DE69718103T2 - Amplitudenerfassungseinrichtung - Google Patents

Amplitudenerfassungseinrichtung

Info

Publication number
DE69718103T2
DE69718103T2 DE69718103T DE69718103T DE69718103T2 DE 69718103 T2 DE69718103 T2 DE 69718103T2 DE 69718103 T DE69718103 T DE 69718103T DE 69718103 T DE69718103 T DE 69718103T DE 69718103 T2 DE69718103 T2 DE 69718103T2
Authority
DE
Germany
Prior art keywords
amplitude detector
amplitude
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69718103T
Other languages
English (en)
Other versions
DE69718103D1 (de
Inventor
Nobuhiro Ishikawa
Motonori Ogihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Publication of DE69718103D1 publication Critical patent/DE69718103D1/de
Application granted granted Critical
Publication of DE69718103T2 publication Critical patent/DE69718103T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/002—Constructional details of contacts for gauges actuating one or more contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
DE69718103T 1996-06-25 1997-06-20 Amplitudenerfassungseinrichtung Expired - Lifetime DE69718103T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16470996A JP3336196B2 (ja) 1996-06-25 1996-06-25 振幅抽出装置

Publications (2)

Publication Number Publication Date
DE69718103D1 DE69718103D1 (de) 2003-02-06
DE69718103T2 true DE69718103T2 (de) 2003-10-30

Family

ID=15798401

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69718103T Expired - Lifetime DE69718103T2 (de) 1996-06-25 1997-06-20 Amplitudenerfassungseinrichtung

Country Status (5)

Country Link
US (1) US5922964A (de)
EP (1) EP0816796B1 (de)
JP (1) JP3336196B2 (de)
CN (1) CN1102739C (de)
DE (1) DE69718103T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2336433B (en) * 1998-04-14 2002-02-06 Mitutoyo Corp Touch signal probe
US6314279B1 (en) * 1998-06-29 2001-11-06 Philips Electronics North America Corporation Frequency offset image rejection
JP3401444B2 (ja) 1998-12-15 2003-04-28 株式会社ミツトヨ 微細形状測定装置
JP3664950B2 (ja) * 2000-06-15 2005-06-29 株式会社村田製作所 角速度センサ
JP3498908B2 (ja) 2000-07-25 2004-02-23 株式会社ミツトヨ 交流信号の振幅サンプリング方法及び振幅検出回路
US20020145415A1 (en) * 2001-04-09 2002-10-10 Vanremmen William John Method and apparatus for determining the instantaneous power of a sinusoidal signal
JP5297818B2 (ja) 2009-01-06 2013-09-25 株式会社ミツトヨ 三次元測定機
CA3070234A1 (en) * 2017-07-18 2019-01-24 Candu Energy Inc. Method and apparatus for detection and positioning of objects by vibration

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5436768A (en) * 1977-08-26 1979-03-17 Norio Akamatsu Instantaneous sine wave detector
FR2408813A1 (fr) * 1977-11-10 1979-06-08 Sagem Perfectionnements aux procedes et dispositifs de palpage a contact, notamment pour machines a mesurer
SU1095065A2 (ru) * 1979-11-05 1984-05-30 Вильнюсский Филиал Экспериментального Научно-Исследовательского Института Металлорежущих Станков Измерительна головка
GB8629438D0 (en) * 1986-12-09 1987-01-21 Reinshaw Plc Processing quadrature signals
DE3723933A1 (de) * 1987-07-20 1989-02-02 Krautkraemer Gmbh Verfahren zum erfassen einer kleinflaechigen, nahezu punktfoermigen und weitgehend kraeftefreien beruehrung zwischen einer sonde und einem festen gegenstand, sowie beruehrungsdetektor
US5339535A (en) * 1990-02-23 1994-08-23 Renishaw Metrology Limited Touch probe
US5247751A (en) * 1990-09-29 1993-09-28 Nikon Corporation Touch probe
JP3074798B2 (ja) * 1991-06-25 2000-08-07 三菱電機株式会社 移相器
US5463393A (en) * 1991-12-05 1995-10-31 Acutronic Ag Method and apparatus for correcting errors in an amplitude encoded signal
US5347361A (en) * 1992-04-08 1994-09-13 Honeywell Inc. Rotation sensor output signal processor
EP0605140B2 (de) * 1992-12-24 2002-10-09 Renishaw plc Tastsonde und Signalverarbeitungsschaltung dafür

Also Published As

Publication number Publication date
US5922964A (en) 1999-07-13
EP0816796B1 (de) 2003-01-02
JPH109848A (ja) 1998-01-16
CN1172260A (zh) 1998-02-04
DE69718103D1 (de) 2003-02-06
JP3336196B2 (ja) 2002-10-21
EP0816796A1 (de) 1998-01-07
CN1102739C (zh) 2003-03-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition