DE69710230D1 - Non-volatile semiconductor memory unit with correction coding circuit - Google Patents
Non-volatile semiconductor memory unit with correction coding circuitInfo
- Publication number
- DE69710230D1 DE69710230D1 DE69710230T DE69710230T DE69710230D1 DE 69710230 D1 DE69710230 D1 DE 69710230D1 DE 69710230 T DE69710230 T DE 69710230T DE 69710230 T DE69710230 T DE 69710230T DE 69710230 D1 DE69710230 D1 DE 69710230D1
- Authority
- DE
- Germany
- Prior art keywords
- data
- error
- prom
- detection signal
- specific
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000001514 detection method Methods 0.000 abstract 6
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
Abstract
A semiconductor storage unit includes: a first PROM; a second PROM for storing parity data based on data stored in the first PROM; an error detecting circuit for detecting an error in read data outputted from the first PROM on the basis of the parity data outputted from the second PROM to generate an error detection signal; an error correcting circuit for outputting the data read out from the first PROM as it is when no error detection signal is supplied thereto, and for outputting error corrected data when the error detection signal is supplied thereto; a specific-mode detecting circuit for generating a specific-mode detection signal when detecting a specific mode; and a different-data generating means for generating data different from data outputted from the error correcting circuit as output data when both of the error detection signal and the specific-mode detection signal are generated. <IMAGE>
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP08041042A JP3106947B2 (en) | 1996-02-28 | 1996-02-28 | Nonvolatile semiconductor memory device |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69710230D1 true DE69710230D1 (en) | 2002-03-21 |
DE69710230T2 DE69710230T2 (en) | 2002-10-24 |
Family
ID=12597355
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69710230T Expired - Fee Related DE69710230T2 (en) | 1996-02-28 | 1997-02-27 | Non-volatile semiconductor memory unit with correction coding circuit |
Country Status (4)
Country | Link |
---|---|
US (1) | US6052816A (en) |
EP (1) | EP0793173B1 (en) |
JP (1) | JP3106947B2 (en) |
DE (1) | DE69710230T2 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100487632B1 (en) * | 1997-10-11 | 2005-07-28 | 주식회사 하이닉스반도체 | Inspection method of multiple faults of DRAM |
US20030120858A1 (en) | 2000-09-15 | 2003-06-26 | Matrix Semiconductor, Inc. | Memory devices and methods for use therewith |
US6591394B2 (en) | 2000-12-22 | 2003-07-08 | Matrix Semiconductor, Inc. | Three-dimensional memory array and method for storing data bits and ECC bits therein |
US7051264B2 (en) * | 2001-11-14 | 2006-05-23 | Monolithic System Technology, Inc. | Error correcting memory and method of operating same |
US7237082B1 (en) * | 2004-06-08 | 2007-06-26 | Sun Microsystems, Inc. | Spatially distributed parity protection |
US7392456B2 (en) * | 2004-11-23 | 2008-06-24 | Mosys, Inc. | Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory |
US8874958B2 (en) * | 2010-11-09 | 2014-10-28 | International Business Machines Corporation | Error detection in a mirrored data storage system |
CN102298112B (en) * | 2011-05-05 | 2016-06-01 | 中兴通讯股份有限公司 | The method of testing of a kind of PLD and system |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61134988A (en) * | 1984-12-04 | 1986-06-23 | Toshiba Corp | Error detecting/correction function controlling system of dynamic type memory |
US4726021A (en) * | 1985-04-17 | 1988-02-16 | Hitachi, Ltd. | Semiconductor memory having error correcting means |
DE3685078D1 (en) * | 1985-09-09 | 1992-06-04 | Hitachi Ltd | MEMORY TEST DEVICE. |
US4710934A (en) * | 1985-11-08 | 1987-12-01 | Texas Instruments Incorporated | Random access memory with error correction capability |
JP2527935B2 (en) * | 1986-05-19 | 1996-08-28 | 株式会社 アドバンテスト | Semiconductor memory test equipment |
US4872168A (en) * | 1986-10-02 | 1989-10-03 | American Telephone And Telegraph Company, At&T Bell Laboratories | Integrated circuit with memory self-test |
US4761783A (en) * | 1986-10-17 | 1988-08-02 | Christensen Harold F | Apparatus and method for reporting occurrences of errors in signals stored in a data processor |
JP2613411B2 (en) * | 1987-12-29 | 1997-05-28 | 株式会社アドバンテスト | Memory test equipment |
JPH01184700A (en) * | 1988-01-11 | 1989-07-24 | Advantest Corp | Memory test equipment |
JP2821278B2 (en) * | 1991-04-15 | 1998-11-05 | 日本電気アイシーマイコンシステム株式会社 | Semiconductor integrated circuit |
JP2745252B2 (en) * | 1991-06-24 | 1998-04-28 | 三菱電機株式会社 | Semiconductor storage device |
US5455517A (en) * | 1992-06-09 | 1995-10-03 | International Business Machines Corporation | Data output impedance control |
JPH06275098A (en) * | 1993-03-24 | 1994-09-30 | Mitsubishi Electric Corp | Semiconductor memory |
JP2801495B2 (en) * | 1993-04-07 | 1998-09-21 | シャープ株式会社 | Optical recording / reproducing device |
-
1996
- 1996-02-28 JP JP08041042A patent/JP3106947B2/en not_active Expired - Fee Related
-
1997
- 1997-02-27 DE DE69710230T patent/DE69710230T2/en not_active Expired - Fee Related
- 1997-02-27 EP EP97103276A patent/EP0793173B1/en not_active Expired - Lifetime
- 1997-02-28 US US08/807,695 patent/US6052816A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP3106947B2 (en) | 2000-11-06 |
EP0793173B1 (en) | 2002-02-06 |
EP0793173A3 (en) | 1998-03-25 |
JPH09231785A (en) | 1997-09-05 |
US6052816A (en) | 2000-04-18 |
DE69710230T2 (en) | 2002-10-24 |
EP0793173A2 (en) | 1997-09-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69821426D1 (en) | Storage arrangement, and data processing system and method | |
KR950002730B1 (en) | Semiconductor integrated circuit | |
EP1619582A3 (en) | Semiconductor memory device with an ECC circuit and method of testing the memory | |
DE3587143D1 (en) | SEMICONDUCTOR STORAGE DEVICE WITH ERROR DETECTION / CORRECTION FUNCTION. | |
EP0364172A3 (en) | Error detection and correction for a data storage system | |
KR870007610A (en) | Error Correction Code Generator and Its Generation Method and Dissipation Code Decoder and Its Decoding Method | |
GB2226168B (en) | Error checking and correction in digital memory devices | |
KR960035267A (en) | An error correction / detection circuit and a semiconductor memory device | |
EP0278415A3 (en) | Memory system and related error detection and correction apparatus | |
DE69710230D1 (en) | Non-volatile semiconductor memory unit with correction coding circuit | |
EP0528234A3 (en) | Data processing system for generating data bits based on stored data | |
KR960015600A (en) | Semiconductor memory device | |
DE69216172D1 (en) | Circuit and method for error detection and correction of data words with check bits | |
JPS55157042A (en) | Information processor | |
JPS567299A (en) | Error correcting circuit | |
JPS5622293A (en) | Control system for replacement memory | |
EP0327309A3 (en) | Memory apparatus having error correction function | |
JPH0383300A (en) | Semiconductor memory | |
DE69526789D1 (en) | Memory arrangement with improved result and improved reliability | |
JPS558617A (en) | Storage system | |
JPS57162188A (en) | Error detecting system for storage device | |
JP2000193492A (en) | Emission quantity correction method of light emitting element for optical encoder | |
ATE81219T1 (en) | MEMORY SYSTEM USING A DC POWER-FREE GATE FIELD FOR ERROR CORRECTION. | |
KR970013797A (en) | Reed-Solomon Decoder | |
KR970051426A (en) | Semiconductor memory device having a repair structure without redundancy memory cells |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP |
|
8339 | Ceased/non-payment of the annual fee |