DE69921084T8 - Zerstörungsfreie Prüfung ( Ultraschall ) mit positiver Rückkopplungsschleife und Filter - Google Patents

Zerstörungsfreie Prüfung ( Ultraschall ) mit positiver Rückkopplungsschleife und Filter Download PDF

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Publication number
DE69921084T8
DE69921084T8 DE69921084T DE69921084T DE69921084T8 DE 69921084 T8 DE69921084 T8 DE 69921084T8 DE 69921084 T DE69921084 T DE 69921084T DE 69921084 T DE69921084 T DE 69921084T DE 69921084 T8 DE69921084 T8 DE 69921084T8
Authority
DE
Germany
Prior art keywords
ultrasonic
filter
feedback loop
positive feedback
destructive testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE69921084T
Other languages
English (en)
Other versions
DE69921084T2 (de
DE69921084D1 (de
Inventor
Ryosuke Taniguchi
Shinichi Hattori
Takahiro Sakamoto
Takashi Shimada
Kanji Hiroshima-shi MATSUHASHI
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MATSUHASHI TECHNO RES CO
MATSUHASHI TECHNO RESEARCH Co Ltd
Mitsubishi Electric Corp
Original Assignee
MATSUHASHI TECHNO RES CO
MATSUHASHI TECHNO RESEARCH Co Ltd
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MATSUHASHI TECHNO RES CO, MATSUHASHI TECHNO RESEARCH Co Ltd, Mitsubishi Electric Corp filed Critical MATSUHASHI TECHNO RES CO
Application granted granted Critical
Publication of DE69921084D1 publication Critical patent/DE69921084D1/de
Publication of DE69921084T2 publication Critical patent/DE69921084T2/de
Publication of DE69921084T8 publication Critical patent/DE69921084T8/de
Active legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2412Probes using the magnetostrictive properties of the material to be examined, e.g. electromagnetic acoustic transducers [EMAT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/40Detecting the response signal, e.g. electronic circuits specially adapted therefor by amplitude filtering, e.g. by applying a threshold or by gain control
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/42Detecting the response signal, e.g. electronic circuits specially adapted therefor by frequency filtering or by tuning to resonant frequency
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/01Indexing codes associated with the measuring variable
    • G01N2291/014Resonance or resonant frequency
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/02827Elastic parameters, strength or force
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/02854Length, thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/042Wave modes
    • G01N2291/0421Longitudinal waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/10Number of transducers
    • G01N2291/102Number of transducers one emitter, one receiver

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
DE69921084T 1998-09-01 1999-08-31 Zerstörungsfreie Prüfung ( Ultraschall ) mit positiver Rückkopplungsschleife und Filter Active DE69921084T8 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP24752098 1998-09-01
JP24752098 1998-09-01
PCT/JP1999/004719 WO2000013008A1 (fr) 1998-09-01 1999-08-31 Appareil permettant d'effectuer des tests sans causer de dommages

Publications (3)

Publication Number Publication Date
DE69921084D1 DE69921084D1 (de) 2004-11-18
DE69921084T2 DE69921084T2 (de) 2006-02-02
DE69921084T8 true DE69921084T8 (de) 2006-04-27

Family

ID=17164721

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69921084T Active DE69921084T8 (de) 1998-09-01 1999-08-31 Zerstörungsfreie Prüfung ( Ultraschall ) mit positiver Rückkopplungsschleife und Filter

Country Status (5)

Country Link
US (1) US6202490B1 (de)
EP (1) EP1028314B1 (de)
JP (1) JP4357120B2 (de)
DE (1) DE69921084T8 (de)
WO (1) WO2000013008A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3813580B2 (ja) * 2000-08-28 2006-08-23 三菱電機株式会社 構造物検査装置
JP2003194636A (ja) * 2001-12-27 2003-07-09 Mitsubishi Electric Corp 杭の動的載荷装置、杭の動的載荷法および動的載荷試験法
US7174787B2 (en) * 2003-03-13 2007-02-13 Andec Manufacturing Ltd. System and method for inspecting an industrial furnace or the like
JP4740748B2 (ja) * 2006-01-16 2011-08-03 新日鉄エンジニアリング株式会社 耐火物煉瓦間の空隙検査方法
CN1908649B (zh) * 2006-08-03 2010-05-12 长安大学 一种混凝土结构层析成像检测系统
JP2009216585A (ja) * 2008-03-11 2009-09-24 Hitachi Information & Communication Engineering Ltd 管長測定システム及びその測定方法
JP5624271B2 (ja) * 2008-09-17 2014-11-12 株式会社東芝 配管の厚み測定方法および装置
JPWO2010110423A1 (ja) * 2009-03-26 2012-10-04 並木精密宝石株式会社 圧電磁歪複合型磁気センサ
JP5305023B2 (ja) * 2009-06-15 2013-10-02 パルステック工業株式会社 製品検査装置および製品検査方法
KR101101413B1 (ko) 2010-05-07 2012-01-02 한국과학기술원 비파괴검사를 위한 레이저 시스템
RU2473892C1 (ru) * 2011-09-14 2013-01-27 Александр Сергеевич Колеватов Способ неразрушающего теплового контроля состояния арматуры в протяженных железобетонных изделиях
US8903675B2 (en) * 2011-10-14 2014-12-02 Vibrant Corporation Acoustic systems and methods for nondestructive testing of a part through frequency sweeps
JP5904339B2 (ja) * 2013-03-08 2016-04-13 三菱電機株式会社 液体検知方法および液体検知装置
KR101635708B1 (ko) * 2015-05-22 2016-07-01 영남대학교 산학협력단 반사계수를 이용한 균열 검출 시스템 및 그것을 이용한 균열 검출 방법
KR101707632B1 (ko) * 2015-08-24 2017-02-20 영남대학교 산학협력단 투과계수를 이용한 균열 검출 시스템 및 그것을 이용한 균열 검출 방법
US10145820B2 (en) * 2016-03-02 2018-12-04 Drexel University Identification of water pipe material based on stress wave propagation
CN106404905B (zh) * 2016-08-31 2019-01-01 江苏筑升土木工程科技有限公司 一种智能化冲击映像法检测系统
US10724996B2 (en) * 2017-03-17 2020-07-28 Kabushiki Kaisha Toshiba Position location system, position location method, and non-transitory computer readable storage medium
KR102218069B1 (ko) * 2019-04-29 2021-02-22 영남대학교 산학협력단 전자파와 차단 캐비티 프로브를 이용한 도체 균열 검출장치 및 도체 균열 검출 방법
CN113390962A (zh) * 2021-04-30 2021-09-14 同济大学 基于定向敲击的可植入式混凝土构件损伤监测装置及方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4140021A (en) * 1976-10-08 1979-02-20 Agency Of Industrial Science & Technology Method and device for monitoring superconducting system
US4249422A (en) * 1979-10-22 1981-02-10 The United States Of America As Represented By The Secretary Of The Navy Apparatus and process for determining the composition of fluid-filled cavities
US4446733A (en) * 1981-08-17 1984-05-08 Design Professionals Financial Corporation Stress control in solid materials
US4566084A (en) * 1982-09-30 1986-01-21 The United States Of America As Represented By The United States Department Of Energy Acoustic velocity measurements in materials using a regenerative method
JP2581929B2 (ja) * 1987-09-07 1997-02-19 株式会社 東横エルメス コンクリ−トの厚さ及び内在ひび割れ深度の測定装置
JP2618696B2 (ja) * 1988-08-25 1997-06-11 昭雄 岩瀬 剥離タイル検出装置
JPH07218477A (ja) * 1994-01-31 1995-08-18 Tomohiko Akuta 探査装置
US5675325A (en) * 1995-10-20 1997-10-07 Japan National Oil Corporation Information transmitting apparatus using tube body
JPH10253339A (ja) * 1997-03-06 1998-09-25 Mitsubishi Electric Corp 音波利用計測方法及び計測装置

Also Published As

Publication number Publication date
DE69921084T2 (de) 2006-02-02
WO2000013008A1 (fr) 2000-03-09
JP4357120B2 (ja) 2009-11-04
EP1028314B1 (de) 2004-10-13
EP1028314A1 (de) 2000-08-16
DE69921084D1 (de) 2004-11-18
US6202490B1 (en) 2001-03-20
EP1028314A4 (de) 2001-11-07

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