DE69839919D1 - Testschaltung für ein asic - Google Patents

Testschaltung für ein asic

Info

Publication number
DE69839919D1
DE69839919D1 DE69839919T DE69839919T DE69839919D1 DE 69839919 D1 DE69839919 D1 DE 69839919D1 DE 69839919 T DE69839919 T DE 69839919T DE 69839919 T DE69839919 T DE 69839919T DE 69839919 D1 DE69839919 D1 DE 69839919D1
Authority
DE
Germany
Prior art keywords
logic blocks
logic
user
array
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69839919T
Other languages
German (de)
English (en)
Inventor
Dana How
Adi Srinivasan
Robert Osann
Shridhar Mukund
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Callahan Cellular LLC
Original Assignee
Lightspeed Logic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lightspeed Logic Inc filed Critical Lightspeed Logic Inc
Application granted granted Critical
Publication of DE69839919D1 publication Critical patent/DE69839919D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE69839919T 1997-12-05 1998-11-23 Testschaltung für ein asic Expired - Lifetime DE69839919D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/985,790 US6223313B1 (en) 1997-12-05 1997-12-05 Method and apparatus for controlling and observing data in a logic block-based asic
PCT/US1998/025086 WO1999030236A1 (en) 1997-12-05 1998-11-23 TEST CIRCUITRY FOR ASICs

Publications (1)

Publication Number Publication Date
DE69839919D1 true DE69839919D1 (de) 2008-10-02

Family

ID=25531796

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69839919T Expired - Lifetime DE69839919D1 (de) 1997-12-05 1998-11-23 Testschaltung für ein asic

Country Status (6)

Country Link
US (1) US6223313B1 (enExample)
EP (1) EP1034479B1 (enExample)
JP (1) JP4361681B2 (enExample)
AT (1) ATE405883T1 (enExample)
DE (1) DE69839919D1 (enExample)
WO (1) WO1999030236A1 (enExample)

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JPH08263438A (ja) * 1994-11-23 1996-10-11 Xerox Corp ディジタルワークの配給及び使用制御システム並びにディジタルワークへのアクセス制御方法
US6055659A (en) * 1999-02-26 2000-04-25 Texas Instruments Incorporated Boundary scan with latching output buffer and weak input buffer
US6014038A (en) * 1997-03-21 2000-01-11 Lightspeed Semiconductor Corporation Function block architecture for gate array
US6348828B1 (en) * 2000-09-29 2002-02-19 Agilent Technologies, Inc. Clock enable circuit for use in a high speed reprogrammable delay line incorporating glitchless enable/disable functionality
US6373312B1 (en) 2000-09-29 2002-04-16 Agilent Technologies, Inc. Precision, high speed delay system for providing delayed clock edges with new delay values every clock period
US6320419B1 (en) * 2000-10-04 2001-11-20 International Business Machines Corporation Non-latency affected contention prevention during scan-based test
NZ508052A (en) * 2000-11-09 2003-06-30 Derek Ward Programmable controller
US6694463B2 (en) * 2001-01-16 2004-02-17 Atmel Corporation Input/output continuity test mode circuit
US6696856B1 (en) 2001-10-30 2004-02-24 Lightspeed Semiconductor Corporation Function block architecture with variable drive strengths
US7039843B2 (en) * 2001-11-13 2006-05-02 Sun Microsystems, Inc. Modeling custom scan flops in level sensitive scan design
US6545501B1 (en) 2001-12-10 2003-04-08 International Business Machines Corporation Method and system for use of a field programmable function within a standard cell chip for repair of logic circuits
US7047464B2 (en) * 2001-12-10 2006-05-16 International Business Machines Corporation Method and system for use of a field programmable function within an application specific integrated circuit (ASIC) to access internal signals for external observation and control
US6668361B2 (en) 2001-12-10 2003-12-23 International Business Machines Corporation Method and system for use of a field programmable function within a chip to enable configurable I/O signal timing characteristics
US6754881B2 (en) 2001-12-10 2004-06-22 International Business Machines Corporation Field programmable network processor and method for customizing a network processor
US6861867B2 (en) * 2002-03-07 2005-03-01 Lightspeed Semiconductor Corporation Method and apparatus for built-in self-test of logic circuits with multiple clock domains
US7145977B2 (en) * 2003-07-30 2006-12-05 International Business Machines Corporation Diagnostic method and apparatus for non-destructively observing latch data
US7970594B2 (en) * 2005-06-30 2011-06-28 The Mathworks, Inc. System and method for using model analysis to generate directed test vectors
US7461365B1 (en) * 2005-07-09 2008-12-02 Lightspeed Logic, Inc. Increased effective flip-flop density in a structured ASIC
US9471479B2 (en) * 2005-10-05 2016-10-18 International Business Machines Corporation Method and system for simulating job entry subsystem (JES) operation
US8332793B2 (en) * 2006-05-18 2012-12-11 Otrsotech, Llc Methods and systems for placement and routing
JP5022741B2 (ja) * 2007-03-12 2012-09-12 株式会社リコー 半導体集積回路
US8347260B2 (en) 2010-09-13 2013-01-01 International Business Machines Corporation Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage
US9479456B2 (en) 2012-11-02 2016-10-25 Altera Corporation Programmable logic device with integrated network-on-chip
US9793881B2 (en) * 2013-08-05 2017-10-17 Samsung Electronics Co., Ltd. Flip-flop with zero-delay bypass mux
CN112231999B (zh) * 2020-09-24 2023-09-15 联暻半导体(山东)有限公司 一种提高双沿时钟电路测试覆盖率的装置及其设计方法
TWI835442B (zh) * 2022-11-30 2024-03-11 瑞昱半導體股份有限公司 具有時脈遮蔽電路之晶片

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US5550839A (en) * 1993-03-12 1996-08-27 Xilinx, Inc. Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays
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Also Published As

Publication number Publication date
ATE405883T1 (de) 2008-09-15
WO1999030236A1 (en) 1999-06-17
JP2001526423A (ja) 2001-12-18
JP4361681B2 (ja) 2009-11-11
US6223313B1 (en) 2001-04-24
EP1034479A1 (en) 2000-09-13
EP1034479B1 (en) 2008-08-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: OTRSOTECH, LLC, WILMINGTON, DEL., US