DE69836880D1 - Integrierte Halbleiterschaltung mit Testmode- und Normalbetriebsstrompfaden - Google Patents

Integrierte Halbleiterschaltung mit Testmode- und Normalbetriebsstrompfaden

Info

Publication number
DE69836880D1
DE69836880D1 DE69836880T DE69836880T DE69836880D1 DE 69836880 D1 DE69836880 D1 DE 69836880D1 DE 69836880 T DE69836880 T DE 69836880T DE 69836880 T DE69836880 T DE 69836880T DE 69836880 D1 DE69836880 D1 DE 69836880D1
Authority
DE
Germany
Prior art keywords
normal operating
test mode
operating current
semiconductor circuit
current paths
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69836880T
Other languages
English (en)
Other versions
DE69836880T2 (de
Inventor
Kazuko Nishimura
Hironori Akamatsu
Akira Matsuzawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69836880D1 publication Critical patent/DE69836880D1/de
Publication of DE69836880T2 publication Critical patent/DE69836880T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69836880T 1997-05-23 1998-05-22 Integrierte Halbleiterschaltung mit Testmode- und Normalbetriebsstrompfaden Expired - Lifetime DE69836880T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP13336997 1997-05-23
JP13336997 1997-05-23

Publications (2)

Publication Number Publication Date
DE69836880D1 true DE69836880D1 (de) 2007-03-08
DE69836880T2 DE69836880T2 (de) 2007-05-24

Family

ID=15103125

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69836880T Expired - Lifetime DE69836880T2 (de) 1997-05-23 1998-05-22 Integrierte Halbleiterschaltung mit Testmode- und Normalbetriebsstrompfaden

Country Status (3)

Country Link
EP (1) EP0880172B1 (de)
KR (1) KR100506667B1 (de)
DE (1) DE69836880T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100569543B1 (ko) * 1998-12-31 2006-08-21 주식회사 하이닉스반도체 반도체 메모리 테스트 장치
CN108829551B (zh) * 2018-06-04 2021-06-11 北京航天自动控制研究所 一种高低压火工品等效器测试系统及方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63217821A (ja) * 1987-03-06 1988-09-09 Toshiba Corp 半導体集積回路
US5025344A (en) * 1988-11-30 1991-06-18 Carnegie Mellon University Built-in current testing of integrated circuits
US5644251A (en) * 1993-04-22 1997-07-01 Lsi Logic Corporation Switchable pull-ups and pull-downs for IDDQ testing of integrated circuits
ATE300741T1 (de) * 1996-06-05 2005-08-15 Imec Inter Uni Micro Electr Hochauflösendes stromversorgungsprüfsystem

Also Published As

Publication number Publication date
DE69836880T2 (de) 2007-05-24
EP0880172A3 (de) 2002-04-03
EP0880172B1 (de) 2007-01-17
KR19980087302A (ko) 1998-12-05
KR100506667B1 (ko) 2005-09-26
EP0880172A2 (de) 1998-11-25

Similar Documents

Publication Publication Date Title
DE69828234D1 (de) Integrierte Halbleiterschaltungsanordnung
DE69830962D1 (de) Integrierte Halbleiterschaltungsanordnung
DE69824972D1 (de) Integrierter halbleiterschaltkreis
DE69830772D1 (de) Integrierte Halbleiterschaltungsanordnung
DE69935099D1 (de) Leistungsschaltung mit Einschaltstrombegrenzung, und integrierte Schaltung mit dieser Leistungsschaltung
DE60143340D1 (de) Integrierte Halbleiterschaltung mit reduziertem Leckstrom
DE69943120D1 (de) Integrierte Halbleiterschaltung
DE69830883D1 (de) Halbleiterbauelement und mit diesem Bauelement bestückte Leiterplatte
DE69827863D1 (de) Integriertes Halbleiterschaltkreisbauelement
DE69927658D1 (de) Integrierte Halbleiterschaltung
FI19991946A (fi) Piiri puolijohdekytkinlaitteen estotilan saattamiseksi ylivirtatapauksessa
DE69832359D1 (de) Halbleitervorrichtung -anordnung und -schaltungen
DE69621420D1 (de) Halbleiteranordnung mit Modusregistersteuerschaltung
DE69837135D1 (de) Integrierte Halbleiterschaltungsanordnung
DE69900484D1 (de) Sicherung für integrierten Schaltkreis mit lokalisiertem Zusammenbruch
DE59909951D1 (de) Schaltungsanordnung mit temperaturabhängiger Halbleiterbauelement-Test- und Reparaturlogik
DE69830878D1 (de) Integrierte Halbleiterschaltungsanordnung
DE69907997D1 (de) Halbleiterspeicherschaltung mit Redundanz
DE69904685D1 (de) Sequentielle logische Schaltung mit Betriebs- und Schlafmodus
DE69909375D1 (de) Integrierte Schaltungsanordnung
DE69909523D1 (de) Schaltung mit gemischten Signalen und Geräte integrierter Schaltungen
DE69531657D1 (de) Integrierte Schaltung mit Prüfungspfad
DE69838660D1 (de) Integrierte Halbleiterschaltungsanordnung
DE69836625D1 (de) Prüfen der funktionellen blöcke in einer integrierten halbleiterschaltung
DE69823769D1 (de) Niederspannungs-Abtast- und Halteschaltungen

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PANASONIC CORP., KADOMA, OSAKA, JP