DE8701592U1 - Laserinterferometer-Refraktometer - Google Patents

Laserinterferometer-Refraktometer

Info

Publication number
DE8701592U1
DE8701592U1 DE8701592U DE8701592U DE8701592U1 DE 8701592 U1 DE8701592 U1 DE 8701592U1 DE 8701592 U DE8701592 U DE 8701592U DE 8701592 U DE8701592 U DE 8701592U DE 8701592 U1 DE8701592 U1 DE 8701592U1
Authority
DE
Germany
Prior art keywords
refractometer according
partial
beam splitter
path
end plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8701592U
Other languages
German (de)
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DR DIETER FROELICH PHYSIKALISCHE OPTIK und OPTOELEKTRONIK ENTWICKLUNG - HERSTELLUNG - VERTRIEB 3000 HANNOVER DE
Original Assignee
DR DIETER FROELICH PHYSIKALISCHE OPTIK und OPTOELEKTRONIK ENTWICKLUNG - HERSTELLUNG - VERTRIEB 3000 HANNOVER DE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DR DIETER FROELICH PHYSIKALISCHE OPTIK und OPTOELEKTRONIK ENTWICKLUNG - HERSTELLUNG - VERTRIEB 3000 HANNOVER DE filed Critical DR DIETER FROELICH PHYSIKALISCHE OPTIK und OPTOELEKTRONIK ENTWICKLUNG - HERSTELLUNG - VERTRIEB 3000 HANNOVER DE
Priority to DE8701592U priority Critical patent/DE8701592U1/de
Publication of DE8701592U1 publication Critical patent/DE8701592U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
DE8701592U 1987-02-03 1987-02-03 Laserinterferometer-Refraktometer Expired DE8701592U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8701592U DE8701592U1 (de) 1987-02-03 1987-02-03 Laserinterferometer-Refraktometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE8701592U DE8701592U1 (de) 1987-02-03 1987-02-03 Laserinterferometer-Refraktometer

Publications (1)

Publication Number Publication Date
DE8701592U1 true DE8701592U1 (de) 1987-05-21

Family

ID=6804262

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8701592U Expired DE8701592U1 (de) 1987-02-03 1987-02-03 Laserinterferometer-Refraktometer

Country Status (1)

Country Link
DE (1) DE8701592U1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0277496A2 (fr) * 1987-02-03 1988-08-10 Spindler & Hoyer GmbH & Co.KG. Interféromètre-réfractomètre laser

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0277496A2 (fr) * 1987-02-03 1988-08-10 Spindler & Hoyer GmbH & Co.KG. Interféromètre-réfractomètre laser
EP0277496A3 (en) * 1987-02-03 1989-05-03 Spindler & Hoyer Gmbh & Co.Kg. Laser interferometer-refractometer

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