DK0427797T3 - Polarisationsinterferometer - Google Patents

Polarisationsinterferometer

Info

Publication number
DK0427797T3
DK0427797T3 DK90901537.2T DK90901537T DK0427797T3 DK 0427797 T3 DK0427797 T3 DK 0427797T3 DK 90901537 T DK90901537 T DK 90901537T DK 0427797 T3 DK0427797 T3 DK 0427797T3
Authority
DK
Denmark
Prior art keywords
double
refracting
wedges
parallel
light beam
Prior art date
Application number
DK90901537.2T
Other languages
English (en)
Inventor
Heinz Wagner
Martin Labhart
Ulrich Glaus
Original Assignee
Buehler Ag
Bran & L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Buehler Ag, Bran & L filed Critical Buehler Ag
Application granted granted Critical
Publication of DK0427797T3 publication Critical patent/DK0427797T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4537—Devices with refractive scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0261—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods polarised

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Polarising Elements (AREA)
DK90901537.2T 1989-03-03 1990-01-15 Polarisationsinterferometer DK0427797T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH80389 1989-03-03

Publications (1)

Publication Number Publication Date
DK0427797T3 true DK0427797T3 (da) 1994-10-17

Family

ID=4195552

Family Applications (1)

Application Number Title Priority Date Filing Date
DK90901537.2T DK0427797T3 (da) 1989-03-03 1990-01-15 Polarisationsinterferometer

Country Status (8)

Country Link
US (1) US5157458A (da)
EP (2) EP0605391A3 (da)
JP (1) JP2997312B2 (da)
AT (1) ATE111591T1 (da)
DE (1) DE59007132D1 (da)
DK (1) DK0427797T3 (da)
ES (1) ES2061011T3 (da)
WO (1) WO1990010191A1 (da)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69017159T2 (de) * 1989-12-11 1995-08-10 Konishiroku Photo Ind Laser-interferometrischer Messapparat.
DE4016731C3 (de) * 1990-05-24 2001-04-26 Bruker Analytik Gmbh Fourierspektrometer
DE4104636A1 (de) * 1991-02-15 1992-08-20 Bran & Luebbe Polarisationsinterferometer mit schmalbandfilter
DE4113842A1 (de) * 1991-04-27 1992-11-05 Deutsche Forsch Luft Raumfahrt Verfahren und einrichtung zur messung und bestimmung einer wegdifferenz in interferometern nach michelson
JPH05172738A (ja) * 1991-12-24 1993-07-09 Jasco Corp 音響セル
CH683713A5 (de) * 1992-02-18 1994-04-29 Buehler Ag Verfahren und Vorrichtung zum Erfassen von Parametern von Stoffen.
US5418612A (en) * 1992-02-27 1995-05-23 Renishaw, Plc Method of and apparatus for determining surface contour of diffusely reflecting objects
US5347377A (en) * 1992-06-17 1994-09-13 Eastman Kodak Company Planar waveguide liquid crystal variable retarder
CN1034883C (zh) * 1993-03-12 1997-05-14 复旦大学 一种椭圆偏振光谱仪的设计方法
US5440388A (en) * 1993-08-02 1995-08-08 Erickson; Jon W. Chemical analysis and imaging by discrete fourier transform spectroscopy
DE19623206B4 (de) * 1996-06-11 2007-12-13 Richard Frisse Gmbh Verfahren zum Veredeln von Schokolademasse
DE19650507C1 (de) * 1996-10-30 1997-12-18 O K Tec Optik Keramik Technolo Interferometrische Meßanordnung
CZ284282B6 (cs) * 1996-11-04 1998-10-14 Petr Heřman Způsob určení spektrálního složení elektromagnetického záření a zařízení k jeho provádění
US6646743B2 (en) 1996-11-04 2003-11-11 Petr Herman Method and device for the spectral analysis of light
US6222632B1 (en) 1999-04-07 2001-04-24 Luxtron Corporation Polarization interferometer spectrometer with rotatable birefringent element
DE19944355B4 (de) * 1999-09-16 2004-11-18 Leica Microsystems Heidelberg Gmbh Optische Anordnung
US7408713B1 (en) * 2002-01-08 2008-08-05 Yung-Chieh Hsieh Step-phase interferometric optical interleaver
AU2003216901A1 (en) * 2002-04-26 2003-11-10 International Business Machines Corporation Polarizing beamsplitter
EP1482287A1 (de) * 2003-05-26 2004-12-01 Abb Research Ltd. Polarisations-Fourier-Spektrometer
EP1873692B1 (en) 2006-06-29 2011-12-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP5950939B2 (ja) 2010-12-29 2016-07-13 スリーエム イノベイティブ プロパティズ カンパニー 屈折型偏波変換器及び偏光色合成器
US20140185052A1 (en) * 2012-12-27 2014-07-03 Qiushui Chen Fourier-transform spectrometer and method
CN104568151B (zh) * 2013-10-15 2016-08-10 南京理工大学 一种基于对称楔形干涉腔的高光谱全偏振成像装置及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3737235A (en) * 1972-02-10 1973-06-05 Cary Instruments Polarization interferometer with beam polarizing compensator
FR2300998A2 (fr) * 1975-02-11 1976-09-10 Anvar Dispositif pour la spectrometrie interferentielle a modulation selective
FR2340540A2 (fr) * 1976-02-05 1977-09-02 Anvar Dispositif pour la spectrometrie interferentielle a modulation selective
US4265540A (en) * 1979-10-01 1981-05-05 Laser Precision Corporation Refractively scanned interferometer
DD201191B1 (de) * 1981-09-24 1987-07-15 Ilmenau Tech Hochschule Kippinvariantes interferometer mit ebenen spiegeln
JPS59164925A (ja) * 1983-03-11 1984-09-18 Hitachi Ltd 屈折的走査法を用いた二光束干渉計
DE3542161A1 (de) * 1985-11-28 1987-06-04 Kayser Threde Gmbh Verfahren und vorrichtung zur reduktion der datenrate bei der fourierspektroskopie
DE3825683C1 (da) * 1988-07-28 1989-12-28 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch, De

Also Published As

Publication number Publication date
EP0605391A3 (en) 1994-07-27
WO1990010191A1 (de) 1990-09-07
ES2061011T3 (es) 1994-12-01
ATE111591T1 (de) 1994-09-15
EP0427797A1 (de) 1991-05-22
JPH03504643A (ja) 1991-10-09
EP0427797B1 (de) 1994-09-14
EP0605391A2 (de) 1994-07-06
DE59007132D1 (de) 1994-10-20
US5157458A (en) 1992-10-20
JP2997312B2 (ja) 2000-01-11

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Legal Events

Date Code Title Description
AHB Application shelved due to non-payment