DK1507270T3 - Indretning til afprövning af en varistors ældningsgrad - Google Patents
Indretning til afprövning af en varistors ældningsgradInfo
- Publication number
- DK1507270T3 DK1507270T3 DK04356144T DK04356144T DK1507270T3 DK 1507270 T3 DK1507270 T3 DK 1507270T3 DK 04356144 T DK04356144 T DK 04356144T DK 04356144 T DK04356144 T DK 04356144T DK 1507270 T3 DK1507270 T3 DK 1507270T3
- Authority
- DK
- Denmark
- Prior art keywords
- varistor
- testing
- aging degree
- terminals
- voltages
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/12—Overvoltage protection resistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1236—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of surge arresters
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Thermistors And Varistors (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0309973A FR2858856B1 (fr) | 2003-08-14 | 2003-08-14 | Appareil de controle du vieillissement d'une varistance |
Publications (1)
Publication Number | Publication Date |
---|---|
DK1507270T3 true DK1507270T3 (da) | 2006-10-16 |
Family
ID=33561182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK04356144T DK1507270T3 (da) | 2003-08-14 | 2004-08-02 | Indretning til afprövning af en varistors ældningsgrad |
Country Status (8)
Country | Link |
---|---|
EP (1) | EP1507270B1 (da) |
AT (1) | ATE330320T1 (da) |
DE (1) | DE602004001181T2 (da) |
DK (1) | DK1507270T3 (da) |
ES (1) | ES2267024T3 (da) |
FR (1) | FR2858856B1 (da) |
PL (1) | PL1507270T3 (da) |
PT (1) | PT1507270E (da) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008005777A1 (de) * | 2008-01-23 | 2009-07-30 | Pikman, Yakov Markovich | Gerät zur Zuverlässigkeitsprüfung eines nichtlinearen Überspannungsschutzes |
US10848053B2 (en) * | 2018-07-13 | 2020-11-24 | Kohler Co. | Robust inverter topology |
DE102019209588B3 (de) * | 2019-07-01 | 2020-09-03 | Phoenix Contact Gmbh & Co. Kg | Verfahren zur Bestimmung des Alterungszustandes eines Überspannungsableiters, wobei dem Überspannungsableiter eine U/I-Kennlinie und eine Deratingkurve zugeordnet ist, und eine Vorrichtung zur Ausführung des Verfahrens |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2669004A (en) * | 1952-11-21 | 1954-02-16 | Bell Telephone Labor Inc | Varistor curve tracer |
DE3423444A1 (de) * | 1983-12-15 | 1985-09-05 | AVE S.p.A., Vestone, Brescia | Geraet fuer die begrenzung von oder den schutz vor auftretenden ueberspannungen mit einer hierin enthaltenen vorrichtung zum feststellen und anzeigen des auf alterung oder auf einen katastrophenfall zurueckgehenden lebensendes des geraetes |
DE4344443A1 (de) * | 1993-12-24 | 1995-06-29 | Bettermann Obo Ohg | Verfahren zur Funktionsprüfung von steckbaren Überspannungsableitern für elektrische Anlagen |
JPH11153636A (ja) * | 1997-11-21 | 1999-06-08 | Murata Mfg Co Ltd | バリスタの選別方法 |
-
2003
- 2003-08-14 FR FR0309973A patent/FR2858856B1/fr not_active Expired - Fee Related
-
2004
- 2004-08-02 DE DE602004001181T patent/DE602004001181T2/de active Active
- 2004-08-02 PT PT04356144T patent/PT1507270E/pt unknown
- 2004-08-02 PL PL04356144T patent/PL1507270T3/pl unknown
- 2004-08-02 ES ES04356144T patent/ES2267024T3/es active Active
- 2004-08-02 DK DK04356144T patent/DK1507270T3/da active
- 2004-08-02 EP EP04356144A patent/EP1507270B1/fr not_active Not-in-force
- 2004-08-02 AT AT04356144T patent/ATE330320T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE602004001181D1 (de) | 2006-07-27 |
FR2858856B1 (fr) | 2006-02-10 |
PT1507270E (pt) | 2006-10-31 |
DE602004001181T2 (de) | 2007-06-06 |
ES2267024T3 (es) | 2007-03-01 |
EP1507270B1 (fr) | 2006-06-14 |
FR2858856A1 (fr) | 2005-02-18 |
ATE330320T1 (de) | 2006-07-15 |
EP1507270A1 (fr) | 2005-02-16 |
PL1507270T3 (pl) | 2007-03-30 |
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