DE69823413D1 - Rastersondemikroskop - Google Patents
RastersondemikroskopInfo
- Publication number
- DE69823413D1 DE69823413D1 DE69823413T DE69823413T DE69823413D1 DE 69823413 D1 DE69823413 D1 DE 69823413D1 DE 69823413 T DE69823413 T DE 69823413T DE 69823413 T DE69823413 T DE 69823413T DE 69823413 D1 DE69823413 D1 DE 69823413D1
- Authority
- DE
- Germany
- Prior art keywords
- scanning probe
- probe microscope
- microscope
- scanning
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
- G01Q60/08—MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/32—AC mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/50—MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
- G01Q60/52—Resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/038—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices
- G01R33/0385—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices in relation with magnetic force measurements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/865—Magnetic force probe
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9043938A JPH10239329A (ja) | 1997-02-27 | 1997-02-27 | 走査プローブ顕微鏡 |
JP4393897 | 1997-02-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69823413D1 true DE69823413D1 (de) | 2004-06-03 |
DE69823413T2 DE69823413T2 (de) | 2004-09-09 |
Family
ID=12677649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69823413T Expired - Fee Related DE69823413T2 (de) | 1997-02-27 | 1998-02-27 | Rastersondemikroskop |
Country Status (4)
Country | Link |
---|---|
US (1) | US5939715A (de) |
EP (1) | EP0862046B1 (de) |
JP (1) | JPH10239329A (de) |
DE (1) | DE69823413T2 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11160333A (ja) * | 1997-11-25 | 1999-06-18 | Jeol Ltd | 走査プローブ顕微鏡 |
JP3406236B2 (ja) * | 1998-02-19 | 2003-05-12 | セイコーインスツルメンツ株式会社 | 走査プローブ顕微鏡の測定方法および装置 |
US6672144B2 (en) | 1999-03-29 | 2004-01-06 | Veeco Instruments Inc. | Dynamic activation for an atomic force microscope and method of use thereof |
US6189374B1 (en) | 1999-03-29 | 2001-02-20 | Nanodevices, Inc. | Active probe for an atomic force microscope and method of use thereof |
TW435701U (en) * | 2000-05-03 | 2001-05-16 | Ind Tech Res Inst | Atomic force microscope |
EP1162645A3 (de) * | 2000-06-09 | 2007-09-26 | Jeol Ltd. | Probeninspektionsgerät |
RU2193769C2 (ru) * | 2000-12-14 | 2002-11-27 | Закрытое акционерное общество "НТ-МДТ" | Способ измерения характеристик приповерхностного магнитного поля с использованием сканирующего зондового микроскопа |
US20030234358A1 (en) * | 2002-06-20 | 2003-12-25 | Nec Research Institute, Inc. | Piezo-noise microscope and methods for use thereof |
KR100501893B1 (ko) * | 2002-11-14 | 2005-07-25 | 한국전자통신연구원 | 주파수 응답 분리 방식을 이용한 비접촉식 측정 장치 및그 측정 방법 |
US7023204B2 (en) * | 2002-11-18 | 2006-04-04 | International Business Machine Corporation | Magnetic imaging microscope test system and its application for characterization of read and write heads for magnetic recording |
US20050092907A1 (en) * | 2003-11-04 | 2005-05-05 | West Paul E. | Oscillating scanning probe microscope |
US7111504B2 (en) * | 2004-09-30 | 2006-09-26 | Lucent Technologies Inc. | Atomic force microscope |
JP2008089502A (ja) * | 2006-10-04 | 2008-04-17 | Kagawa Univ | 自励発振駆動機構、センサおよびプローブ顕微鏡 |
WO2011109913A1 (en) | 2010-03-10 | 2011-09-15 | Zurich Instruments Ag | Apparatus and method for demodulating an input signal |
US8347409B2 (en) * | 2010-05-24 | 2013-01-01 | Massachusetts Institute Of Technology | Resonance compensation in scanning probe microscopy |
JP5579516B2 (ja) * | 2010-07-01 | 2014-08-27 | 株式会社日立製作所 | 走査プローブ顕微鏡 |
JP2012198192A (ja) * | 2011-03-07 | 2012-10-18 | Tokyo Institute Of Technology | 磁気力顕微鏡及び高空間分解能磁場測定方法 |
JP6481191B2 (ja) * | 2013-09-02 | 2019-03-13 | 国立大学法人秋田大学 | 交流磁場測定装置および交流磁場測定方法 |
CN105137126B (zh) * | 2015-09-16 | 2018-10-30 | 中北大学 | 一种氮空位色心金刚石的扫描磁强计 |
US20220208538A1 (en) * | 2019-05-31 | 2022-06-30 | Purdue Research Foundation | Integrated microfluidic probe (imfp) and methods of use thereof |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5266897A (en) * | 1990-09-05 | 1993-11-30 | International Business Machines Corporation | Magnetic field observation with tunneling microscopy |
US5266896A (en) * | 1992-06-09 | 1993-11-30 | International Business Machines Corporation | Mechanical detection and imaging of magnetic resonance by magnetic moment modulation |
US5308974B1 (en) * | 1992-11-30 | 1998-01-06 | Digital Instr Inc | Scanning probe microscope using stored data for vertical probe positioning |
JP3076889B2 (ja) * | 1993-09-02 | 2000-08-14 | セイコーインスツルメンツ株式会社 | 磁気力顕微鏡 |
US5465046A (en) * | 1994-03-21 | 1995-11-07 | Campbell; Ann. N. | Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits |
-
1997
- 1997-02-27 JP JP9043938A patent/JPH10239329A/ja not_active Withdrawn
-
1998
- 1998-02-27 DE DE69823413T patent/DE69823413T2/de not_active Expired - Fee Related
- 1998-02-27 EP EP98301473A patent/EP0862046B1/de not_active Expired - Lifetime
- 1998-02-27 US US09/031,641 patent/US5939715A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69823413T2 (de) | 2004-09-09 |
EP0862046A1 (de) | 1998-09-02 |
JPH10239329A (ja) | 1998-09-11 |
US5939715A (en) | 1999-08-17 |
EP0862046B1 (de) | 2004-04-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |