DE69911591D1 - Leseschaltung für einen nichtflüchtigen Speicher - Google Patents
Leseschaltung für einen nichtflüchtigen SpeicherInfo
- Publication number
- DE69911591D1 DE69911591D1 DE69911591T DE69911591T DE69911591D1 DE 69911591 D1 DE69911591 D1 DE 69911591D1 DE 69911591 T DE69911591 T DE 69911591T DE 69911591 T DE69911591 T DE 69911591T DE 69911591 D1 DE69911591 D1 DE 69911591D1
- Authority
- DE
- Germany
- Prior art keywords
- volatile memory
- read circuit
- read
- circuit
- volatile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
- G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99830469A EP1071096B1 (de) | 1999-07-22 | 1999-07-22 | Leseschaltung für einen nichtflüchtigen Speicher |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69911591D1 true DE69911591D1 (de) | 2003-10-30 |
Family
ID=8243514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69911591T Expired - Lifetime DE69911591D1 (de) | 1999-07-22 | 1999-07-22 | Leseschaltung für einen nichtflüchtigen Speicher |
Country Status (4)
Country | Link |
---|---|
US (1) | US6327184B1 (de) |
EP (1) | EP1071096B1 (de) |
JP (1) | JP3655538B2 (de) |
DE (1) | DE69911591D1 (de) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1318013B1 (it) * | 2000-06-13 | 2003-07-21 | St Microelectronics Srl | Disposizione circuitale per l'abbassamento della tensione di soglia di un transistore configurato a diodo. |
US6535434B2 (en) | 2001-04-05 | 2003-03-18 | Saifun Semiconductors Ltd. | Architecture and scheme for a non-strobed read sequence |
IL148959A (en) * | 2001-04-05 | 2006-09-05 | Saifun Semiconductors Ltd | Architecture and scheme for a non-strobed read sequence |
US6917544B2 (en) | 2002-07-10 | 2005-07-12 | Saifun Semiconductors Ltd. | Multiple use memory chip |
US7136304B2 (en) | 2002-10-29 | 2006-11-14 | Saifun Semiconductor Ltd | Method, system and circuit for programming a non-volatile memory array |
US7178004B2 (en) | 2003-01-31 | 2007-02-13 | Yan Polansky | Memory array programming circuit and a method for using the circuit |
US7652930B2 (en) | 2004-04-01 | 2010-01-26 | Saifun Semiconductors Ltd. | Method, circuit and system for erasing one or more non-volatile memory cells |
US7009880B1 (en) | 2004-08-17 | 2006-03-07 | Programmable Microelectronics Corporation | Non-volatile memory architecture to improve read performance |
US7638850B2 (en) | 2004-10-14 | 2009-12-29 | Saifun Semiconductors Ltd. | Non-volatile memory structure and method of fabrication |
US7082061B2 (en) * | 2004-12-03 | 2006-07-25 | Macronix International Co., Ltd. | Memory array with low power bit line precharge |
US7082069B2 (en) * | 2004-12-03 | 2006-07-25 | Macronix International Co., Ltd. | Memory array with fast bit line precharge |
US8053812B2 (en) | 2005-03-17 | 2011-11-08 | Spansion Israel Ltd | Contact in planar NROM technology |
FR2885726B1 (fr) * | 2005-05-11 | 2007-07-06 | Atmel Corp | Circuit amplificateur de detection pour la detection parallele de quatre niveaux de courant |
WO2006124159A2 (en) * | 2005-05-11 | 2006-11-23 | Atmel Corporation | Sense amplifier circuit for parallel sensing of four current levels |
US8400841B2 (en) | 2005-06-15 | 2013-03-19 | Spansion Israel Ltd. | Device to program adjacent storage cells of different NROM cells |
EP1746645A3 (de) | 2005-07-18 | 2009-01-21 | Saifun Semiconductors Ltd. | Speicherzellenanordnung mit sub-minimalem Wortleitungsabstand und Verfahren zu deren Herstellung |
