EP0033945B1 - Lecksuchvorrichtung mit Helium - Google Patents

Lecksuchvorrichtung mit Helium Download PDF

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Publication number
EP0033945B1
EP0033945B1 EP81100778A EP81100778A EP0033945B1 EP 0033945 B1 EP0033945 B1 EP 0033945B1 EP 81100778 A EP81100778 A EP 81100778A EP 81100778 A EP81100778 A EP 81100778A EP 0033945 B1 EP0033945 B1 EP 0033945B1
Authority
EP
European Patent Office
Prior art keywords
inlet
pump
diffusion pump
detector
helium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
EP81100778A
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English (en)
French (fr)
Other versions
EP0033945B2 (de
EP0033945A2 (de
EP0033945A3 (en
Inventor
Jacques Tallon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Compagnie Industrielle de Telecommunication CIT Alcatel SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=9238433&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP0033945(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Compagnie Industrielle de Telecommunication CIT Alcatel SA filed Critical Compagnie Industrielle de Telecommunication CIT Alcatel SA
Priority to AT81100778T priority Critical patent/ATE7629T1/de
Publication of EP0033945A2 publication Critical patent/EP0033945A2/de
Publication of EP0033945A3 publication Critical patent/EP0033945A3/fr
Application granted granted Critical
Publication of EP0033945B1 publication Critical patent/EP0033945B1/de
Publication of EP0033945B2 publication Critical patent/EP0033945B2/de
Expired legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/02Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/202Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems

Definitions

  • the invention relates to a helium leak detector comprising a molecular diffusion pump comprising an inlet and an outlet, and a spectrometric measurement cell arranged in bypass on said pump, said outlet being connected, by an outlet pipe, to an inlet flange for connection to an installation to be tested.
  • Document US-A-3 968 675 discloses a helium leak detector, in which the tracer gas passes through either by counter-current to the helium pump (fig. 1), or a cold trap, before being analyzed. in the cell (fig. 3).
  • a primary pump is used before the measurement to degass the system and during the measurement to maintain a determined pressure at the delivery outlet of the diffusion pump. It has been found that a detector of the countercurrent type delivers a detection signal which is not very stable, due to the operation of the diffusion pump in the underheating regime. However, without such a regime, helium would not pass through the diffusion pump in countercurrent.
  • the helium atoms are detected before their aspiration by the diffusion pump, as is the case in the detector according to FIG. 3 of this document, access to the enclosure to be monitored and the delivery outlet of the diffusion pump no longer communicate directly. It is therefore impossible to take advantage of a vane pump which possibly exists in connection with said enclosure.
  • the detector must have its own primary pump.
  • the object of the invention is to propose a detector which does not need a clean vane pump when one already exists in connection with the enclosure to be monitored.
  • a detector as specified above which is characterized in that to avoid the use of a vane pump in the detector the input of the diffusion pump is connected to a point of the outlet pipe via a throttle.
  • the detector can advantageously include an isolation valve at the inlet, a sampling valve on the inlet of the diffusion pump and a measurement valve on the short-circuit pipe.
  • the detector may further include a trap between the diffusion pump and the spectrometric cell.
  • Another trap can be interposed between the sampling valve and the inlet of the diffusion pump.
  • the single figure is a schematic representation of a helium leak detector according to the invention.
  • a set 1 of a leak detector comprises an inlet pipe 2, an inlet flange 3 and an isolation valve 4.
  • the inlet pipe 2 leads to the inlet 5 of a diffusion pump via a diaphragm or throttle which can be constituted by an adjustable sampling valve 11.
  • a spectrometric measurement cell 8 is connected to the diffusion pump 6 via a pipe 9.
  • the outlet 7 of the diffusion pump 6 is connected by a pipe 10 and a measurement valve 12 at a connection point on the pipe 2 between the valves 4 and 11.
  • the inlet flange 3 of the detector 1 is, when in use, connected by a pipe 13 to an auxiliary pumping unit 14 comprising a vane pump 15 with an isolation valve 16 and a connection flange 17 to an installation to test not shown.
  • the ratio n is linked to the pumping speeds at the input of the spectrometer 8 and at the input of the auxiliary pump of this group. We are therefore in the presence of a flow amplifier assembly.
  • Another advantage of this arrangement is that it makes it possible to produce a detector without a vane pump, and having no additional connection flange for this vane pump.
  • any trap which may be, for example, of the liquid nitrogen, ionic type, or still zeolites.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
  • Measurement Of Radiation (AREA)

Claims (6)

1. Helium-Lecksucher, der eine Molekulardiffusionspumpe (6) mit einem Eingang (5) und einem Ausgang (7) und eine spektrometrische Meßzelle (8) aufweist, die in Ableitung an der Pumpe angeordnet ist, wobei der Ausgang (7) über eine Ausgangsleitung (10) mit einem Flansch (3) zum Anschluß an eine zu testende Anlage verbunden ist, dadurch gekennzeichnet, daß, um die Verwendung einer Vorvakuumpumpe im Lecksucher zu vermeiden, der Eingang (5) der Diffusionspumpe mit einem Punkt der Ausgangsleitung (10) über eine Drosselstelle (11) verbunden ist.
2. Lecksucher nach Anspruch 1, dadurch gekennzeichnet, daß die Drosselstelle aus einem Regelventil (11) besteht.
3. Lecksucher nach Anspruch 1, dadurch gekennzeichnet, daß er ein Isolierventil (4) aufweist, das in der Eingangskanalisation (2) angeordnet ist.
4. Lecksucher nach einem der Ansprüche 1 bis 3, dadurch gekennzeichnet, daß er ein Meßventil (12) in der Ausgangsleitung (10) aufweist.
5. Lecksucher nach einem der Ansprüche 1 bis 4, dadurch gekennzeichnet, daß eine Fall zwischen die Diffusionspumpe (6) und die spektrometrische Zelle (8) eingefügt ist.
6. Lecksucher nach einem der Ansprüche 1 bis 5, dadurch gekennzeichnet, daß eine Falle zwischen dem Regelventil (11) und dem Eingang (5) der Diffusionspumpe angeordnet ist.
EP81100778A 1980-02-11 1981-02-04 Lecksuchvorrichtung mit Helium Expired EP0033945B2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT81100778T ATE7629T1 (de) 1980-02-11 1981-02-04 Lecksuchvorrichtung mit helium.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8002923A FR2475728A1 (fr) 1980-02-11 1980-02-11 Detecteur de fuites a helium
FR8002923 1980-02-11

Publications (4)

Publication Number Publication Date
EP0033945A2 EP0033945A2 (de) 1981-08-19
EP0033945A3 EP0033945A3 (en) 1981-08-26
EP0033945B1 true EP0033945B1 (de) 1984-05-23
EP0033945B2 EP0033945B2 (de) 1989-01-11

Family

ID=9238433

Family Applications (1)

Application Number Title Priority Date Filing Date
EP81100778A Expired EP0033945B2 (de) 1980-02-11 1981-02-04 Lecksuchvorrichtung mit Helium

Country Status (5)

Country Link
US (2) US4365158A (de)
EP (1) EP0033945B2 (de)
AT (1) ATE7629T1 (de)
DE (1) DE3163699D1 (de)
FR (1) FR2475728A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2532424A1 (fr) * 1982-08-27 1984-03-02 Cit Alcatel Dispositif de mesure et d'affichage du taux q de fuite pour un detecteur de fuites a gaz traceur
FR2561771B1 (fr) * 1984-03-23 1986-06-27 Cit Alcatel Procede pour depolluer un detecteur de fuite a helium et dispositif pour la mise en oeuvre du procede
JPS6197918A (ja) * 1984-10-19 1986-05-16 Hitachi Ltd X線露光装置
FR2604522B1 (fr) * 1986-09-26 1989-06-16 Cit Alcatel Installation de detection de fuite a gaz traceur et procede d'utilisation
US4785666A (en) * 1986-12-19 1988-11-22 Martin Marietta Corporation Method of increasing the sensitivity of a leak detector in the probe mode
EP0344345B1 (de) * 1988-06-01 1991-09-18 Leybold Aktiengesellschaft Pumpsystem für ein Lecksuchgerät
ES2069713T3 (es) * 1990-07-06 1995-05-16 Cit Alcatel Conjunto mecanico de bombeo para vacio secundario e instalacion para la deteccion de fuga que utiliza un conjunto de este tipo.
JPH0674855A (ja) * 1992-07-08 1994-03-18 Hitachi Bill Shisetsu Eng Kk 真空漏洩検出方法、および同装置
DE4228313A1 (de) * 1992-08-26 1994-03-03 Leybold Ag Gegenstrom-Lecksucher mit Hochvakuumpumpe
US5347845A (en) * 1993-02-19 1994-09-20 Whirlpool Corporation Appliance shipping container air sampling system
US5551285A (en) * 1994-05-18 1996-09-03 The United States Of America As Represented By The United States Department Of Energy Leak checker data logging system
FR2728072B1 (fr) * 1994-12-07 1997-01-10 Cit Alcatel Detecteur de fuite
DE19504278A1 (de) * 1995-02-09 1996-08-14 Leybold Ag Testgas-Lecksuchgerät
DE19506123C2 (de) * 1995-02-22 1997-01-09 Cerdec Ag Bleifreie Glasfritte, Verfahren zu ihrer Herstellung und deren Verwendung
FR2761776B1 (fr) * 1997-04-03 1999-07-23 Alsthom Cge Alcatel Detecteur de fuite a gaz traceur

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1047204A (de) * 1964-05-26 1900-01-01
FR1474137A (fr) * 1966-02-08 1967-03-24 Alcatel Sa Détecteur de fuites à l'hélium aisément transportable
US3842266A (en) * 1973-04-11 1974-10-15 Us Air Force Atmospheric sampling probe for a mass spectrometer
US3968675A (en) * 1974-06-07 1976-07-13 Varian Associates Method and apparatus for preparing a mass spectrometer leak detector system for operation

Also Published As

Publication number Publication date
EP0033945B2 (de) 1989-01-11
EP0033945A2 (de) 1981-08-19
US4365158A (en) 1982-12-21
EP0033945A3 (en) 1981-08-26
FR2475728B1 (de) 1981-12-31
DE3163699D1 (en) 1984-06-28
FR2475728A1 (fr) 1981-08-14
ATE7629T1 (de) 1984-06-15
US4436998A (en) 1984-03-13

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