DE69839617D1 - Vorrichtung und Verfahren zur Messung von Eigenschaften des Lichts - Google Patents

Vorrichtung und Verfahren zur Messung von Eigenschaften des Lichts

Info

Publication number
DE69839617D1
DE69839617D1 DE69839617T DE69839617T DE69839617D1 DE 69839617 D1 DE69839617 D1 DE 69839617D1 DE 69839617 T DE69839617 T DE 69839617T DE 69839617 T DE69839617 T DE 69839617T DE 69839617 D1 DE69839617 D1 DE 69839617D1
Authority
DE
Germany
Prior art keywords
light
measuring properties
properties
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69839617T
Other languages
English (en)
Inventor
Susumu Machida
Shudong Jiang
Jun Chen
Yoshihisa Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Science and Technology Agency
Original Assignee
Japan Science and Technology Agency
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP26206497A external-priority patent/JP3810531B2/ja
Priority claimed from JP00891998A external-priority patent/JP3701457B2/ja
Application filed by Japan Science and Technology Agency filed Critical Japan Science and Technology Agency
Application granted granted Critical
Publication of DE69839617D1 publication Critical patent/DE69839617D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
DE69839617T 1997-09-26 1998-09-25 Vorrichtung und Verfahren zur Messung von Eigenschaften des Lichts Expired - Lifetime DE69839617D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP26206497A JP3810531B2 (ja) 1997-09-26 1997-09-26 光位相特性測定装置及び測定方法
JP00891998A JP3701457B2 (ja) 1998-01-20 1998-01-20 光振幅位相特性測定装置およびその測定方法

Publications (1)

Publication Number Publication Date
DE69839617D1 true DE69839617D1 (de) 2008-07-24

Family

ID=26343543

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69839617T Expired - Lifetime DE69839617D1 (de) 1997-09-26 1998-09-25 Vorrichtung und Verfahren zur Messung von Eigenschaften des Lichts
DE69839596T Expired - Lifetime DE69839596D1 (de) 1997-09-26 1998-09-25 Vorrichtung und Verfahren zur Messung von Lichteigenschaften

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69839596T Expired - Lifetime DE69839596D1 (de) 1997-09-26 1998-09-25 Vorrichtung und Verfahren zur Messung von Lichteigenschaften

Country Status (3)

Country Link
US (1) US6141138A (de)
EP (2) EP1455170B1 (de)
DE (2) DE69839617D1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6801355B1 (en) * 2000-11-16 2004-10-05 Lightbit Corporation, Inc. Optical signal converter with filtered output
JP3865289B2 (ja) * 2000-11-22 2007-01-10 独立行政法人科学技術振興機構 マイクロ波によるプラズマ発生装置
US7608808B2 (en) * 2006-11-07 2009-10-27 Canon Kabushiki Kaisha Injection-locked pulsed laser with high wavelength stability
JP5852300B2 (ja) * 2009-12-02 2016-02-03 オリンパス株式会社 光検出装置、顕微鏡および内視鏡
KR20130073450A (ko) * 2011-12-23 2013-07-03 한국전자통신연구원 테라헤르츠파 생성기 및 테라헤르츠파 생성 방법
WO2015171135A1 (en) * 2014-05-07 2015-11-12 Halliburton Energy Services, Inc. Adaptive feedback for phase estimation and adjustment
CN104332816B (zh) * 2014-11-26 2017-10-17 山西大学 一种锁定两束同频率激光到任意位相的方法
CN106768335B (zh) * 2017-03-23 2019-04-09 天津大学 一种非线性光谱相位测量方法
TWI647430B (zh) * 2017-10-12 2019-01-11 致茂電子股份有限公司 光學量測裝置
CN109612955B (zh) * 2019-01-07 2023-11-24 中国科学院力学研究所 一种和频振动光谱相位测量装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2203974B1 (de) * 1972-10-23 1977-01-14 Commissariat Energie Atomique
US4836676A (en) * 1984-04-25 1989-06-06 The Board Of Trustees Of The Leland Stanford Junior University Phase reading fiber optic interferometer
US5253038A (en) * 1986-03-03 1993-10-12 U.S. Philips Corp. Interferometric device for detecting a centering error
US4906095A (en) * 1988-01-25 1990-03-06 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for performing two-frequency interferometry
JPH04161832A (ja) * 1990-10-26 1992-06-05 Olympus Optical Co Ltd 光位相差測定法
JPH04283603A (ja) * 1991-03-12 1992-10-08 Yokogawa Electric Corp 光源に近赤外レ−ザダイオ−ドを用いた光学的測定装置
JPH04331333A (ja) * 1991-05-02 1992-11-19 Canon Inc 波長変化測定装置
JP3237384B2 (ja) * 1994-03-09 2001-12-10 日本電信電話株式会社 光デバイスの波長分散測定方法及び装置
US5623339A (en) * 1995-08-04 1997-04-22 International Business Machines Corporation Interferometric measuring method based on multi-pole sensing

Also Published As

Publication number Publication date
EP0908710B1 (de) 2008-06-11
US6141138A (en) 2000-10-31
EP0908710A2 (de) 1999-04-14
DE69839596D1 (de) 2008-07-24
EP1455170B1 (de) 2008-06-11
EP1455170A1 (de) 2004-09-08
EP0908710A3 (de) 2000-05-17

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Legal Events

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8364 No opposition during term of opposition