GB2117132A - Interferometer - Google Patents

Interferometer Download PDF

Info

Publication number
GB2117132A
GB2117132A GB8307262A GB8307262A GB2117132A GB 2117132 A GB2117132 A GB 2117132A GB 8307262 A GB8307262 A GB 8307262A GB 8307262 A GB8307262 A GB 8307262A GB 2117132 A GB2117132 A GB 2117132A
Authority
GB
United Kingdom
Prior art keywords
polarization
optical fiber
interferometer
maintaining
perpendicularly crossing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB8307262A
Other versions
GB2117132B (en
GB8307262D0 (en
Inventor
Kiyofumi Mochizuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Publication of GB8307262D0 publication Critical patent/GB8307262D0/en
Publication of GB2117132A publication Critical patent/GB2117132A/en
Application granted granted Critical
Publication of GB2117132B publication Critical patent/GB2117132B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration
    • G01B9/02024Measuring in transmission, i.e. light traverses the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0226Fibres

Abstract

An interferometer, characterized by a polarization-maintaining optical fiber (312) for transmitting incident light while preserving planes of polarization in two perpendicularly crossing principal axes, a constant temperature bath (311) for maintaining the polarization- maintaining optical fiber at an arbitrary temperature, and combining means (313) for receiving light emitted from the polarization- maintaining optical fiber to combine components along the two perpendicularly crossing principal axes. An optical path difference is introduced between the 2 polarization states by passage through the fibre, which is proportional to the temp. of the fibre, and therefore the 2 states can be considered to follow 2 independent optical paths, the difference between which can be varied by changing the temp. of the bath. <IMAGE>

Description

SPECIFICATION Interferometer The present invention relates to an interferometer.
An example of a known interferometer is a Mach-Zehnder interferometer. However, high precision measurement is impossible with such a conventional interferometer.
It is an object of the present invention to provide an interferometer which permits high precision variatios of the optical path lengths of two light waves by using an optical fiber and changing its atmosphere temperature.
In accordance with the present invention, there is provided an interferometer, comprising a polarization-maintaining optical fiber for transmitting incident light while preserving planes of polarization in two perpendicularly crossing principal axes, a constant temperature bath for maintaining the polarization-maintaining optical fiber at an arbitrary temperature, and combining means for receiving light emitted from the polarization-maintaining optical fiber to combine components along the two perpendicularly crossing principal axes, wherein two optical waveguides extending along the two perpendicularly crossing principal axes are used as two independent optical paths, and a difference in length between the optical paths is varied by changing atmosphere temperature in the constant temperature bath.
Embodiments of the present invention will now be described, by way of example, with reference to the accompanying drawings, in which: Fig. 1 is a system diagram showing the arrangement of an example of a known interferometer; Fig. 2 is a perspective view illustrating a basic arrangement of a part of an interferometer of the present invention; Fig. 3 is a system diagram illustrating an embodiment of the present invention; Fig. 4 is a system diagram showing an arrangement of a partly modified portion of the embodiment of Fig. 3; and Fig. 5 is a graph showing, by way of example, output variations of an analyzer with respect to temperature changes of the atmosphere of a polarization-maintaining optical fiber for use in the present invention.
To distinguish the present invention from the prior art, an example of a known interferometers will first be described.
An interferometer heretofore employed is such as shown in Fig. 1. The illustrated interferometer is commonly referred to as a Mach-Zehnder interferometer. In Fig. 1, light waves 11 are branched by a beam splitter 12 into light waves 1 3 and 14. These two light waves are, respectively, reflected by a mirror 1 5 and an optical delay line 19 and a mirror 16, and then combined again by a beam splitter 1 7 into a composite wave 18. In this interferometer, one of the optical paths is used as a test optical path while the other a reference optical path. In this case, since adjustment of the delay time of the optical delay line 19 is carried out mechanically, high precision measurement is impossible.
A detailed description will now be given of embodiments of the present invention with reference to Figures 2 to 5.
Fig. 2 shows a basic arrangement of the present invention. In Fig. 2, light waves rendered by a polarizer 21 into linearly polarized light are rotated, as they are, by a half-wave plate 23 so that they may lie intermediate between two perpendicularly crossing principal axes 25 and 26 of a stress-induced polarization-maintaining optical fiber 29 which transmits light while preserving the plane of polarization in the two perpendicularly crossing principal axes. The polarization-maintaining optical fiber 29 is an optical fiber designed so that two perpendicularly crossing linearly polarized light waves 27 and 28 may propagate therethrough independently without mode coupling to each other; it can be said that two independent optical waveguides along the principal axes 25 and 26 are formed by one optical fiber.Upon entering the polarizationmaintaining optical fiber 29, the light waves 24, rotated by the halfwave plate 23 so that they may lie intermediate between the two principal axes 25 and 26, are split into light waves 27 and 28 and propagate independently in the optical fiber.
At the output side of the optical fiber, the light waves 27 and 28 are partly combined by an analyzer 210 into light waves 211.
On the other hand, since the two perpendicularly crossing optical waveguides of the polarization-maintaining optical fiber 29 have different refractive indexes, the two light waves 27 and 28 propagate at different different velocities. In consequence, the light waves 27 and 28 have a phase difference 5R therebetween at the output side of the polarization-maintaining optical fiber 29.The phase difference err is given by the following equation:
where A is the wavelength of the light waves 24, L is the length of the polarization-maintaining optical fiber 29, Cp is the optical elastic constant of the polarization-maintaining optical fiber 29, a is a proportional coefficient related to the Young's modulus, the Poisson's ratio and thermal expansion coefficient of the polarizationmaintaining optical fiber 29, To is the softening temperature of silica glass containing a dopant, which is about 1000 C and T is the temperature of the atmosphere in which the polarizationmaintaining optical fiber 29 is placed. Eq. (1) indicates that the phase difference r, between the light waves 27 and 28 bears a linear relation to a temperature variation.Namely, the temperature variation corresponds to movement of the optical delay line 19 of the interferometer shown in Fig. 1. The beam splitter 12 and the beam splitter 17 in Fig. 1 correspond to the end face 212 of the polarization-maintaining optical fiber 29 on the input side thereof and the analyzer 210 in Fig. 2.
The polarization-maintaining optical fiber 29 is housed in a constant temperature bath which can be set at an arbitrary temperature. Fig. 5 shows an example of measured results of output variations of the analyzer with temperature changes of the atmosphere of the polarization maintaining optical fiber. It is seen from Fig. 5 that the optical output undergoes sinusoidal variations with the temperature changes.
Fig. 3 illustrates an embodiment of the present invention. In Fig. 3, light waves 31 are split by a beam splitter 32 into light waves 33 and 34. The two light waves are respectively rendered into perpendicularly crossing linearly polarized light waves by halfwave plates or polarizers 35 and 36 and halfwave plates 38 and 39 depending on whether they are linearly polarized light waves or not, and they are combined again by a beam splitter 37. Composite waves 316 of the two perpendicularly light waves are brought by a halfwave plate 310 into alignment with two perpendicularly crossing axes of a polarization maintaining optical fiber 312 to propagate therein. The two perpendicularly crossing light waves are supplied to an analyzer 313, from which only components in its axial direction are sent out.The delay path of this interferometer is constituted by changing the temperature of the polarization-maintaining optical fiber by changing the temperature of the atmosphere of a constant temperature bath 311 the temperature of which can be set as desired. The amount of change in temperature, in the case of the light waves 31 emitted from an He-Ne laser (having a wavelength of 0.6328 m), can easily be held below 0.1 ym/C-m per unit length and unit temperature change of the polarization maintaining optical fiber, and the temperature can be changed continuously.
While the foregoing description has been given in connection with the interferometer which is a combination of the polarization-maintaining optical fiber and the Mach-Zehnder interferometer, it is possible to produce an interferometer similar to that described above from another interferometer with the polarization maintaining optical fiber. By using two optical paths of this interferometer as a test optical path and a reference optical path, respectively, the refractive index of a material or the coherence of a -light source can be measured with high accuracy.
For this measurement, it is possible to employ a method of obtaining the abovesaid refractive index from variations in the coherence through using a photo detector 314 or a method of obtaining it from displacement of interference fringes by using a screen in place of the photo detector 314.
The part of the inferometer formed between the beam splitters 32 and 37 in Fig. 3 can also be arranged as shown in Fig. 4. In Fig. 4, reference numerals 41 and 42 indicate a combination of a polarizer and a halfwave plate, or a polarizer and a 1/4 plate; in the case of the former, the output light of the halfwave plate 42 is adjusted to be inclined 45 degrees to the principal axis of a polarization beam splitter 43 and, in the case of the latter, the output of the 1/4 wave plate 42 is adjusted to be a circularly polarized light.
Reference numerals 44 and 45 designate mirrors, and 46 identifies a polarization beam splitter.
As has been described in the foregoing, the present invention employs two perpendicularly crossing transmission lines of the polarizationmaintaining optical fiber as two optical paths or a part of the optical path of the interferometer and utilizes the fact that the difference in lengths between the two optical paths is varied by temperature with high accuracy; the invention offers an optical fiber interferometer having an optical delay line which moves with high accuracy.

Claims (2)

Claims
1. An interferometer, comprising a polarization-maintaining optical fiber for transmitting incident light while preserving planes of polarization in two perpendicularly crossing principal axes, a constant temperature bath for maintaining the polarization-maintaining optical fiber at an arbitrary temperature, combining means for receiving light emitted from the polarization-maintaining optical fiber to combine components along the two perpendicularly crossing principal axes, wherein two optical waveguides extending along the two perpendicularly crossing principal axes are used as two independent optical paths, and means are provided for controlling the atmosphere temperature in the constant temperature bath to vary a difference in length between the optical paths.
2. An interferometer substantially as herein described with reference to Figure 2 with or without reference to Figures 3 and 4 of the accompanying drawings.
GB8307262A 1982-03-19 1983-03-16 Interferometer Expired GB2117132B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57042584A JPS58160848A (en) 1982-03-19 1982-03-19 Photointerferometer

Publications (3)

Publication Number Publication Date
GB8307262D0 GB8307262D0 (en) 1983-04-20
GB2117132A true GB2117132A (en) 1983-10-05
GB2117132B GB2117132B (en) 1986-01-22

Family

ID=12640111

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8307262A Expired GB2117132B (en) 1982-03-19 1983-03-16 Interferometer

Country Status (2)

Country Link
JP (1) JPS58160848A (en)
GB (1) GB2117132B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1986000402A1 (en) * 1984-06-30 1986-01-16 Kent Scientific And Industrial Projects Limited Interferometric sensor
FR2611279A1 (en) * 1987-02-19 1988-08-26 Brother Ind Ltd OPTICAL FREQUENCY SHIFT DEVICE
FR2697336A1 (en) * 1992-10-28 1994-04-29 Inst Francais Du Petrole Method and device for differential measurement of refractive indices and associated use.
WO2007025834A1 (en) * 2005-09-01 2007-03-08 Robert Bosch Gmbh Interferrometric measuring device
CN104330162A (en) * 2014-11-17 2015-02-04 中国科学院光电研究院 Portable Fourier transformation spectrograph

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2507790B2 (en) * 1988-12-20 1996-06-19 富士通株式会社 Semiconductor laser FM modulation characteristic measuring device
JP2802390B2 (en) * 1989-06-02 1998-09-24 日本電信電話株式会社 Optical frequency modulation characteristics measurement device
JPH0359428A (en) * 1989-07-28 1991-03-14 Fujitsu Ltd Method and device for measuring frequency modulation characteristic of semiconductor laser
KR101358091B1 (en) * 2012-01-11 2014-02-06 주식회사 고영테크놀러지 An Interferometer using asymmetric polarization and Optical Apparatus using the Interferometer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1175855A (en) * 1966-08-25 1970-01-01 American Optical Corp Improvements in or relating to information processors

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1175855A (en) * 1966-08-25 1970-01-01 American Optical Corp Improvements in or relating to information processors

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1986000402A1 (en) * 1984-06-30 1986-01-16 Kent Scientific And Industrial Projects Limited Interferometric sensor
US4725143A (en) * 1984-06-30 1988-02-16 Kent Scientific And Industrial Projects Limited Interferometric sensor
FR2611279A1 (en) * 1987-02-19 1988-08-26 Brother Ind Ltd OPTICAL FREQUENCY SHIFT DEVICE
US4852106A (en) * 1987-02-19 1989-07-25 Brother Kogyo Kabushiki Kaisha Optical system for producing controlled beat frequency
FR2697336A1 (en) * 1992-10-28 1994-04-29 Inst Francais Du Petrole Method and device for differential measurement of refractive indices and associated use.
WO1994010552A1 (en) * 1992-10-28 1994-05-11 Institut Français Du Petrole Process and device for the differential measurement of refraction indexes and use thereof
WO2007025834A1 (en) * 2005-09-01 2007-03-08 Robert Bosch Gmbh Interferrometric measuring device
CN104330162A (en) * 2014-11-17 2015-02-04 中国科学院光电研究院 Portable Fourier transformation spectrograph

Also Published As

Publication number Publication date
GB2117132B (en) 1986-01-22
JPS6352694B2 (en) 1988-10-19
JPS58160848A (en) 1983-09-24
GB8307262D0 (en) 1983-04-20

Similar Documents

Publication Publication Date Title
JP4316691B2 (en) Device for measuring excursion
US5648848A (en) Beam delivery apparatus and method for interferometry using rotatable polarization chucks
Berger et al. Integrated optics for astronomical interferometry-II. first laboratory white-light interferograms
US7426039B2 (en) Optically balanced instrument for high accuracy measurement of dimensional change
US20180364431A1 (en) Compact and low cost beam launcher using planar lightwave circuit
US4798468A (en) Interference apparatus for detecting state of wave surface
Yu et al. Distributed measurement of polarization characteristics for a multifunctional integrated optical chip: A review
JPH0342622B2 (en)
GB2117132A (en) Interferometer
US4762417A (en) Fringe scanning point diffraction interferometer by polarization
EP1286132A2 (en) Birefringent beam combiners for polarized beams in interferometers
US5311279A (en) Integrated optical apparatus for the interferometric measurement of light waves
EP0059644B1 (en) Optical gyroscope
Bock et al. Characterization of highly birefringent optical fibers using interferometric techniques
US6775005B2 (en) Low-coherence reflectometer with polarization control
Hand et al. Extrinsic Michelson interferometric fibre optic sensor with bend insensitive downlead
JPH0464030B2 (en)
GB2245381A (en) Fourier spectrometer
JPS6227603A (en) Optical measuring apparatus of displacement
RU2313066C1 (en) Interferometric mode of measuring the thickness and the values of refraction of transparent objects
JPH0440649B2 (en)
JPS633236A (en) Wavelength dispersion measuring instrument for optical fiber
US20060279740A1 (en) Optically balanced instrument for high accuracy measurement of dimensional change
JPS5935102A (en) Polarization plane retaining-optical fiber type sensor
JPS6332339A (en) Optical fiber dispersion measuring instrument

Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20020316