US7668017B2 (en) | 2005-08-17 | 2010-02-23 | Saifun Semiconductors Ltd. | Method of erasing non-volatile memory cells |
TWI334575B (en) * | 2005-11-22 | 2010-12-11 | Ind Tech Res Inst | Radio frequency identification tag with embedded memroy testing scheme and the method of testing the same |
US7808818B2 (en) | 2006-01-12 | 2010-10-05 | Saifun Semiconductors Ltd. | Secondary injection for NROM |
US7760554B2 (en) | 2006-02-21 | 2010-07-20 | Saifun Semiconductors Ltd. | NROM non-volatile memory and mode of operation |
US7692961B2 (en) | 2006-02-21 | 2010-04-06 | Saifun Semiconductors Ltd. | Method, circuit and device for disturb-control of programming nonvolatile memory cells by hot-hole injection (HHI) and by channel hot-electron (CHE) injection |
US8253452B2 (en) | 2006-02-21 | 2012-08-28 | Spansion Israel Ltd | Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same |
US7701779B2 (en) | 2006-04-27 | 2010-04-20 | Sajfun Semiconductors Ltd. | Method for programming a reference cell |
US7369450B2 (en) | 2006-05-26 | 2008-05-06 | Freescale Semiconductor, Inc. | Nonvolatile memory having latching sense amplifier and method of operation |
US8665651B1 (en) * | 2012-09-11 | 2014-03-04 | Winbond Electronics Corp. | Reference cell circuit and method of producing a reference current |
TWI485713B (zh) * | 2012-12-11 | 2015-05-21 | Winbond Electronics Corp | 用以產生參考電流之參考單元電路以及方法 |
ITUA20161478A1 (it) * | 2016-03-09 | 2017-09-09 | St Microelectronics Srl | Circuito e metodo di lettura di una cella di memoria di un dispositivo di memoria non volatile |
US11107509B1 (en) | 2020-06-12 | 2021-08-31 | Micron Technology, Inc. | Continuous sensing to determine read points |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4223394A (en) * | 1979-02-13 | 1980-09-16 | Intel Corporation | Sensing amplifier for floating gate memory devices |
JPS63239694A (ja) * | 1987-03-27 | 1988-10-05 | Toshiba Corp | 半導体記憶装置 |
US4879682A (en) * | 1988-09-15 | 1989-11-07 | Motorola, Inc. | Sense amplifier precharge control |
JP2601903B2 (ja) * | 1989-04-25 | 1997-04-23 | 株式会社東芝 | 半導体記憶装置 |
WO1993018412A1 (en) * | 1992-03-13 | 1993-09-16 | Silicon Storage Technology, Inc. | A sensing circuit for a floating gate memory device |
EP0740307B1 (de) * | 1995-04-28 | 2001-12-12 | STMicroelectronics S.r.l. | Leseverstärkerschaltung für Halbleiterspeicheranordnungen |
EP0814484B1 (de) * | 1996-06-18 | 2003-09-17 | STMicroelectronics S.r.l. | Nichtflüchtiger Speicher mit Einzelzellenreferenzsignalgeneratorschaltung zum Auslesen von Speicherzellen |
FR2762434B1 (fr) * | 1997-04-16 | 1999-05-28 | Sgs Thomson Microelectronics | Circuit de lecture de memoire avec dispositif de limitation de precharge |
DE69820594D1 (de) * | 1998-05-29 | 2004-01-29 | St Microelectronics Srl | Anordnung und Verfahren zum Lesen von nichtflüchtigen Speicherzellen |
-
1999
- 1999-07-22 EP EP99830469A patent/EP1071096B1/de not_active Expired - Lifetime
- 1999-07-22 DE DE69911591T patent/DE69911591D1/de not_active Expired - Lifetime
-
2000
- 2000-07-21 US US09/621,019 patent/US6327184B1/en not_active Expired - Lifetime
- 2000-07-21 JP JP2000253119A patent/JP3655538B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2001084782A (ja) | 2001-03-30 |
EP1071096A1 (de) | 2001-01-24 |
JP3655538B2 (ja) | 2005-06-02 |
EP1071096B1 (de) | 2003-09-24 |
US6327184B1 (en) | 2001-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |