DK171492B1 - Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale - Google Patents

Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale Download PDF

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Publication number
DK171492B1
DK171492B1 DK072394A DK72394A DK171492B1 DK 171492 B1 DK171492 B1 DK 171492B1 DK 072394 A DK072394 A DK 072394A DK 72394 A DK72394 A DK 72394A DK 171492 B1 DK171492 B1 DK 171492B1
Authority
DK
Denmark
Prior art keywords
plate
detector
angle
density
source
Prior art date
Application number
DK072394A
Other languages
Danish (da)
English (en)
Other versions
DK72394A (da
Inventor
Sten Dueholm
Steen Teller
Original Assignee
Wesser & Dueholm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DK072394A priority Critical patent/DK171492B1/da
Application filed by Wesser & Dueholm filed Critical Wesser & Dueholm
Priority to EP95922432A priority patent/EP0766814B1/de
Priority to ES95922432T priority patent/ES2159642T3/es
Priority to DE69521613A priority patent/DE69521613D1/de
Priority to US08/750,835 priority patent/US5970116A/en
Priority to PT95922432T priority patent/PT766814E/pt
Priority to AU27329/95A priority patent/AU2732995A/en
Priority to AT95922432T priority patent/ATE202846T1/de
Priority to CA002192340A priority patent/CA2192340C/en
Priority to PCT/DK1995/000242 priority patent/WO1995035491A1/en
Priority to DE69521613T priority patent/DE69521613T4/de
Publication of DK72394A publication Critical patent/DK72394A/da
Application granted granted Critical
Publication of DK171492B1 publication Critical patent/DK171492B1/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Toxicology (AREA)
  • Wood Science & Technology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DK072394A 1994-06-20 1994-06-20 Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale DK171492B1 (da)

Priority Applications (11)

Application Number Priority Date Filing Date Title
DK072394A DK171492B1 (da) 1994-06-20 1994-06-20 Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale
ES95922432T ES2159642T3 (es) 1994-06-20 1995-06-15 Metodo para determinar el perfil de densidad de un material en forma de placa.
DE69521613A DE69521613D1 (de) 1994-06-20 1995-06-15 Methode zur bestimmung des dichteprofils eines scheibenförmigen materials
US08/750,835 US5970116A (en) 1994-06-20 1995-06-15 Method of determining the density profile of a plate-shaped material
EP95922432A EP0766814B1 (de) 1994-06-20 1995-06-15 Methode zur bestimmung des dichteprofils eines scheibenförmigen materials
PT95922432T PT766814E (pt) 1994-06-20 1995-06-15 Processo para a determinacao do perfil de densidadesde um material com a forma de placa
AU27329/95A AU2732995A (en) 1994-06-20 1995-06-15 A method of determining the density profile of a plate-shaped material
AT95922432T ATE202846T1 (de) 1994-06-20 1995-06-15 Methode zur bestimmung des dichteprofils eines scheibenförmigen materials
CA002192340A CA2192340C (en) 1994-06-20 1995-06-15 A method of determining the density profile of a plate-shaped material
PCT/DK1995/000242 WO1995035491A1 (en) 1994-06-20 1995-06-15 A method of determining the density profile of a plate-shaped material
DE69521613T DE69521613T4 (de) 1994-06-20 1995-06-15 Methode zur bestimmung des dichteprofils eines scheibenförmigen materials

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DK72394 1994-06-20
DK072394A DK171492B1 (da) 1994-06-20 1994-06-20 Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale

Publications (2)

Publication Number Publication Date
DK72394A DK72394A (da) 1995-12-21
DK171492B1 true DK171492B1 (da) 1996-11-25

Family

ID=8096803

Family Applications (1)

Application Number Title Priority Date Filing Date
DK072394A DK171492B1 (da) 1994-06-20 1994-06-20 Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale

Country Status (10)

Country Link
US (1) US5970116A (de)
EP (1) EP0766814B1 (de)
AT (1) ATE202846T1 (de)
AU (1) AU2732995A (de)
CA (1) CA2192340C (de)
DE (2) DE69521613D1 (de)
DK (1) DK171492B1 (de)
ES (1) ES2159642T3 (de)
PT (1) PT766814E (de)
WO (1) WO1995035491A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK171779B1 (da) * 1996-02-14 1997-05-20 Wesser & Dueholm Fremgangsmåde til bestemmelse af densitetsprofil
FI990153A0 (fi) * 1999-01-28 1999-01-28 Valtion Teknillinen Tiheysjakaumaltaan homogeenisen materiaalin/puuhakkeen kosteuden on-line mittausmenetelmä perustuen gammasäteilyn transmissioon ja materiaaliin paksuuden mittaukseen
CA2348150C (en) 2000-05-25 2007-03-13 Esam M.A. Hussein Non-rotating x-ray system for three-dimensional, three-parameter imaging
NZ505539A (en) * 2000-07-03 2002-03-28 Fletcher Challenge Forests Ltd A method for wood drying using x-rays to determine moisture content to enable sorting
US6563906B2 (en) 2000-08-28 2003-05-13 University Of New Brunswick X-ray compton scattering density measurement at a point within an object
EP1258723A1 (de) * 2001-05-18 2002-11-20 Imal S.R.L. Nichtzerstörendes Verfahren zum kontinuierlischen Messen des Dichteprofils von Platten
DE10149317B4 (de) * 2001-10-05 2015-02-19 Albert-Ludwigs-Universität Freiburg Vorrichtung zur Messung der dielektrischen Eigenschaften eines Substrats
US6895072B2 (en) 2003-03-26 2005-05-17 Heimann Systems Corp. Apparatus and method for non-destructive inspection of material in containers
GB0411401D0 (en) * 2004-05-21 2004-06-23 Tissuomics Ltd Penetrating radiation measurements
CA2513990C (en) * 2004-08-27 2010-09-14 Paul Jacob Arsenault X-ray scatter image reconstruction by balancing of discrepancies between detector responses, and apparatus therefor
DE102004057743B4 (de) * 2004-09-08 2007-08-09 Mahlo Gmbh & Co Kg Verfahren und Vorrichtung zum Bestimmen des Flächengewichtes einer geförderten Materialprobe
NZ538649A (en) * 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
RU2300756C1 (ru) * 2005-09-19 2007-06-10 Институт Информатики и Проблем Регионального Управления КБНЦ РАН Способ реализации микрорентгенофлуоресцентного анализа материалов с трехмерным разрешением
NL1038030C2 (nl) * 2010-06-11 2011-12-13 Multigarant B V Werkwijze voor het onderzoeken van een verzameling houten delen.
US8767912B1 (en) 2013-04-09 2014-07-01 King Abdulaziz University System for inspection and imaging of insulated pipes and vessels using backscattered radiation and X-ray fluorescence
US9151722B2 (en) 2014-01-15 2015-10-06 King Abdulaziz University Systems for determining and imaging wax deposition and simultaneous corrosion and wax deposit determination in pipelines
US8976936B1 (en) 2014-05-22 2015-03-10 King Abdulaziz University Collimator for backscattered radiation imaging and method of using the same
DE102014212514A1 (de) 2014-06-27 2015-12-31 Volkswagen Aktiengesellschaft Schwenklager
US20160274039A1 (en) 2014-09-25 2016-09-22 King Abdulaziz University System for determining and imaging wax deposition and corrosion in pipelines
US9020099B1 (en) 2014-12-03 2015-04-28 King Abdulaziz University Miniaturized pipe inspection system for measuring corrosion and scale in small pipes
US9784699B2 (en) * 2015-03-03 2017-10-10 Panalytical B.V. Quantitative X-ray analysis—matrix thickness correction
US10215796B2 (en) 2015-05-11 2019-02-26 Northwestern University System and method for deducing charge density gradients in doped semiconductors
CN110614558A (zh) * 2019-09-23 2019-12-27 临沂兴滕人造板机械有限公司 一种人工智能检板系统
US10890544B1 (en) 2019-12-18 2021-01-12 Field Service Solutions LLC Nuclear densitometer assemblies for hydraulic fracturing

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4047029A (en) * 1976-07-02 1977-09-06 Allport John J Self-compensating X-ray or γ-ray thickness gauge
US4228351A (en) * 1979-02-26 1980-10-14 The United States Of America As Represented By The United States Department Of Energy Method for measuring the density of lightweight materials
CA1202431A (en) * 1984-05-18 1986-03-25 Josef W. Repsch Method and apparatus to measure the weight per unit area, density and thickness of a moving sheet
DE3886334D1 (de) * 1987-10-05 1994-01-27 Philips Patentverwaltung Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle.
FR2629914B1 (fr) * 1988-04-06 1991-09-06 Aerospatiale Procede et dispositif pour determiner la masse volumique d'un volume elementaire de matiere
US5247561A (en) * 1991-01-02 1993-09-21 Kotowski Andreas F Luggage inspection device
FR2672120B1 (fr) * 1991-01-30 1993-05-14 Aerospatiale Procede et systeme a effet compton pour la localisation d'un plan separant deux milieux de densites differentes.
US5195117A (en) * 1992-04-24 1993-03-16 University Of Houston Method for using secondary radiation scattering to evaluate the thickness of materials
DE4243454C1 (de) * 1992-12-22 1994-03-10 Grecon Greten Gmbh & Co Kg Vorrichtung und Verfahren zur Erstellung eines Rohdichteprofils über die Dicke einer Platte

Also Published As

Publication number Publication date
DK72394A (da) 1995-12-21
DE69521613T4 (de) 2002-12-19
WO1995035491A1 (en) 1995-12-28
DE69521613D1 (de) 2001-08-09
ATE202846T1 (de) 2001-07-15
CA2192340C (en) 2001-02-13
AU2732995A (en) 1996-01-15
CA2192340A1 (en) 1995-12-28
ES2159642T3 (es) 2001-10-16
EP0766814A1 (de) 1997-04-09
US5970116A (en) 1999-10-19
DE69521613T2 (de) 2001-10-31
EP0766814B1 (de) 2001-07-04
PT766814E (pt) 2001-12-28

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Legal Events

Date Code Title Description
B1 Patent granted (law 1993)
PUP Patent expired

Expiry date: 20140620