DE69735990D1 - Photoleitender Detektor - Google Patents

Photoleitender Detektor

Info

Publication number
DE69735990D1
DE69735990D1 DE69735990T DE69735990T DE69735990D1 DE 69735990 D1 DE69735990 D1 DE 69735990D1 DE 69735990 T DE69735990 T DE 69735990T DE 69735990 T DE69735990 T DE 69735990T DE 69735990 D1 DE69735990 D1 DE 69735990D1
Authority
DE
Germany
Prior art keywords
photoconductive detector
photoconductive
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69735990T
Other languages
English (en)
Other versions
DE69735990T2 (de
Inventor
Eric Costard
Philippe Bois
Eric Herniou
Marcel Audier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thales SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales SA filed Critical Thales SA
Publication of DE69735990D1 publication Critical patent/DE69735990D1/de
Application granted granted Critical
Publication of DE69735990T2 publication Critical patent/DE69735990T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/041Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L31/00
    • H01L25/043Stacked arrangements of devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14643Photodiode arrays; MOS imagers
    • H01L27/14649Infrared imagers
    • H01L27/1465Infrared imagers of the hybrid type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE69735990T 1996-12-04 1997-12-02 Photoleitender Detektor Expired - Lifetime DE69735990T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9614851A FR2756666B1 (fr) 1996-12-04 1996-12-04 Detecteur d'ondes electromagnetiques
FR9614851 1996-12-04

Publications (2)

Publication Number Publication Date
DE69735990D1 true DE69735990D1 (de) 2006-07-06
DE69735990T2 DE69735990T2 (de) 2007-01-04

Family

ID=9498308

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69735990T Expired - Lifetime DE69735990T2 (de) 1996-12-04 1997-12-02 Photoleitender Detektor

Country Status (8)

Country Link
US (1) US6091126A (de)
EP (1) EP0849798B1 (de)
JP (1) JPH10223874A (de)
CA (1) CA2223539A1 (de)
DE (1) DE69735990T2 (de)
FR (1) FR2756666B1 (de)
IL (1) IL122429A (de)
SG (1) SG67447A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999019912A1 (en) * 1997-10-16 1999-04-22 California Institute Of Technology Dual-band quantum-well infrared sensing array
CA2351721C (en) * 1998-11-20 2004-02-24 California Institute Of Technology Slotted quantum well sensor
US7291858B2 (en) * 1999-12-24 2007-11-06 Bae Systems Information And Electronic Systems Integration Inc. QWIP with tunable spectral response
US6875975B2 (en) * 1999-12-24 2005-04-05 Bae Systems Information And Electronic Systems Integration Inc Multi-color, multi-focal plane optical detector
EP1254483A4 (de) * 1999-12-24 2008-03-05 Bae Systems Information Optischer mehrfarbendetektor mit mehreren bildebenen
FR2808925B1 (fr) * 2000-05-12 2003-08-08 Thomson Csf Detecteur optique bi-spectral
FR2808926B1 (fr) * 2000-05-12 2003-08-01 Thomson Csf Detecteur optique polarimetrique
FR2811808B1 (fr) * 2000-07-11 2002-10-25 Thomson Csf Dispositif d'auto-compensation pour detecteurs soustractifs
FR2855654B1 (fr) * 2003-05-27 2006-03-03 Thales Sa Detecteur d'ondes electromagnetiques avec surface de couplage optique comprenant des motifs lamellaires
FR2855653B1 (fr) * 2003-05-27 2005-10-21 Thales Sa Structure amorphe de couplage optique pour detecteur d'ondes electromagnetiques et detecteur associe
FR2863774B1 (fr) * 2003-12-16 2006-03-03 Thales Sa Photodetecteur a concentration de champ proche
FR2915833B1 (fr) * 2007-05-04 2010-03-12 Thales Sa Detecteur matriciel d'impulsions laser avec sommation rapide.
DE102008006987A1 (de) * 2008-01-31 2009-08-06 Osram Opto Semiconductors Gmbh Strahlungsempfänger und Verfahren zur Herstellung eines Strahlungsempfängers
FR2937792B1 (fr) * 2008-10-24 2011-03-18 Thales Sa Dispositif d'imagerie multispectral a base de multi-puits quantiques
FR2937791B1 (fr) * 2008-10-24 2010-11-26 Thales Sa Dispositif d'imagerie polarimetrique optimise par rapport au contraste de polarisation
FR2940463B1 (fr) * 2008-12-23 2012-07-27 Thales Sa Systeme d'imagerie passive equipe d'un telemetre
JP5533294B2 (ja) * 2010-06-08 2014-06-25 富士通株式会社 イメージセンサ及び撮像装置
DE102012007677B4 (de) 2012-04-17 2015-05-07 Airbus Defence and Space GmbH Optische Sensoranordnung
KR101304094B1 (ko) * 2012-05-23 2013-09-05 서울대학교산학협력단 플래시 메모리의 구조를 이용한 전자파 측정 장치 및 이를 이용한 전자파 측정 방법
US11282887B2 (en) 2019-04-11 2022-03-22 Hrl Laboratories, Llc Simultaneous dual-band image sensors

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193923A (ja) * 1984-10-15 1986-05-12 Sharp Corp 色温度の検出回路
CA1314614C (en) * 1988-06-06 1993-03-16 Clyde George Bethea Quantum-well radiation detector
FR2653229B1 (fr) * 1989-10-12 1992-01-17 Thomson Csf Detecteur capacitif d'onde electromagnetique.
FR2655434B1 (fr) * 1989-12-05 1992-02-28 Thomson Csf Dispositif optique a puits quantiques et procede de realisation.
GB2248964A (en) * 1990-10-17 1992-04-22 Philips Electronic Associated Plural-wavelength infrared detector devices
FR2670006B1 (fr) * 1990-11-29 1993-03-12 Thomson Csf Bolometre electronique a puits quantique et application a un detecteur de rayonnements.
FR2678774B1 (fr) * 1991-07-05 1998-07-10 Thomson Csf Detecteur d'ondes electromagnetiques.
FR2693594B1 (fr) * 1992-07-07 1994-08-26 Thomson Csf Détecteur d'ondes électromagnétiques à puits quantiques.
FR2729789B1 (fr) * 1993-09-10 1998-03-20 Thomson Csf Detecteur a puits quantique et procede de realisation
FR2718571B1 (fr) * 1994-04-08 1996-05-15 Thomson Csf Composant hybride semiconducteur.
US5552603A (en) * 1994-09-15 1996-09-03 Martin Marietta Corporation Bias and readout for multicolor quantum well detectors
FR2726691B1 (fr) * 1994-11-08 1997-01-24 Thomson Csf Photodetecteur de grande dimension et procede de realisation d'un tel photodetecteur
FR2726903B1 (fr) * 1994-11-10 1996-12-06 Thomson Csf Ecartometre integre
US5731621A (en) * 1996-03-19 1998-03-24 Santa Barbara Research Center Three band and four band multispectral structures having two simultaneous signal outputs

Also Published As

Publication number Publication date
EP0849798B1 (de) 2006-05-31
US6091126A (en) 2000-07-18
CA2223539A1 (fr) 1998-06-04
IL122429A0 (en) 1998-06-15
IL122429A (en) 2002-03-10
SG67447A1 (en) 1999-09-21
FR2756666A1 (fr) 1998-06-05
FR2756666B1 (fr) 1999-02-19
EP0849798A1 (de) 1998-06-24
DE69735990T2 (de) 2007-01-04
JPH10223874A (ja) 1998-08-21

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Legal Events

Date Code Title Description
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