DE69809504T2 - Mikroskop mit Beleuchtungssystem für sichtbares und ultraviolettes Licht - Google Patents

Mikroskop mit Beleuchtungssystem für sichtbares und ultraviolettes Licht

Info

Publication number
DE69809504T2
DE69809504T2 DE69809504T DE69809504T DE69809504T2 DE 69809504 T2 DE69809504 T2 DE 69809504T2 DE 69809504 T DE69809504 T DE 69809504T DE 69809504 T DE69809504 T DE 69809504T DE 69809504 T2 DE69809504 T2 DE 69809504T2
Authority
DE
Germany
Prior art keywords
microscope
visible
ultraviolet light
lighting system
lighting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69809504T
Other languages
English (en)
Other versions
DE69809504D1 (de
Inventor
Takeuchi Atsushi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Application granted granted Critical
Publication of DE69809504D1 publication Critical patent/DE69809504D1/de
Publication of DE69809504T2 publication Critical patent/DE69809504T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/082Condensers for incident illumination only
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/18Arrangements with more than one light path, e.g. for comparing two specimens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Lenses (AREA)
DE69809504T 1997-08-06 1998-08-05 Mikroskop mit Beleuchtungssystem für sichtbares und ultraviolettes Licht Expired - Lifetime DE69809504T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22432397A JP3843548B2 (ja) 1997-08-06 1997-08-06 顕微鏡装置

Publications (2)

Publication Number Publication Date
DE69809504D1 DE69809504D1 (de) 2003-01-02
DE69809504T2 true DE69809504T2 (de) 2003-07-17

Family

ID=16811961

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69809504T Expired - Lifetime DE69809504T2 (de) 1997-08-06 1998-08-05 Mikroskop mit Beleuchtungssystem für sichtbares und ultraviolettes Licht

Country Status (4)

Country Link
US (1) US6337767B1 (de)
EP (1) EP0896237B1 (de)
JP (1) JP3843548B2 (de)
DE (1) DE69809504T2 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6339498B1 (en) * 1999-04-27 2002-01-15 Olympus Optical Co., Ltd. Ultraviolet microscope optical system and optical filter used in the same optical system
JP4493119B2 (ja) * 1999-04-27 2010-06-30 オリンパス株式会社 紫外線顕微鏡
JP2001154104A (ja) * 1999-11-25 2001-06-08 Olympus Optical Co Ltd 顕微鏡装置
US6636354B1 (en) * 1999-12-29 2003-10-21 Intel Corporation Microscope device for a computer system
US6567212B1 (en) * 2000-08-16 2003-05-20 Leica Microsystems Heidelberg Gmbh Vibration damping device for microscopes and microscope with a vibration damping device
DE50107742D1 (de) * 2000-12-11 2006-03-02 Leica Microsystems Mikroskop
DE10120424B4 (de) * 2001-04-26 2004-08-05 Leica Microsystems Heidelberg Gmbh Scanmikroskop und Auskoppelelement
US6891618B2 (en) * 2001-09-07 2005-05-10 Wallac Oy Optical instrument and process for measurement of samples
US6822741B2 (en) * 2001-09-07 2004-11-23 Wallac Oy Optical instrument and process for measurement of samples
US7023553B2 (en) * 2001-09-07 2006-04-04 Wallac Oy Intelligent instrumentation with changeable optical components
US7305115B2 (en) * 2002-02-22 2007-12-04 Siemens Energy And Automation, Inc. Method and system for improving ability of a machine vision system to discriminate features of a target
DE10245170A1 (de) * 2002-09-26 2004-04-01 Leica Microsystems Wetzlar Gmbh Vorrichtung und Verfahren um positionieren eines optischen Bauteils
JP2006154237A (ja) * 2004-11-29 2006-06-15 Olympus Corp 顕微鏡
JP2006154239A (ja) * 2004-11-29 2006-06-15 Olympus Corp 顕微鏡
US20070103892A1 (en) * 2005-11-08 2007-05-10 Cooper Brands, Inc. Toolbox with lighted handle
JP5296686B2 (ja) 2006-08-14 2013-09-25 ウエストオーバー サイエンティフィック,インコーポレイテッド 半導体蛍光アセンブリ及び顕微鏡
WO2008072365A1 (ja) * 2006-12-13 2008-06-19 Nikon Corporation 蛍光検出装置及び蛍光観察システム
DE102007027084B4 (de) * 2007-06-12 2021-01-14 Carl Zeiss Microscopy Gmbh Mikroskop für die Beobachtung einer Probe im Hellfeld-Durchlicht- oder im Fluoreszenz-Auflicht-Kontrastverfahren
US20090236543A1 (en) * 2008-03-19 2009-09-24 Nikon Corporation Fluorescence Detection Using Lyman-alpha Line Illumination
JP2016095493A (ja) * 2014-11-07 2016-05-26 オリンパス株式会社 顕微鏡装置
CN112839148B (zh) * 2020-12-23 2023-03-14 北京市农林科学院智能装备技术研究中心 摄像头组件、电子设备及紫外辐射强度检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59172617A (ja) * 1983-03-22 1984-09-29 Olympus Optical Co Ltd 自動制御式照明光学系を備えた顕微鏡
US4756611A (en) * 1984-08-31 1988-07-12 Olympus Optical Co., Ltd. Multiple-purpose microscope
US4656358A (en) 1985-03-12 1987-04-07 Optoscan Corporation Laser-based wafer measuring system
DE3610692A1 (de) * 1986-03-29 1987-10-01 Leitz Ernst Gmbh Modulare einrichtung
JP3324780B2 (ja) * 1991-05-16 2002-09-17 オリンパス光学工業株式会社 紫外線顕微鏡
US5633752A (en) * 1994-07-27 1997-05-27 Olympus Optical Co., Ltd. Optical switching apparatus for a reflected fluorescence microscope
JP3537205B2 (ja) * 1995-02-02 2004-06-14 オリンパス株式会社 顕微鏡装置
JP3656918B2 (ja) 1995-06-12 2005-06-08 オリンパス株式会社 電動レボルバ制御装置
US5717518A (en) * 1996-07-22 1998-02-10 Kla Instruments Corporation Broad spectrum ultraviolet catadioptric imaging system

Also Published As

Publication number Publication date
EP0896237B1 (de) 2002-11-20
EP0896237A1 (de) 1999-02-10
US6337767B1 (en) 2002-01-08
DE69809504D1 (de) 2003-01-02
JPH1152253A (ja) 1999-02-26
JP3843548B2 (ja) 2006-11-08

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