frequency of the oscillator 51 and thus on the capacitance of the capacitor 26, which in turn depends on the position of the plate 4.
• the microprocessor 40 reads when the input is present ssignals at port 42 the count of the counter 44, and stores this value in a memory '(RAM) 53rd
• the microprocessor 40 carries out three such measurements in succession.
• the first measurement takes place immediately after the trigger signal of the device 39, that is to say at the time when the Coin passes the coil 37 and before it has reached the plate 4.
• the second measurement is carried out for a period of time corresponding to the coin runtime between the coil 37 and the plate 4 after the trigger signal of the device 39, that is to say at the point in time at which the coin deflects the plate 4 from the rest position in accordance with the coin thickness.
• the third measurement takes place after the trigger signal, which is chosen so large that the coin has normally left the area of the plate 4.
• the microprocessor 40 then processes the three measured values obtained in these three measurements and stored in the memory 53 as follows: it subtracts the first measured value from the second measured value and compares the difference obtained with two for each acceptable coin type in the memory 53 stored limit values. If the difference lies between two limit values of an acceptable coin type, a character characterizing this coin type is stored in the memory 53. Otherwise, a signal which triggers the return of the coin is emitted.
• the microprocessor further calculates the difference between the third and the first measured value and also emits a signal which triggers the return of the coin if this difference exceeds a predetermined limit value stored in the memory 53.
• the additional first measurement and the formation of the difference between the second and the first measured value has the advantage that changes in the oscillator frequencies as a result of temperature changes or other interferences are compensated for.
• the third measurement has the purpose of hanging coins or using a thread, for example Adhesive tape to remove stuck coins. Such coins are still on the plate 4 in the third measurement, which is why the difference between the third and first measured value is the same as the difference between the second and first measured value and thus larger than the corresponding predetermined limit value, if it is exceeded, the non-acceptance and return of the coin is triggered.
• the electrical properties of the coin alloy or the coin metal, the diameter of the coin and the knurling of the coin edge are checked by means of test devices (not shown), likewise controlled by the microprocessor 40, as already mentioned in the introduction .
• the microprocessor compares the respective measured value in a manner similar to the thickness test with two values stored for each acceptable coin type and stores the character assigned to the relevant coin type in the memory 53 if the measured value lies between the two limit values for a coin type .
• the microprocessor compares the stored characters assigned to acceptable coin types and emits a signal which triggers the acceptance of the coin if all the characters match. Otherwise it triggers the return of the coin.
• the plate 4 In its rest position, the plate 4 could also lie directly against the wall 2, but it is more expedient - as shown in the drawing - at a distance which is smaller than the thickness of the thinnest acceptable coin type is to keep away from the wall so that the course of the thin, light coins is not braked too much.
• the plate 4 has the advantage that bent coins are eliminated. The acceptance of bent coins is particularly undesirable if the coins are sorted and stored as change by type of coin after being accepted for return, because the relevant parts of the cashier are precisely adapted to the respective thickness of the acceptable type of coin.
• capacitor 26 with variable capacitance
• a different mechanical-electrical converter which determines the amplitude or the frequency of an electrical signal, in particular another frequency-determining component of an oscillator.
• a coil could be used with a coil core movable with respect to it, attached to the plate 4 or another sensing element, whose inductance and thus the oscillator frequency changes depending on the position of the sensing element.
• the described device with the capacitor 26 is preferred because of its simplicity and reliability.
• test device for testing the diameter of the coins can - as mentioned above - be designed in accordance with the test device described in European patent application with the publication number 0 023 965, namely two coils arranged on the two wide walls of the coin channel with transverse to the Coin running direction directly or at intervals next to each other arranged U or E cores, so that the influencing of the coil field or the coupling
• the test device for the coin diameter can also be designed in accordance with the described test device for the coin thickness: a lever which projects obliquely to the coin running direction into the coin channel and serves in the Rest position is resiliently held on one of the two narrow walls or at a distance from one of the two narrow walls of the coin channel, which is smaller than the diameter of the smallest acceptable coin type.
• the lever can be made in the same way as the plate 4 with the movable plate set of a capacitor corresponding to the capacitor 26 or a rotating capacitor
• the test device for testing the electrical properties of the coin alloy or the coin metal can - as in the European.
• the two coils have pot cores whose outside diameter is smaller than the diameter of the smallest acceptable coin type.
• the microprocessor 40 triggers the acceptance of the coin only if the examination of the thickness, the diameter and the alloy of a coin yields values which are within the tolerance range of one and the same coin type lie.
• the test value when testing the coin thickness is.
• the status of the counter 44 or the aforementioned difference in the counter readings, when checking the coin diameter by means of the sensing element designed as a lever, the level of the corresponding counter or the counter reading difference, and when checking the coin diameter by means of the coils U or E cores as well as the testing of the coin alloy by means of the coils with pot cores is a quantity which is dependent on the influence of the magnetic field.
• This size can be the size of a signal transmitted from one coil to the other, but it can also be the damping of the vibrations of an oscillating circuit with a self-induction coil arranged on the coin channel or the value of the gain of an oscillator amplifier controlled by a control device with -am Coin channel arranged self-induction coil, in which the coin causes the oscillator vibrations to suspend or to be inserted.
• a control device with -am Coin channel arranged self-induction coil in which the coin causes the oscillator vibrations to suspend or to be inserted.

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Testing Of Coins (AREA)

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• 1982
  • 1982-03-04 CH CH1321/82A patent/CH655810A5/de not_active IP Right Cessation
• 1983
  • 1983-02-14 WO PCT/CH1983/000014 patent/WO1983003154A1/en not_active Application Discontinuation
  • 1983-02-14 EP EP83900549A patent/EP0102358A1/de not_active Withdrawn
  • 1983-10-20 FI FI833847A patent/FI833847A/fi not_active Application Discontinuation
  • 1983-11-01 DK DK4992/83A patent/DK499283D0/da not_active Application Discontinuation
  • 1983-11-03 NO NO834018A patent/NO834018L/no unknown

Non-Patent Citations (1)

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